DE602005024565D1 - Spektrometer - Google Patents

Spektrometer

Info

Publication number
DE602005024565D1
DE602005024565D1 DE602005024565T DE602005024565T DE602005024565D1 DE 602005024565 D1 DE602005024565 D1 DE 602005024565D1 DE 602005024565 T DE602005024565 T DE 602005024565T DE 602005024565 T DE602005024565 T DE 602005024565T DE 602005024565 D1 DE602005024565 D1 DE 602005024565D1
Authority
DE
Germany
Prior art keywords
spectrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005024565T
Other languages
English (en)
Inventor
Helmut Teichmann
Dietmar Hiller
Ulrich Starker
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Publication of DE602005024565D1 publication Critical patent/DE602005024565D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2803—Investigating the spectrum using photoelectric array detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0256—Compact construction
    • G01J3/0259—Monolithic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0262—Constructional arrangements for removing stray light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
DE602005024565T 2004-07-16 2005-07-08 Spektrometer Active DE602005024565D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004210687A JP4473665B2 (ja) 2004-07-16 2004-07-16 分光器
PCT/JP2005/013096 WO2006009089A1 (en) 2004-07-16 2005-07-08 Spectrometer

Publications (1)

Publication Number Publication Date
DE602005024565D1 true DE602005024565D1 (de) 2010-12-16

Family

ID=34981382

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005024565T Active DE602005024565D1 (de) 2004-07-16 2005-07-08 Spektrometer

Country Status (5)

Country Link
US (1) US7605917B2 (de)
EP (1) EP1776567B1 (de)
JP (1) JP4473665B2 (de)
DE (1) DE602005024565D1 (de)
WO (1) WO2006009089A1 (de)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7697137B2 (en) * 2006-04-28 2010-04-13 Corning Incorporated Monolithic Offner spectrometer
US8203710B1 (en) 2006-06-12 2012-06-19 Wavefront Research, Inc. Compact wide field fast hyperspectral imager
JP4891841B2 (ja) 2007-06-08 2012-03-07 浜松ホトニクス株式会社 分光モジュール
JP4887221B2 (ja) 2007-06-08 2012-02-29 浜松ホトニクス株式会社 分光モジュール
WO2008149939A1 (ja) 2007-06-08 2008-12-11 Hamamatsu Photonics K.K. 分光器
US8068223B2 (en) 2007-06-08 2011-11-29 Hamamatsu Photonics K.K. Spectroscopic module
JP4891840B2 (ja) * 2007-06-08 2012-03-07 浜松ホトニクス株式会社 分光モジュール
KR20100017082A (ko) 2007-06-08 2010-02-16 하마마츠 포토닉스 가부시키가이샤 분광 모듈
EP2063239A4 (de) 2007-06-08 2013-12-25 Hamamatsu Photonics Kk Spektroskopisches modul
US7817274B2 (en) 2007-10-05 2010-10-19 Jingyun Zhang Compact spectrometer
US7812949B2 (en) * 2007-10-17 2010-10-12 Horiba Jobin Yvon Inc. Spectrometer with cylindrical lens for astigmatism correction and demagnification
US8345226B2 (en) 2007-11-30 2013-01-01 Jingyun Zhang Spectrometers miniaturized for working with cellular phones and other portable electronic devices
DE202008003977U1 (de) * 2008-02-26 2009-07-02 Bürkert Werke GmbH & Co. KG Mikrospektrometer
JP5415060B2 (ja) * 2008-05-15 2014-02-12 浜松ホトニクス株式会社 分光モジュール
JP5205241B2 (ja) 2008-05-15 2013-06-05 浜松ホトニクス株式会社 分光モジュール
JP2009300417A (ja) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk 分光モジュールの製造方法及び分光モジュール
JP5207938B2 (ja) 2008-05-15 2013-06-12 浜松ホトニクス株式会社 分光モジュール及び分光モジュールの製造方法
JP2009300422A (ja) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk 分光モジュール
JP5205240B2 (ja) * 2008-05-15 2013-06-05 浜松ホトニクス株式会社 分光モジュールの製造方法及び分光モジュール
JP5205238B2 (ja) * 2008-05-15 2013-06-05 浜松ホトニクス株式会社 分光モジュール
JP2009300418A (ja) * 2008-05-15 2009-12-24 Hamamatsu Photonics Kk 分光モジュール
US8054462B2 (en) * 2009-09-16 2011-11-08 Itt Manufacturing Enterprises, Inc. Quantum efficiency enhancement device for array detectors
JP2011164014A (ja) * 2010-02-12 2011-08-25 Shimadzu Corp ポリクロメータ
JP5113947B2 (ja) * 2012-04-18 2013-01-09 浜松ホトニクス株式会社 分光モジュール
JP6251073B2 (ja) 2014-02-05 2017-12-20 浜松ホトニクス株式会社 分光器、及び分光器の製造方法
FI20155547A (fi) * 2015-07-10 2017-01-11 Outotec Finland Oy Transparentti suojaava seinäelin käytettäväksi menetelmässä tai laitteessa fluidien laseravusteista optista säteilyspektroskooppia varten
DE102016225344A1 (de) * 2016-12-16 2018-06-21 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. System zur Analyse von elektromagnetischer Strahlung und Bauelement zur Herstellung desselben
GB201708643D0 (en) * 2017-05-31 2017-07-12 Univ Edinburgh Optical wireless communications system
JP6524281B2 (ja) * 2018-02-14 2019-06-05 浜松ホトニクス株式会社 分光器

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4633078A (en) * 1985-07-23 1986-12-30 The Perkin-Elmer Corporation Optical interference eliminator
DE3743131A1 (de) 1987-10-26 1989-05-03 Siemens Ag Anordnung zur hochaufloesenden spektroskopie
DE4038638A1 (de) 1990-12-04 1992-06-11 Zeiss Carl Fa Diodenzeilen-spektrometer
JPH09250946A (ja) 1996-03-14 1997-09-22 Nikon Corp 分光装置
JP3137020B2 (ja) 1997-02-14 2001-02-19 日本電気株式会社 分光計
EP0942267B1 (de) 1998-03-11 2006-08-30 Gretag-Macbeth AG Spektrometer
EP1041372B1 (de) * 1999-04-01 2006-03-01 Gretag-Macbeth AG Spektrometer
CN1296684C (zh) 2000-07-28 2007-01-24 大塚电子株式会社 光谱检测设备
WO2004111586A1 (en) * 2003-05-27 2004-12-23 Wayne State University Diffractive imaging spectrometer

Also Published As

Publication number Publication date
US20070211250A1 (en) 2007-09-13
EP1776567B1 (de) 2010-11-03
JP4473665B2 (ja) 2010-06-02
JP2006030031A (ja) 2006-02-02
US7605917B2 (en) 2009-10-20
EP1776567A1 (de) 2007-04-25
WO2006009089A1 (en) 2006-01-26

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