DE3681657D1 - Schaltungsanordnung zum pruefen integrierter schaltungseinheiten. - Google Patents

Schaltungsanordnung zum pruefen integrierter schaltungseinheiten.

Info

Publication number
DE3681657D1
DE3681657D1 DE8686109401T DE3681657T DE3681657D1 DE 3681657 D1 DE3681657 D1 DE 3681657D1 DE 8686109401 T DE8686109401 T DE 8686109401T DE 3681657 T DE3681657 T DE 3681657T DE 3681657 D1 DE3681657 D1 DE 3681657D1
Authority
DE
Germany
Prior art keywords
test circuit
pref
circuit
testing integrated
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8686109401T
Other languages
English (en)
Inventor
Heinz Krug
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to DE8686109401T priority Critical patent/DE3681657D1/de
Application granted granted Critical
Publication of DE3681657D1 publication Critical patent/DE3681657D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/006—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation at wafer scale level, i.e. wafer scale integration [WSI]
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S257/00—Active solid-state devices, e.g. transistors, solid-state diodes
    • Y10S257/92—Conductor layers on different levels connected in parallel, e.g. to reduce resistance
DE8686109401T 1985-07-24 1986-07-09 Schaltungsanordnung zum pruefen integrierter schaltungseinheiten. Expired - Lifetime DE3681657D1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE8686109401T DE3681657D1 (de) 1985-07-24 1986-07-09 Schaltungsanordnung zum pruefen integrierter schaltungseinheiten.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19853526485 DE3526485A1 (de) 1985-07-24 1985-07-24 Schaltungsanordnung zum pruefen integrierter schaltungseinheiten
DE8686109401T DE3681657D1 (de) 1985-07-24 1986-07-09 Schaltungsanordnung zum pruefen integrierter schaltungseinheiten.

Publications (1)

Publication Number Publication Date
DE3681657D1 true DE3681657D1 (de) 1991-10-31

Family

ID=6276647

Family Applications (2)

Application Number Title Priority Date Filing Date
DE19853526485 Granted DE3526485A1 (de) 1985-07-24 1985-07-24 Schaltungsanordnung zum pruefen integrierter schaltungseinheiten
DE8686109401T Expired - Lifetime DE3681657D1 (de) 1985-07-24 1986-07-09 Schaltungsanordnung zum pruefen integrierter schaltungseinheiten.

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE19853526485 Granted DE3526485A1 (de) 1985-07-24 1985-07-24 Schaltungsanordnung zum pruefen integrierter schaltungseinheiten

Country Status (7)

Country Link
US (1) US4961053A (de)
EP (1) EP0212208B1 (de)
JP (1) JPS6316633A (de)
CN (1) CN1011085B (de)
AT (1) ATE67861T1 (de)
DE (2) DE3526485A1 (de)
IN (1) IN164539B (de)

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Also Published As

Publication number Publication date
ATE67861T1 (de) 1991-10-15
US4961053A (en) 1990-10-02
CN1011085B (zh) 1991-01-02
CN86105604A (zh) 1987-02-11
DE3526485A1 (de) 1987-02-05
IN164539B (de) 1989-04-01
EP0212208A1 (de) 1987-03-04
DE3526485C2 (de) 1987-08-06
EP0212208B1 (de) 1991-09-25
JPS6316633A (ja) 1988-01-23

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