DE102014208100A1 - sensor arrangement - Google Patents
sensor arrangement Download PDFInfo
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- DE102014208100A1 DE102014208100A1 DE102014208100.9A DE102014208100A DE102014208100A1 DE 102014208100 A1 DE102014208100 A1 DE 102014208100A1 DE 102014208100 A DE102014208100 A DE 102014208100A DE 102014208100 A1 DE102014208100 A1 DE 102014208100A1
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- sensor
- circuit board
- printed circuit
- air pressure
- breakthrough
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L19/00—Details of, or accessories for, apparatus for measuring steady or quasi-steady pressure of a fluent medium insofar as such details or accessories are not special to particular types of pressure gauges
- G01L19/0061—Electrical connection means
- G01L19/0069—Electrical connection means from the sensor to its support
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B7/00—Microstructural systems; Auxiliary parts of microstructural devices or systems
- B81B7/0032—Packages or encapsulation
- B81B7/0061—Packages or encapsulation suitable for fluid transfer from the MEMS out of the package or vice versa, e.g. transfer of liquid, gas, sound
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L19/00—Details of, or accessories for, apparatus for measuring steady or quasi-steady pressure of a fluent medium insofar as such details or accessories are not special to particular types of pressure gauges
- G01L19/0092—Pressure sensor associated with other sensors, e.g. for measuring acceleration or temperature
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/02—Sensors
- B81B2201/0264—Pressure sensors
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/02—Sensors
- B81B2201/0292—Sensors not provided for in B81B2201/0207 - B81B2201/0285
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2207/00—Microstructural systems or auxiliary parts thereof
- B81B2207/01—Microstructural systems or auxiliary parts thereof comprising a micromechanical device connected to control or processing electronics, i.e. Smart-MEMS
- B81B2207/012—Microstructural systems or auxiliary parts thereof comprising a micromechanical device connected to control or processing electronics, i.e. Smart-MEMS the micromechanical device and the control or processing electronics being separate parts in the same package
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2203/00—Forming microstructural systems
- B81C2203/07—Integrating an electronic processing unit with a micromechanical structure
- B81C2203/0785—Transfer and j oin technology, i.e. forming the electronic processing unit and the micromechanical structure on separate substrates and joining the substrates
- B81C2203/0792—Forming interconnections between the electronic processing unit and the micromechanical structure
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1515—Shape
- H01L2924/15151—Shape the die mounting substrate comprising an aperture, e.g. for underfilling, outgassing, window type wire connections
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
Abstract
Die Erfindung betrifft eine Sensoranordnung mit einem Sensor und einer Leiterplatte. Der Sensor, insbesondere elektrische Anschlüsse des Sensors, ist mit der Leiterplatte lötverbunden. Der Sensor ist bevorzugt ausgebildet, einen insbesondere statischen Luftdruck und/oder eine Luftfeuchtigkeit zu erfassen. Erfindungsgemäß weist der Sensor eine Oberfläche mit einer Sensoröffnung zum Erfassen eines Luftdruckes auf. Der Sensor weist auch wenigstens einen elektrischen Anschluss auf, welcher an der Oberfläche des Sensors ausgebildet ist, die der Leiterplatte zugewandt ist, wobei der elektrisch Anschluss mittels eines Lotmittels mit der Leiterplatte verbunden ist. Die Leiterplatte weist einen Durchbruch auch, welcher derart angeordnet ist, dass der Sensor über die Sensoröffnung den Luftdruck durch den Durchbruch hindurch erfassen kann.The invention relates to a sensor arrangement with a sensor and a printed circuit board. The sensor, in particular electrical connections of the sensor, is soldered to the circuit board. The sensor is preferably designed to detect a particular static air pressure and / or humidity. According to the invention, the sensor has a surface with a sensor opening for detecting an air pressure. The sensor also has at least one electrical connection which is formed on the surface of the sensor which faces the printed circuit board, the electrical connection being connected to the printed circuit board by means of a solder. The printed circuit board also has an opening which is arranged such that the sensor can detect the air pressure through the opening via the sensor opening.
Description
Stand der TechnikState of the art
Die Erfindung betrifft eine Sensoranordnung mit einem Sensor und einer Leiterplatte. Der Sensor, insbesondere elektrische Anschlüsse des Sensors, ist mit der Leiterplatte lötverbunden. Der Sensor ist bevorzugt ausgebildet, einen insbesondere statischen Luftdruck und/oder eine Luftfeuchtigkeit zu erfassen.The invention relates to a sensor arrangement with a sensor and a printed circuit board. The sensor, in particular electrical connections of the sensor, is soldered to the circuit board. The sensor is preferably designed to detect a particular static air pressure and / or humidity.
Sensoren zum Erfassen eines Luftdrucks oder einer Luftfeuchtigkeit sind mit einem Sensorgehäuse bekannt, welches den Sensor und einen Schaltkreis zur Signalverarbeitung des Sensorsignals umgibt. Sowohl der Sensor als auch der Schaltkreis zur Signalverarbeitung können auf einer gemeinsamen Leiterplatte angeordnet und mit der gemeinsamen Leiterplatte verbunden sein. Sensors for detecting an air pressure or a humidity are known with a sensor housing, which surrounds the sensor and a circuit for signal processing of the sensor signal. Both the sensor and the signal processing circuit may be disposed on a common circuit board and connected to the common circuit board.
Offenbarung der ErfindungDisclosure of the invention
Erfindungsgemäß weist der Sensor eine Oberfläche mit einer Sensoröffnung zum Erfassen eines Luftdruckes, insbesondere eines den Sensor umgebenden Umgebungsluftdruckes auf. Der Sensor weist auch wenigstens einen elektrischen Anschluss auf, welcher – bevorzugt als elektrisch leitfähiger Flächenbereich – an der Oberfläche des Sensors ausgebildet ist. Die Oberfläche des Sensors ist der Leiterplatte zugewandt, wobei der elektrisch Anschluss mittels eines Lötmittels, insbesondere einer Lotperle, im Englischen auch Bump genannt, mit der Leiterplatte verbunden ist. Die Leiterplatte weist einen Durchbruch auch, welcher derart angeordnet ist, dass der Sensor über die Sensoröffnung den Luftdruck durch den Durchbruch hindurch erfassen kann.According to the invention, the sensor has a surface with a sensor opening for detecting an air pressure, in particular an ambient air pressure surrounding the sensor. The sensor also has at least one electrical connection, which is preferably formed as an electrically conductive surface region on the surface of the sensor. The surface of the sensor faces the printed circuit board, wherein the electrical connection by means of a solder, in particular a solder ball, also called bump in English, is connected to the printed circuit board. The printed circuit board also has an opening which is arranged such that the sensor can detect the air pressure through the opening via the sensor opening.
Auf diese Weise kann der Sensor vorteilhaft aufwandsgünstig mit einer Leiterplatte verbunden werden, weiter vorteilhaft kann ein den Sensor umgebendes Gehäuse entfallen, insoweit die Sensoröffnung oder ein Flächenbereich des Sensors, welcher zum Erfassen des Luftdruckes ausgebildet ist, durch den Durchbruch der Leiterplatte hindurch mit der Umgebungsluft Kontakt haben kann und so das den Sensor umgebende Gehäuse mit einem Durchbruch entfallen kann. In this way, the sensor advantageously can be connected to a printed circuit board, further advantageously a housing surrounding the sensor can be omitted insofar as the sensor opening or an area of the sensor, which is designed to detect the air pressure, through the breakthrough of the circuit board through with the ambient air Contact can have and so the housing surrounding the sensor can be omitted with a breakthrough.
Der Sensor ist bevorzugt ausgebildet, ein Sensorsignal zu erzeugen, das den Luftdruck und/oder die Luftfeuchtigkeit repräsentiert und das Sensorsignal ausgangsseitig auszugeben.The sensor is preferably designed to generate a sensor signal which represents the air pressure and / or the air humidity and output the sensor signal on the output side.
In einer bevorzugten Ausführungsform der Sensoranordnung erstreckt sich zwischen dem Sensor und der Leiterplatte ein Spalt, wobei der Spalt mit einem Dichtmittel, insbesondere einer Dichtmasse, bevorzugt umlaufend abgedichtet ist, sodass der Luftdruck nur durch den Durchbruch hindurch erfasst werden kann. Die Dichtmasse ist beispielsweise durch ein Epoxidharz gebildet, bevorzugt ist die Dichtmasse ein sogenanntes Underfill-Material, umfassend Epoxidharz.In a preferred embodiment of the sensor arrangement, a gap extends between the sensor and the printed circuit board, wherein the gap is preferably circumferentially sealed with a sealing agent, in particular a sealing compound, so that the air pressure can only be detected through the opening. The sealant is formed for example by an epoxy resin, preferably, the sealant is a so-called underfill material comprising epoxy resin.
In einer bevorzugten Ausführungsform ist das Dichtmittel derart thixotrop ausgebildet, dass das Dichtmittel von dem zuvor erwähnten Spalt mittels Kapillarkräfte eingesaugt werden kann, wobei das Dichtmittel maximal bis hin zu dem Durchbruch reicht und so nicht in den Durchbruch hinein fließen kann.In a preferred embodiment, the sealant is thixotropic in such a way that the sealant can be sucked in from the aforementioned gap by means of capillary forces, the sealant reaching as far as the breakthrough and thus not being able to flow into the aperture.
Dadurch kann der Durchbruch vorteilhaft frei bleiben, wogegen der Spalt, welcher sich zwischen der Leiterplatte und dem Sensor erstreckt, ausgefüllt werden und die Lotperlen, auch Bumps genannt, umfließen kann.This allows the breakthrough advantageously remain free, whereas the gap, which extends between the circuit board and the sensor, are filled, and the solder balls, also called bumps, can flow around.
In einer bevorzugten Ausführungsform ist der Sensor als gehäuseloser Halbleiterbaustein, auch Bare-Die genannt, ausgebildet. So kann der Halbleiterbaustein vorteilhaft aufwandsgünstig mit der Leiterplatte verbunden werden, sodass die elektrischen Verbindungen, welche durch die sogenannten Bumps oder Lotperlen gebildet sind, eine sonst notwendige Drahtbondverbindung entfallen lassen können.In a preferred embodiment, the sensor is designed as a housing-free semiconductor module, also called Bare-Die. Thus, the semiconductor device can be advantageous advantageously connected to the circuit board, so that the electrical connections, which are formed by the so-called bumps or solder balls, can be omitted an otherwise necessary Drahtbondverbindung.
Der Sensor als gehäuseloser Halbleiterbaustein kann beispielsweise in einem weiteren Arbeitsschritt nach dem Verlöten und nach dem Abdichten mit Epoxidharz vollständig mittels einer Vergußmasse, beispielsweise einem weiteren Epoxidharz, verschlossen werden.The sensor as a caseless semiconductor component, for example, in a further step after soldering and after sealing with epoxy resin completely by means of a potting compound, such as a further epoxy resin, are closed.
In einer bevorzugten Ausführungsform weist die Sensoranordnung einen integrierten Schaltkreis auf, welcher zur Signalverarbeitung des Sensorsignals ausgebildet ist und welcher eingangsseitig mit dem Sensor elektrisch verbunden und weiter bevorzugt mit der Leiterplatte lötverbunden ist. So kann der Sensor vorteilhaft aufwandsgünstig zusammen mit dem Schaltkreis, insbesondere einem Chip zur Signalverarbeitung, gemeinsam auf einer Leiterplatte angeordnet sein, wobei ein den Schaltkreis zur Signalverarbeitung und das den Sensor umgebende Gehäuse entfallen kann.In a preferred embodiment, the sensor arrangement has an integrated circuit which is designed for signal processing of the sensor signal and which is electrically connected on the input side to the sensor and more preferably is solder-connected to the printed circuit board. Thus, the sensor can advantageously advantageously be arranged together with the circuit, in particular a chip for signal processing, together on a printed circuit board, whereby a circuit for signal processing and the housing surrounding the sensor can be dispensed with.
In einer bevorzugten Ausführungsform ist der Sensor und/oder der Schaltkreis mittels Flip-Chip-Montage mit der Leiterplatte verbunden. Dadurch kann die Sensoranordnung vorteilhaft aufwandsgünstig bereitgestellt werden.In a preferred embodiment, the sensor and / or the circuit is connected to the printed circuit board by means of flip-chip mounting. As a result, the sensor arrangement can advantageously be provided at low cost.
In einer anderen Ausführungsform ist der Sensor und/oder der Schaltkreis mittels SMD-Löttechnik, insbesondere mittels eines Reflow-Lötverfahrens, mit der Leiterplatte verbunden.In another embodiment, the sensor and / or the circuit by means of SMD soldering, in particular by means of a reflow soldering, connected to the circuit board.
In einer bevorzugten Ausführungsform weist die Leiterplatte auf einer dem Sensor gegenüberliegenden Seite elektrische Anschlüsse zum Lötverbinden mit einer weiteren Leiterplatte auf, sodass die Leiterplatte und die weitere Leiterplatte derart voneinander beabstandet sind, dass einen Luftdruck durch den Durchbruch hindurch erfasst werden kann. So kann die Leiterplatte vorteilhaft als Sensormodul, welches die Leiterplatte, den Sensor oder zusätzlich den Schaltkreis zur Signalverarbeitung des Sensorsignals umfasst, mittels Flip-Chip-Löttechnik oder Reflow-Löttechnik mit der weiteren Leiterplatte verbunden werden. In a preferred embodiment, the printed circuit board on a side opposite the sensor electrical connections for soldering to another circuit board, so that the circuit board and the other circuit board are spaced apart such that an air pressure can be detected through the opening. Thus, the circuit board can advantageously be connected as a sensor module, which includes the circuit board, the sensor or additionally the circuit for signal processing of the sensor signal, by means of flip-chip soldering or reflow soldering with the other circuit board.
Ein Abstand der Leiterplatte von der weiteren Leiterplatte beträgt beispielsweise wenigstens 100 Mikrometer, weiter bevorzugt zwischen 50 Mikrometer und 300 Mikrometer.A distance of the printed circuit board from the further printed circuit board is for example at least 100 micrometers, more preferably between 50 micrometers and 300 micrometers.
In einer bevorzugten Ausführungsform sind die elektrischen Anschlüsse des Sensors in dem Spalt zwischen dem Sensor und der Leiterplatte angeordnet. Weiter bevorzugt ist der Spalt von dem Dichtmittel – bevorzugt umlaufend – im Bereich der Anschlüsse ausgefüllt. Weiter bevorzugt sind die Anschlüsse in das Dichtmittel eingebettet. Dadurch sind die Anschlüsse vorteilhaft vor Feuchtigkeit der Umgebungsluft geschützt, welche durch den Durchbruch in den Spalt gelangen kann. In a preferred embodiment, the electrical connections of the sensor are arranged in the gap between the sensor and the printed circuit board. More preferably, the gap of the sealing means - preferably circumferentially - filled in the region of the connections. More preferably, the terminals are embedded in the sealant. As a result, the connections are advantageously protected from moisture of the ambient air, which can pass through the opening in the gap.
So kann die Sensoranordnung vorteilhaft aufwandsgünstig bereitgestellt werden, soweit die elektrischen Anschlüsse nicht nur am Rand der Leiterplatte angeordnet sein können, sondern auch auf einer Fläche der Leiterplatte verteilt sein können, welche der weiteren Leiterplatte gegenüberliegt.Thus, the sensor arrangement can advantageously be provided at low cost, as far as the electrical connections can not only be arranged at the edge of the circuit board, but can also be distributed on a surface of the circuit board, which is opposite to the other circuit board.
In einer bevorzugten Ausführungsform sind die Anschlüsse zum Lötverbinden mit der weiteren Leiterplatte in einem zu dem Sensor benachbarten Bereich ausgebildet. Weiter bevorzugt ist der Bereich der Leiterplatte, auf dem der Sensor angeordnet ist, frei von mechanischen Verbindungen zu der weiteren Leiterplatte hin. So kann der Sensor vorteilhaft zusammen mit einem Teil der Leiterplatte, auf dem der Sensor mit der Leiterplatte verbunden ist, relativ zu der weiteren Leiterplatte schwingen oder thermisch bedingte Wärmeausdehnungen erfahren. Weiter vorteilhaft kann das Sensorsignal so weitgehend frei oder frei von Artefakten sein, welche dem Sensorsignal, das die zu erfassende Messgröße repräsentiert, überlagert sind und dieses verfälschen.In a preferred embodiment, the terminals for solder bonding with the further printed circuit board are formed in a region adjacent to the sensor. More preferably, the region of the circuit board on which the sensor is arranged, free of mechanical connections to the other circuit board. Thus, the sensor can advantageously oscillate together with a part of the printed circuit board on which the sensor is connected to the printed circuit board relative to the other printed circuit board or experience thermally induced thermal expansions. Further advantageously, the sensor signal can be largely free or free of artifacts, which are superimposed on the sensor signal, which represents the measured variable to be detected, and this falsify.
Es wurde nämlich erkannt, dass der Sensor, insbesondere der zuvor erwähnte gehäuselos ausgebildete Sensor, insbesondere Halbleitersensor, empfindlich ist gegenüber mechanischen Verbiegungen des Sensorbausteins. Solche Verbiegungen können beispielsweise von der Leiterplatte, mit der der Sensor verlötet ist, auf den Sensorbaustein wirken.It was in fact recognized that the sensor, in particular the previously mentioned housing-less sensor, in particular a semiconductor sensor, is sensitive to mechanical bending of the sensor module. Such bends can act on the sensor module, for example, from the printed circuit board with which the sensor is soldered.
In einer bevorzugten Ausführungsform ist der Sensor ein MEMS-Sensor. So kann der Sensor vorteilhaft platzsparend ausgebildet sein.In a preferred embodiment, the sensor is a MEMS sensor. Thus, the sensor can advantageously be designed to save space.
In einer bevorzugten Ausführungsform ist ein Durchmesser des Durchbruchs in der Leiterplatte größer als eine Erstreckung des Spaltes zwischen dem Sensor und der Leiterplatte. So kann vorteilhaft eine Kapillarwirkung, welche das zuvor erwähnte Dichtmittel in den Spalt saugen kann, vor dem Durchbruch stoppen oder so gering ausgebildet sein, dass das Dichtmittel nicht in den Durchbruch hinein gesaugt werden kann.In a preferred embodiment, a diameter of the aperture in the circuit board is greater than an extension of the gap between the sensor and the circuit board. Thus, advantageously, a capillary action, which can suck the aforementioned sealing means into the gap, stop before the breakthrough or be made so small that the sealant can not be sucked into the opening.
Der zuvor erwähnte Durchbruch in der Leiterplatte weist bevorzugt einen Durchmesser zwischen 20 Mikrometer und 300 Mikrometer auf. The aforementioned breakdown in the printed circuit board preferably has a diameter between 20 microns and 300 microns.
Die Erfindung wird nun im Folgenden anhand von Figuren und weiteren Ausführungsbeispielen beschrieben. Weitere vorteilhafte Ausführungsformen ergeben sich aus den in den abhängigen Ansprüchen und in den Figuren beschriebenen Merkmalen.The invention will now be described below with reference to figures and further embodiments. Further advantageous embodiments will become apparent from the features described in the dependent claims and in the figures.
Der Sensor
Die Sensoranordnung
Der Sensor
Die elektrischen Anschlüsse
Zu einer Montage des Sensors
Der Sensor
Die Leiterplatte
Die Öffnung
Der Durchbruch
Mit der Leiterplatte
Der Schaltkreis
Der Schaltkreis
Die Lotverbindung zwischen der Leiterplatte
Ein Endabschnitt
Der Sensor
Die Leiterplatte
Claims (10)
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DE102014208100.9A DE102014208100A1 (en) | 2014-04-29 | 2014-04-29 | sensor arrangement |
PCT/EP2015/058306 WO2015165745A1 (en) | 2014-04-29 | 2015-04-16 | Sensor arrangement |
TW104113335A TW201541059A (en) | 2014-04-29 | 2015-04-27 | Sensor device |
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DE102014208100.9A DE102014208100A1 (en) | 2014-04-29 | 2014-04-29 | sensor arrangement |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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DE102015218355A1 (en) | 2015-09-24 | 2017-03-30 | Robert Bosch Gmbh | Microelectronic component arrangement and production method for a microelectronic component arrangement |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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DE102015218355A1 (en) | 2015-09-24 | 2017-03-30 | Robert Bosch Gmbh | Microelectronic component arrangement and production method for a microelectronic component arrangement |
US9919912B2 (en) | 2015-09-24 | 2018-03-20 | Robert Bosch Gmbh | Microelectronic component arrangement and production method for a microelectronic component arrangement |
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