FR2633400B1
(fr)
*
|
1988-06-24 |
1990-11-09 |
Labo Electronique Physique |
Systeme de controle automatique de circuits integres
|
EP0363098B1
(de)
*
|
1988-10-03 |
1995-04-05 |
Canon Kabushiki Kaisha |
Vorrichtung zum Regeln der Temperatur
|
US5646540A
(en)
*
|
1989-04-19 |
1997-07-08 |
Interuniversitair Micro-Elektronic Centrum Vzw |
Apparatus and method for measuring electromagnetic ageing parameter of a circuit element and predicting its values
|
US5151871A
(en)
*
|
1989-06-16 |
1992-09-29 |
Tokyo Electron Limited |
Method for heat-processing semiconductor device and apparatus for the same
|
US4982347A
(en)
*
|
1989-06-22 |
1991-01-01 |
Unisys Corporation |
Process and apparatus for producing temperature profiles in a workpiece as it passes through a belt furnace
|
FR2665047B1
(fr)
*
|
1990-07-23 |
1993-05-21 |
Froilabo |
Etude de deverminage de modules electroniques.
|
JPH04104074A
(ja)
*
|
1990-08-22 |
1992-04-06 |
Mitsubishi Electric Corp |
電子基板検査装置
|
US5148003A
(en)
*
|
1990-11-28 |
1992-09-15 |
International Business Machines Corporation |
Modular test oven
|
DE4041027C1
(de)
*
|
1990-12-20 |
1992-06-25 |
Siemens Nixdorf Informationssysteme Ag, 4790 Paderborn, De |
|
US5166607A
(en)
*
|
1991-05-31 |
1992-11-24 |
Vlsi Technology, Inc. |
Method and apparatus to heat the surface of a semiconductor die in a device during burn-in while withdrawing heat from device leads
|
US6998860B1
(en)
|
1991-06-04 |
2006-02-14 |
Micron Technology, Inc. |
Method for burn-in testing semiconductor dice
|
CA2073916A1
(en)
*
|
1991-07-19 |
1993-01-20 |
Tatsuya Hashinaga |
Burn-in apparatus and method
|
CA2073899A1
(en)
*
|
1991-07-19 |
1993-01-20 |
Tatsuya Hashinaga |
Burn-in apparatus and method
|
CA2073896A1
(en)
*
|
1991-07-19 |
1993-01-20 |
Tatsuya Hashinaga |
Burn-in apparatus and method
|
CA2073886A1
(en)
*
|
1991-07-19 |
1993-01-20 |
Tatsuya Hashinaga |
Burn-in apparatus and method
|
JP2862154B2
(ja)
*
|
1991-07-22 |
1999-02-24 |
富士通株式会社 |
バーンイン装置
|
US5541524A
(en)
*
|
1991-08-23 |
1996-07-30 |
Nchip, Inc. |
Burn-in technologies for unpackaged integrated circuits
|
US5515910A
(en)
*
|
1993-05-03 |
1996-05-14 |
Micro Control System |
Apparatus for burn-in of high power semiconductor devices
|
JP2546172B2
(ja)
*
|
1993-11-04 |
1996-10-23 |
日本電気株式会社 |
高速バス装置
|
JP2962129B2
(ja)
*
|
1993-12-29 |
1999-10-12 |
日本電気株式会社 |
半導体試験装置
|
DE19631340C2
(de)
*
|
1995-08-04 |
2000-11-30 |
Advantest Corp |
Anordnung zum Testen von ICs
|
US5778692A
(en)
*
|
1996-08-20 |
1998-07-14 |
International Business Machines Corporation |
Allocation of compressors to cooling chambers
|
US6489793B2
(en)
|
1996-10-21 |
2002-12-03 |
Delta Design, Inc. |
Temperature control of electronic devices using power following feedback
|
US6476627B1
(en)
*
|
1996-10-21 |
2002-11-05 |
Delta Design, Inc. |
Method and apparatus for temperature control of a device during testing
|
US5903163A
(en)
*
|
1996-12-24 |
1999-05-11 |
Micron Technology, Inc. |
Apparatus and method of controlling the environmental temperature near semiconductor devices under test
|
US6005404A
(en)
*
|
1997-04-30 |
1999-12-21 |
Rpi, Inc. |
Environmental test apparatus with partition-isolated thermal chamber
|
JPH11126743A
(ja)
*
|
1997-10-24 |
1999-05-11 |
Tokyo Electron Ltd |
処理装置
|
JP4703850B2
(ja)
*
|
1998-07-14 |
2011-06-15 |
デルタ・デザイン・インコーポレイテッド |
電力追従帰還作用を利用した電子装置の温度制御
|
WO2000004396A1
(en)
|
1998-07-14 |
2000-01-27 |
Schlumberger Technologies, Inc. |
Apparatus, method and system of liquid-based, wide range, fast response temperature cycling control of electronic devices
|
US6518782B1
(en)
|
2000-08-29 |
2003-02-11 |
Delta Design, Inc. |
Active power monitoring using externally located current sensors
|
US6761192B2
(en)
|
2002-09-19 |
2004-07-13 |
Swiftflo, Llc |
Assembly for automatic vehicle fueling
|
US7078247B2
(en)
*
|
2003-06-06 |
2006-07-18 |
International Business Machines Corporation |
Early detection of contact liner integrity by chemical reaction
|
US7265561B2
(en)
*
|
2003-09-30 |
2007-09-04 |
International Business Machines Corporation |
Device burn in utilizing voltage control
|
US20050127931A1
(en)
*
|
2003-12-11 |
2005-06-16 |
Karlinsey Robert L.Jr. |
Variable temperature test cell and associated method
|
US8549912B2
(en)
|
2007-12-18 |
2013-10-08 |
Teradyne, Inc. |
Disk drive transport, clamping and testing
|
US7996174B2
(en)
|
2007-12-18 |
2011-08-09 |
Teradyne, Inc. |
Disk drive testing
|
US8041449B2
(en)
|
2008-04-17 |
2011-10-18 |
Teradyne, Inc. |
Bulk feeding disk drives to disk drive testing systems
|
US8102173B2
(en)
|
2008-04-17 |
2012-01-24 |
Teradyne, Inc. |
Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit
|
US8238099B2
(en)
|
2008-04-17 |
2012-08-07 |
Teradyne, Inc. |
Enclosed operating area for disk drive testing systems
|
US20090262455A1
(en)
|
2008-04-17 |
2009-10-22 |
Teradyne, Inc. |
Temperature Control Within Disk Drive Testing Systems
|
US7945424B2
(en)
|
2008-04-17 |
2011-05-17 |
Teradyne, Inc. |
Disk drive emulator and method of use thereof
|
US8305751B2
(en)
|
2008-04-17 |
2012-11-06 |
Teradyne, Inc. |
Vibration isolation within disk drive testing systems
|
US8160739B2
(en)
|
2008-04-17 |
2012-04-17 |
Teradyne, Inc. |
Transferring storage devices within storage device testing systems
|
US8095234B2
(en)
|
2008-04-17 |
2012-01-10 |
Teradyne, Inc. |
Transferring disk drives within disk drive testing systems
|
US7848106B2
(en)
|
2008-04-17 |
2010-12-07 |
Teradyne, Inc. |
Temperature control within disk drive testing systems
|
US8117480B2
(en)
|
2008-04-17 |
2012-02-14 |
Teradyne, Inc. |
Dependent temperature control within disk drive testing systems
|
WO2009148942A2
(en)
|
2008-06-03 |
2009-12-10 |
Teradyne, Inc. |
Processing storage devices
|
US8008934B2
(en)
*
|
2009-06-10 |
2011-08-30 |
Freescale Semiconductor, Inc. |
Burn-in system for electronic devices
|
US8687356B2
(en)
|
2010-02-02 |
2014-04-01 |
Teradyne, Inc. |
Storage device testing system cooling
|
US8466699B2
(en)
|
2009-07-15 |
2013-06-18 |
Teradyne, Inc. |
Heating storage devices in a testing system
|
US8628239B2
(en)
|
2009-07-15 |
2014-01-14 |
Teradyne, Inc. |
Storage device temperature sensing
|
US8547123B2
(en)
|
2009-07-15 |
2013-10-01 |
Teradyne, Inc. |
Storage device testing system with a conductive heating assembly
|
US7920380B2
(en)
|
2009-07-15 |
2011-04-05 |
Teradyne, Inc. |
Test slot cooling system for a storage device testing system
|
US8116079B2
(en)
|
2009-07-15 |
2012-02-14 |
Teradyne, Inc. |
Storage device testing system cooling
|
US7995349B2
(en)
|
2009-07-15 |
2011-08-09 |
Teradyne, Inc. |
Storage device temperature sensing
|
US9779780B2
(en)
|
2010-06-17 |
2017-10-03 |
Teradyne, Inc. |
Damping vibrations within storage device testing systems
|
US8687349B2
(en)
|
2010-07-21 |
2014-04-01 |
Teradyne, Inc. |
Bulk transfer of storage devices using manual loading
|
US9001456B2
(en)
|
2010-08-31 |
2015-04-07 |
Teradyne, Inc. |
Engaging test slots
|
US9459312B2
(en)
|
2013-04-10 |
2016-10-04 |
Teradyne, Inc. |
Electronic assembly test system
|
CN105606990A
(zh)
*
|
2015-11-24 |
2016-05-25 |
北京新润泰思特测控技术有限公司 |
老炼试验箱
|
US11226390B2
(en)
|
2017-08-28 |
2022-01-18 |
Teradyne, Inc. |
Calibration process for an automated test system
|
US10725091B2
(en)
|
2017-08-28 |
2020-07-28 |
Teradyne, Inc. |
Automated test system having multiple stages
|
US10845410B2
(en)
|
2017-08-28 |
2020-11-24 |
Teradyne, Inc. |
Automated test system having orthogonal robots
|
US10948534B2
(en)
|
2017-08-28 |
2021-03-16 |
Teradyne, Inc. |
Automated test system employing robotics
|
US10983145B2
(en)
|
2018-04-24 |
2021-04-20 |
Teradyne, Inc. |
System for testing devices inside of carriers
|
US10775408B2
(en)
|
2018-08-20 |
2020-09-15 |
Teradyne, Inc. |
System for testing devices inside of carriers
|
US11754596B2
(en)
|
2020-10-22 |
2023-09-12 |
Teradyne, Inc. |
Test site configuration in an automated test system
|
US11953519B2
(en)
|
2020-10-22 |
2024-04-09 |
Teradyne, Inc. |
Modular automated test system
|
US11899042B2
(en)
|
2020-10-22 |
2024-02-13 |
Teradyne, Inc. |
Automated test system
|
US11754622B2
(en)
|
2020-10-22 |
2023-09-12 |
Teradyne, Inc. |
Thermal control system for an automated test system
|
US11867749B2
(en)
|
2020-10-22 |
2024-01-09 |
Teradyne, Inc. |
Vision system for an automated test system
|
TWI797824B
(zh)
*
|
2021-09-17 |
2023-04-01 |
致茂電子股份有限公司 |
壓測頭之快速拆裝組件及具備該組件之電子元件測試設備
|