DE3475225D1 - Method and devices for detecting spectral features - Google Patents

Method and devices for detecting spectral features

Info

Publication number
DE3475225D1
DE3475225D1 DE8484107044T DE3475225T DE3475225D1 DE 3475225 D1 DE3475225 D1 DE 3475225D1 DE 8484107044 T DE8484107044 T DE 8484107044T DE 3475225 T DE3475225 T DE 3475225T DE 3475225 D1 DE3475225 D1 DE 3475225D1
Authority
DE
Germany
Prior art keywords
devices
spectral features
detecting spectral
detecting
features
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8484107044T
Other languages
English (en)
Inventor
Gary Carl Bjorklund
Marc David Levenson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of DE3475225D1 publication Critical patent/DE3475225D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J3/433—Modulation spectrometry; Derivative spectrometry
    • G01J3/4338—Frequency modulated spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/447—Polarisation spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/04—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by beating two waves of a same source but of different frequency and measuring the phase shift of the lower frequency obtained
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/19—Dichroism

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
DE8484107044T 1983-07-07 1984-06-20 Method and devices for detecting spectral features Expired DE3475225D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/511,593 US4523847A (en) 1983-07-07 1983-07-07 Frequency modulation-polarization spectroscopy method and device for detecting spectral features

Publications (1)

Publication Number Publication Date
DE3475225D1 true DE3475225D1 (en) 1988-12-22

Family

ID=24035584

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484107044T Expired DE3475225D1 (en) 1983-07-07 1984-06-20 Method and devices for detecting spectral features

Country Status (5)

Country Link
US (1) US4523847A (de)
EP (1) EP0131183B1 (de)
JP (1) JPS6025423A (de)
CA (1) CA1208930A (de)
DE (1) DE3475225D1 (de)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4614116A (en) * 1985-02-04 1986-09-30 International Business Machines Corporation Phase sensitive ultrasonic modulation method for the detection of strain-sensitive spectral features
US4594511A (en) * 1985-03-29 1986-06-10 Sri International Method and apparatus for double modulation spectroscopy
JPS61293972A (ja) * 1985-06-24 1986-12-24 Nisshin Flour Milling Co Ltd １，４−ジヒドロピリジンスルホン誘導体およびその製法
US4856899A (en) * 1985-12-20 1989-08-15 Yokogawa Electric Corporation Optical frequency analyzer using a local oscillator heterodyne detection of incident light
GB8612221D0 (en) * 1986-05-20 1986-06-25 Amersham Int Plc Assaying species in sample
US5036204A (en) * 1989-07-24 1991-07-30 Philip Morris, Inc. Continuous concentration monitoring by circular dichroism
US5097201A (en) * 1990-02-15 1992-03-17 Photon Dynamics, Inc. Voltage imaging system using electro-optics
US5124635A (en) * 1990-02-15 1992-06-23 Photon Dynamics, Inc. Voltage imaging system using electro-optics
US4983911A (en) * 1990-02-15 1991-01-08 Photon Dynamics, Inc. Voltage imaging system using electro-optics
US5170127A (en) * 1991-02-19 1992-12-08 Photon Dynamics, Inc. Capacitance imaging system using electro-optics
US5432461A (en) * 1991-06-28 1995-07-11 Photon Dynamics, Inc. Method of testing active matrix liquid crystal display substrates
JPH0772700B2 (ja) * 1991-07-05 1995-08-02 日本分光株式会社 位相差制御装置及び方法
US5444385A (en) * 1991-09-10 1995-08-22 Photon Dynamics, Inc. Testing apparatus for liquid crystal display substrates
US5543729A (en) * 1991-09-10 1996-08-06 Photon Dynamics, Inc. Testing apparatus and connector for liquid crystal display substrates
US5504438A (en) * 1991-09-10 1996-04-02 Photon Dynamics, Inc. Testing method for imaging defects in a liquid crystal display substrate
US5459409A (en) * 1991-09-10 1995-10-17 Photon Dynamics, Inc. Testing device for liquid crystal display base plate
US5465052A (en) * 1991-09-10 1995-11-07 Photon Dynamics, Inc. Method of testing liquid crystal display substrates
US5406213A (en) * 1991-09-10 1995-04-11 Photon Dynamics, Inc. Instrument for testing liquid crystal display base plates
TW342447B (en) * 1996-11-11 1998-10-11 Cherng Jou Noninvasive polarized common path optical heterodyne glucose monitoring system
US5949480A (en) * 1997-03-03 1999-09-07 The United States Of America As Represented By The Secretary Of The Army Broad band imaging spectroradiometer
US6064488A (en) * 1997-06-06 2000-05-16 Monitor Labs, Inc. Method and apparatus for in situ gas concentration measurement
US6040914A (en) * 1997-06-10 2000-03-21 New Focus, Inc. Simple, low cost, laser absorption sensor system
DE19827638A1 (de) * 1998-06-20 1999-12-23 Alcatel Sa Methode zur Messung von Störungseffekten auf Glasfaserübertragungsstrecken sowie Übertragungssystem
DE69912525T2 (de) * 1998-06-22 2004-09-23 Saint-Gobain Glass France Messung interner Spannungen in einem transparenten Material, wie Fensterscheiben
US6323950B1 (en) * 1999-09-28 2001-11-27 Lucent Technologies, Inc. Chromatic dispersion measurement for optical components
US6856398B2 (en) * 2001-10-24 2005-02-15 Exfo Electro-Optical Engineering Inc. Method of and apparatus for making wavelength-resolved polarimetric measurements
US7230712B2 (en) * 2003-11-03 2007-06-12 Battelle Memorial Institute Reduction of residual amplitude modulation in frequency-modulated signals
FR2922307B1 (fr) * 2007-10-10 2017-03-24 Centre Nat Rech Scient Procede et dispositif de caracterisation d'elements microscopiques
TWI456184B (zh) * 2011-12-19 2014-10-11 Ind Tech Res Inst 光譜檢測裝置及光譜檢測方法
KR102506803B1 (ko) * 2018-11-23 2023-03-07 삼성전자주식회사 배선 기판 테스트 방법 및 이를 수행하기 위한 장치

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3239671A (en) * 1962-05-21 1966-03-08 Gen Telephone & Elect Single-sideband light modulator
US4297035A (en) * 1979-09-14 1981-10-27 International Business Machines Corporation Method and device for detecting a specific spectral feature

Also Published As

Publication number Publication date
EP0131183B1 (de) 1988-11-17
EP0131183A3 (en) 1986-04-30
US4523847A (en) 1985-06-18
JPS6025423A (ja) 1985-02-08
JPH041861B2 (de) 1992-01-14
CA1208930A (en) 1986-08-05
EP0131183A2 (de) 1985-01-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee