DE59410197D1 - Optisches Verfahren und Vorrichtung zur Analyse von Substanzen an Sensoroberflächen - Google Patents

Optisches Verfahren und Vorrichtung zur Analyse von Substanzen an Sensoroberflächen

Info

Publication number
DE59410197D1
DE59410197D1 DE59410197T DE59410197T DE59410197D1 DE 59410197 D1 DE59410197 D1 DE 59410197D1 DE 59410197 T DE59410197 T DE 59410197T DE 59410197 T DE59410197 T DE 59410197T DE 59410197 D1 DE59410197 D1 DE 59410197D1
Authority
DE
Germany
Prior art keywords
optical
plane
grating coupler
image formation
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE59410197T
Other languages
English (en)
Inventor
Christof Fattinger
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Cytiva Sweden AB
Original Assignee
F Hoffmann La Roche AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by F Hoffmann La Roche AG filed Critical F Hoffmann La Roche AG
Application granted granted Critical
Publication of DE59410197D1 publication Critical patent/DE59410197D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/10—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type
    • G02B6/12—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings of the optical waveguide type of the integrated circuit kind
    • G02B6/122—Basic optical elements, e.g. light-guiding paths
    • G02B6/124—Geodesic lenses or integrated gratings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4788—Diffraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S436/00—Chemistry: analytical and immunological testing
    • Y10S436/805—Optical property
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S436/00—Chemistry: analytical and immunological testing
    • Y10S436/806—Electrical property or magnetic property
DE59410197T 1993-03-26 1994-03-15 Optisches Verfahren und Vorrichtung zur Analyse von Substanzen an Sensoroberflächen Expired - Fee Related DE59410197D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH92793 1993-03-26

Publications (1)

Publication Number Publication Date
DE59410197D1 true DE59410197D1 (de) 2002-11-21

Family

ID=4198413

Family Applications (1)

Application Number Title Priority Date Filing Date
DE59410197T Expired - Fee Related DE59410197D1 (de) 1993-03-26 1994-03-15 Optisches Verfahren und Vorrichtung zur Analyse von Substanzen an Sensoroberflächen

Country Status (6)

Country Link
US (1) US5479260A (de)
EP (1) EP0617273B1 (de)
JP (1) JPH06300683A (de)
AT (1) ATE226320T1 (de)
CA (1) CA2119980A1 (de)
DE (1) DE59410197D1 (de)

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US20090303479A1 (en) * 2006-02-06 2009-12-10 Stmicroelectronics S.R.L. Optical Apparatus and Method for the Inspection of Nucleic Acid Probes by Polarized Radiation
US8288157B2 (en) 2007-09-12 2012-10-16 Plc Diagnostics, Inc. Waveguide-based optical scanning systems
US9976192B2 (en) 2006-03-10 2018-05-22 Ldip, Llc Waveguide-based detection system with scanning light source
US9423397B2 (en) 2006-03-10 2016-08-23 Indx Lifecare, Inc. Waveguide-based detection system with scanning light source
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CN102721670B (zh) * 2012-06-28 2014-06-04 南京邮电大学 一种半导体等离子体频率测量方法
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US10156488B2 (en) * 2013-08-29 2018-12-18 Corning Incorporated Prism-coupling systems and methods for characterizing curved parts
US9983064B2 (en) 2013-10-30 2018-05-29 Corning Incorporated Apparatus and methods for measuring mode spectra for ion-exchanged glasses having steep index region
US10018566B2 (en) 2014-02-28 2018-07-10 Ldip, Llc Partially encapsulated waveguide based sensing chips, systems and methods of use
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CN108169175B (zh) * 2016-12-08 2022-07-26 松下知识产权经营株式会社 光检测系统
CN108168715B (zh) * 2016-12-08 2021-02-19 松下知识产权经营株式会社 光检测装置
CN116648615A (zh) * 2020-11-27 2023-08-25 弗·哈夫曼-拉罗切有限公司 用于检测结合亲和力的衍射传感器
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Also Published As

Publication number Publication date
EP0617273B1 (de) 2002-10-16
EP0617273A3 (en) 1995-09-06
EP0617273A2 (de) 1994-09-28
CA2119980A1 (en) 1994-09-27
JPH06300683A (ja) 1994-10-28
ATE226320T1 (de) 2002-11-15
US5479260A (en) 1995-12-26

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: BIACORE AB, UPPSALA, SE

8328 Change in the person/name/address of the agent

Representative=s name: WEICKMANN & WEICKMANN, 81679 MUENCHEN

8327 Change in the person/name/address of the patent owner

Owner name: GE HEALTHCARE BIO-SCIENCES AB, UPPSALA, SE

8328 Change in the person/name/address of the agent

Representative=s name: HAMMONDS LLP, LONDON, GB

8339 Ceased/non-payment of the annual fee