DE3565895D1 - Contactless eddy current testing method, and apparatus for carrying out this method - Google Patents
Contactless eddy current testing method, and apparatus for carrying out this methodInfo
- Publication number
- DE3565895D1 DE3565895D1 DE8585402524T DE3565895T DE3565895D1 DE 3565895 D1 DE3565895 D1 DE 3565895D1 DE 8585402524 T DE8585402524 T DE 8585402524T DE 3565895 T DE3565895 T DE 3565895T DE 3565895 D1 DE3565895 D1 DE 3565895D1
- Authority
- DE
- Germany
- Prior art keywords
- carrying
- eddy current
- current testing
- testing method
- contactless eddy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000000034 method Methods 0.000 title 1
- 238000012360 testing method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
- G01N27/9053—Compensating for probe to workpiece spacing
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR8419409A FR2574938B1 (fr) | 1984-12-19 | 1984-12-19 | Methode de controle par courants de foucault sans contact et dispositif de mise en oeuvre |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3565895D1 true DE3565895D1 (en) | 1988-12-01 |
Family
ID=9310756
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8585402524T Expired DE3565895D1 (en) | 1984-12-19 | 1985-12-18 | Contactless eddy current testing method, and apparatus for carrying out this method |
Country Status (4)
Country | Link |
---|---|
US (1) | US4727322A (de) |
EP (1) | EP0187094B2 (de) |
DE (1) | DE3565895D1 (de) |
FR (1) | FR2574938B1 (de) |
Families Citing this family (36)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0242492B1 (de) * | 1985-12-28 | 1992-08-05 | Yamaha Corporation | Kontaktloser Markierungssensor |
GB8622702D0 (en) * | 1986-09-20 | 1986-10-29 | Ford Motor Co | Measuring coating thickness |
US4849693A (en) * | 1988-02-29 | 1989-07-18 | Battelle Memorial Institute | Automated measurement system employing eddy currents to adjust probe position and determine metal hardness |
US5200704A (en) * | 1991-02-28 | 1993-04-06 | Westinghouse Electric Corp. | System and method including a buried flexible sheet target impregnated with ferromagnetic particles and eddy current probe for determining proximity of a non-conductive underground structure |
DE69222207T2 (de) * | 1991-03-13 | 1998-03-05 | Westinghouse Electric Corp | Verfahren zur Feststellung des Verformungmasses in einem Material, in Reaktion auf eine zusammendrückende Kraft |
US5223793A (en) * | 1991-04-29 | 1993-06-29 | Intex Inc. | Apparatus for controlled rotation of a sphere or ball for inspecting or marking the surface with a predetermined pattern |
US5394084A (en) * | 1991-12-23 | 1995-02-28 | The Boeing Company | Method and apparatus for reducing errors in eddy-current conductivity measurements due to lift-off by interpolating between a plurality of reference conductivity measurements |
US5420507A (en) * | 1992-09-28 | 1995-05-30 | Edward L. Laskowski | Method and apparatus for sensing a target characteristic by measuring both impedance and resonant frequency of a tank circuit |
US5552704A (en) * | 1993-06-25 | 1996-09-03 | Tencor Instruments | Eddy current test method and apparatus for measuring conductance by determining intersection of lift-off and selected curves |
US5541510A (en) * | 1995-04-06 | 1996-07-30 | Kaman Instrumentation Corporation | Multi-Parameter eddy current measuring system with parameter compensation technical field |
US6285183B1 (en) | 1996-09-30 | 2001-09-04 | Mcdonnell Douglas Corporation | Method and system for measuring the volume loss of a metal substrate |
DE19860487A1 (de) * | 1998-12-28 | 2000-07-06 | Siemens Ag | Verfahren und Vorrichtung zur räumlichen Vermessung einer Inhomogenität an einer Oberfläche eines Kernreaktorbauteils und Anwendung des Verfahrens zur Vermessung einer elektrisch praktisch nicht leitenden Schicht |
US6346807B1 (en) * | 1999-10-22 | 2002-02-12 | Bently Nevada Corporation | Digital eddy current proximity system: apparatus and method |
JP3758439B2 (ja) * | 1999-12-20 | 2006-03-22 | 日本精工株式会社 | 曲面を有する被検査体の欠陥を曲面に沿って非接触で検出する方法 |
SE520322C2 (sv) * | 2000-03-23 | 2003-06-24 | Daprox Ab | Sätt och anordning för avståndsbestämning mellan en stator och en denna motstående roterande rotor |
TWI241398B (en) * | 2000-03-28 | 2005-10-11 | Toshiba Corp | Eddy current loss measuring sensor, film thickness measuring device, film thickness measuring method and recording medium |
US20030210041A1 (en) * | 2000-04-07 | 2003-11-13 | Le Cuong Duy | Eddy current measuring system for monitoring and controlling a chemical vapor deposition (CVD) process |
US6741076B2 (en) | 2000-04-07 | 2004-05-25 | Cuong Duy Le | Eddy current measuring system for monitoring and controlling a CMP process |
US6549006B2 (en) | 2000-04-07 | 2003-04-15 | Cuong Duy Le | Eddy current measurements of thin-film metal coatings using a selectable calibration standard |
US6407546B1 (en) * | 2000-04-07 | 2002-06-18 | Cuong Duy Le | Non-contact technique for using an eddy current probe for measuring the thickness of metal layers disposed on semi-conductor wafer products |
US6762604B2 (en) | 2000-04-07 | 2004-07-13 | Cuong Duy Le | Standalone eddy current measuring system for thickness estimation of conductive films |
US6593737B2 (en) | 2000-08-24 | 2003-07-15 | Shell Oil Company | Method for measuring the wall thickness of an electrically conductive object |
JP2002148012A (ja) * | 2000-11-08 | 2002-05-22 | Ulvac Japan Ltd | 膜厚測定装置及び膜厚測定方法 |
US6933718B2 (en) * | 2001-06-12 | 2005-08-23 | The Boeing Company | Quantification method and system for corrosion and damage assessment |
GB0124910D0 (en) * | 2001-10-17 | 2001-12-05 | Accentus Plc | Measurement of material properties |
WO2003034054A2 (en) * | 2001-10-17 | 2003-04-24 | Aea Technology Plc | Method and apparatus for measuring material properties and lift-off components of an object using a magnetic probe |
US20040207395A1 (en) * | 2002-04-08 | 2004-10-21 | Moshe Sarfaty | Eddy current-capacitance sensor for conducting film characterization |
JP4451111B2 (ja) * | 2003-10-20 | 2010-04-14 | 株式会社荏原製作所 | 渦電流センサ |
US7295003B2 (en) * | 2004-09-22 | 2007-11-13 | The Boeing Company | Non-destructive testing system and method utilizing a magnetic field to identify defects in a layer of a laminated material |
US7830140B2 (en) * | 2007-08-07 | 2010-11-09 | General Electric Company | Eddy current system and method for estimating material properties of parts |
FI20085456L (fi) * | 2008-05-15 | 2009-11-16 | Valtion Teknillinen | Menetelmä ja laitteisto sähköisen koodin tunnistamiseksi |
GB0820930D0 (en) * | 2008-11-17 | 2008-12-24 | Dvs Techology Ltd | Coating thickness measurement |
US20130249540A1 (en) * | 2012-03-22 | 2013-09-26 | Olympus Ndt Inc. | Eddy current array probe and method for lift-off compensation during operation without known lift references |
US9335151B2 (en) | 2012-10-26 | 2016-05-10 | Applied Materials, Inc. | Film measurement |
CN106404899A (zh) * | 2016-08-29 | 2017-02-15 | 爱德森(厦门)电子有限公司 | 一种涡流检测提离晃动补偿方法 |
CN116086300B (zh) * | 2023-04-07 | 2023-06-09 | 苏州中科科仪技术发展有限公司 | 一种磁悬浮分子泵位移传感器的校准方法及其应用 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3358225A (en) * | 1964-03-27 | 1967-12-12 | Richard S Peugeot | Lift-off compensation for eddy current testers |
GB1130870A (en) * | 1966-10-20 | 1968-10-16 | Nat Res Dev | Method and apparatus for detecting and measuring cracks in metal structures |
US3718855A (en) * | 1970-11-30 | 1973-02-27 | R Cordova | Eddy current flaw detection system |
JPS5376926A (en) * | 1976-12-21 | 1978-07-07 | Nippon Kokan Kk | Molten metal level monitor controller of continuous casting machine that use eddy flow system range finder for measurement of molten metal level |
DE2815228C3 (de) * | 1978-04-08 | 1980-11-27 | Institut Dr. Friedrich Foerster Pruefgeraetebau, 7410 Reutlingen | Prüfanordnung für die zerstörungsfreie Prüfung von metallischem Prüfgut |
US4215310A (en) * | 1978-07-10 | 1980-07-29 | United States Steel Corporation | Magnetic testing method and apparatus having provision for eliminating inaccuracies caused by gaps between probe and test piece |
US4438754A (en) * | 1979-08-14 | 1984-03-27 | Shell Oil Company | Method for sensing and remotely controlling a tool to workpiece spatial relationship |
CA1158314A (en) * | 1980-08-18 | 1983-12-06 | Majesty (Her) In Right Of Canada As Represented By Atomic Energy Of Cana Da Limited | Eddy current surface probe |
JPS57178155A (en) * | 1981-04-27 | 1982-11-02 | Hitachi Ltd | Eddy current test equipment |
US4596953A (en) * | 1982-04-14 | 1986-06-24 | Daidotokushuko Kabushikikaisha | Apparatus for scanning a material for detection of flaws and having material axis deviation detection |
US4641092A (en) * | 1982-07-08 | 1987-02-03 | Sumitomo Metal Industries, Ltd. | Rotary probe apparatus for detecting flaws in a test object |
US4644274A (en) * | 1983-04-01 | 1987-02-17 | General Electric Company | Apparatus for supporting an eddy current probe used to scan an irregular surface |
-
1984
- 1984-12-19 FR FR8419409A patent/FR2574938B1/fr not_active Expired
-
1985
- 1985-12-17 US US06/809,785 patent/US4727322A/en not_active Expired - Lifetime
- 1985-12-18 EP EP85402524A patent/EP0187094B2/de not_active Expired - Lifetime
- 1985-12-18 DE DE8585402524T patent/DE3565895D1/de not_active Expired
Also Published As
Publication number | Publication date |
---|---|
EP0187094A1 (de) | 1986-07-09 |
EP0187094B1 (de) | 1988-10-26 |
US4727322A (en) | 1988-02-23 |
EP0187094B2 (de) | 1992-05-13 |
FR2574938A1 (fr) | 1986-06-20 |
FR2574938B1 (fr) | 1986-12-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8363 | Opposition against the patent | ||
8366 | Restricted maintained after opposition proceedings | ||
8339 | Ceased/non-payment of the annual fee |