DE3855086D1 - Gerät zur Dichtemessung und seine Verwendung - Google Patents

Gerät zur Dichtemessung und seine Verwendung

Info

Publication number
DE3855086D1
DE3855086D1 DE3855086T DE3855086T DE3855086D1 DE 3855086 D1 DE3855086 D1 DE 3855086D1 DE 3855086 T DE3855086 T DE 3855086T DE 3855086 T DE3855086 T DE 3855086T DE 3855086 D1 DE3855086 D1 DE 3855086D1
Authority
DE
Germany
Prior art keywords
measurement device
density measurement
density
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE3855086T
Other languages
English (en)
Other versions
DE3855086T2 (de
Inventor
Tomoaki C O Fuji Photo Komatsu
Shigeo C O Fuji Photo Fil Sato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Holdings Corp
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP6765487U external-priority patent/JPS63175845U/ja
Priority claimed from JP1987067655U external-priority patent/JPH0530133Y2/ja
Priority claimed from JP62110296A external-priority patent/JPH0616010B2/ja
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Application granted granted Critical
Publication of DE3855086D1 publication Critical patent/DE3855086D1/de
Publication of DE3855086T2 publication Critical patent/DE3855086T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N2021/0162—Arrangements or apparatus for facilitating the optical investigation using microprocessors for control of a sequence of operations, e.g. test, powering, switching, processing
DE3855086T 1987-05-06 1988-05-04 Gerät zur Dichtemessung und seine Verwendung Expired - Fee Related DE3855086T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP6765487U JPS63175845U (de) 1987-05-06 1987-05-06
JP1987067655U JPH0530133Y2 (de) 1987-05-06 1987-05-06
JP62110296A JPH0616010B2 (ja) 1987-05-06 1987-05-06 濃度較正方法

Publications (2)

Publication Number Publication Date
DE3855086D1 true DE3855086D1 (de) 1996-04-18
DE3855086T2 DE3855086T2 (de) 1996-07-25

Family

ID=27299516

Family Applications (1)

Application Number Title Priority Date Filing Date
DE3855086T Expired - Fee Related DE3855086T2 (de) 1987-05-06 1988-05-04 Gerät zur Dichtemessung und seine Verwendung

Country Status (4)

Country Link
US (2) US4937764A (de)
EP (1) EP0290013B1 (de)
CN (1) CN1014471B (de)
DE (1) DE3855086T2 (de)

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EP0369489A3 (de) * 1988-11-18 1991-11-27 Omron Corporation Steuerungssystem für Sensoren
NL8901722A (nl) * 1989-07-06 1991-02-01 Oce Nederland Bv Inrichting voor het meten van door een informatiedrager verstrooid licht.
NL8901759A (nl) * 1989-07-10 1991-02-01 Nederland Ptt Werkwijze voor het detecteren van een streepcode.
JPH0395435A (ja) * 1989-09-08 1991-04-19 Terumo Corp 測定装置
US5459677A (en) * 1990-10-09 1995-10-17 Board Of Regents Of The University Of Washington Calibration transfer for analytical instruments
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US5251157A (en) * 1990-12-28 1993-10-05 Westinghouse Electric Corp. Process for offset adjustment of a microprocessor based overcurrent protective device and apparatus
JP3118552B2 (ja) * 1991-02-27 2000-12-18 ロッシュ ダイアグノスティックス コーポレイション 体液の分析装置及び方法
US5319437A (en) * 1991-07-26 1994-06-07 Kollmorgen Corporation Handheld portable spectrophotometer
US5229835A (en) * 1991-08-07 1993-07-20 Hughes Aircraft Company Optical monitoring
US5416575A (en) * 1991-11-18 1995-05-16 Schwartz; Mark Method and system for calibrating an optical density measurement apparatus
US5347476A (en) * 1992-11-25 1994-09-13 Mcbean Sr Ronald V Instrumentation system with multiple sensor modules
DE4305968C2 (de) * 1993-02-26 1996-04-04 Techkon Elektronik Gmbh Handmeßgerät für Remissionsmessungen an farbigen Kontrollfeldern von Druckbogen
DE4310204A1 (de) * 1993-03-29 1994-10-06 Siemens Ag Verfahren zum Justieren eines Meßgerätes, insbesondere eines IR-Absorptions-Photometers
US5377000A (en) * 1993-04-29 1994-12-27 Color And Appearance Technology, Inc. Portable appearance measuring apparatus
GB2281637B (en) * 1993-09-01 1997-01-15 Kodak Ltd Calibration of sensitometers
JP3212779B2 (ja) * 1993-11-12 2001-09-25 富士写真フイルム株式会社 光学式分析装置の分光器の機差補正方法
EP0698785B1 (de) * 1994-08-24 2001-04-11 Gretag-Macbeth AG Computergesteuertes Gerät zur Erfassung optischer Transmissions- und/oder Remissionseigenschaften eines Messobjekts, Verfahren zum Betrieb eines solchen Geräts und Verfahren zur Initialisierung von Messfunktionen eines solchen Geräts
US5710713A (en) * 1995-03-20 1998-01-20 The Dow Chemical Company Method of creating standardized spectral libraries for enhanced library searching
US5701181A (en) * 1995-05-12 1997-12-23 Bayer Corporation Fiber optic diffuse light reflectance sensor utilized in the detection of occult blood
US6167318A (en) * 1997-12-22 2000-12-26 Alemite Corporation Oil mist generating system and method
US6040904A (en) * 1998-12-23 2000-03-21 Eastman Kodak Company Diffuse optical transmission density measurement system
JP3628209B2 (ja) * 1999-05-11 2005-03-09 富士写真フイルム株式会社 圧力測定方法および圧力測定フィルム
US7460696B2 (en) 2004-06-01 2008-12-02 Lumidigm, Inc. Multispectral imaging biometrics
US7751594B2 (en) 2003-04-04 2010-07-06 Lumidigm, Inc. White-light spectral biometric sensors
US20050007582A1 (en) * 2003-07-07 2005-01-13 Lumidigm, Inc. Methods and apparatus for collection of optical reference measurements for monolithic sensors
US20110163163A1 (en) * 2004-06-01 2011-07-07 Lumidigm, Inc. Multispectral barcode imaging
US8229185B2 (en) 2004-06-01 2012-07-24 Lumidigm, Inc. Hygienic biometric sensors
US8787630B2 (en) 2004-08-11 2014-07-22 Lumidigm, Inc. Multispectral barcode imaging
WO2007022213A2 (en) * 2005-08-15 2007-02-22 X-Rite, Incorporated Spectrophotometer with light guiding element
US7995808B2 (en) 2006-07-19 2011-08-09 Lumidigm, Inc. Contactless multispectral biometric capture
US8175346B2 (en) 2006-07-19 2012-05-08 Lumidigm, Inc. Whole-hand multispectral biometric imaging
US8355545B2 (en) 2007-04-10 2013-01-15 Lumidigm, Inc. Biometric detection using spatial, temporal, and/or spectral techniques
WO2008110036A1 (fr) * 2007-03-14 2008-09-18 HUANG, Jintong Dispositif et méthode de correction
US8285010B2 (en) 2007-03-21 2012-10-09 Lumidigm, Inc. Biometrics based on locally consistent features
US8653440B2 (en) * 2008-06-17 2014-02-18 Xerox Corporation Sensor and housing in a replicating system to facilitate detection of objects using electromagnetic radiation
US8872908B2 (en) 2009-08-26 2014-10-28 Lumidigm, Inc Dual-imager biometric sensor
US8570149B2 (en) 2010-03-16 2013-10-29 Lumidigm, Inc. Biometric imaging using an optical adaptive interface
US20140226161A1 (en) * 2013-02-12 2014-08-14 Bio-Rad Laboratories, Inc. Densitometer step tablet
CN109406461B (zh) * 2018-09-30 2021-05-14 山东泰利信医疗科技有限公司 血小板聚集率测量结果判定方法及血小板聚集仪的标定方法
CN110376188B (zh) * 2019-05-30 2022-04-22 碧沃丰生物科技(广东)股份有限公司 一种基于图像分析的无机氮检测方法
CN111504849B (zh) * 2020-04-28 2023-05-30 济宁鲁科检测科技有限公司 透射式黑白密度计的误差校准方法
CN111693403A (zh) * 2020-06-02 2020-09-22 河南省计量科学研究院 一种黑白密度片的校验检测方法
RU209618U1 (ru) * 2021-07-26 2022-03-17 Общество с ограниченной ответственностью «АРИОН» Цифровой денситометр-яркомер
CN114689460B (zh) * 2022-06-01 2022-08-23 西北大学 一种在线密度自动测量的原油密度值校正方法

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US3604815A (en) * 1968-04-22 1971-09-14 Miles Lab Reflectance meter
US3970393A (en) * 1974-07-23 1976-07-20 Harris Corporation Automatic compensation for densitometer imbalance
US4029420A (en) * 1974-12-27 1977-06-14 Romilly John Simms Light reflectance instrument
JPS5232384A (en) * 1975-09-08 1977-03-11 Fuji Photo Film Co Ltd Densitometer
US4020330A (en) * 1976-05-03 1977-04-26 International Telephone And Telegraph Corporation Densitometer
US4198677A (en) * 1978-01-30 1980-04-15 Exxon Research & Engineering Co. Method and apparatus for compensating a sensor
US4199816A (en) * 1978-06-28 1980-04-22 Humphrey Instruments, Inc. Optical calibration apparatus and procedure
US4242730A (en) * 1979-03-09 1980-12-30 Helena Laboratories Corporation Single scan microprocessor-controlled densitometer
GB2054845B (en) * 1979-07-26 1984-01-04 Wiggins Teape Group Ltd Measuring reflectivity
JPS56154605A (en) * 1980-05-01 1981-11-30 Dainippon Screen Mfg Co Ltd Measuring method and device for mesh image density or mesh area rate
US4479714A (en) * 1981-04-14 1984-10-30 Lehrer Leo K Reflection densitometer with ellipsoid reflection surface
DE3127381A1 (de) * 1981-07-10 1983-01-27 Salvat Editores, S.A., Barcelona Messorgane fuer im geschlossenen kreis arbeitende systeme zur ueberwachung und korrektur des drucks bei offset-druckmaschinen
DE3276136D1 (en) * 1981-08-28 1987-05-27 Ligg Pty Ltd Reflectance meter
US4446715A (en) * 1982-06-07 1984-05-08 Camino Laboratories, Inc. Transducer calibration system
JPS5955526A (ja) * 1982-09-24 1984-03-30 Sharp Corp インタ−フエ−ス回路
US4583187A (en) * 1983-02-02 1986-04-15 Siemens Gammasonics, Inc. Method and circuit for stabilizing conversion gain of radiation detectors of a radiation detection system
DE3315377A1 (de) * 1983-02-19 1984-08-23 Dr. Bruno Lange Gmbh, 1000 Berlin Farbmessgeraet
US4587623A (en) * 1983-04-26 1986-05-06 Troxler Electronic Laboratories, Inc. Method for recalibrating nuclear density gauges
US4552458A (en) * 1983-10-11 1985-11-12 Eastman Kodak Company Compact reflectometer
US4566798A (en) * 1983-11-10 1986-01-28 Eastman Kodak Company Method for calibrating a reflectometer containing black and white references displaced from the sample position
DE8411914U1 (de) * 1984-04-16 1984-08-23 LRE Relais + Elektronik GmbH, 8000 München Remissionsphotometer für die Auswertung von Reagenzpapierstreifen
DE3575350D1 (en) * 1984-08-08 1990-02-15 Gretag Ag Densitometer.
JPS6168539A (ja) * 1984-09-12 1986-04-08 Omron Tateisi Electronics Co 生化学測定装置
GB8429211D0 (en) * 1984-11-19 1984-12-27 Mit Peritronic Ltd Reflectometer
US4762412A (en) * 1984-12-26 1988-08-09 Shimadzu Corporation Optical scanning device
US4697236A (en) * 1985-03-11 1987-09-29 Helena Laboratories Corporation Densitometer with automatic gain and reference value adjustment of analog waveform
FR2580805B1 (fr) * 1985-04-23 1987-12-31 Centre Nat Rech Scient Spectrophotometre a tres haute resolution
US4669052A (en) * 1985-07-02 1987-05-26 Motorola, Inc. Apparatus and method for calibrating a sensor
US4744657A (en) * 1985-07-11 1988-05-17 Beckman Instruments, Inc. Method and record for calibration of a spectrophotometer
JPH0629852B2 (ja) * 1985-08-26 1994-04-20 富士写真フイルム株式会社 偏倚乾式分析要素を用いた液体試料中の被検物質の定量分析方法
DE3642922C2 (de) * 1985-12-16 1998-01-15 Minolta Camera Kk Fotoelektrische Farbmeßeinrichtung
US4750837A (en) * 1986-04-11 1988-06-14 Sclavo Inc. Fluorometer with reference light source

Also Published As

Publication number Publication date
DE3855086T2 (de) 1996-07-25
EP0290013B1 (de) 1996-03-13
EP0290013A2 (de) 1988-11-09
CN1030980A (zh) 1989-02-08
CN1014471B (zh) 1991-10-23
US5016203A (en) 1991-05-14
US4937764A (en) 1990-06-26
EP0290013A3 (en) 1990-11-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee