DE19983376T1 - Vorrichtung, Verfahren und System einer auf Flüssigkeit beruhenden Temperaturwechselbeanspruchungsregelung elektronischer Bauelemente mit weitem Bereich und schnellem Ansprechen - Google Patents

Vorrichtung, Verfahren und System einer auf Flüssigkeit beruhenden Temperaturwechselbeanspruchungsregelung elektronischer Bauelemente mit weitem Bereich und schnellem Ansprechen

Info

Publication number
DE19983376T1
DE19983376T1 DE19983376T DE19983376T DE19983376T1 DE 19983376 T1 DE19983376 T1 DE 19983376T1 DE 19983376 T DE19983376 T DE 19983376T DE 19983376 T DE19983376 T DE 19983376T DE 19983376 T1 DE19983376 T1 DE 19983376T1
Authority
DE
Germany
Prior art keywords
liquid
electronic components
wide range
temperature change
quick response
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE19983376T
Other languages
English (en)
Inventor
Mark F Malinoski
Thomas P Jones
Brian Annis
Jonathan E Turner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Delta Design Inc
Original Assignee
Schlumberger Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Schlumberger Technologies Inc filed Critical Schlumberger Technologies Inc
Publication of DE19983376T1 publication Critical patent/DE19983376T1/de
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D23/00—Control of temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2862—Chambers or ovens; Tanks
DE19983376T 1998-07-14 1999-07-14 Vorrichtung, Verfahren und System einer auf Flüssigkeit beruhenden Temperaturwechselbeanspruchungsregelung elektronischer Bauelemente mit weitem Bereich und schnellem Ansprechen Ceased DE19983376T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US9271598P 1998-07-14 1998-07-14
PCT/US1999/015848 WO2000004396A1 (en) 1998-07-14 1999-07-14 Apparatus, method and system of liquid-based, wide range, fast response temperature cycling control of electronic devices

Publications (1)

Publication Number Publication Date
DE19983376T1 true DE19983376T1 (de) 2001-06-28

Family

ID=22234720

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19983376T Ceased DE19983376T1 (de) 1998-07-14 1999-07-14 Vorrichtung, Verfahren und System einer auf Flüssigkeit beruhenden Temperaturwechselbeanspruchungsregelung elektronischer Bauelemente mit weitem Bereich und schnellem Ansprechen

Country Status (6)

Country Link
US (4) US6389225B1 (de)
JP (1) JP5000803B2 (de)
KR (1) KR100681981B1 (de)
AU (1) AU4991899A (de)
DE (1) DE19983376T1 (de)
WO (1) WO2000004396A1 (de)

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US6498899B2 (en) 2002-12-24
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US20030047305A1 (en) 2003-03-13
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US20020033391A1 (en) 2002-03-21
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