DE3377390D1 - Apparatus and method for tracking integrated circuit devices - Google Patents

Apparatus and method for tracking integrated circuit devices

Info

Publication number
DE3377390D1
DE3377390D1 DE8383300849T DE3377390T DE3377390D1 DE 3377390 D1 DE3377390 D1 DE 3377390D1 DE 8383300849 T DE8383300849 T DE 8383300849T DE 3377390 T DE3377390 T DE 3377390T DE 3377390 D1 DE3377390 D1 DE 3377390D1
Authority
DE
Germany
Prior art keywords
integrated circuit
circuit devices
tracking integrated
tracking
devices
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8383300849T
Other languages
English (en)
Inventor
William D Morton
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Analog Devices Inc
Original Assignee
Precision Monolithics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Precision Monolithics Inc filed Critical Precision Monolithics Inc
Application granted granted Critical
Publication of DE3377390D1 publication Critical patent/DE3377390D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07C—TIME OR ATTENDANCE REGISTERS; REGISTERING OR INDICATING THE WORKING OF MACHINES; GENERATING RANDOM NUMBERS; VOTING OR LOTTERY APPARATUS; ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDED FOR ELSEWHERE
    • G07C3/00—Registering or indicating the condition or the working of machines or other apparatus, other than vehicles
    • G07C3/14—Quality control systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
DE8383300849T 1982-02-19 1983-02-18 Apparatus and method for tracking integrated circuit devices Expired DE3377390D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/350,245 US4454413A (en) 1982-02-19 1982-02-19 Apparatus for tracking integrated circuit devices

Publications (1)

Publication Number Publication Date
DE3377390D1 true DE3377390D1 (en) 1988-08-18

Family

ID=23375862

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8383300849T Expired DE3377390D1 (en) 1982-02-19 1983-02-18 Apparatus and method for tracking integrated circuit devices

Country Status (4)

Country Link
US (1) US4454413A (de)
EP (1) EP0087286B1 (de)
JP (1) JPS58194351A (de)
DE (1) DE3377390D1 (de)

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Publication number Priority date Publication date Assignee Title
CH668718A5 (de) * 1983-08-08 1989-01-31 Schoeller & Co Ag A Verfahren zur aussonderung bestimmter gebinde, wie industriebehaelter, flaschenkaesten aus einem gebindepark und vorrichtung zur durchfuehrung des verfahrens.
US4787143A (en) * 1985-12-04 1988-11-29 Tdk Corporation Method for detecting and correcting failure in mounting of electronic parts on substrate and apparatus therefor
JPS62151729U (de) * 1986-03-17 1987-09-26
US4889977A (en) * 1987-12-21 1989-12-26 Southwestern Bell Telephone Company Method of identifying the disposition of plug-in units at a warehouse
JPH01294384A (ja) * 1988-05-20 1989-11-28 Yazaki Corp コネクタ
US4947335A (en) * 1988-09-12 1990-08-07 At&T Bell Laboratories Identification of workpiece information
US5038023A (en) * 1989-06-28 1991-08-06 C. Itoh Information Systems Development, Inc. System for storing and monitoring bar coded articles such as keys in a drawer
WO1997029383A1 (de) * 1996-02-09 1997-08-14 Mci Computer Gmbh Verfahren zum handhaben von elektronischen bauelementen
US5867505A (en) * 1996-08-07 1999-02-02 Micron Technology, Inc. Method and apparatus for testing an integrated circuit including the step/means for storing an associated test identifier in association with integrated circuit identifier for each test to be performed on the integrated circuit
US5927512A (en) * 1997-01-17 1999-07-27 Micron Technology, Inc. Method for sorting integrated circuit devices
US6100486A (en) * 1998-08-13 2000-08-08 Micron Technology, Inc. Method for sorting integrated circuit devices
US5844803A (en) * 1997-02-17 1998-12-01 Micron Technology, Inc. Method of sorting a group of integrated circuit devices for those devices requiring special testing
US5915231A (en) 1997-02-26 1999-06-22 Micron Technology, Inc. Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture
US5856923A (en) * 1997-03-24 1999-01-05 Micron Technology, Inc. Method for continuous, non lot-based integrated circuit manufacturing
US7120513B1 (en) * 1997-06-06 2006-10-10 Micron Technology, Inc. Method for using data regarding manufacturing procedures integrated circuits (ICS) have undergone, such as repairs, to select procedures the ICS will undergo, such as additional repairs
US5907492A (en) * 1997-06-06 1999-05-25 Micron Technology, Inc. Method for using data regarding manufacturing procedures integrated circuits (IC's) have undergone, such as repairs, to select procedures the IC's will undergo, such as additional repairs
US6049624A (en) 1998-02-20 2000-04-11 Micron Technology, Inc. Non-lot based method for assembling integrated circuit devices
US6392289B1 (en) 1999-04-15 2002-05-21 Micron Technology, Inc. Integrated circuit substrate having through hole markings to indicate defective/non-defective status of same
US6524881B1 (en) 2000-08-25 2003-02-25 Micron Technology, Inc. Method and apparatus for marking a bare semiconductor die
US6792365B2 (en) * 2001-08-10 2004-09-14 Micron Technology, Inc. Sequential unique marking
US7169685B2 (en) 2002-02-25 2007-01-30 Micron Technology, Inc. Wafer back side coating to balance stress from passivation layer on front of wafer and be used as die attach adhesive
US9697402B1 (en) * 2016-11-22 2017-07-04 Xilinx, Inc. System and method for integrated circuit handling and tracking

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2537778A (en) * 1948-02-18 1951-01-09 Remington Rand Inc Perforated record card
US3435192A (en) * 1964-11-09 1969-03-25 Thomas C Hartney Record device and system
US3354568A (en) * 1965-01-06 1967-11-28 Koschier Willi Record card with film insert
US3358824A (en) * 1965-08-03 1967-12-19 Hoffmann La Roche Dispensing of pharmaceuticals
US3412333A (en) * 1965-11-15 1968-11-19 Philco Ford Corp Apparatus for sequentially testing electrical components under controlled environment conditions
DE1774009B1 (de) * 1967-05-15 1972-03-09 Agency Ind Science Techn Magnetischer matrixspeicher aus magnetleitern und wortleitern
US3529277A (en) * 1968-05-01 1970-09-15 Barnes Corp Integrated circuit carrier
US3644715A (en) * 1969-09-22 1972-02-22 Becton Dickinson Co Machine readable label and sample identification system utilizing the same
US3916157A (en) * 1970-09-08 1975-10-28 Mmbi Inc Specimen carrier
GB1419622A (en) * 1972-03-09 1975-12-31 Plessey Co Ltd Data handling systems
DD96586B1 (de) * 1972-05-17 1980-04-30 Guenther Pfeiffer Einrichtung zur optisch-elektronischen identifizierung von proben
US3831006A (en) * 1973-01-19 1974-08-20 Honeywell Inc Patient-specimen identification system using stored associated numbers
DE2648307A1 (de) * 1976-10-26 1978-05-03 Licentia Gmbh Einrichtung zur pruefdatenerfassung von in bewegung befindlichen, mit einer fabrikationsnummer versehenen prueflingen
JPS53112369A (en) * 1977-03-10 1978-09-30 Kubota Ltd Transmission mechanism for a vehicle
US4128757A (en) * 1977-05-05 1978-12-05 Garner Jr Dudley E Customer initiated ordering system
JPS5488034A (en) * 1977-12-24 1979-07-12 Fujitsu Ltd Simulator for aural response system
JPS5671949A (en) * 1979-11-15 1981-06-15 Nissin Electric Co Ltd Specimen carrier for charge particle injector
US4365148A (en) * 1979-12-19 1982-12-21 Franklin Electric Co., Inc. Data processing system
US4349731A (en) * 1980-01-16 1982-09-14 Hobart Corporation Commodity key with on site encoding feature

Also Published As

Publication number Publication date
US4454413A (en) 1984-06-12
EP0087286A3 (en) 1985-05-22
EP0087286B1 (de) 1988-07-13
EP0087286A2 (de) 1983-08-31
JPH04389B2 (de) 1992-01-07
JPS58194351A (ja) 1983-11-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: ANALOG DEVICES INC., NORWOOD, MASS., US

8339 Ceased/non-payment of the annual fee