DE3577355D1 - Mikroskop. - Google Patents

Mikroskop.

Info

Publication number
DE3577355D1
DE3577355D1 DE8585107775T DE3577355T DE3577355D1 DE 3577355 D1 DE3577355 D1 DE 3577355D1 DE 8585107775 T DE8585107775 T DE 8585107775T DE 3577355 T DE3577355 T DE 3577355T DE 3577355 D1 DE3577355 D1 DE 3577355D1
Authority
DE
Germany
Prior art keywords
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8585107775T
Other languages
English (en)
Inventor
Makoto Yoshinaga
Yoichi Iba
Noriyuki Miyahara
Masami Kawasaki
Terumasa Morita
Takashi Nagano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP59129204A external-priority patent/JP2501098B2/ja
Priority claimed from JP27966384A external-priority patent/JPS61158313A/ja
Priority claimed from JP27966484A external-priority patent/JPH061296B2/ja
Priority claimed from JP60018771A external-priority patent/JPH0783043B2/ja
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Application granted granted Critical
Publication of DE3577355D1 publication Critical patent/DE3577355D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
DE8585107775T 1984-06-25 1985-06-23 Mikroskop. Expired - Lifetime DE3577355D1 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP59129204A JP2501098B2 (ja) 1984-06-25 1984-06-25 顕微鏡
JP27966384A JPS61158313A (ja) 1984-12-29 1984-12-29 顕微鏡
JP27966484A JPH061296B2 (ja) 1984-12-29 1984-12-29 顕微鏡
JP60018771A JPH0783043B2 (ja) 1985-02-04 1985-02-04 ウエハ検査顕微鏡装置

Publications (1)

Publication Number Publication Date
DE3577355D1 true DE3577355D1 (de) 1990-05-31

Family

ID=27457035

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8585107775T Expired - Lifetime DE3577355D1 (de) 1984-06-25 1985-06-23 Mikroskop.

Country Status (3)

Country Link
US (1) US4744642A (de)
EP (1) EP0169387B1 (de)
DE (1) DE3577355D1 (de)

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5235457A (en) * 1987-09-24 1993-08-10 Washington University Kit for converting a standard microscope into a single aperture confocal scanning epi-illumination microscope
US5198927A (en) * 1989-09-20 1993-03-30 Yale University Adapter for microscope
DE4212924C2 (de) * 1991-07-23 2001-11-29 Olympus Optical Co Stereomikroskop
JP3067331B2 (ja) * 1991-10-30 2000-07-17 株式会社ニコン 顕微鏡
JPH06324285A (ja) * 1993-05-13 1994-11-25 Olympus Optical Co Ltd 視覚表示装置
JPH09152555A (ja) * 1995-11-29 1997-06-10 Olympus Optical Co Ltd 顕微鏡光学系
US7295314B1 (en) 1998-07-10 2007-11-13 Nanometrics Incorporated Metrology/inspection positioning system
US6320609B1 (en) * 1998-07-10 2001-11-20 Nanometrics Incorporated System using a polar coordinate stage and continuous image rotation to compensate for stage rotation
ATE225046T1 (de) * 1999-12-15 2002-10-15 Moeller Wedel Gmbh Beleuchtungseinrichtung für ein operationsmikroskop
US7668362B2 (en) * 2000-05-03 2010-02-23 Aperio Technologies, Inc. System and method for assessing virtual slide image quality
US7738688B2 (en) * 2000-05-03 2010-06-15 Aperio Technologies, Inc. System and method for viewing virtual slides
US6711283B1 (en) 2000-05-03 2004-03-23 Aperio Technologies, Inc. Fully automatic rapid microscope slide scanner
US7518652B2 (en) * 2000-05-03 2009-04-14 Aperio Technologies, Inc. Method and apparatus for pre-focus in a linear array based slide scanner
US6268957B1 (en) 2000-09-25 2001-07-31 Rex A. Hoover Computer controlled stereo microscopy
FR2823314B1 (fr) * 2001-04-09 2003-08-15 Univ Joseph Fourier Microscope numerique
US6850362B2 (en) * 2001-08-08 2005-02-01 Atto Bioscience Inc. Microscope optical system with a stationary sample stage and stationary viewing ports suited for viewing various fields of view of a sample
DE10152609A1 (de) * 2001-10-25 2003-05-08 Max Planck Gesellschaft Optisches Mikroskop mit verstellbarem Objektiv
DE10159221B4 (de) * 2001-11-27 2006-01-19 Siemens Ag Mikroskop
US7257268B2 (en) 2003-02-28 2007-08-14 Aperio Technologies, Inc. Systems and methods for image pattern recognition
US7116440B2 (en) 2003-02-28 2006-10-03 Aperio Technologies, Inc. Image processing and analysis framework
DE10361522A1 (de) * 2003-12-23 2005-07-28 Pac Tech - Packaging Technologies Gmbh Optisches System
WO2005119575A2 (en) 2004-05-27 2005-12-15 Aperio Technologies, Inc Systems and methods for creating and viewing three dimensional virtual slides
DE102004048101B4 (de) 2004-09-30 2018-04-05 Carl Zeiss Microscopy Gmbh Einstellbarer Mikroskoptubus
US7787674B2 (en) * 2005-01-27 2010-08-31 Aperio Technologies, Incorporated Systems and methods for viewing three dimensional virtual slides
US8164622B2 (en) * 2005-07-01 2012-04-24 Aperio Technologies, Inc. System and method for single optical axis multi-detector microscope slide scanner
EP1757969A1 (de) * 2005-08-24 2007-02-28 Olympus Corporation Mikroskopbewegungseinheit und Mikroskopgerät
FR2893132B1 (fr) * 2005-11-09 2008-07-25 Innopsys Sa Dispositif d'analyse a balayage d'echantillons biologiques par fluorescence
US8086077B2 (en) * 2006-06-30 2011-12-27 Aperio Technologies, Inc. Method for storing and retrieving large images via DICOM
US8010555B2 (en) 2006-06-30 2011-08-30 Aperio Technologies, Inc. System and method for managing images over a network
US8165363B2 (en) 2007-05-04 2012-04-24 Aperio Technologies, Inc. System and method for quality assurance in pathology
EP2175302B1 (de) * 2007-08-07 2018-09-19 Nikon Corporation Mikroskop
US20100020393A1 (en) * 2008-07-24 2010-01-28 Hologic Inc. System and Device for Non-Destructive Raman Analysis
US8964286B2 (en) 2008-07-24 2015-02-24 Hologic Inc System and device for non-destructive Raman analysis
US8077386B2 (en) * 2008-10-22 2011-12-13 Microbrightfield, Inc. Movable objective lens assembly for an optical microscope and optical microscopes having such an assembly
EP3764085A3 (de) 2008-10-24 2021-03-24 Leica Biosystems Imaging Inc. Fluoreszenz-scanner mit komplettobjektträger
JP5522989B2 (ja) * 2009-07-08 2014-06-18 オリンパス株式会社 観察光学系及びそれを備えた顕微鏡
EP2510494B1 (de) 2009-12-11 2021-12-22 Leica Biosystems Imaging, Inc. Verbessertes signal-rausch-verhältnis bei der analyse von digitalen pathologiebildern
CN103597397B (zh) * 2011-01-12 2016-10-26 Idea机器显影设计及生产有限公司 紧凑型显微镜系统及方法
CN105338931B (zh) 2013-03-13 2018-08-03 光学医疗公司 激光眼科手术系统
AU2014249863B2 (en) 2013-03-13 2018-07-12 Amo Development, Llc Free floating patient interface for laser surgery system
JP6523106B2 (ja) * 2015-08-28 2019-05-29 オリンパス株式会社 顕微鏡システム、顕微鏡システムの制御方法及び顕微鏡システムの制御プログラム
CN115453737A (zh) * 2022-11-10 2022-12-09 盛吉盛(宁波)半导体科技有限公司 一种显微镜的光学系统

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2464793A (en) * 1942-08-08 1949-03-22 Lester Cooke Jr H Method and apparatus for photographic scanning
DE1572557A1 (de) * 1967-10-19 1970-04-23 Molekularelektronik Doppelmikroskop zur Beobachtung von Positionsvorgaengen vorzugsweise in der Siliziumplanartechnologie
US3580682A (en) * 1967-10-30 1971-05-25 Mini Ind Constructillor Method and stereoscopic optical apparatus for determining the roughness of the surfaces of machined parts
US3641648A (en) * 1970-08-20 1972-02-15 Bell Telephone Labor Inc Piece part handling apparatus
DE2537153A1 (de) * 1975-08-21 1977-03-03 Bosch Gmbh Robert Vorrichtung zum vergleich zweier gegenstaende
US4007326A (en) * 1976-01-15 1977-02-08 Xerox Corporation Electronic copy analysis
DE2754498B2 (de) * 1976-12-10 1980-05-08 Olympus Optical Co., Ltd., Tokio Umgekehrtes Mikroskop
US4292663A (en) * 1978-01-16 1981-09-29 Bausch & Lomb Incorporated High intensity illumination light table
JPS5836969B2 (ja) * 1978-01-23 1983-08-12 株式会社甲南カメラ研究所 眼球顕微鏡
JPS55130510A (en) * 1979-03-30 1980-10-09 Olympus Optical Co Ltd Afocal barrel lens
JPS56101119A (en) * 1980-01-17 1981-08-13 Canon Inc Observing device
DE3003246A1 (de) * 1980-01-30 1981-08-06 Grundig E.M.V. Elektro-Mechanische Versuchsanstalt Max Grundig & Co KG, 8510 Fürth Operationsmikroskop mit fernsehkamera
DE3046663A1 (de) * 1980-12-11 1982-07-15 Fa. Carl Zeiss, 7920 Heidenheim Gelenkoptik
DE3105018A1 (de) * 1981-02-12 1982-09-02 Fa. Carl Zeiss, 7920 Heidenheim Operationsmikroskop
DE8112436U1 (de) * 1981-04-27 1984-02-23 Karl Süss KG, Präzisionsgeräte für Wissenschaft und Industrie GmbH & Co, 8046 Garching Vorrichtung zum automatischen Justieren von ebenen Gegenständen mit zwei Bezugspunkten, insbesondere bei der Herstellung von Halbleiterbauelementen
JPS5986020A (ja) * 1982-11-09 1984-05-18 Nippon Kogaku Kk <Nikon> 視野可変顕微鏡装置
DE8401952U1 (de) * 1984-01-25 1984-06-14 C. Reichert Optische Werke Ag, Wien Mikroskop

Also Published As

Publication number Publication date
EP0169387A3 (en) 1987-05-13
US4744642A (en) 1988-05-17
EP0169387A2 (de) 1986-01-29
EP0169387B1 (de) 1990-04-25

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)
8339 Ceased/non-payment of the annual fee