DE3851654T2 - Spannungsdetektor. - Google Patents

Spannungsdetektor.

Info

Publication number: DE3851654T2
Authority: DE; Germany
Prior art keywords: voltage detector; detector; voltage
Prior art date: 1987-06-10
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Fee Related

Application number

DE3851654T

Other languages

English (en)

Other versions

DE3851654D1 (de

Inventor

Takuya Nakamura

Shinichiro Aoshima

Yutaka Tsuchiya

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Hamamatsu Photonics KK

Original Assignee

Hamamatsu Photonics KK

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1987-06-10

Filing date

1988-06-10

Publication date

1995-01-19

1988-06-10 Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK

1994-11-03 Publication of DE3851654D1 publication Critical patent/DE3851654D1/de

1995-01-19 Application granted granted Critical

1995-01-19 Publication of DE3851654T2 publication Critical patent/DE3851654T2/de

2008-06-11 Anticipated expiration legal-status Critical

Status Expired - Fee Related legal-status Critical Current

Links

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
- G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
- G01R15/242—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption based on the Pockels effect, i.e. linear electro-optic effect
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/07—Non contact-making probes
- G01R1/071—Non contact-making probes containing electro-optic elements

DE3851654T 1987-06-10 1988-06-10 Spannungsdetektor. Expired - Fee Related DE3851654T2 (de)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
JP62144984A JPS63308572A (ja)	1987-06-10	1987-06-10	電圧検出装置

Publications (2)

Publication Number	Publication Date
DE3851654D1 DE3851654D1 (de)	1994-11-03
DE3851654T2 true DE3851654T2 (de)	1995-01-19

Family

ID=15374775

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE3851654T Expired - Fee Related DE3851654T2 (de)	1987-06-10	1988-06-10	Spannungsdetektor.

Country Status (4)

Country	Link
US (1)	US4855591A (de)
EP (1)	EP0294836B1 (de)
JP (1)	JPS63308572A (de)
DE (1)	DE3851654T2 (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4975635A (en) *	1987-11-05	1990-12-04	Hironori Takahashi	Voltage detector using a sampling type high-speed photodetector
US5025209A (en) *	1988-06-30	1991-06-18	Victor Company Of Japan, Ltd.	Apparatus for detecting surface potential distribution
US5034903A (en) *	1989-01-30	1991-07-23	Alfano Robert R	Apparatus and method for measuring the time evolution of carriers propogating within submicron and micron electronic devices
US4928058A (en) *	1989-05-23	1990-05-22	The University Of Rochester	Electro-optic signal measurement
DE3924369A1 (de) *	1989-07-22	1991-01-31	Asea Brown Boveri	Verfahren zur messung eines elektrischen feldes oder einer elektrischen spannung und einrichtung zur durchfuehrung des verfahrens
JP2556910B2 (ja) *	1989-11-30	1996-11-27	浜松ホトニクス株式会社	光強度変化検出装置
US5097201A (en) *	1990-02-15	1992-03-17	Photon Dynamics, Inc.	Voltage imaging system using electro-optics
US4983911A (en) *	1990-02-15	1991-01-08	Photon Dynamics, Inc.	Voltage imaging system using electro-optics
US5124635A (en) *	1990-02-15	1992-06-23	Photon Dynamics, Inc.	Voltage imaging system using electro-optics
US5170127A (en) *	1991-02-19	1992-12-08	Photon Dynamics, Inc.	Capacitance imaging system using electro-optics
US5432461A (en) *	1991-06-28	1995-07-11	Photon Dynamics, Inc.	Method of testing active matrix liquid crystal display substrates
US5444385A (en) *	1991-09-10	1995-08-22	Photon Dynamics, Inc.	Testing apparatus for liquid crystal display substrates
US5543729A (en) *	1991-09-10	1996-08-06	Photon Dynamics, Inc.	Testing apparatus and connector for liquid crystal display substrates
US5504438A (en) *	1991-09-10	1996-04-02	Photon Dynamics, Inc.	Testing method for imaging defects in a liquid crystal display substrate
US5406213A (en) *	1991-09-10	1995-04-11	Photon Dynamics, Inc.	Instrument for testing liquid crystal display base plates
US5459409A (en) *	1991-09-10	1995-10-17	Photon Dynamics, Inc.	Testing device for liquid crystal display base plate
US5465052A (en) *	1991-09-10	1995-11-07	Photon Dynamics, Inc.	Method of testing liquid crystal display substrates
JPH06265574A (ja) *	1993-03-15	1994-09-22	Hamamatsu Photonics Kk	Ｅ−ｏプローブ
DE4416298A1 (de) *	1994-05-09	1995-11-16	Abb Research Ltd	Verfahren und Vorrichtung zur optischen Ermittlung einer physikalischen Größe
SE9502257D0 (sv) *	1995-06-21	1995-06-21	Asea Brown Boveri	High voltage measuring device
DE19634251A1 (de) *	1996-08-26	1998-03-05	Abb Patent Gmbh	Spannungswandler
JP3223155B2 (ja) *	1998-02-05	2001-10-29	科学技術振興事業団	薄膜スピンプローブ
DE19810781C1 (de) *	1998-03-06	1999-08-26	Siemens Ag	Vorrichtung zum Messen einer elektrischen Spannung oder einer elektrischen Feldstärke
JP2000221213A (ja)	1998-11-24	2000-08-11	Ando Electric Co Ltd	電気光学プロ―ブ
DE19955978C2 (de) *	1998-11-24	2002-06-27	Ando Electric	Elektrooptische Sonde für ein Oszilloskop das eine Signalwellenform mißt
US6323985B1 (en)	1998-12-30	2001-11-27	Intel Corporation	Mosfet through silicon modulator and method
US6269199B1 (en) *	1998-12-30	2001-07-31	Intel Corporation	Through silicon modulator and method using polarized light

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE2845625A1 (de) *	1978-10-19	1980-04-30	Siemens Ag	Anordnung zur elektrooptischen spannungsmessung
US4446425A (en) *	1982-02-12	1984-05-01	The University Of Rochester	Measurement of electrical signals with picosecond resolution
US4618819A (en) *	1984-03-27	1986-10-21	The University Of Rochester	Measurement of electrical signals with subpicosecond resolution
US4603293A (en) *	1984-03-27	1986-07-29	University Of Rochester	Measurement of electrical signals with subpicosecond resolution
JPS61124834A (ja) *	1984-11-21	1986-06-12	Sharp Corp	光応用センサ
EP0197196A1 (de) *	1985-03-08	1986-10-15	The University Of Rochester	Elektro-elektronenoptisches Oszilloskop zur Zeitauflösung elektrischer Wellenzüge im Picosekundenbereich

1987
- 1987-06-10 JP JP62144984A patent/JPS63308572A/ja active Granted
1988
- 1988-06-08 US US07/203,929 patent/US4855591A/en not_active Expired - Fee Related
- 1988-06-10 DE DE3851654T patent/DE3851654T2/de not_active Expired - Fee Related
- 1988-06-10 EP EP88109295A patent/EP0294836B1/de not_active Expired - Lifetime

Also Published As

Publication number	Publication date
EP0294836A3 (en)	1990-08-01
JPS63308572A (ja)	1988-12-15
JPH0573178B2 (de)	1993-10-13
DE3851654D1 (de)	1994-11-03
EP0294836B1 (de)	1994-09-28
US4855591A (en)	1989-08-08
EP0294836A2 (de)	1988-12-14

Legal Events

Date	Code	Title	Description
1995-10-26	8364	No opposition during term of opposition
2003-04-10	8339	Ceased/non-payment of the annual fee

Publication	Publication Date	Title
DE3851654T2 (de)	1995-01-19	Spannungsdetektor.
DE3873422D1 (de)	1992-09-10	Spannungsdetektor.
DE3866594D1 (de)	1992-01-16	Lagedetektor.
DE68915275D1 (de)	1994-06-16	Detektor.
DE3786778D1 (de)	1993-09-02	Spannungsvergleichsschaltung.
DE3877628D1 (de)	1993-03-04	Spannungsdetektor.
DE3850918D1 (de)	1994-09-08	Spannungsdetektor.
DE3877827D1 (de)	1993-03-11	Spannungsdetektor.
DE3851912T2 (de)	1995-05-11	Phasendetektor.
DE3880216T2 (de)	1993-08-26	Spannungsdetektor.
DE3887008D1 (de)	1994-02-24	Spannungsdetektor.
DE3886821T2 (de)	1994-04-28	Spannungsdetektor.
DE3785583T2 (de)	1993-11-25	Stromdetektor.
NO885487L (no)	1989-06-12	Detektor.
DE3579333D1 (de)	1990-10-04	Spannungsdetektor.
DE3784927T2 (de)	1993-10-14	Überstromdetektor.
DE3884489T2 (de)	1994-01-27	Spannungsdetektor.
DE3887006D1 (de)	1994-02-24	Spannungsdetektor.
DE3582153D1 (de)	1991-04-18	Pegel-detektor.
FI882892A (fi)	1988-12-18	Detektor av polymerfraktion.
FI885688A (fi)	1989-06-12	Detektor foer baervaogsfasfel foer en datademodulator.
DE3885006D1 (de)	1993-11-25	Spannungsdetektor.
NO863529D0 (no)	1986-09-03	Detektor.
DE3767979D1 (de)	1991-03-14	Wahltondetektor.
DE3872422T2 (de)	1993-02-25	Spitzendetektor.