DE602005026522D1 - Messinstrument für elektrische potentiale und bilderzeugungsvorrichtung - Google Patents

Messinstrument für elektrische potentiale und bilderzeugungsvorrichtung

Info

Publication number
DE602005026522D1
DE602005026522D1 DE602005026522T DE602005026522T DE602005026522D1 DE 602005026522 D1 DE602005026522 D1 DE 602005026522D1 DE 602005026522 T DE602005026522 T DE 602005026522T DE 602005026522 T DE602005026522 T DE 602005026522T DE 602005026522 D1 DE602005026522 D1 DE 602005026522D1
Authority
DE
Germany
Prior art keywords
electrode
measuring instrument
measurement
field effect
generating device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005026522T
Other languages
English (en)
Inventor
Yoshikatsu Ichimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Publication of DE602005026522D1 publication Critical patent/DE602005026522D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/12—Measuring electrostatic fields or voltage-potential
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R5/00—Instruments for converting a single current or a single voltage into a mechanical displacement
    • G01R5/28—Electrostatic instruments
DE602005026522T 2004-06-08 2005-06-07 Messinstrument für elektrische potentiale und bilderzeugungsvorrichtung Active DE602005026522D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004169274A JP4794828B2 (ja) 2004-06-08 2004-06-08 電位測定装置および画像形成装置
PCT/JP2005/010758 WO2005121819A1 (en) 2004-06-08 2005-06-07 Electric potential measuring instrument and image forming apparatus

Publications (1)

Publication Number Publication Date
DE602005026522D1 true DE602005026522D1 (de) 2011-04-07

Family

ID=35064659

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005026522T Active DE602005026522D1 (de) 2004-06-08 2005-06-07 Messinstrument für elektrische potentiale und bilderzeugungsvorrichtung

Country Status (8)

Country Link
US (1) US7489135B2 (de)
EP (1) EP1756598B1 (de)
JP (1) JP4794828B2 (de)
KR (1) KR100852331B1 (de)
CN (1) CN100549706C (de)
AT (1) ATE499616T1 (de)
DE (1) DE602005026522D1 (de)
WO (1) WO2005121819A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7382137B2 (en) * 2005-05-27 2008-06-03 Canon Kabushiki Kaisha Potential measuring apparatus
CN101330656A (zh) * 2008-07-08 2008-12-24 华为技术有限公司 一种根据终端的能力进行跟踪的方法
EP2169700B1 (de) * 2008-09-26 2011-11-09 Siemens Aktiengesellschaft Verfahren und Vorrichtung zur Überwachung eines Schaltvorganges und Relaisbaugruppe
WO2010034334A1 (de) * 2008-09-26 2010-04-01 Siemens Aktiengesellschaft Verfahren und mikroelektromechanisches system zum erfassen einer messgrösse für einen durch einen elektrischen leiter fliessenden elektrischen strom sowie anordnung
DE102008052477A1 (de) 2008-10-20 2010-06-10 Siemens Aktiengesellschaft Als mikromechanisches System ausgebildeter Sensor für elektrische Felder
JP6030926B2 (ja) * 2012-11-14 2016-11-24 矢崎総業株式会社 導通検査装置
JP6624122B2 (ja) * 2017-03-02 2019-12-25 京セラドキュメントソリューションズ株式会社 電界センサーおよびそれを備えた画像形成装置
CN109523881B (zh) * 2018-12-25 2020-09-08 东北大学 一种静电场描绘仪及其使用方法

Family Cites Families (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4030347A (en) * 1975-10-31 1977-06-21 Electrical Power Research Institute Biaxial capacitance strain transducer
DE2715831A1 (de) 1977-04-07 1978-10-19 Electric Power Res Inst Vorrichtung zur kapazitiven dehnungsmessung
US4205267A (en) * 1977-11-03 1980-05-27 Williams Bruce T High speed electrostatic voltmeter
JPS55114962A (en) * 1979-02-28 1980-09-04 Ricoh Co Ltd Surface potentiometer
US4339721A (en) * 1979-06-06 1982-07-13 Ando Electric Co., Ltd. Electrostatic voltmeter
JPS56126767A (en) * 1980-02-18 1981-10-05 Williams Bruce T Static voltmeter
US4370616A (en) * 1980-08-15 1983-01-25 Williams Bruce T Low impedance electrostatic detector
JPS58211669A (ja) * 1982-06-03 1983-12-09 Canon Inc 表面電位計の較正方法
US4614908A (en) * 1984-04-13 1986-09-30 Xerox Corporation Microdeflector probe for electrostatic voltmeters
JPS60253958A (ja) * 1984-05-31 1985-12-14 Sharp Corp センサ
US4605946A (en) * 1984-08-16 1986-08-12 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Fet charge sensor and voltage probe
US4720682A (en) * 1984-11-29 1988-01-19 Matsushita Electric Industrial Co., Ltd. Surface electric potential sensor
US4818945A (en) * 1986-04-22 1989-04-04 Voyager Technologies, Inc. Non contacting volt meter
US4767973A (en) * 1987-07-06 1988-08-30 Sarcos Incorporated Systems and methods for sensing position and movement
US4973910A (en) * 1988-01-14 1990-11-27 Wilson Mahlon S Surface potential analyzer
JPH01210871A (ja) * 1988-02-18 1989-08-24 Victor Co Of Japan Ltd 表面電位分布と対応する電気信号の発生装置
JPH01299472A (ja) * 1988-05-27 1989-12-04 Victor Co Of Japan Ltd 表面電位分布と対応する電気信号の発生装置
CN1029065C (zh) * 1988-05-10 1995-06-21 日本胜利株式会社 影像传感装置
JPH0271166A (ja) 1988-09-07 1990-03-09 Canon Inc 表面電位センサー
GB8914910D0 (en) * 1989-06-29 1989-08-23 Vg Instr Group Charge transducer
JPH0425764A (ja) 1990-05-21 1992-01-29 Nec Corp 半導体加速度センサ
JP2982360B2 (ja) * 1991-04-25 1999-11-22 松下電器産業株式会社 静電界検出素子および静電界測定装置
JP3225579B2 (ja) * 1992-02-27 2001-11-05 ソニー株式会社 静電気測定装置
US5212451A (en) * 1992-03-09 1993-05-18 Xerox Corporation Single balanced beam electrostatic voltmeter modulator
US5323115A (en) * 1992-05-05 1994-06-21 Xerox Corporation Electrostatic voltmeter producing a low voltage output
JP3331648B2 (ja) 1992-12-25 2002-10-07 株式会社デンソー 半導体加速度センサ
US5504356A (en) * 1992-11-16 1996-04-02 Nippondenso Co., Ltd. Semiconductor accelerometer
JPH06196721A (ja) 1992-12-25 1994-07-15 Nippondenso Co Ltd 半導体加速度センサ及びその製造方法
DE4328083A1 (de) 1993-08-20 1994-03-31 Ignaz Eisele Verfahren zur mikroskopischen Messung von Topographie und lateralen Potentialverteilungen an einer Oberfläche mit einer Feldeffektanordnung
JPH07104019A (ja) * 1993-10-01 1995-04-21 Ricoh Co Ltd 表面電位測定方法およびその測定装置
US5517123A (en) * 1994-08-26 1996-05-14 Analog Devices, Inc. High sensitivity integrated micromechanical electrostatic potential sensor
JPH08110361A (ja) * 1994-10-07 1996-04-30 Ricoh Co Ltd 表面電位測定装置
JPH10208623A (ja) * 1997-01-25 1998-08-07 Canon Inc 電界放出型電子放出素子の製造方法とこれを用いた画像形成装置、及びこれらにより形成された電界放出型電子放出素子または画像形成装置、並びに画像形成装置に用いる基板
CN1165817C (zh) * 1998-04-20 2004-09-08 株式会社理光 能够控制成像处理速度的图像形成方法及其装置
US6177800B1 (en) * 1998-11-10 2001-01-23 Xerox Corporation Method and apparatus for using shuttered windows in a micro-electro-mechanical system
JP4515549B2 (ja) * 1999-03-12 2010-08-04 誠 石田 半導体素子および半導体センサ
DE10044887A1 (de) 1999-09-18 2001-05-17 Stephan Buschnakowski Mikromechanischer Antrieb
JP2002156356A (ja) * 2000-11-15 2002-05-31 Matsushita Electric Works Ltd 半導体化学センサ及びその製造方法
JP2002321198A (ja) * 2001-02-22 2002-11-05 Canon Inc マイクロ構造体、マイクロ力学量センサ、マイクロアクチュエータ、マイクロ光偏向器、光走査型ディスプレイ、及びそれらの製造方法
US6806717B2 (en) * 2001-09-27 2004-10-19 Xerox Corporation Spacing compensating electrostatic voltmeter
JP2004301554A (ja) * 2003-03-28 2004-10-28 Canon Inc 電位測定装置及び画像形成装置
US7274193B2 (en) * 2003-03-28 2007-09-25 Canon Kabushiki Kaisha Micromechanical potential sensor
JP2004294350A (ja) * 2003-03-28 2004-10-21 Canon Inc 電位センサおよび画像形成装置
JP5027984B2 (ja) * 2003-03-28 2012-09-19 キヤノン株式会社 揺動体を用いた電位測定装置、電位測定方法、及び画像形成装置
JP2006003131A (ja) * 2004-06-15 2006-01-05 Canon Inc 電位センサ
US7049804B2 (en) * 2004-07-12 2006-05-23 Canon Kabushiki Kaisha Electric potential measuring apparatus, and image forming apparatus
US7382137B2 (en) * 2005-05-27 2008-06-03 Canon Kabushiki Kaisha Potential measuring apparatus

Also Published As

Publication number Publication date
JP2005351627A (ja) 2005-12-22
EP1756598A1 (de) 2007-02-28
ATE499616T1 (de) 2011-03-15
US20070229086A1 (en) 2007-10-04
WO2005121819A1 (en) 2005-12-22
CN100549706C (zh) 2009-10-14
CN1965238A (zh) 2007-05-16
EP1756598B1 (de) 2011-02-23
JP4794828B2 (ja) 2011-10-19
US7489135B2 (en) 2009-02-10
KR100852331B1 (ko) 2008-08-14
KR20070030265A (ko) 2007-03-15

Similar Documents

Publication Publication Date Title
DE602005026522D1 (de) Messinstrument für elektrische potentiale und bilderzeugungsvorrichtung
CN205961068U (zh) D类音频放大器装置
EP4241668A3 (de) Vorrichtung und verfahren zur messung einer elektrodermalen aktivität mit stromkompensation
TW200606548A (en) Temperature sensor for liquid crystal display device
JP2010025918A (ja) 電圧検出装置および線間電圧検出装置
CN107833840A (zh) AlGaN/GaN高电子迁移率晶体管的结温测试方法
TW200500829A (en) Data latch circuit and electronic device
CN104950493A (zh) 一种基板和显示装置
CN106768437A (zh) 一种温度检测系统及方法
RU2015118350A (ru) Интегральная схема с нанопроводными датчиками на полевых транзисторах, изготовленных химическим методом, сенсорное устройство, способ измерения и способ изготовления
TW200632335A (en) TFT tester and test method
US11373563B2 (en) Anti-noise signal modulation circuit, modulation method, display panel and display device
JP2016109474A (ja) 非接触電圧センサ及び電力測定装置
ATE363152T1 (de) Ein genauer leistungsdetektor zur verwendung in einem leistungsverstärker
US20080029762A1 (en) Test system incorporating a field effect transistor sensor
CN104677967A (zh) 离子敏感场效应管传感器及其电压模式读出电路
KR101729685B1 (ko) 이온 농도 검출 방법 및 장치
CN103364083A (zh) 基于等精度测频的光信号检测装置和方法
Nishizawa et al. Capacitance measurement of running hardware devices and its application to malicious modification detection
JP2010256125A (ja) 電圧検出装置および線間電圧検出装置
De Marcellis et al. High sensitivity, high resolution, uncalibrated phase read-out circuit for optoelectronic detection of chemical substances
US20170238093A1 (en) Device for measuring an electric current generated by an acoustic amplifier in order to actuate an acoustic speaker
TWI489168B (zh) 待測物特性檢測裝置及其檢測方法
KR100744939B1 (ko) Ｌｄｍｏｓ 트랜지스터의 캐패시턴스 계산 방법
JP2017203732A (ja) 電圧測定装置