DE602005011220D1 - Lithographischer Apparat und Verfahren zur Herstellung von Bauelementen - Google Patents

Lithographischer Apparat und Verfahren zur Herstellung von Bauelementen

Info

Publication number
DE602005011220D1
DE602005011220D1 DE602005011220T DE602005011220T DE602005011220D1 DE 602005011220 D1 DE602005011220 D1 DE 602005011220D1 DE 602005011220 T DE602005011220 T DE 602005011220T DE 602005011220 T DE602005011220 T DE 602005011220T DE 602005011220 D1 DE602005011220 D1 DE 602005011220D1
Authority
DE
Germany
Prior art keywords
manufacture
components
lithographic apparatus
lithographic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005011220T
Other languages
English (en)
Inventor
Kars Zeger Troost
Arno Jan Bleeker
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ASML Netherlands BV
Original Assignee
ASML Netherlands BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ASML Netherlands BV filed Critical ASML Netherlands BV
Publication of DE602005011220D1 publication Critical patent/DE602005011220D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70491—Information management, e.g. software; Active and passive control, e.g. details of controlling exposure processes or exposure tool monitoring processes
    • G03F7/70516—Calibration of components of the microlithographic apparatus, e.g. light sources, addressable masks or detectors
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216—Mask projection systems
    • G03F7/70283—Mask effects on the imaging process
    • G03F7/70291—Addressable masks, e.g. spatial light modulators [SLMs], digital micro-mirror devices [DMDs] or liquid crystal display [LCD] patterning devices
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
DE602005011220T 2004-10-18 2005-10-07 Lithographischer Apparat und Verfahren zur Herstellung von Bauelementen Active DE602005011220D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/966,147 US7177012B2 (en) 2004-10-18 2004-10-18 Lithographic apparatus and device manufacturing method

Publications (1)

Publication Number Publication Date
DE602005011220D1 true DE602005011220D1 (de) 2009-01-08

Family

ID=35432125

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005011220T Active DE602005011220D1 (de) 2004-10-18 2005-10-07 Lithographischer Apparat und Verfahren zur Herstellung von Bauelementen

Country Status (8)

Country Link
US (2) US7177012B2 (de)
EP (2) EP1986051A3 (de)
JP (1) JP4430601B2 (de)
KR (1) KR100732223B1 (de)
CN (1) CN100593132C (de)
DE (1) DE602005011220D1 (de)
SG (1) SG121967A1 (de)
TW (3) TWI331677B (de)

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US7403265B2 (en) 2005-03-30 2008-07-22 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method utilizing data filtering
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US8259285B2 (en) * 2006-12-14 2012-09-04 Asml Holding N.V. Lithographic system, device manufacturing method, setpoint data optimization method, and apparatus for producing optimized setpoint data
US8451427B2 (en) 2007-09-14 2013-05-28 Nikon Corporation Illumination optical system, exposure apparatus, optical element and manufacturing method thereof, and device manufacturing method
EP2048543B1 (de) * 2007-10-09 2013-12-04 ASML Netherlands B.V. Optischer Fokussensor, Prüfvorrichtung und lithografische Vorrichtung
JP5267029B2 (ja) * 2007-10-12 2013-08-21 株式会社ニコン 照明光学装置、露光装置及びデバイスの製造方法
CN101681125B (zh) * 2007-10-16 2013-08-21 株式会社尼康 照明光学系统、曝光装置以及元件制造方法
CN101681123B (zh) * 2007-10-16 2013-06-12 株式会社尼康 照明光学系统、曝光装置以及元件制造方法
US8379187B2 (en) 2007-10-24 2013-02-19 Nikon Corporation Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method
US9116346B2 (en) * 2007-11-06 2015-08-25 Nikon Corporation Illumination apparatus, illumination method, exposure apparatus, and device manufacturing method
NL1036322A1 (nl) * 2007-12-21 2009-06-23 Asml Holding Nv Systems and methods for lithographic illuminator beam deviation measurement and calibration using grating sensors.
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KR101695034B1 (ko) * 2008-05-28 2017-01-10 가부시키가이샤 니콘 공간 광 변조기의 검사 장치, 조명 광학계, 노광 장치, 검사 방법, 조명 광학계의 조정 방법, 조명 방법, 노광 방법, 및 디바이스 제조 방법
US8351024B2 (en) * 2009-03-13 2013-01-08 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method involving a level sensor having a detection grating including three or more segments
US8675210B2 (en) 2009-03-13 2014-03-18 Asml Netherlands B.V. Level sensor, lithographic apparatus, and substrate surface positioning method
US8488107B2 (en) 2009-03-13 2013-07-16 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method involving a level sensor having multiple projection units and detection units
EP2228685B1 (de) * 2009-03-13 2018-06-27 ASML Netherlands B.V. Niveausensor für ein lithografisches Gerät und Verfahren zur Herstellung einer Vorrichtung
JP5451238B2 (ja) * 2009-08-03 2014-03-26 浜松ホトニクス株式会社 レーザ加工方法
CN104360583B (zh) * 2009-09-30 2017-04-19 首尔大学校产学协力团 基于图像处理的光刻系统和目标对象涂覆方法
NL2006131A (en) 2010-03-12 2011-09-13 Asml Netherlands Bv Lithographic apparatus and device manufacturing method.
NL2006004A (en) * 2010-03-25 2011-09-27 Asml Netherlands Bv Imprint lithography.
NL2006556A (en) * 2010-05-13 2011-11-15 Asml Holding Nv Optical system, inspection system and manufacturing method.
JP5518612B2 (ja) * 2010-07-20 2014-06-11 株式会社ディスコ 光学装置およびこれを備えるレーザー加工装置
US8957394B2 (en) * 2011-11-29 2015-02-17 Kla-Tencor Corporation Compact high-voltage electron gun
JP5801737B2 (ja) * 2012-03-16 2015-10-28 株式会社Ｓｃｒｅｅｎホールディングス 検査装置、露光装置及び検査方法
CN108646526A (zh) * 2018-05-10 2018-10-12 山东临沂新华印刷物流集团有限责任公司 印刷制版方法、系统和装置
EP3582008A1 (de) * 2018-06-15 2019-12-18 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Belichtungsanordnung für ein system zur generativen fertigung, system zur generativen fertigung und verfahren zur herstellung eines objekts
CN114174890A (zh) * 2019-08-09 2022-03-11 Asml荷兰有限公司 量测装置及其相位调制器设备

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US7177012B2 (en) * 2004-10-18 2007-02-13 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method

Also Published As

Publication number Publication date
JP2006135312A (ja) 2006-05-25
EP1647864A1 (de) 2006-04-19
CN1763635A (zh) 2006-04-26
KR20060054049A (ko) 2006-05-22
TWI331677B (en) 2010-10-11
CN100593132C (zh) 2010-03-03
TW200628777A (en) 2006-08-16
SG121967A1 (en) 2006-05-26
TW200912561A (en) 2009-03-16
KR100732223B1 (ko) 2007-06-27
EP1986051A3 (de) 2009-03-11
EP1986051A2 (de) 2008-10-29
US20060082752A1 (en) 2006-04-20
JP4430601B2 (ja) 2010-03-10
US7965380B2 (en) 2011-06-21
US20070252967A1 (en) 2007-11-01
EP1647864B1 (de) 2008-11-26
US7177012B2 (en) 2007-02-13
TW200921083A (en) 2009-05-16
TWI435184B (zh) 2014-04-21
TWI334926B (en) 2010-12-21

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