DE602004022029D1 - St) mit verteilter befehlsinterpretation und verallgemeinertem befehlsprotokoll - Google Patents
St) mit verteilter befehlsinterpretation und verallgemeinertem befehlsprotokollInfo
- Publication number
- DE602004022029D1 DE602004022029D1 DE602004022029T DE602004022029T DE602004022029D1 DE 602004022029 D1 DE602004022029 D1 DE 602004022029D1 DE 602004022029 T DE602004022029 T DE 602004022029T DE 602004022029 T DE602004022029 T DE 602004022029T DE 602004022029 D1 DE602004022029 D1 DE 602004022029D1
- Authority
- DE
- Germany
- Prior art keywords
- command
- distributed
- interpretation
- protocol
- general
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/14—Implementation of control logic, e.g. test mode decoders
- G11C29/16—Implementation of control logic, e.g. test mode decoders using microprogrammed units, e.g. state machines
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US45645103P | 2003-03-20 | 2003-03-20 | |
US10/630,480 US7392442B2 (en) | 2003-03-20 | 2003-07-29 | Built-in self-test (BIST) architecture having distributed interpretation and generalized command protocol |
PCT/US2004/008664 WO2004086411A1 (en) | 2003-03-20 | 2004-03-19 | Memory built-in self-test (bist) architecture having distributed command interpretation and generalized command protocol |
Publications (1)
Publication Number | Publication Date |
---|---|
DE602004022029D1 true DE602004022029D1 (de) | 2009-08-27 |
Family
ID=39733993
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602004022029T Expired - Lifetime DE602004022029D1 (de) | 2003-03-20 | 2004-03-19 | St) mit verteilter befehlsinterpretation und verallgemeinertem befehlsprotokoll |
Country Status (7)
Country | Link |
---|---|
US (2) | US7392442B2 (de) |
EP (1) | EP1604372B1 (de) |
CA (1) | CA2519618A1 (de) |
DE (1) | DE602004022029D1 (de) |
ES (1) | ES2329797T3 (de) |
RU (1) | RU2336581C2 (de) |
WO (1) | WO2004086411A1 (de) |
Families Citing this family (47)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7392442B2 (en) * | 2003-03-20 | 2008-06-24 | Qualcomm Incorporated | Built-in self-test (BIST) architecture having distributed interpretation and generalized command protocol |
US7184915B2 (en) * | 2003-03-20 | 2007-02-27 | Qualcomm, Incorporated | Tiered built-in self-test (BIST) architecture for testing distributed memory modules |
US20050066226A1 (en) * | 2003-09-23 | 2005-03-24 | Adams R. Dean | Redundant memory self-test |
US7370238B2 (en) * | 2003-10-31 | 2008-05-06 | Dell Products L.P. | System, method and software for isolating dual-channel memory during diagnostics |
US8250295B2 (en) | 2004-01-05 | 2012-08-21 | Smart Modular Technologies, Inc. | Multi-rank memory module that emulates a memory module having a different number of ranks |
US7146587B2 (en) * | 2004-01-08 | 2006-12-05 | International Business Machines Corporation | Scalable logic self-test configuration for multiple chips |
US7916574B1 (en) | 2004-03-05 | 2011-03-29 | Netlist, Inc. | Circuit providing load isolation and memory domain translation for memory module |
US8244891B2 (en) * | 2004-03-08 | 2012-08-14 | Ixia | Simulating a large number of users |
EP1585139A1 (de) * | 2004-04-08 | 2005-10-12 | STMicroelectronics Pvt. Ltd | On-chip Hochgeschwindigkeitstester zum Testen und Charakterisieren unterschiedlicher Speichertypen |
US7203873B1 (en) * | 2004-06-04 | 2007-04-10 | Magma Design Automation, Inc. | Asynchronous control of memory self test |
US7260759B1 (en) * | 2004-06-16 | 2007-08-21 | Sun Microsystems, Inc. | Method and apparatus for an efficient memory built-in self test architecture for high performance microprocessors |
US7240267B2 (en) * | 2004-11-08 | 2007-07-03 | Marvell International Ltd. | System and method for conducting BIST operations |
EP1724788A1 (de) * | 2005-05-18 | 2006-11-22 | STMicroelectronics S.r.l. | Verbesserte eingebaute Selbsttestmethode und System |
US7519886B2 (en) * | 2006-01-05 | 2009-04-14 | International Business Machines Corporation | Apparatus and method for integrated functional built-in self test for an ASIC |
JP2007272635A (ja) * | 2006-03-31 | 2007-10-18 | Toshiba Corp | メモリシステム及びコントローラ |
JP2008108326A (ja) * | 2006-10-24 | 2008-05-08 | Toshiba Corp | 記憶装置およびその自己テスト方法 |
WO2008100495A1 (en) * | 2007-02-13 | 2008-08-21 | Gainspan Corporation | Method and system of fast clearing of memory using a built-in self-test circuit |
JP2008269669A (ja) * | 2007-04-17 | 2008-11-06 | Renesas Technology Corp | 半導体装置及びデータ処理システム |
US7973549B2 (en) * | 2007-06-12 | 2011-07-05 | International Business Machines Corporation | Method and apparatus for calibrating internal pulses in an integrated circuit |
JP4683014B2 (ja) * | 2007-06-25 | 2011-05-11 | 株式会社デンソー | 経路案内装置、道路地図データ作成装置及び道路地図データ作成方法 |
US7757133B1 (en) * | 2007-07-05 | 2010-07-13 | Oracle America, Inc. | Built-in self-test hardware and method for generating memory tests with arbitrary address sequences |
US7730369B2 (en) * | 2007-08-17 | 2010-06-01 | International Business Machines Corporation | Method for performing memory diagnostics using a programmable diagnostic memory module |
US7739562B2 (en) | 2007-08-17 | 2010-06-15 | International Business Machines Corporation | Programmable diagnostic memory module |
US8516185B2 (en) | 2009-07-16 | 2013-08-20 | Netlist, Inc. | System and method utilizing distributed byte-wise buffers on a memory module |
US8787060B2 (en) | 2010-11-03 | 2014-07-22 | Netlist, Inc. | Method and apparatus for optimizing driver load in a memory package |
US8001434B1 (en) | 2008-04-14 | 2011-08-16 | Netlist, Inc. | Memory board with self-testing capability |
US8154901B1 (en) | 2008-04-14 | 2012-04-10 | Netlist, Inc. | Circuit providing load isolation and noise reduction |
US9128632B2 (en) | 2009-07-16 | 2015-09-08 | Netlist, Inc. | Memory module with distributed data buffers and method of operation |
KR101088588B1 (ko) * | 2010-12-03 | 2011-12-06 | 삼성전자주식회사 | 멀티 칩 패키지 테스트 장치 및 테스트 방법 |
GB2498980A (en) * | 2012-02-01 | 2013-08-07 | Inside Secure | Device and method to perform a parallel memory test |
US9230046B2 (en) | 2012-03-30 | 2016-01-05 | International Business Machines Corporation | Generating clock signals for a cycle accurate, cycle reproducible FPGA based hardware accelerator |
US9286423B2 (en) * | 2012-03-30 | 2016-03-15 | International Business Machines Corporation | Cycle accurate and cycle reproducible memory for an FPGA based hardware accelerator |
US8872322B2 (en) | 2012-10-22 | 2014-10-28 | International Business Machines Corporation | Stacked chip module with integrated circuit chips having integratable built-in self-maintenance blocks |
US8853847B2 (en) | 2012-10-22 | 2014-10-07 | International Business Machines Corporation | Stacked chip module with integrated circuit chips having integratable and reconfigurable built-in self-maintenance blocks |
US9194912B2 (en) | 2012-11-29 | 2015-11-24 | International Business Machines Corporation | Circuits for self-reconfiguration or intrinsic functional changes of chips before vs. after stacking |
US9116876B2 (en) | 2012-12-18 | 2015-08-25 | Qualcomm Incorporated | Programmable built-in-self tester (BIST) in memory controller |
US9275757B2 (en) * | 2013-02-01 | 2016-03-01 | Scaleo Chip | Apparatus and method for non-intrusive random memory failure emulation within an integrated circuit |
US20140258780A1 (en) * | 2013-03-05 | 2014-09-11 | Micron Technology, Inc. | Memory controllers including test mode engines and methods for repair of memory over busses used during normal operation of the memory |
CN105706064B (zh) | 2013-07-27 | 2019-08-27 | 奈特力斯股份有限公司 | 具有本地分别同步的内存模块 |
US9946620B2 (en) | 2015-02-03 | 2018-04-17 | Invecas, Inc. | Memory built-in self test system |
US9715942B2 (en) | 2015-06-09 | 2017-07-25 | International Business Machines Corporation | Built-in self-test (BIST) circuit and associated BIST method for embedded memories |
KR102391385B1 (ko) * | 2015-08-13 | 2022-04-27 | 삼성전자주식회사 | 내장형 로직 분석기 및 이를 포함하는 집적 회로 |
US9761329B2 (en) | 2015-10-20 | 2017-09-12 | Globalfoundries Inc. | Built-in self-test (BIST) circuit and associated BIST method for embedded memories |
US9881693B2 (en) * | 2016-02-16 | 2018-01-30 | Micron Technology, Inc. | Selectors on interface die for memory device |
CN109275109B (zh) * | 2017-07-17 | 2021-08-24 | 中兴通讯股份有限公司 | 消息的处理方法、装置、终端及基站 |
US10937518B2 (en) | 2018-12-12 | 2021-03-02 | Micron Technology, Inc. | Multiple algorithmic pattern generator testing of a memory device |
CN114518902A (zh) | 2020-11-20 | 2022-05-20 | 马来西亚瑞天芯私人有限公司 | 一种内存定序器系统和应用该系统的内存定序方法 |
Family Cites Families (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5224101A (en) | 1990-05-16 | 1993-06-29 | The United States Of America As Represented By The Secretary Of The Air Force | Micro-coded built-in self-test apparatus for a memory array |
US5617531A (en) | 1993-11-02 | 1997-04-01 | Motorola, Inc. | Data Processor having a built-in internal self test controller for testing a plurality of memories internal to the data processor |
US5633877A (en) * | 1995-05-31 | 1997-05-27 | International Business Machines Corporation | Programmable built-in self test method and controller for arrays |
US5661732A (en) * | 1995-05-31 | 1997-08-26 | International Business Machines Corporation | Programmable ABIST microprocessor for testing arrays with two logical views |
US5675545A (en) * | 1995-09-08 | 1997-10-07 | Ambit Design Systems, Inc. | Method of forming a database that defines an integrated circuit memory with built in test circuitry |
US6272588B1 (en) * | 1997-05-30 | 2001-08-07 | Motorola Inc. | Method and apparatus for verifying and characterizing data retention time in a DRAM using built-in test circuitry |
US5995731A (en) * | 1997-12-29 | 1999-11-30 | Motorola, Inc. | Multiple BIST controllers for testing multiple embedded memory arrays |
US6327556B1 (en) | 1998-02-21 | 2001-12-04 | Adaptec, Inc. | AT-speed computer model testing methods |
US6249889B1 (en) | 1998-10-13 | 2001-06-19 | Advantest Corp. | Method and structure for testing embedded memories |
KR100308621B1 (ko) | 1998-11-19 | 2001-12-17 | 윤종용 | 반도체 메모리 장치를 위한 프로그램 가능한 내장 자기 테스트 시스템 |
US6349398B1 (en) | 1999-01-26 | 2002-02-19 | Silicon Graphics, Inc. | Method and apparatus for partial-scan built-in self test logic |
US6415403B1 (en) | 1999-01-29 | 2002-07-02 | Global Unichip Corporation | Programmable built in self test for embedded DRAM |
KR100748391B1 (ko) | 1999-05-07 | 2007-08-10 | 모픽스 테크놀로지 아이엔씨 | 무선 통신 장치 및 작동 방법 |
US6557129B1 (en) | 1999-11-23 | 2003-04-29 | Janusz Rajski | Method and apparatus for selectively compacting test responses |
JP4165990B2 (ja) | 1999-12-20 | 2008-10-15 | Tdk株式会社 | メモリコントローラ及びメモリコントローラを備えるフラッシュメモリシステム、並びに、フラッシュメモリへのデータの書き込み方法 |
US6643804B1 (en) | 2000-04-19 | 2003-11-04 | International Business Machines Corporation | Stability test for silicon on insulator SRAM memory cells utilizing bitline precharge stress operations to stress memory cells under test |
US6874111B1 (en) | 2000-07-26 | 2005-03-29 | International Business Machines Corporation | System initialization of microcode-based memory built-in self-test |
