DE50012908D1 - Flacher Röntgendetektor mit Alkalihalogenid-Scintillator - Google Patents

Flacher Röntgendetektor mit Alkalihalogenid-Scintillator

Info

Publication number
DE50012908D1
DE50012908D1 DE50012908T DE50012908T DE50012908D1 DE 50012908 D1 DE50012908 D1 DE 50012908D1 DE 50012908 T DE50012908 T DE 50012908T DE 50012908 T DE50012908 T DE 50012908T DE 50012908 D1 DE50012908 D1 DE 50012908D1
Authority
DE
Germany
Prior art keywords
flat
ray detector
alkali halide
halide scintillator
scintillator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE50012908T
Other languages
English (en)
Inventor
Herbert Dr Boerner
Hans Dr Nikol
Herfried Dr Wieczorek
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Intellectual Property and Standards GmbH
Original Assignee
Philips Intellectual Property and Standards GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Intellectual Property and Standards GmbH filed Critical Philips Intellectual Property and Standards GmbH
Priority to DE50012908T priority Critical patent/DE50012908D1/de
Application granted granted Critical
Publication of DE50012908D1 publication Critical patent/DE50012908D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/20Measuring radiation intensity with scintillation detectors
    • G01T1/2018Scintillation-photodiode combinations
DE50012908T 1999-12-21 2000-12-12 Flacher Röntgendetektor mit Alkalihalogenid-Scintillator Expired - Fee Related DE50012908D1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE50012908T DE50012908D1 (de) 1999-12-21 2000-12-12 Flacher Röntgendetektor mit Alkalihalogenid-Scintillator

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19961673A DE19961673A1 (de) 1999-12-21 1999-12-21 Flacher Röntgendetektor mit Alkalihalogenid-Scintillator
DE50012908T DE50012908D1 (de) 1999-12-21 2000-12-12 Flacher Röntgendetektor mit Alkalihalogenid-Scintillator

Publications (1)

Publication Number Publication Date
DE50012908D1 true DE50012908D1 (de) 2006-07-20

Family

ID=7933573

Family Applications (2)

Application Number Title Priority Date Filing Date
DE19961673A Withdrawn DE19961673A1 (de) 1999-12-21 1999-12-21 Flacher Röntgendetektor mit Alkalihalogenid-Scintillator
DE50012908T Expired - Fee Related DE50012908D1 (de) 1999-12-21 2000-12-12 Flacher Röntgendetektor mit Alkalihalogenid-Scintillator

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE19961673A Withdrawn DE19961673A1 (de) 1999-12-21 1999-12-21 Flacher Röntgendetektor mit Alkalihalogenid-Scintillator

Country Status (4)

Country Link
US (1) US6476395B2 (de)
EP (1) EP1111405B1 (de)
JP (1) JP2001228254A (de)
DE (2) DE19961673A1 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10119792A1 (de) * 2001-04-23 2002-10-31 Siemens Ag Verfahren zur Herstellung einer Leuchtstoffschicht
ITTO20020575A1 (it) * 2002-07-02 2004-01-02 Enea Ente Nuove Tec Metodo di rivelazione di immagini micrometriche e sub-micrometriche mediante irraggiamento di una maschera o di un campione biologico con ra
DE10238398A1 (de) 2002-08-22 2004-02-26 Philips Intellectual Property & Standards Gmbh Vorrichtung zur Erzeugung von Bildern und/oder Projektionen
US7355184B2 (en) * 2003-04-07 2008-04-08 Canon Kabushiki Kaisha Radiation detecting apparatus and method for manufacturing the same
JP2005121415A (ja) * 2003-10-15 2005-05-12 Shimadzu Corp 粒度分布測定装置
CN100422288C (zh) * 2006-04-14 2008-10-01 厦门大学 钇铝石榴石制备方法
DE102006038969B4 (de) * 2006-08-21 2013-02-28 Siemens Aktiengesellschaft Röntgenkonverterelement und Verfahren zu dessen Herstellung
DE102008009676A1 (de) * 2008-02-18 2009-08-27 Siemens Aktiengesellschaft Strahlungswandler und Verfahren zur Herstellung eines Strahlungswandlers
WO2012021519A2 (en) * 2010-08-10 2012-02-16 Northwestern University Methods and compositions for the detection of x-ray and gamma-ray radiation
US9296945B2 (en) 2013-04-12 2016-03-29 Radiation Monitoring Devices, Inc. Plastic scintillators
US9526468B2 (en) 2014-09-09 2016-12-27 General Electric Company Multiple frame acquisition for exposure control in X-ray medical imagers
WO2017030624A1 (en) 2015-06-03 2017-02-23 Northwestern University Chalco-phosphate-based hard radiation detectors

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4076984A (en) * 1976-06-23 1978-02-28 Jury Vasilievich Gromov Introscope
US4242221A (en) * 1977-11-21 1980-12-30 General Electric Company Ceramic-like scintillators
GB2034148B (en) * 1978-08-30 1983-06-15 Gen Electric Multi element high resolution scintillator structure
US4375423A (en) * 1980-07-15 1983-03-01 General Electric Company Index-matched phosphor scintillator structures
FR2621705B1 (fr) * 1987-10-09 1990-03-30 Thomson Csf Detecteur multiradiations, notamment detecteur de rayons x a double energie
CN1042772C (zh) * 1993-10-16 1999-03-31 中国科学院西安光学精密机械研究所 一种x射线象增强器及其制作方法
DE19519775A1 (de) * 1995-05-30 1996-12-12 Siemens Ag Verfahren zum Erzeugen dotierter Alkalihalogenidaufdampfschichten
US6178224B1 (en) * 1995-06-23 2001-01-23 Science Applications International Corporation Enhanced X-ray converter screen for X-ray radioscopic systems
JPH09264963A (ja) * 1996-03-29 1997-10-07 Yazaki Corp α線シンチレーション検出器
US6078052A (en) * 1997-08-29 2000-06-20 Picker International, Inc. Scintillation detector with wavelength-shifting optical fibers
WO1999039395A1 (en) * 1998-02-02 1999-08-05 Uniax Corporation Organic diodes with switchable photosensitivity

Also Published As

Publication number Publication date
EP1111405A2 (de) 2001-06-27
EP1111405B1 (de) 2006-06-07
EP1111405A3 (de) 2002-07-24
JP2001228254A (ja) 2001-08-24
US20010006214A1 (en) 2001-07-05
US6476395B2 (en) 2002-11-05
DE19961673A1 (de) 2001-06-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee