DE19840226B4 - Method of applying a circuit chip to a carrier - Google Patents
Method of applying a circuit chip to a carrier Download PDFInfo
- Publication number
- DE19840226B4 DE19840226B4 DE19840226A DE19840226A DE19840226B4 DE 19840226 B4 DE19840226 B4 DE 19840226B4 DE 19840226 A DE19840226 A DE 19840226A DE 19840226 A DE19840226 A DE 19840226A DE 19840226 B4 DE19840226 B4 DE 19840226B4
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- Prior art keywords
- circuit
- substrate
- auxiliary substrate
- circuit chip
- auxiliary
- Prior art date
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/93—Batch processes
- H01L24/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L24/96—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being encapsulated in a common layer, e.g. neo-wafer or pseudo-wafer, said common layer being separable into individual assemblies after connecting
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- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
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- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
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- H01L21/6836—Wafer tapes, e.g. grinding or dicing support tapes
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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- H01L24/75—Apparatus for connecting with bump connectors or layer connectors
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- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
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Abstract
Verfahren
zum Aufbringen eines auf ein Hilfssubstrat (30) aufgebrachten Schaltungschips
(6) auf ein Schaltungssubstrat (8; 22), mit folgenden Schritten:
Bereitstellen
des auf das Hilfssubstrat (30) aufgebrachten Schaltungschips (6);
Positionieren
eines flexiblen Schaltungssubstrats (8; 22), auf oder in das der
Schaltungschip (6) aufgebracht werden soll, an der von dem Hilfssubstrat
(30) abgewandten Oberfläche
des Schaltungschips (6), durch Heranführen des flexiblen Schaltungssubstrats
(8; 22) an die von dem Hilfssubstrat (30) abgewandte Oberfläche des
Schaltungschips (6), indem dasselbe lokal deformiert wird;
Ablösen des
Schaltungschips (6) von dem Hilfssubstrat (30) und Aufbringen desselben
auf das Schaltungssubstrat (8; 22); und
Entfernen des Schaltungssubstrats
(8; 22) mit dem Schaltungschip (6) von dem Hilfssubstrat (30), durch
eine Positionsänderung
des Schaltungssubstrats (8; 22) und/oder des Hilfssubstrats (30),
dadurch
gekennzeichnet, dass
das Hilfssubstrat (30) eine dehnbare flexible
Folie ist.Method for applying a circuit chip (6) applied to an auxiliary substrate (30) to a circuit substrate (8; 22), comprising the following steps:
Providing the circuit chip (6) applied to the auxiliary substrate (30);
Positioning a flexible circuit substrate (8; 22) on or in which the circuit chip (6) is to be applied to the surface of the circuit chip (6) facing away from the auxiliary substrate (30) by bringing the flexible circuit substrate (8; the surface of the circuit chip (6) facing away from the auxiliary substrate (30) by being locally deformed;
Detaching the circuit chip (6) from the auxiliary substrate (30) and applying it to the circuit substrate (8; 22); and
Removing the circuit substrate (8; 22) from the auxiliary substrate (30) with the circuit chip (6) by changing the position of the circuit substrate (8; 22) and / or the auxiliary substrate (30),
characterized in that
the auxiliary substrate (30) is a stretchable flexible film.
Description
Die vorliegende Erfindung bezieht sich auf ein Verfahren zum Positionieren eines Schaltungschips auf einem Schaltungssubstrat, und insbesondere auf einem Verfahren zum Positionieren eines Schaltungschips, der sich auf einem Hilfssubstrat befindet, auf einem Schaltungssubstrat.The The present invention relates to a method for positioning a circuit chip on a circuit substrate, and in particular on a method for positioning a circuit chip, the is on an auxiliary substrate, on a circuit substrate.
Durch die Entwicklung von kontaktbehafteten und kontaktlosen Chipkarten hat sich ein völlig neuer und schnellwachsender Markt für elektronische Mikro-Systeme ergeben. Demnach werden integrierte Schaltungen nicht mehr lediglich in Großgeräte oder auch Handsysteme eingebaut, sondern sozusagen "nackt" in Chipkarten. Eine konsequente Weiterentwicklung in diese Richtung führt zur sogenannten "Wegwerfelektronik", deren erster Vertreter die Telephonkarte war, und die nunmehr auch elektronische Etiketten und dergleichen umfaßt.By the development of contact and contactless smart cards has a completely new and fast growing market for result in electronic micro-systems. Accordingly, integrated Circuits no longer built into large devices or handheld systems but, so to speak, "naked" in smart cards. A consistent development in this direction leads to so-called "disposable electronics", whose first representative is the Telephone card was, and now also electronic labels and the like.
Bei derartigen Anwendungsgebieten sind sehr kleine und sehr dünne Schaltungschips, die die integrierten Schaltungen beinhalten, erforderlich. Ferner handelt es sich beispielsweise bei den elektronischen Etiketten um Massenartikel, so daß Bestrebungen dahingehend durchgeführt werden müssen, eine preisgünstige Massenfertigung zu ermöglichen. Eine solche Massenfertigung erfordert eine parallele Fertigung, die solange wie möglich im Wafer-Verbund durchgeführt wird. So werden die auf den integrierten Schaltungschips definierten integrierten Schaltungen vollständig im Wafer-Verbund fertiggestellt. Letztendlich müssen die Wafer jedoch zu Einzelchips vereinzelt werden, um die Chips nachfolgend auf das Bestimmungssubstrat aufzubringen. Diese Handhabung der Einzelchips ist jedoch bei der für elektronische Etiketten und ähnliche Wegwerfelektronik vorliegenden Größe schwierig. Somit können übliche Handhabungsverfahren, beispielsweise mittels eines Unterdrucks und dergleichen, nicht ohne weiteres angewendet werden.at such applications are very small and very thin circuit chips, which include the integrated circuits required. Further For example, the electronic labels mass-produced so that aspirations carried out to that effect Need to become, a cheap To enable mass production. Such mass production requires parallel production, as long as possible performed in the wafer composite becomes. So are those defined on the integrated circuit chips integrated circuits completely completed in wafer composite. Ultimately, however, the wafers have to be single chips are separated to the chips following the target substrate applied. However, this handling of the individual chips is at the for electronic Labels and similar Disposable electronics present size difficult. Thus, conventional handling methods, for example, by means of a negative pressure and the like, not without be applied further.
In
Das Hilfssubstrat kann beispielsweise ein Siliziumwafer, ein Pyrexglaswafer oder ein Quarzwafer sein. Alternativ kann das Hilfssubstrat durch ein keramisches oder metallisches Substrat gebildet sein. Es ist ferner möglich, als Hilfssubstrat ein flexibles Substrat zu verwenden, beispielsweise eine flexible Polymerfolie.The Auxiliary substrate, for example, a silicon wafer, a Pyrexglaswafer or a quartz wafer. Alternatively, the auxiliary substrate by a ceramic or metallic substrate may be formed. It is furthermore possible, as auxiliary substrate to use a flexible substrate, for example a flexible polymer film.
Ein
erstes bekanntes Verfahren ist nun vorteilhaft anwendbar, um diese
Schaltungschips aus dem Pseudo-Waferverbund auf ein Schaltungssubstrat
aufzubringen. Ein solches Schaltungssubstrat ist bei
Wie
in
Bezugnehmend
auf
Die Aufgabe der vorliegenden Erfindung besteht somit darin, neuartige Verfahren zum Aufbringen eines auf ein Hilfssub strat aufgebrachten Schaltungschips auf einen Träger zu schaffen, bei dem Probleme hinsichtlich der Handhabung kleiner und dünner Schaltungschips nicht auftreten.The Object of the present invention is therefore novel Method of applying a strat applied to a Hilfssub Circuit chips on a carrier to create problems in handling smaller and thinner Circuit chips do not occur.
Diese Aufgabe wird durch ein Verfahren gemäß Patentanspruch 1 oder 2 gelöst. Die Merkmale des Oberbegriffs des Anspruchs 1 sind aus JP 58-25242 A bekannt, die des Anspruchs 2 aus JP 60-275662 A.These The object is achieved by a method according to claim 1 or 2. The Features of the preamble of claim 1 are disclosed in JP 58-25242 A known, the claim 2 of JP 60-275662 A.
Die vorliegende Erfindung schafft ein Verfahren zum Aufbringen eines auf ein Hilfssubstrat aufgebrachten Schaltungschips auf ein Schaltungssubstrat, bei dem zunächst ein auf ein Hilfssubstrat aufgebrachter Schaltungschip bereitgestellt wird. Nachfolgend wird ein Schaltungssubstrat auf oder in das der Schaltungschip aufgebracht werden soll, an der von dem Hilfssubstrat abgewandten Oberfläche des Schaltungschips positioniert, indem eine Positionsänderung des Schaltungssubstrats und/oder des Hilfssubstrats durchgeführt wird.The The present invention provides a method for applying a on an auxiliary substrate applied circuit chip on a circuit substrate, at first a circuit chip applied to an auxiliary substrate is provided becomes. Subsequently, a circuit substrate is placed on or in the circuit chip is to be applied, facing away from the auxiliary substrate surface the circuit chip positioned by a position change of the circuit substrate and / or the auxiliary substrate.
Das Schaltungssubstrat auf das der Schaltungschip aufgebracht wird, ist ein flexibles Substrat, das lokal verwölbt ist, um eine lokale topographische Erhöhung zu bewirken; auf der ein einzelner Schaltungschip plaziert werden kann. überdies ist es möglich, eine Anzahl von Schaltungssubstraten, auf denen Schaltungschips positioniert werden sollen, auf einer flexiblen Trägeranordnung, beispielsweise einer Folie, zu positionieren, wobei dann die flexible Trägeranordnung lokal verwölbt wird, um das Schaltungssubstrat an der von dem Hilfssubstrat abgewandten Oberfläche des Schaltungschips zu positionieren.The Circuit substrate is applied to the circuit chip, is a flexible substrate that is locally domed to provide a local topographical enhancement cause; on which a single circuit chip can be placed. moreover Is it possible, a number of circuit substrates on which circuit chips be positioned on a flexible support assembly, for example, a film to position, in which case the flexible support assembly locally arched to the circuit substrate on the side remote from the auxiliary substrate surface of the circuit chip.
Im Anschluß wird der Schaltungschip von dem Hilfssubstrat abgelöst und auf das Schaltungssubstrat aufgebracht. Abschließend wird das Schaltungssubstrat mit dem aufgebrachten Schaltungschip von dem Hilfssubstrat entfernt, indem wiederum eine Positionsänderung des Schaltungssubstrats und/oder des Hilfssubstrats durchgeführt wird.in the Connection becomes the circuit chip detached from the auxiliary substrate and onto the circuit substrate applied. Finally becomes the circuit substrate with the applied circuit chip removed from the auxiliary substrate, again by a change in position of the circuit substrate and / or the auxiliary substrate.
Erfindungsgemäß ist das Hilfsubstrat, auf welchem die Schaltungschips bereitgestellt werden, eine flexible Folie, die dehnbar ist.This is according to the invention Auxiliary substrate on which the circuit chips are provided, a flexible film that is stretchable.
Somit ist gemäß der vorliegenden Erfindung keine Handhabung des Schaltungschips erforderlich, wobei lediglich Positionsänderungen des Schaltungssubstrats bzw. einer Haftfolie, auf das bzw. die der Schaltungschip aufgebracht werden soll, durchgeführt werden. Somit wird gemäß der vorliegenden Erfindung eine direkte Handhabung der Schaltungschips vermieden, was insbesondere bei sehr kleinen und dünnen Schaltungschips vorteilhaft ist.Thus, according to the present invention, no handling of the circuit chip is required, wherein only changes in position of the circuit substrate or an adhesive film to which the circuit chip is to be applied are performed. Thus, according to the present invention, a direct handling of the circuit avoided chips, which is particularly advantageous for very small and thin circuit chips.
Das Ablösen des Schaltungschips von dem Hilfssubstrat, wenn das Schaltungssubstrat an der von dem Hilfssubstrat abgewandten Oberfläche des Schaltungschips positioniert ist, erfolgt bei bevorzugten Ausführungsbeispielen der vorliegenden Erfindung durch das Zuführen von Energie zu der Verbindungsstelle zwischen Hilfssubstrat und Schaltungschip. Diese zugeführte Energie kann gleichzeitig auch eine Befestigung des Schaltungschips an oder in dem Schaltungssubstrat bewirken, beispielsweise eine Flip-Chip-Verbindung. Somit kann durch ein einmaliges Zuführen von Energie der Schaltungschip sowohl von dem Hilfssubstrat gelöst als auch auf das Schaltungssubstrat aufgebracht werden.The supersede of the circuit chip from the auxiliary substrate when the circuit substrate positioned on the side facing away from the auxiliary substrate surface of the circuit chip is done in preferred embodiments of the present invention Invention by feeding of energy to the junction between auxiliary substrate and Circuit chip. This fed Energy can also be a fixing of the circuit chip on or in the circuit substrate, such as a Flip-chip bonding. Thus, by a single supply of Energy of the circuit chip solved both from the auxiliary substrate and be applied to the circuit substrate.
Das erfindungsgemäße Verfahren eignet sich insbesondere zum Aufbringen von solchen Schaltungschips auf ein Schaltungssubstrat, die sich in einem Pseudo-Waferverbund auf einem Hilfssubstrat befinden. Pseudo-Waferverbund heißt, daß sich die Schaltungschips noch in der geometrischen Anordnung des ursprünglichen Waferverbunds befinden, jedoch bereits durch Ätzgräben, Sägestraßen, Trennfugen und dergleichen getrennt und somit vereinzelt sind. Die Vereinzelung in die Einzelchips erfolgte dabei derart, daß die Chips im Pseudo-Waferverbund bleiben, in dem dieselben die gleiche Anordnung und Beabstandung wie im ursprünglichen Waferverbund besitzen. Aus diesem Pseudo-Waferverbund können die Schaltungschips gemäß dem erfindungsgemäßen Verfahren gelöst und auf ein Schaltungssubstrat aufgebracht werden, so daß eine getrennte Handhabung der Einzelchips nicht notwendig ist.The inventive method is particularly suitable for applying such circuit chips on a circuit substrate, which is in a pseudo-wafer composite on an auxiliary substrate. Pseudo Waferverbund means that the Circuit chips still in the geometric arrangement of the original However, already by etch trenches, Sägestraßen, joints and the like separated and thus isolated. Singling into the individual chips took place in such a way that the Chips remain in the pseudo-wafer composite in which they are the same Have arrangement and spacing as in the original wafer composite. For this pseudo-wafer composite can the circuit chips according to the inventive method solved and applied to a circuit substrate so that a separate Handling the individual chips is not necessary.
Vorzugsweise heben sich die Bondpads oder die Klebefläche auf dem Schaltungssubstrat, auf das der Schaltungschip aufgebracht werden soll, von der restlichen Oberfläche topographisch ab. Somit kann beispielsweise durch einen gezielten Laserbeschuß sowohl die Verbindung Schaltungschip-Hilfssubstrat gelöst als auch die Verbindung Schaltungschip-Trägersubstrat hergestellt werden.Preferably the bonding pads or the adhesive surface lift on the circuit substrate, on which the circuit chip is to be applied, from the rest surface topographically. Thus, for example, by a targeted Laser shot both the connection circuit chip auxiliary substrate solved as well as the connection Circuit chip carrier substrate getting produced.
Weiterbildungen der vorliegenden Erfindung sind in den abhängigen Ansprüchen dargelegt.further developments The present invention is set forth in the dependent claims.
Bevorzugte Ausführungsbeispiele der vorliegenden Erfindung werden nachfolgend bezugnehmend auf die beiliegenden Zeichnungen näher erläutert. Es zeigen:preferred embodiments The present invention will be described below with reference to FIGS enclosed drawings closer explained. Show it:
Bezugnehmend
auf
Die
flexible Haftfolie kann nun, eventuell unter Wärmezufuhr, gedehnt werden,
wodurch sich die Abstände
zwischen den einzelnen Schaltungschips vergrößern, siehe Abstand B in
Um
die Schaltungschips in der in
Die
Folie
Die vorliegende Erfindung vereinfacht somit das Ablösen von Schaltungschips von einer dehnbaren flexiblen Haftfolie als Hilfsträger und das Aufbringen dieser Schaltungschips auf ein Schaltungssubstrat, ohne die Schaltungschips einzeln handhaben zu müssen. Somit eignet sich das erfindungsgemäße Verfahren hervorragend für schnelle und kosteneffiziente Massenfertigungsverfahren.The The present invention thus simplifies the detachment of circuit chips from a stretchable flexible adhesive film as a subcarrier and the application of this Circuit chips on a circuit substrate, without the circuit chips to handle individually. Thus, the inventive method is ideal for fast and cost-efficient mass production processes.
Das Schaltungssubstrat, auf das die jeweiligen Schaltungschips aufgebracht werden, kann beispielsweise ein isolierendes Substrat sein, das eine Ausnehmung aufweist, in die der Schaltungschip eingebracht werden soll. In diesem Fall können die Wände der Ausnehmung beispielsweise abgeschrägt sein, um mögliche Justierungsungenauigkeiten auszugleichen, so daß der Schaltungschip durch die Abschrägung in die Ausnehmung geführt wird.The Circuit substrate to which the respective circuit chips applied can be, for example, an insulating substrate, the has a recess into which the circuit chip is introduced shall be. In this case, you can the walls the recess be beveled, for example, possible adjustment inaccuracies compensate, so that the Circuit chip through the bevel guided into the recess becomes.
Neben der oben beschriebenen bandförmigen Anordnung der flexiblen Träger könnten die Träger auch matrizenförmig, d.h. zweidimensional, in einem lösbaren Verbund angeordnet sein. Wiederum wird jeweils der Träger, d.h. das flexible Schaltungssubstrat, auf das ein Schaltungschip aufgebracht werden soll, über der Hubvorrichtung positioniert, woraufhin durch dieselbe eine vertikale Verwölbung des Trägers durchgeführt wird.Next the above-described band-shaped Arrangement of flexible beams could the carriers also matrix-shaped, i.e. two-dimensional, in a detachable way Be arranged composite. Again, the carrier, i. the flexible circuit substrate to which a circuit chip is applied should, over positioned the lifting device, whereupon by the same a vertical Warp of the carrier carried out becomes.
Es
ist für
Fachleute offensichtlich, daß beliebige
Bewegungen der Hubvorrichtung
Ist
der oder die Schaltungschips mittels eines Haftmittels an dem Hilfssubstrat
angebracht, kann das Ablösen
der Schaltungschips von dem Hilfssubstrat kann auf eine Vielzahl
von Arten erfolgen. Bevorzugt ist jedoch die Ablösung durch das Richten eines
Laserstrahls auf die Verbindungsstelle zwischen Schaltungschip und
Hilfssubstrat. Alternativ kann eine Wärmebehandlung, eine Ultraschallstrahlung oder
eine Ultraviolett-Licht-Bestrahlung durchgeführt werden, um den Schaltungschip
von dem Hilfssubstrat abzulösen. Überdies
könnte
ein solches Ablösen chemisch
bewirkt werden, indem beispielsweise über eine Kanüle lokal
ein Lösungsmittel
zugeführt
wird, oder indem ein lokales Plasma "erzeugt wird. Bei dem erfindungsgemäßen Verfahren
können
jeweils einzelne Schaltungschips auf Schaltungssubstrate aufgebracht
werden, oder jeweils eine Reihe von Schaltungschips, d.h. bei der
Anordnung von
Obwohl
die Vorrichtung
Alternativ können die Schaltungschips mittels elektrostatischer oder magnetischer Kupplungen an dem Hilfssubstrat angebracht sein. Ferner ist es möglich, die Schaltungschips mittels Unterdruck an dem Hilfssubstrat zu halten. In diesen Fällen ist es jeweils nur notwendig, den jeweiligen Haltemechanismus abzustellen, um die Schaltungschips von dem Hilfssubstrat abzulösen.alternative can the circuit chips by means of electrostatic or magnetic Couplings may be attached to the auxiliary substrate. Furthermore, it is possible to To hold circuit chips by means of negative pressure to the auxiliary substrate. In these cases it is only necessary to turn off the respective holding mechanism, to detach the circuit chips from the auxiliary substrate.
- 22
- Hilfssubstratauxiliary substrate
- 44
- Haftschichtadhesive layer
- 6, 6'6 6 '
- Schaltungschipscircuit chips
- 88th
- Schaltungssubstratcircuit substrate
- 1010
- Klebeflächeadhesive surface
- 1212
- Vorrichtung, beispielsweise zum Erzeugen eines LaserbeschussesContraption, for example, to generate a laser shot
- 2020
-
Trägervorrichtung
für Schaltungssubstrate
22 Carrier device for circuit substrates22 - 2222
- Schaltungssubstratecircuit substrates
- 2424
-
Pfeil
einer Richtung, in welche Trägervorrichtung
20 bewegbarArrow of a direction into which carrier device20 movable - 2626
- Hubvorrichtunglifting device
- 2828
- Pfeil einer Richtung, in welche das Schaltungssubstrat bewegbararrow a direction in which the circuit substrate is movable
- 3030
- Hilfssubstrat als dehnbare flexible Folie bzw. Haftfolieauxiliary substrate as a stretchable flexible film or adhesive film
- 3232
- Teil der Haftfolie, der bei Dehnung seine Dicke behältpart the adhesive film, which retains its thickness when stretched
- 3434
- Abschnitt der Haftfolie, der bei Dehnung eine Dünnung erfahrensection the adhesive film, which undergo thinning when stretched
Claims (9)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19840226A DE19840226B4 (en) | 1998-09-03 | 1998-09-03 | Method of applying a circuit chip to a carrier |
PCT/EP1999/006470 WO2000014789A1 (en) | 1998-09-03 | 1999-09-02 | Method for applying a circuit chip onto a support |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19840226A DE19840226B4 (en) | 1998-09-03 | 1998-09-03 | Method of applying a circuit chip to a carrier |
Publications (2)
Publication Number | Publication Date |
---|---|
DE19840226A1 DE19840226A1 (en) | 2000-03-16 |
DE19840226B4 true DE19840226B4 (en) | 2006-02-23 |
Family
ID=7879717
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19840226A Expired - Fee Related DE19840226B4 (en) | 1998-09-03 | 1998-09-03 | Method of applying a circuit chip to a carrier |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE19840226B4 (en) |
WO (1) | WO2000014789A1 (en) |
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US7688206B2 (en) | 2004-11-22 | 2010-03-30 | Alien Technology Corporation | Radio frequency identification (RFID) tag for an item having a conductive layer included or attached |
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DE102020005484A1 (en) | 2020-09-07 | 2022-03-10 | Mühlbauer Gmbh & Co. Kg | Devices and methods for operating at least two tools |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1805174A1 (en) * | 1968-10-25 | 1970-05-14 | Telefunken Patent | Method for applying individual bodies to a basic body |
US3931922A (en) * | 1972-01-29 | 1976-01-13 | Ferranti, Limited | Apparatus for mounting semiconductor devices |
DE3808667A1 (en) * | 1988-03-15 | 1989-10-05 | Siemens Ag | ASSEMBLY METHOD FOR THE PRODUCTION OF LED ROWS |
US5411921A (en) * | 1992-02-10 | 1995-05-02 | Rohm Co., Ltd. | Semiconductor chip die bonding using a double-sided adhesive tape |
DE19738922A1 (en) * | 1997-09-05 | 1998-11-19 | Siemens Ag | Integrated circuit leadframe assembly device e.g. for chip mounting |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5850021B2 (en) * | 1982-07-16 | 1983-11-08 | 富士通株式会社 | Manufacturing method for semiconductor devices |
US4845335A (en) * | 1988-01-28 | 1989-07-04 | Microelectronics And Computer Technology Corporation | Laser Bonding apparatus and method |
JPH06275662A (en) * | 1993-03-24 | 1994-09-30 | Hitachi Ltd | Bonding method for semiconductor pellet and its executing device |
US5528222A (en) * | 1994-09-09 | 1996-06-18 | International Business Machines Corporation | Radio frequency circuit and memory in thin flexible package |
JP3197788B2 (en) * | 1995-05-18 | 2001-08-13 | 株式会社日立製作所 | Method for manufacturing semiconductor device |
-
1998
- 1998-09-03 DE DE19840226A patent/DE19840226B4/en not_active Expired - Fee Related
-
1999
- 1999-09-02 WO PCT/EP1999/006470 patent/WO2000014789A1/en active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1805174A1 (en) * | 1968-10-25 | 1970-05-14 | Telefunken Patent | Method for applying individual bodies to a basic body |
US3931922A (en) * | 1972-01-29 | 1976-01-13 | Ferranti, Limited | Apparatus for mounting semiconductor devices |
DE3808667A1 (en) * | 1988-03-15 | 1989-10-05 | Siemens Ag | ASSEMBLY METHOD FOR THE PRODUCTION OF LED ROWS |
US5411921A (en) * | 1992-02-10 | 1995-05-02 | Rohm Co., Ltd. | Semiconductor chip die bonding using a double-sided adhesive tape |
DE19738922A1 (en) * | 1997-09-05 | 1998-11-19 | Siemens Ag | Integrated circuit leadframe assembly device e.g. for chip mounting |
Non-Patent Citations (18)
Title |
---|
JP 06275662 A (jap. OS und engl. abstract und Maschinenübersetzung der japan. OS) * |
JP 06-275662 A (jap. OS und engl. abstract und Maschinenübersetzung der japan. OS) |
JP 58025242 A (jap. OS und engl. Abstract) * |
JP 58-25242 A (jap. OS und engl. Abstract) |
Patents Abstracts of Japan & JP 03046242 A, E 1066, 1991, Vol. 15/No. 185 * |
Patents Abstracts of Japan & JP 54019363 A, E 102, 1979, Vol. 3/No. 40 * |
Patents Abstracts of Japan & JP 55107239 A, E 32, 1980, Vol. 4/No. 157 * |
Patents Abstracts of Japan & JP 55151342 A, E 45, 1981, Vol. 5/No. 23 * |
Patents Abstracts of Japan & JP 60063939 A, E 335, 1985, Vol. 9/No. 197 * |
Patents Abstracts of Japan & JP 60063940 A, E 335, 1985, Vol. 9/No. 197 * |
Patents Abstracts of Japan & JP 61116846 A, E 445,1986, Vol. 10/No. 302 * |
Patents Abstracts of Japan, JP 3-46242 A, E 1066, 1991, Vol. 15/No. 185 |
Patents Abstracts of Japan, JP 54-19363, E 102, 1979, Vol. 3/No. 40 |
Patents Abstracts of Japan, JP 55-107239 A, E 32, 1980, Vol. 4/No. 157 |
Patents Abstracts of Japan, JP 55-151342 A, E 45, 1981, Vol. 5/No. 23 |
Patents Abstracts of Japan, JP 60-63939 A, E 335, 1985, Vol. 9/No. 197 |
Patents Abstracts of Japan, JP 60-63940 A, E 335, 1985, Vol. 9/No. 197 |
Patents Abstracts of Japan, JP 61-116846 A, E 445, 1986, Vol. 10/No. 302 |
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US8912907B2 (en) | 2003-03-24 | 2014-12-16 | Alien Technology, Llc | RFID tags and processes for producing RFID tags |
US7868766B2 (en) | 2003-03-24 | 2011-01-11 | Alien Technology Corporation | RFID tags and processes for producing RFID tags |
US9418328B2 (en) | 2003-03-24 | 2016-08-16 | Ruizhang Technology Limited Company | RFID tags and processes for producing RFID tags |
US8350703B2 (en) | 2003-03-24 | 2013-01-08 | Alien Technology Corporation | RFID tags and processes for producing RFID tags |
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US8471709B2 (en) | 2004-11-22 | 2013-06-25 | Alien Technology Corporation | Radio frequency identification (RFID) tag for an item having a conductive layer included or attached |
US9070063B2 (en) | 2004-11-22 | 2015-06-30 | Ruizhang Technology Limited Company | Radio frequency identification (RFID) tag for an item having a conductive layer included or attached |
US7688206B2 (en) | 2004-11-22 | 2010-03-30 | Alien Technology Corporation | Radio frequency identification (RFID) tag for an item having a conductive layer included or attached |
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Also Published As
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---|---|
WO2000014789A1 (en) | 2000-03-16 |
DE19840226A1 (en) | 2000-03-16 |
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