DE60223654D1 - Resistzusammensetzung - Google Patents

Resistzusammensetzung

Info

Publication number
DE60223654D1
DE60223654D1 DE60223654T DE60223654T DE60223654D1 DE 60223654 D1 DE60223654 D1 DE 60223654D1 DE 60223654 T DE60223654 T DE 60223654T DE 60223654 T DE60223654 T DE 60223654T DE 60223654 D1 DE60223654 D1 DE 60223654D1
Authority
DE
Germany
Prior art keywords
resist composition
resist
composition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60223654T
Other languages
English (en)
Other versions
DE60223654T2 (de
Inventor
Isamu Kaneko
Shinji Okada
Yasuhide Kawaguchi
Yoko Takebe
Shun-Ichi Kodama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Inc
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Publication of DE60223654D1 publication Critical patent/DE60223654D1/de
Application granted granted Critical
Publication of DE60223654T2 publication Critical patent/DE60223654T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • G03F7/0392Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/0046Photosensitive materials with perfluoro compounds, e.g. for dry lithography
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/039Macromolecular compounds which are photodegradable, e.g. positive electron resists
    • G03F7/0392Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition
    • G03F7/0395Macromolecular compounds which are photodegradable, e.g. positive electron resists the macromolecular compound being present in a chemically amplified positive photoresist composition the macromolecular compound having a backbone with alicyclic moieties
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S430/00Radiation imagery chemistry: process, composition, or product thereof
    • Y10S430/1053Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
    • Y10S430/1055Radiation sensitive composition or product or process of making
    • Y10S430/114Initiator containing
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S430/00Radiation imagery chemistry: process, composition, or product thereof
    • Y10S430/146Laser beam
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/31504Composite [nonstructural laminate]
    • Y10T428/3154Of fluorinated addition polymer from unsaturated monomers
DE2002623654 2001-02-09 2002-01-31 Resistzusammensetzung Expired - Fee Related DE60223654T2 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2001034023 2001-02-09
JP2001034023 2001-02-09
JP2001219570 2001-07-19
JP2001219570 2001-07-19
PCT/JP2002/000794 WO2002065212A1 (fr) 2001-02-09 2002-01-31 Composition de reserve

Publications (2)

Publication Number Publication Date
DE60223654D1 true DE60223654D1 (de) 2008-01-03
DE60223654T2 DE60223654T2 (de) 2008-10-30

Family

ID=26609221

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2002623654 Expired - Fee Related DE60223654T2 (de) 2001-02-09 2002-01-31 Resistzusammensetzung

Country Status (8)

Country Link
US (1) US6818258B2 (de)
EP (1) EP1365290B1 (de)
JP (1) JP3800538B2 (de)
KR (1) KR100776551B1 (de)
CN (1) CN1221861C (de)
DE (1) DE60223654T2 (de)
TW (1) TWI240146B (de)
WO (1) WO2002065212A1 (de)

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KR100857757B1 (ko) * 2001-02-09 2008-09-09 아사히 가라스 가부시키가이샤 불소 함유 화합물, 불소 함유 폴리머 및 이의 제조 방법
WO2002065212A1 (fr) 2001-02-09 2002-08-22 Asahi Glass Company, Limited Composition de reserve
JP2004004561A (ja) * 2002-02-19 2004-01-08 Sumitomo Chem Co Ltd ポジ型レジスト組成物
JP4010160B2 (ja) * 2002-03-04 2007-11-21 旭硝子株式会社 レジスト組成物
JP2003330196A (ja) * 2002-03-05 2003-11-19 Jsr Corp 感放射線性樹脂組成物
JP2004004703A (ja) * 2002-04-03 2004-01-08 Sumitomo Chem Co Ltd ポジ型レジスト組成物
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JP4186054B2 (ja) * 2002-04-05 2008-11-26 信越化学工業株式会社 レジスト材料及びパターン形成方法
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Also Published As

Publication number Publication date
US6818258B2 (en) 2004-11-16
EP1365290B1 (de) 2007-11-21
EP1365290A1 (de) 2003-11-26
CN1221861C (zh) 2005-10-05
WO2002065212A1 (fr) 2002-08-22
JP3800538B2 (ja) 2006-07-26
JPWO2002065212A1 (ja) 2004-06-17
KR20040024544A (ko) 2004-03-20
EP1365290A4 (de) 2005-07-27
TWI240146B (en) 2005-09-21
DE60223654T2 (de) 2008-10-30
CN1493020A (zh) 2004-04-28
KR100776551B1 (ko) 2007-11-16
US20040033439A1 (en) 2004-02-19

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