DE2861533D1 - Semiconductor device for resistance structures in high-density integrated circuits and method for making it - Google Patents

Semiconductor device for resistance structures in high-density integrated circuits and method for making it

Info

Publication number
DE2861533D1
DE2861533D1 DE7878101028T DE2861533T DE2861533D1 DE 2861533 D1 DE2861533 D1 DE 2861533D1 DE 7878101028 T DE7878101028 T DE 7878101028T DE 2861533 T DE2861533 T DE 2861533T DE 2861533 D1 DE2861533 D1 DE 2861533D1
Authority
DE
Germany
Prior art keywords
making
semiconductor device
integrated circuits
density integrated
resistance structures
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE7878101028T
Other languages
English (en)
Inventor
Narasipur Gundappa Anantha
Augustine Wei-Chun Chang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of DE2861533D1 publication Critical patent/DE2861533D1/de
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/74Making of localized buried regions, e.g. buried collector layers, internal connections substrate contacts
    • H01L21/743Making of internal connections, substrate contacts
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76Making of isolation regions between components
    • H01L21/762Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/76224Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using trench refilling with dielectric materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
    • H01L27/04Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
    • H01L27/08Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind
    • H01L27/0802Resistors only
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/86Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
    • H01L29/8605Resistors with PN junctions
DE7878101028T 1977-10-25 1978-09-29 Semiconductor device for resistance structures in high-density integrated circuits and method for making it Expired DE2861533D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/844,768 US4228450A (en) 1977-10-25 1977-10-25 Buried high sheet resistance structure for high density integrated circuits with reach through contacts

Publications (1)

Publication Number Publication Date
DE2861533D1 true DE2861533D1 (en) 1982-02-25

Family

ID=25293580

Family Applications (1)

Application Number Title Priority Date Filing Date
DE7878101028T Expired DE2861533D1 (en) 1977-10-25 1978-09-29 Semiconductor device for resistance structures in high-density integrated circuits and method for making it

Country Status (6)

Country Link
US (1) US4228450A (de)
EP (1) EP0001574B1 (de)
JP (1) JPS5466087A (de)
CA (1) CA1102011A (de)
DE (1) DE2861533D1 (de)
IT (1) IT1159142B (de)

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JPS55138267A (en) * 1979-04-12 1980-10-28 Matsushita Electric Ind Co Ltd Manufacture of semiconductor integrated circuit containing resistance element
JPS5632762A (en) * 1979-08-27 1981-04-02 Fujitsu Ltd Semiconductor device
US4476478A (en) * 1980-04-24 1984-10-09 Tokyo Shibaura Denki Kabushiki Kaisha Semiconductor read only memory and method of making the same
JPS58103169A (ja) * 1981-12-15 1983-06-20 Matsushita Electric Ind Co Ltd 半導体可変抵抗素子
JPS58127363A (ja) * 1982-01-25 1983-07-29 Hitachi Ltd 半導体集積回路装置
JPS6097659A (ja) * 1983-11-01 1985-05-31 Matsushita Electronics Corp 半導体集積回路
US4737469A (en) * 1984-01-19 1988-04-12 Honeywell Inc. Controlled mode field effect transistors and method therefore
US4763184A (en) * 1985-04-30 1988-08-09 Waferscale Integration, Inc. Input circuit for protecting against damage caused by electrostatic discharge
US4949150A (en) * 1986-04-17 1990-08-14 Exar Corporation Programmable bonding pad with sandwiched silicon oxide and silicon nitride layers
US5066603A (en) * 1989-09-06 1991-11-19 Gte Laboratories Incorporated Method of manufacturing static induction transistors
JP3360970B2 (ja) * 1995-05-22 2003-01-07 株式会社東芝 半導体装置の製造方法
US5883566A (en) * 1997-02-24 1999-03-16 International Business Machines Corporation Noise-isolated buried resistor
US6100153A (en) * 1998-01-20 2000-08-08 International Business Machines Corporation Reliable diffusion resistor and diffusion capacitor
JPH11297847A (ja) * 1998-04-13 1999-10-29 Nec Kyushu Ltd 半導体装置及びその製造方法
DE19917370C1 (de) 1999-04-16 2000-10-05 St Microelectronics Gmbh In einer integrierten halbleiterschaltung gebildeter weitgehend spannungsunabhängiger elektrischer Widerstand
JP3528750B2 (ja) * 2000-03-16 2004-05-24 株式会社デンソー 半導体装置
JP4599660B2 (ja) * 2000-05-24 2010-12-15 ソニー株式会社 半導体抵抗素子を有する半導体装置とその製造方法
US7384854B2 (en) * 2002-03-08 2008-06-10 International Business Machines Corporation Method of forming low capacitance ESD robust diodes
FR2884050B1 (fr) * 2005-04-01 2007-07-20 St Microelectronics Sa Circuit integre comprenant un substrat et une resistance
US7910450B2 (en) * 2006-02-22 2011-03-22 International Business Machines Corporation Method of fabricating a precision buried resistor
US10170464B2 (en) 2015-06-05 2019-01-01 International Business Machines Corporation Compound semiconductor devices having buried resistors formed in buffer layer
US10410966B2 (en) 2017-12-19 2019-09-10 International Business Machines Corporation BEOL embedded high density vertical resistor structure
CN108922925B (zh) * 2018-07-09 2021-06-25 深圳市物芯智能科技有限公司 一种功率器件保护芯片及其制作方法

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GB1086128A (en) * 1964-10-23 1967-10-04 Motorola Inc Fabrication of four-layer switch with controlled breakdown voltage
US3430110A (en) * 1965-12-02 1969-02-25 Rca Corp Monolithic integrated circuits with a plurality of isolation zones
US3443176A (en) * 1966-03-31 1969-05-06 Ibm Low resistivity semiconductor underpass connector and fabrication method therefor
US3786318A (en) * 1966-10-14 1974-01-15 Hitachi Ltd Semiconductor device having channel preventing structure
US3629667A (en) * 1969-03-14 1971-12-21 Ibm Semiconductor resistor with uniforms current distribution at its contact surface
US3601669A (en) * 1969-05-07 1971-08-24 Texas Instruments Inc Integrated heater element array and drive matrix therefor
JPS4840307B1 (de) * 1970-06-12 1973-11-29
US3631309A (en) * 1970-07-23 1971-12-28 Semiconductor Elect Memories Integrated circuit bipolar memory cell
US3648125A (en) * 1971-02-02 1972-03-07 Fairchild Camera Instr Co Method of fabricating integrated circuits with oxidized isolation and the resulting structure
JPS4869477A (de) * 1971-12-21 1973-09-20
US3787710A (en) * 1972-01-25 1974-01-22 J Cunningham Integrated circuit structure having electrically isolated circuit components
JPS5120267B2 (de) * 1972-05-13 1976-06-23
CA997481A (en) * 1972-12-29 1976-09-21 International Business Machines Corporation Dc testing of integrated circuits and a novel integrated circuit structure to facilitate such testing
JPS5321838B2 (de) * 1973-02-28 1978-07-05
JPS49131788A (de) * 1973-04-23 1974-12-17
JPS49131789A (de) * 1973-04-23 1974-12-17
US3966577A (en) * 1973-08-27 1976-06-29 Trw Inc. Dielectrically isolated semiconductor devices
US3953875A (en) * 1974-01-02 1976-04-27 Motorola, Inc. Capacitor structure and circuit facilitating increased frequency stability of integrated circuits
US3990092A (en) * 1974-01-11 1976-11-02 Hitachi, Ltd. Resistance element for semiconductor integrated circuit
US3990102A (en) * 1974-06-28 1976-11-02 Hitachi, Ltd. Semiconductor integrated circuits and method of manufacturing the same
JPS514978A (ja) * 1974-07-02 1976-01-16 Mitsubishi Electric Corp Handotaishusekikairono seisakuho
JPS5167080A (en) * 1974-12-07 1976-06-10 Fujitsu Ltd Handotaisochino seizohoho
JPS5275989A (en) * 1975-12-22 1977-06-25 Hitachi Ltd Production of semiconductor device
DE2605641C3 (de) * 1976-02-12 1979-12-20 Siemens Ag, 1000 Berlin Und 8000 Muenchen Hochfrequenztransistor und Verfahren zu seiner Herstellung

Also Published As

Publication number Publication date
US4228450A (en) 1980-10-14
CA1102011A (en) 1981-05-26
JPH0140498B2 (de) 1989-08-29
IT7828238A0 (it) 1978-09-29
IT1159142B (it) 1987-02-25
EP0001574A1 (de) 1979-05-02
EP0001574B1 (de) 1982-01-13
JPS5466087A (en) 1979-05-28

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Legal Events

Date Code Title Description
8339 Ceased/non-payment of the annual fee