EP1332416A2 (de) * | 2000-09-06 | 2003-08-06 | Infineon Technologies AG | Bist für das parallele prüfen von onchip-speicher |
US7093177B2 (en) | 2001-03-20 | 2006-08-15 | Schlumberger Technologies, Inc. | Low-jitter clock for test system |
US6347056B1 (en) * | 2001-05-16 | 2002-02-12 | Motorola, Inc. | Recording of result information in a built-in self-test circuit and method therefor |
DE10129771A1 (de) * | 2001-06-20 | 2003-01-23 | Infineon Technologies Ag | Testanordnung zum parallelen Funktionstest von Halbleiterspeicherbausteinen und Testverfahren |
US7644333B2 (en) | 2001-12-18 | 2010-01-05 | Christopher John Hill | Restartable logic BIST controller |
US7062689B2 (en) | 2001-12-20 | 2006-06-13 | Arm Limited | Method and apparatus for memory self testing |
US7184915B2 (en) * | 2003-03-20 | 2007-02-27 | Qualcomm, Incorporated | Tiered built-in self-test (BIST) architecture for testing distributed memory modules |
US7392442B2 (en) * | 2003-03-20 | 2008-06-24 | Qualcomm Incorporated | Built-in self-test (BIST) architecture having distributed interpretation and generalized command protocol |
US7461304B1 (en) * | 2003-07-07 | 2008-12-02 | Marvell Israel (M.I.S.L.) Ltd. | Integrated circuit test using clock signal modification |
-
2003
- 2003-07-29 US US10/630,480 patent/US7392442B2/en active Active
-
2004
- 2004-03-19 WO PCT/US2004/008664 patent/WO2004086411A1/en active Application Filing
- 2004-03-19 CA CA002519618A patent/CA2519618A1/en not_active Abandoned
- 2004-03-19 DE DE602004022029T patent/DE602004022029D1/de not_active Expired - Lifetime
- 2004-03-19 ES ES04757984T patent/ES2329797T3/es not_active Expired - Lifetime
- 2004-03-19 RU RU2005132307/09A patent/RU2336581C2/ru not_active IP Right Cessation
- 2004-03-19 EP EP04757984A patent/EP1604372B1/de not_active Expired - Lifetime
-
2008
- 2008-05-18 US US12/122,702 patent/US7814380B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
RU2336581C2 (ru) | 2008-10-20 |
US20050257109A1 (en) | 2005-11-17 |
EP1604372A1 (de) | 2005-12-14 |
EP1604372B1 (de) | 2009-07-15 |
RU2005132307A (ru) | 2006-04-10 |
US7814380B2 (en) | 2010-10-12 |
CA2519618A1 (en) | 2004-10-07 |
US7392442B2 (en) | 2008-06-24 |
WO2004086411A1 (en) | 2004-10-07 |
US20080215944A1 (en) | 2008-09-04 |
ES2329797T3 (es) | 2009-12-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE602004022029D1 (de) | St) mit verteilter befehlsinterpretation und verallgemeinertem befehlsprotokoll | |
DE60326611D1 (de) | N und dergleichen | |
DE60330207D1 (de) | le | |
DK1474420T3 (da) | Quinazolinforbindelser | |
ITMI20030310V0 (it) | Cerniera | |
DE60328206D1 (de) | Scheibenwaschanlagendüse und scheibenwaschanlage | |
DE60326590D1 (de) | Tend lamotrigin | |
DE60330269D1 (de) | Piperazinyl- und diazapanylbenzamide und-benzothioamide | |
DE50308359D1 (de) | Armlehne | |
DE50308343D1 (de) | Armlehne | |
DE50302956D1 (de) | Schminkgerät | |
DE60235937D1 (de) | Dekorfolie und Zierelement | |
DE60304229D1 (de) | Pinselabflacher und mit Pinselabflacher ausgerüstete Zeichenvorrichtung | |
DE60323517D1 (de) | Hybridisierungsnachweisverfahren und bioassay-vorr | |
DE60223675D1 (de) | Homogenisiervorrichtung | |
ATA1572002A (de) | Managementspleisskassette | |
DE60319512D1 (de) | Drehgelenk | |
DE60221576D1 (de) | Lötlegierung und lötverbindung | |
DE60331383D1 (de) | Dämpfer | |
DE60300597D1 (de) | Drosselvorrichtung | |
ATE299873T1 (de) | Substituierte c-furan-2-yl-methylamin- und c- thiophen-2-yl-methylamin-derivate | |
ATA19152002A (de) | Hubkupplung | |
FI20021792A0 (fi) | Jousi- ja kielisoitinrakenne | |
DE60219418D1 (de) | Silanylphenole und -naphthole | |
ATA16872002A (de) | Zwischenstück |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |