DE3683573D1 - Automatischer analysenapparat. - Google Patents

Automatischer analysenapparat.

Info

Publication number
DE3683573D1
DE3683573D1 DE8686108560T DE3683573T DE3683573D1 DE 3683573 D1 DE3683573 D1 DE 3683573D1 DE 8686108560 T DE8686108560 T DE 8686108560T DE 3683573 T DE3683573 T DE 3683573T DE 3683573 D1 DE3683573 D1 DE 3683573D1
Authority
DE
Germany
Prior art keywords
automatic analyzer
analyzer
automatic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8686108560T
Other languages
English (en)
Inventor
Kouichi Wakatake
Takejirou Yokosuka
Hidehiko Fujioka
Teruo Mochida
Kazutomi Yokota
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JAPAN TECTRON INSTR CORP
Original Assignee
JAPAN TECTRON INSTR CORP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP60139553A external-priority patent/JPS62863A/ja
Priority claimed from JP3623086A external-priority patent/JPS62194462A/ja
Priority claimed from JP3860386A external-priority patent/JPS62195560A/ja
Priority claimed from JP6167386A external-priority patent/JPS62217163A/ja
Priority claimed from JP7612286A external-priority patent/JPS62232569A/ja
Priority claimed from JP8385186A external-priority patent/JPS62239058A/ja
Application filed by JAPAN TECTRON INSTR CORP filed Critical JAPAN TECTRON INSTR CORP
Application granted granted Critical
Publication of DE3683573D1 publication Critical patent/DE3683573D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/251—Colorimeters; Construction thereof
    • G01N21/253—Colorimeters; Construction thereof for batch operation, i.e. multisample apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/0092—Scheduling
    • G01N35/0095—Scheduling introducing urgent samples with priority, e.g. Short Turn Around Time Samples [STATS]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/025—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N2035/00346—Heating or cooling arrangements
    • G01N2035/00435—Refrigerated reagent storage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N2035/0097—Control arrangements for automatic analysers monitoring reactions as a function of time
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0439—Rotary sample carriers, i.e. carousels
    • G01N2035/0446—Combinations of the above
    • G01N2035/0448—Combinations of the above composed of interchangeable ring elements
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S436/00—Chemistry: analytical and immunological testing
    • Y10S436/807—Apparatus included in process claim, e.g. physical support structures
DE8686108560T 1985-06-26 1986-06-23 Automatischer analysenapparat. Expired - Fee Related DE3683573D1 (de)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
JP60139553A JPS62863A (ja) 1985-06-26 1985-06-26 自動分析装置
JP3623086A JPS62194462A (ja) 1986-02-20 1986-02-20 試薬ボトルテ−ブルの冷却装置
JP3860386A JPS62195560A (ja) 1986-02-24 1986-02-24 試薬ボトルテ−ブル
JP6167386A JPS62217163A (ja) 1986-03-19 1986-03-19 自動分析装置
JP7612286A JPS62232569A (ja) 1986-04-02 1986-04-02 自動分析装置
JP8385186A JPS62239058A (ja) 1986-04-11 1986-04-11 自動分析装置

Publications (1)

Publication Number Publication Date
DE3683573D1 true DE3683573D1 (de) 1992-03-05

Family

ID=27549803

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8686108560T Expired - Fee Related DE3683573D1 (de) 1985-06-26 1986-06-23 Automatischer analysenapparat.

Country Status (5)

Country Link
US (1) US4774055A (de)
EP (1) EP0216026B1 (de)
AU (1) AU591685B2 (de)
CA (1) CA1268692A (de)
DE (1) DE3683573D1 (de)

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CA1268692A (en) 1990-05-08
EP0216026A1 (de) 1987-04-01
EP0216026B1 (de) 1992-01-22

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