DE602004030295D1 - Methode und Apparat zum Auswählen eines Schaltkreis Betriebsmodus - Google Patents
Methode und Apparat zum Auswählen eines Schaltkreis BetriebsmodusInfo
- Publication number
- DE602004030295D1 DE602004030295D1 DE602004030295T DE602004030295T DE602004030295D1 DE 602004030295 D1 DE602004030295 D1 DE 602004030295D1 DE 602004030295 T DE602004030295 T DE 602004030295T DE 602004030295 T DE602004030295 T DE 602004030295T DE 602004030295 D1 DE602004030295 D1 DE 602004030295D1
- Authority
- DE
- Germany
- Prior art keywords
- selecting
- operating mode
- circuit operating
- circuit
- mode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
- G06F21/71—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information
- G06F21/74—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information operating in dual or compartmented mode, i.e. at least one secure mode
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31719—Security aspects, e.g. preventing unauthorised access during test
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Mathematical Physics (AREA)
- Computer Security & Cryptography (AREA)
- Software Systems (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Read Only Memory (AREA)
- Semiconductor Integrated Circuits (AREA)
- Storage Device Security (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0302230A FR2851668A1 (fr) | 2003-02-24 | 2003-02-24 | Procede et dispositif de selection de mode de fonctionnement d'un circuit integre |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602004030295D1 true DE602004030295D1 (de) | 2011-01-13 |
Family
ID=32799531
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602004030295T Expired - Lifetime DE602004030295D1 (de) | 2003-02-24 | 2004-02-23 | Methode und Apparat zum Auswählen eines Schaltkreis Betriebsmodus |
Country Status (5)
Country | Link |
---|---|
US (1) | US7194570B2 (de) |
EP (1) | EP1455259B1 (de) |
JP (1) | JP2004259272A (de) |
DE (1) | DE602004030295D1 (de) |
FR (1) | FR2851668A1 (de) |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB8511995D0 (en) * | 1985-05-11 | 1985-06-19 | Ross S R | Software protection |
JPH0827730B2 (ja) * | 1986-11-07 | 1996-03-21 | 沖電気工業株式会社 | シングルチップマイクロコンピュータ及びそのテスト方法 |
US5602789A (en) * | 1991-03-12 | 1997-02-11 | Kabushiki Kaisha Toshiba | Electrically erasable and programmable non-volatile and multi-level memory systemn with write-verify controller |
EP0510634B1 (de) * | 1991-04-25 | 1999-07-07 | Nippon Steel Corporation | Datenbankauffindungssystem |
JPH06236447A (ja) | 1993-02-09 | 1994-08-23 | Mitsubishi Electric Corp | Icカード用マイクロコンピュータ |
KR0140176B1 (ko) * | 1994-11-30 | 1998-07-15 | 김광호 | 반도체 메모리장치의 동작모드 제어장치 및 방법 |
JP3461234B2 (ja) * | 1996-01-22 | 2003-10-27 | 株式会社東芝 | データ保護回路 |
JP3351953B2 (ja) * | 1996-03-19 | 2002-12-03 | 富士通株式会社 | モードレジスタ制御回路およびこれを有する半導体装置 |
JPH10302482A (ja) * | 1997-02-27 | 1998-11-13 | Sanyo Electric Co Ltd | 半導体メモリ |
US6762951B2 (en) * | 2001-11-13 | 2004-07-13 | Hitachi, Ltd. | Semiconductor integrated circuit device |
DE60110944T2 (de) * | 2000-01-07 | 2006-04-27 | Sharp K.K. | Magnetoresistive Anordnung und diese verwendendes magnetisches Speicherelement |
DE10106340A1 (de) * | 2001-02-09 | 2002-08-29 | Europ Lab Molekularbiolog | Schaltung zur Verarbeitung von Daten |
US6989861B2 (en) * | 2001-09-14 | 2006-01-24 | Hewlett-Packard Development Company, L.P. | User selection of power-on configuration |
-
2003
- 2003-02-24 FR FR0302230A patent/FR2851668A1/fr not_active Withdrawn
-
2004
- 2004-02-23 US US10/784,430 patent/US7194570B2/en not_active Expired - Fee Related
- 2004-02-23 JP JP2004046082A patent/JP2004259272A/ja not_active Withdrawn
- 2004-02-23 DE DE602004030295T patent/DE602004030295D1/de not_active Expired - Lifetime
- 2004-02-23 EP EP04300094A patent/EP1455259B1/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP1455259B1 (de) | 2010-12-01 |
EP1455259A3 (de) | 2004-09-29 |
FR2851668A1 (fr) | 2004-08-27 |
JP2004259272A (ja) | 2004-09-16 |
US7194570B2 (en) | 2007-03-20 |
US20040165458A1 (en) | 2004-08-26 |
EP1455259A2 (de) | 2004-09-08 |
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