DE60317876D1 - Voraussagende, adaptive stromversorgung für einen integrierten schaltkreis im test - Google Patents

Voraussagende, adaptive stromversorgung für einen integrierten schaltkreis im test

Info

Publication number
DE60317876D1
DE60317876D1 DE60317876T DE60317876T DE60317876D1 DE 60317876 D1 DE60317876 D1 DE 60317876D1 DE 60317876 T DE60317876 T DE 60317876T DE 60317876 T DE60317876 T DE 60317876T DE 60317876 D1 DE60317876 D1 DE 60317876D1
Authority
DE
Germany
Prior art keywords
predictive
test
power supply
integrated circuit
adaptive power
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60317876T
Other languages
English (en)
Other versions
DE60317876T2 (de
Inventor
Benjamin N Eldridge
Charles A Miller
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FormFactor Inc
Original Assignee
FormFactor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/062,999 external-priority patent/US7342405B2/en
Priority claimed from US10/206,276 external-priority patent/US6657455B2/en
Application filed by FormFactor Inc filed Critical FormFactor Inc
Application granted granted Critical
Publication of DE60317876D1 publication Critical patent/DE60317876D1/de
Publication of DE60317876T2 publication Critical patent/DE60317876T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G06F1/26—Power supply means, e.g. regulation thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
DE60317876T 2002-01-30 2003-01-29 Voraussagende, adaptive stromversorgung für einen integrierten schaltkreis im test Expired - Lifetime DE60317876T2 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US10/062,999 US7342405B2 (en) 2000-01-18 2002-01-30 Apparatus for reducing power supply noise in an integrated circuit
US10/206,276 US6657455B2 (en) 2000-01-18 2002-07-25 Predictive, adaptive power supply for an integrated circuit under test
US206276 2002-07-25
PCT/US2003/002581 WO2003065064A2 (en) 2002-01-30 2003-01-29 Predictive, adaptive power supply for an integrated circuit under test
US62999 2008-04-04

Publications (2)

Publication Number Publication Date
DE60317876D1 true DE60317876D1 (de) 2008-01-17
DE60317876T2 DE60317876T2 (de) 2008-10-23

Family

ID=39035686

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60317876T Expired - Lifetime DE60317876T2 (de) 2002-01-30 2003-01-29 Voraussagende, adaptive stromversorgung für einen integrierten schaltkreis im test

Country Status (3)

Country Link
CN (1) CN101101313A (de)
DE (1) DE60317876T2 (de)
TW (3) TWI298922B (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7924113B2 (en) * 2008-02-15 2011-04-12 Realtek Semiconductor Corp. Integrated front-end passive equalizer and method thereof
WO2010029597A1 (ja) * 2008-09-10 2010-03-18 株式会社アドバンテスト 試験装置および回路システム
US8717053B2 (en) * 2011-11-04 2014-05-06 Keithley Instruments, Inc. DC-AC probe card topology
CN103312550A (zh) * 2012-03-06 2013-09-18 英华达（上海）科技有限公司 具双电源的通讯测试设备及其通讯测试方法
KR102637795B1 (ko) * 2017-02-10 2024-02-19 에스케이하이닉스 주식회사 반도체 장치
CN110308338B (zh) * 2018-03-20 2021-09-24 明泰科技股份有限公司 在线式电压自适应调测系统

Also Published As

Publication number Publication date
TW200729377A (en) 2007-08-01
TW200302539A (en) 2003-08-01
TWI298918B (en) 2008-07-11
DE60317876T2 (de) 2008-10-23
TW200732685A (en) 2007-09-01
CN101101313A (zh) 2008-01-09
TWI298923B (en) 2008-07-11
TWI298922B (en) 2008-07-11

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition