CN1177187C - 独立制冷型电冰箱 - Google Patents
独立制冷型电冰箱Info
- Publication number
- CN1177187C CN1177187C CNB01139921XA CN01139921A CN1177187C CN 1177187 C CN1177187 C CN 1177187C CN B01139921X A CNB01139921X A CN B01139921XA CN 01139921 A CN01139921 A CN 01139921A CN 1177187 C CN1177187 C CN 1177187C
- Authority
- CN
- China
- Prior art keywords
- refrigerating chamber
- cold air
- chamber side
- refrigerator
- refrigerator pipe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Abstract
Description
Claims (5)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CNB01139921XA CN1177187C (zh) | 2001-11-19 | 2001-11-19 | 独立制冷型电冰箱 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CNB01139921XA CN1177187C (zh) | 2001-11-19 | 2001-11-19 | 独立制冷型电冰箱 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1420333A CN1420333A (zh) | 2003-05-28 |
CN1177187C true CN1177187C (zh) | 2004-11-24 |
Family
ID=4675521
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB01139921XA Expired - Fee Related CN1177187C (zh) | 2001-11-19 | 2001-11-19 | 独立制冷型电冰箱 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN1177187C (zh) |
Cited By (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7778031B1 (en) | 2009-07-15 | 2010-08-17 | Teradyne, Inc. | Test slot cooling system for a storage device testing system |
US7848106B2 (en) | 2008-04-17 | 2010-12-07 | Teradyne, Inc. | Temperature control within disk drive testing systems |
US7890207B2 (en) | 2008-04-17 | 2011-02-15 | Teradyne, Inc. | Transferring storage devices within storage device testing systems |
US7904211B2 (en) | 2008-04-17 | 2011-03-08 | Teradyne, Inc. | Dependent temperature control within disk drive testing systems |
US7908029B2 (en) | 2008-06-03 | 2011-03-15 | Teradyne, Inc. | Processing storage devices |
US7911778B2 (en) | 2008-04-17 | 2011-03-22 | Teradyne, Inc. | Vibration isolation within disk drive testing systems |
US7929303B1 (en) | 2010-02-02 | 2011-04-19 | Teradyne, Inc. | Storage device testing system cooling |
US7932734B2 (en) | 2009-07-15 | 2011-04-26 | Teradyne, Inc. | Individually heating storage devices in a testing system |
US7940529B2 (en) | 2009-07-15 | 2011-05-10 | Teradyne, Inc. | Storage device temperature sensing |
US7945424B2 (en) | 2008-04-17 | 2011-05-17 | Teradyne, Inc. | Disk drive emulator and method of use thereof |
US7987018B2 (en) | 2008-04-17 | 2011-07-26 | Teradyne, Inc. | Transferring disk drives within disk drive testing systems |
US7996174B2 (en) | 2007-12-18 | 2011-08-09 | Teradyne, Inc. | Disk drive testing |
US8041449B2 (en) | 2008-04-17 | 2011-10-18 | Teradyne, Inc. | Bulk feeding disk drives to disk drive testing systems |
US8102173B2 (en) | 2008-04-17 | 2012-01-24 | Teradyne, Inc. | Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit |
US8116079B2 (en) | 2009-07-15 | 2012-02-14 | Teradyne, Inc. | Storage device testing system cooling |
US8238099B2 (en) | 2008-04-17 | 2012-08-07 | Teradyne, Inc. | Enclosed operating area for disk drive testing systems |
US8405971B2 (en) | 2007-12-18 | 2013-03-26 | Teradyne, Inc. | Disk drive transport, clamping and testing |
US8482915B2 (en) | 2008-04-17 | 2013-07-09 | Teradyne, Inc. | Temperature control within disk drive testing systems |
US8547123B2 (en) | 2009-07-15 | 2013-10-01 | Teradyne, Inc. | Storage device testing system with a conductive heating assembly |
US8628239B2 (en) | 2009-07-15 | 2014-01-14 | Teradyne, Inc. | Storage device temperature sensing |
US8687349B2 (en) | 2010-07-21 | 2014-04-01 | Teradyne, Inc. | Bulk transfer of storage devices using manual loading |
US9001456B2 (en) | 2010-08-31 | 2015-04-07 | Teradyne, Inc. | Engaging test slots |
US9459312B2 (en) | 2013-04-10 | 2016-10-04 | Teradyne, Inc. | Electronic assembly test system |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1779395B (zh) * | 2004-11-18 | 2010-05-05 | 乐金电子(天津)电器有限公司 | 冰箱 |
-
2001
- 2001-11-19 CN CNB01139921XA patent/CN1177187C/zh not_active Expired - Fee Related
Cited By (40)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7996174B2 (en) | 2007-12-18 | 2011-08-09 | Teradyne, Inc. | Disk drive testing |
US8549912B2 (en) | 2007-12-18 | 2013-10-08 | Teradyne, Inc. | Disk drive transport, clamping and testing |
US8467180B2 (en) | 2007-12-18 | 2013-06-18 | Teradyne, Inc. | Disk drive transport, clamping and testing |
US8405971B2 (en) | 2007-12-18 | 2013-03-26 | Teradyne, Inc. | Disk drive transport, clamping and testing |
US8140182B2 (en) | 2008-04-17 | 2012-03-20 | Teradyne, Inc. | Bulk feeding disk drives to disk drive testing systems |
US8238099B2 (en) | 2008-04-17 | 2012-08-07 | Teradyne, Inc. | Enclosed operating area for disk drive testing systems |
US8712580B2 (en) | 2008-04-17 | 2014-04-29 | Teradyne, Inc. | Transferring storage devices within storage device testing systems |
US8160739B2 (en) | 2008-04-17 | 2012-04-17 | Teradyne, Inc. | Transferring storage devices within storage device testing systems |
US8655482B2 (en) | 2008-04-17 | 2014-02-18 | Teradyne, Inc. | Enclosed operating area for storage device testing systems |
US7848106B2 (en) | 2008-04-17 | 2010-12-07 | Teradyne, Inc. | Temperature control within disk drive testing systems |
US7945424B2 (en) | 2008-04-17 | 2011-05-17 | Teradyne, Inc. | Disk drive emulator and method of use thereof |
US7987018B2 (en) | 2008-04-17 | 2011-07-26 | Teradyne, Inc. | Transferring disk drives within disk drive testing systems |
US7904211B2 (en) | 2008-04-17 | 2011-03-08 | Teradyne, Inc. | Dependent temperature control within disk drive testing systems |
US8305751B2 (en) | 2008-04-17 | 2012-11-06 | Teradyne, Inc. | Vibration isolation within disk drive testing systems |
US8041449B2 (en) | 2008-04-17 | 2011-10-18 | Teradyne, Inc. | Bulk feeding disk drives to disk drive testing systems |
US7911778B2 (en) | 2008-04-17 | 2011-03-22 | Teradyne, Inc. | Vibration isolation within disk drive testing systems |
US8095234B2 (en) | 2008-04-17 | 2012-01-10 | Teradyne, Inc. | Transferring disk drives within disk drive testing systems |
US8102173B2 (en) | 2008-04-17 | 2012-01-24 | Teradyne, Inc. | Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit |
US8117480B2 (en) | 2008-04-17 | 2012-02-14 | Teradyne, Inc. | Dependent temperature control within disk drive testing systems |
US8482915B2 (en) | 2008-04-17 | 2013-07-09 | Teradyne, Inc. | Temperature control within disk drive testing systems |
US7890207B2 (en) | 2008-04-17 | 2011-02-15 | Teradyne, Inc. | Transferring storage devices within storage device testing systems |
US8451608B2 (en) | 2008-04-17 | 2013-05-28 | Teradyne, Inc. | Temperature control within storage device testing systems |
US8086343B2 (en) | 2008-06-03 | 2011-12-27 | Teradyne, Inc. | Processing storage devices |
US7908029B2 (en) | 2008-06-03 | 2011-03-15 | Teradyne, Inc. | Processing storage devices |
US7995349B2 (en) | 2009-07-15 | 2011-08-09 | Teradyne, Inc. | Storage device temperature sensing |
US7940529B2 (en) | 2009-07-15 | 2011-05-10 | Teradyne, Inc. | Storage device temperature sensing |
US7778031B1 (en) | 2009-07-15 | 2010-08-17 | Teradyne, Inc. | Test slot cooling system for a storage device testing system |
US7920380B2 (en) | 2009-07-15 | 2011-04-05 | Teradyne, Inc. | Test slot cooling system for a storage device testing system |
US8466699B2 (en) | 2009-07-15 | 2013-06-18 | Teradyne, Inc. | Heating storage devices in a testing system |
US8116079B2 (en) | 2009-07-15 | 2012-02-14 | Teradyne, Inc. | Storage device testing system cooling |
US8547123B2 (en) | 2009-07-15 | 2013-10-01 | Teradyne, Inc. | Storage device testing system with a conductive heating assembly |
US8279603B2 (en) | 2009-07-15 | 2012-10-02 | Teradyne, Inc. | Test slot cooling system for a storage device testing system |
US8628239B2 (en) | 2009-07-15 | 2014-01-14 | Teradyne, Inc. | Storage device temperature sensing |
US7932734B2 (en) | 2009-07-15 | 2011-04-26 | Teradyne, Inc. | Individually heating storage devices in a testing system |
US8687356B2 (en) | 2010-02-02 | 2014-04-01 | Teradyne, Inc. | Storage device testing system cooling |
US7929303B1 (en) | 2010-02-02 | 2011-04-19 | Teradyne, Inc. | Storage device testing system cooling |
US8687349B2 (en) | 2010-07-21 | 2014-04-01 | Teradyne, Inc. | Bulk transfer of storage devices using manual loading |
US8964361B2 (en) | 2010-07-21 | 2015-02-24 | Teradyne, Inc. | Bulk transfer of storage devices using manual loading |
US9001456B2 (en) | 2010-08-31 | 2015-04-07 | Teradyne, Inc. | Engaging test slots |
US9459312B2 (en) | 2013-04-10 | 2016-10-04 | Teradyne, Inc. | Electronic assembly test system |
Also Published As
Publication number | Publication date |
---|---|
CN1420333A (zh) | 2003-05-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: TAIZHOU LG ELECTRONICS FREEZER CO., LTD. Free format text: FORMER OWNER: LG ELECTRONICS ( TIANJIN ) ELECTRICAL APPLIANCES CO., LTD. Effective date: 20091225 |
|
C41 | Transfer of patent application or patent right or utility model | ||
C56 | Change in the name or address of the patentee |
Owner name: TAIZHOU LG ELECTRONICS FREEZER CO., LTD. Free format text: FORMER NAME: LG ELECTRONICS ( TIANJIN ) ELECTRICAL APPLIANCES CO., LTD. |
|
CP03 | Change of name, title or address |
Address after: No. 2 Yingbin Road, Taizhou Economic Development Zone, Jiangsu Patentee after: TAIZHOU LG ELECTRONICS REFRIGERATION Co.,Ltd. Address before: Beichen District, Tianjin Xing Lake Road Patentee before: LG Electronics (Tianjin) Appliances Co.,Ltd. |
|
TR01 | Transfer of patent right |
Effective date of registration: 20091225 Address after: No. 2 Yingbin Road, Taizhou Economic Development Zone, Jiangsu Patentee after: TAIZHOU LG ELECTRONICS REFRIGERATION Co.,Ltd. Address before: Beichen District, Tianjin Xing Lake Road Patentee before: LG Electronics (Tianjin) Appliances Co.,Ltd. |
|
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20041124 Termination date: 20111119 |