CN105759785A - Test equipment control method and device - Google Patents
Test equipment control method and device Download PDFInfo
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- CN105759785A CN105759785A CN201610088030.1A CN201610088030A CN105759785A CN 105759785 A CN105759785 A CN 105759785A CN 201610088030 A CN201610088030 A CN 201610088030A CN 105759785 A CN105759785 A CN 105759785A
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
Abstract
The invention discloses a test equipment control method and device. The method comprises the steps that the test logic for testing a mainboard to be tested is acquired, and the test logic includes the test sequence for testing multiple functions of the mainboard to be tested; and test equipment used for testing the multiple functions of the mainboard to be tested is controlled to perform testing according to the test sequence. The technical problems in the prior art that the multiple functions of the controller mainboard cannot be automatically tested can be solved.
Description
Technical field
The present invention relates to field tests, in particular to a kind of control method testing equipment and device.
Background technology
Controller function test (FunctionalCircuitTest is called for short FCT) adopts manual test, frock function singleness, and a kind of test fixture can only test a kind of function, it is impossible to multiple functions of Board Under Test are tested automatically, and testing efficiency is low.
For above-mentioned problem, effective solution is not yet proposed at present.
Summary of the invention
Embodiments provide a kind of control method testing equipment and device, at least to solve the technical problem multiple functions of controller mainboard cannot tested automatically in prior art.
An aspect according to embodiments of the present invention, provide a kind of control method testing equipment, including: obtaining and treat the test logic that testing host carries out testing, wherein, described test logic includes the testing sequence that multiple functions of described mainboard to be tested are tested；The test testing equipment being used for testing the plurality of function of described mainboard to be tested is controlled according to described testing sequence.
Further, described test equipment includes multiple test module, the test testing equipment controlling the plurality of function for testing described mainboard to be tested according to described testing sequence includes: obtain in the plurality of test module for performing the first test module of test the first function, wherein, described first function is in the plurality of function indicated by described testing sequence；Testing module to described first and send control instruction, wherein, described control instruction is used for controlling described first test module and described mainboard to be tested is tested.
Further, after sending control instruction to described first test module, described method also includes: receive the test result data that described first test module sends, and wherein, described test result data is obtain after described first test module performs described first function of test；Judge whether described test result data meets default value scope；If it is judged that described test result data meets described default value scope, then judge that whether described first function is last function of described testing sequence instruction, and when judging last function that described first function is not the instruction of described testing sequence, control the indicated by described testing sequence corresponding to the second function second test module and perform test；When judging last function that described first function is the instruction of described testing sequence, it is determined that described mainboard to be tested is qualified；If it is judged that described test result data is unsatisfactory for described default value scope, it is determined that described mainboard to be tested is abnormal.
Further, after judging that described test result data is unsatisfactory for described default value scope, and before determining that described mainboard to be tested is abnormal, described method also includes: again tests module to described first and sends described control instruction；Receive the test result data that described first test module sends again；Judge whether the test result data that described first test module sends again meets described default value scope；If it is judged that the test result data that described first test module sends again is unsatisfactory for described default value scope, it is judged that whether the number of times sending described control instruction to described first test module has reached threshold value；Send the number of times of described control instruction reached described threshold value if it is judged that test module to described first, it is determined that described mainboard to be tested is abnormal.
Further, described first test module is the test module indicated by described testing sequence current location, and described test module is following operational blocks which partition system: drive circuit test module, electromechanical testing module, voltage test module, relay contact analog control system module, communication test module, discharge test module.
Another aspect according to embodiments of the present invention, additionally provide a kind of control device testing equipment, including: acquiring unit, treat, for obtaining, the test logic that testing host carries out testing, wherein, described test logic includes testing sequence that multiple functions of described mainboard to be tested are tested；Test cell, for controlling the test testing equipment of the plurality of function for testing described mainboard to be tested according to described testing sequence.
Further, described test equipment includes multiple test module, described test cell includes: obtain subelement, for obtaining in the plurality of test module for performing the first test module of test the first function, wherein, described first function is in the plurality of function indicated by described testing sequence；Sending subelement, send control instruction for testing module to described first, wherein, described control instruction is used for controlling described first test module and described mainboard to be tested is tested.
Further, described device also includes: first receives unit, for after sending control instruction to described first test module, receive the test result data that described first test module sends, wherein, described test result data is obtain after described first test module performs described first function of test；First judging unit, for judging whether described test result data meets default value scope the second judging unit, for if it is judged that described test result data meets described default value scope, then judge that whether described first function is last function of described testing sequence instruction, control unit, for when judging last function that described first function is not the instruction of described testing sequence, controlling the indicated by described testing sequence corresponding to the second function second test module and perform test；First determines unit, for when judging last function that described first function is the instruction of described testing sequence, it is determined that described mainboard to be tested is qualified；Second determines unit, for if it is judged that described test result data is unsatisfactory for described default value scope, it is determined that described mainboard to be tested is abnormal.
Further, described device also includes: transmitting element, for after judging that described test result data is unsatisfactory for described default value scope, and before determining that described mainboard to be tested is abnormal, again test module to described first and send described control instruction；Second receives unit, for receiving the test result data that described first test module sends again；3rd judging unit, for judging whether the test result data that described first test module sends again meets described default value scope；4th judging unit, for if it is judged that the test result data that described first test module sends again is unsatisfactory for described default value scope, it is judged that whether the number of times sending described control instruction to described first test module has reached threshold value；3rd determines unit, for if it is judged that test module to described first and send the number of times of described control instruction and reached described threshold value, it is determined that described mainboard to be tested is abnormal.
Further, described first test module is the test module indicated by described testing sequence current location, and described test module is following operational blocks which partition system: drive circuit test module, electromechanical testing module, voltage test module, relay contact analog control system module, communication test module, discharge test module.
In embodiments of the present invention, obtaining and treat the test logic that testing host carries out testing, wherein, described test logic includes the testing sequence that multiple functions of described mainboard to be tested are tested；The test testing equipment being used for testing the plurality of function of described mainboard to be tested is controlled according to described testing sequence.Test by treating testing host according to testing sequence control test equipment, reached automatically to treat the technique effect that testing host carries out testing, and then solved the technical problem multiple functions of controller mainboard cannot tested automatically in prior art.
Accompanying drawing explanation
Accompanying drawing described herein is used for providing a further understanding of the present invention, constitutes the part of the present invention, and the schematic description and description of the present invention is used for explaining the present invention, is not intended that inappropriate limitation of the present invention.In the accompanying drawings:
Fig. 1 is the flow chart of the control method of test equipment according to embodiments of the present invention；And
Fig. 2 is the schematic diagram controlling device of test equipment according to embodiments of the present invention.
Detailed description of the invention
In order to make those skilled in the art be more fully understood that the present invention program, below in conjunction with the accompanying drawing in the embodiment of the present invention, technical scheme in the embodiment of the present invention is clearly and completely described, obviously, described embodiment is only the embodiment of a present invention part, rather than whole embodiments.Based on the embodiment in the present invention, the every other embodiment that those of ordinary skill in the art obtain under not making creative work premise, all should belong to the scope of protection of the invention.
It should be noted that term " first " in description and claims of this specification and above-mentioned accompanying drawing, " second " etc. are for distinguishing similar object, without being used for describing specific order or precedence.Should be appreciated that the data of so use can be exchanged in the appropriate case, in order to embodiments of the invention described herein can with except here diagram or describe those except order implement.In addition, term " includes " and " having " and their any deformation, it is intended to cover non-exclusive comprising, such as, contain series of steps or the process of unit, method, system, product or equipment be not necessarily limited to those steps or the unit clearly listed, but can include clearly not listing or for intrinsic other step of these processes, method, product or equipment or unit.
According to embodiments of the present invention, provide the embodiment of a kind of control method testing equipment, it should be noted that, can perform in the computer system of such as one group of computer executable instructions in the step shown in the flow chart of accompanying drawing, and, although illustrate logical order in flow charts, but in some cases, it is possible to perform shown or described step with the order being different from herein.
As it is shown in figure 1, the control method of this test equipment comprises the steps:
Step S102, obtains and treats the test logic that testing host carries out testing, and wherein, test logic includes treating the testing sequence that multiple functions of testing host carry out testing.
Step S104, controls the test testing equipment being used for testing multiple functions of mainboard to be tested according to testing sequence.
Mainboard to be tested can be the controller mainboard of air-conditioning, tests several functions of mainboard to be tested according to testing sequence.
Testing by treating testing host according to testing sequence control test equipment, having reached automatically to treat the technique effect that testing host carries out testing, thus solving the technical problem that the multiple functions that cannot treat testing host in prior art carry out testing automatically.
Alternatively, test equipment includes multiple test module, the test testing equipment controlling the multiple functions for testing mainboard to be tested according to testing sequence includes: obtain in multiple test module for performing the first test module of test the first function, wherein, the first function is in the multiple functions indicated by testing sequence；Testing module to first and send control instruction, wherein, control instruction is used for controlling the first test module and treats testing host and test.
Mainboard to be tested needs the function carrying out testing to have multiple, and the order after needing the function carrying out testing to arrange mainboard to be tested is testing sequence.Above-mentioned first function can any one function in the multiple functions indicated by testing sequence.Above-mentioned first test module is performed for the test module of test the first function.
Test equipment is tested module to first and is sent control instruction, treats testing host and tests controlling the first test module.
Alternatively, after sending control instruction to the first test module, the control method of the test equipment that the embodiment of the present invention provides also includes: receive the test result data that the first test module sends, and wherein, test result data is obtain after the first test module performs test the first function；Judge whether test result data meets default value scope；If it is judged that test result data meets default value scope, then judge that whether the first function is last function of testing sequence instruction, and when judging last function that the first function is not testing sequence instruction, control the indicated by testing sequence corresponding to the second function second test module and perform test；When judging last function that the first function is testing sequence instruction, it is determined that mainboard to be tested is qualified；If it is judged that test result data is unsatisfactory for default value scope, it is determined that mainboard to be tested is abnormal.
Mainboard to be tested needs the function carrying out testing to have multiple, multiple functions are tested respectively, if test result shows that all functions to be tested are all normal, then determine that mainboard to be tested is qualified, if it is abnormal that test result shows there is a function to be tested, then determine that mainboard to be tested is defective, it may also be said to be that mainboard to be tested is abnormal.
The order of the function indicated by testing sequence is treated testing host and is tested.
First test module receives the control instruction that test equipment sends, and execution control instruction is treated the first function of testing host and tested, and after having tested, sends test result data to test equipment.After test equipment receives test result data, it is judged that whether test result data is within default value scope.
Default value scope is set in advance, and default value scope meets following condition: when the first function of mainboard to be tested is normal, treats the first function of testing host and carries out test and obtain default value scope.Default value scope is referred to experience and determines.
If it is judged that test result data is within default value scope, it is determined that the first function of mainboard to be tested is normal.
If it is judged that test result data is not within default value scope, the first function then determining mainboard to be tested is abnormal, prove problematic owing at least one function of mainboard to be tested has been tested by result data, now, determine that mainboard to be tested is defective, namely determine that mainboard to be tested is abnormal.
If it is determined that the first function of mainboard to be tested is normal, judge that whether the first function is last function of testing sequence instruction, if it is judged that the first function is last function of testing sequence instruction, then illustrate that all functions indicated by testing sequence are all completed, and repertoire is all normal, now, it is determined that mainboard to be tested is qualified.
Sometimes, due to the interference factor that some are accidental, even if certain function of mainboard to be tested is normal, treat after this function of testing host carries out once test, test result data is not still within default value scope, at this time, if it is determined that this function of mainboard to be tested is problematic, it is judged that arise that error.
Situation in order to avoid above-mentioned error in judgement, the control method of the test equipment that the embodiment of the present invention provides can additionally comprise following step: alternatively, after judging that test result data is unsatisfactory for default value scope, again test module to first and send control instruction；Receive the test result data that the first test module sends again；Judge whether the test result data that the first test module sends again meets default value scope；If it is judged that the test result data that the first test module sends again is unsatisfactory for default value scope, it is judged that whether the number of times sending control instruction to the first test module has reached threshold value；Send the number of times of control instruction reached threshold value if it is judged that test module to first, it is determined that mainboard to be tested is abnormal.
Namely, treat after certain function of testing host carries out once test, when test result data is not within default value scope, again send control instruction to the test module (i.e. above-mentioned first test module) corresponding to this function, after first test module receives control instruction, again the first function treating testing host is tested, if test result is not still within default value scope, then continue to test module to first and send control instruction, threshold value is reached until the number of times sending control instruction to the first test module, if the number of times sending control instruction to the first test module has equalized to threshold value, and test result data is not still within default value scope, now, determine this dysfunction of mainboard to be tested, determine that mainboard to be tested is abnormal.If certain test result data once is within default value scope, then this function stopping treating testing host is tested, and determines that this function of mainboard to be tested is normal.
Threshold value is the numerical value pre-set, and determines according to practical situation.Such as, threshold value can be 50,100,200, etc..
Threshold value is used to be equivalent to the full test number of times of certain function setting for mainboard to be tested, i.e. for some function, it is secondary that test can carry out at most N (N is above-mentioned threshold value).
If certain test result once is within default value scope in these n times, then no longer carries out test next time, and determine that this function is normal.
If test result in these n times each time is not within default value scope, then the n times of this function tested after terminating, no longer carry out test next time, and determine this dysfunction.
Other conditions can be used to replace threshold value, such as, after any one function is carried out once test, if test result data is not within default value scope, just this function once can be tested at an ensuing preset time period interval at regular intervals, if all test result data received in preset time period are not within default value scope, determine this dysfunction, if the test result data received in preset time period having one within default value scope, it is determined that this function is normal.Such as, preset time period can be 2 minutes, and interval can be 0.5 second.
Alternatively, first test module is the test module indicated by testing sequence current location, and test module is following operational blocks which partition system: drive circuit test module, electromechanical testing module, voltage test module, relay contact analog control system module, communication test module, discharge test module.
Function indicated by testing sequence current location is the first function, and the first test module is treat the test module that the first function of testing host carries out testing.Test module be not limited to above enumerate several.
Different functions is carried out modularized design by the control method of the test equipment that the embodiment of the present invention provides, calling module is carried out by sending control instruction to module, multiple functions that disparate modules treats testing host in a certain order can be made to test, the multiple functions that can not only treat testing host are tested automatically, and disclosure satisfy that the diversified demand of test.
The embodiment of the present invention additionally provides a kind of control device testing equipment.The device that controls of this test equipment is able to carry out the control method of above-mentioned test equipment, and the control method of above-mentioned test equipment also can be implemented by the control device of this test equipment.
As in figure 2 it is shown, the control device of this test equipment includes acquiring unit 22 and test cell 24.
Acquiring unit 22 treats, for obtaining, the test logic that testing host carries out testing, and wherein, test logic includes treating the testing sequence that multiple functions of testing host carry out testing.
Test cell 24 for controlling the test testing equipment of the multiple functions for testing mainboard to be tested according to testing sequence.
Mainboard to be tested can be the controller mainboard of air-conditioning, tests several functions of mainboard to be tested according to testing sequence.
Testing by treating testing host according to testing sequence control test equipment, having reached automatically to treat the technique effect that testing host carries out testing, thus solving the technical problem that the multiple functions that cannot treat testing host in prior art carry out testing automatically.
Alternatively, test equipment includes multiple test module, and test cell 24 includes obtaining subelement and sending subelement.Obtaining subelement for obtaining for performing the first test module of test the first function in multiple test module, wherein, the first function is in the multiple functions indicated by testing sequence.Sending subelement and send control instruction for testing module to first, wherein, control instruction is used for controlling the first test module and treats testing host and test.
Mainboard to be tested needs the function carrying out testing to have multiple, and the order after needing the function carrying out testing to arrange mainboard to be tested is testing sequence.Above-mentioned first function can any one function in the multiple functions indicated by testing sequence.Above-mentioned first test module is performed for the test module of test the first function.
Test equipment is tested module to first and is sent control instruction, treats testing host and tests controlling the first test module.
Alternatively, the control device of the test equipment that the embodiment of the present invention provides also includes the first reception unit, the first judging unit, the second judging unit, control unit, first determines that unit and second determines unit.First receives unit is used for, after sending control instruction to the first test module, receiving the test result data that the first test module sends, and wherein, test result data is obtain after the first function is tested in the first test module execution.First judging unit is used for judging whether test result data meets default value scope.Second judging unit for if it is judged that test result data meets default value scope, then judges that whether the first function is last function of testing sequence instruction.Control unit is for when judging last function that the first function is not testing sequence instruction, controlling the indicated by testing sequence corresponding to the second function second test module and perform test.First determines that unit is for when judging last function that the first function is testing sequence instruction, it is determined that mainboard to be tested is qualified.Second determines that unit is for if it is judged that test result data is unsatisfactory for default value scope, it is determined that mainboard to be tested is abnormal.
Mainboard to be tested needs the function carrying out testing to have multiple, multiple functions are tested respectively, if test result shows that all functions to be tested are all normal, then determine that mainboard to be tested is qualified, if it is abnormal that test result shows there is a function to be tested, then determine that mainboard to be tested is defective, it may also be said to be that mainboard to be tested is abnormal.
The order of the function indicated by testing sequence is treated testing host and is tested.
First test module receives the control instruction that test equipment sends, and execution control instruction is treated the first function of testing host and tested, and after having tested, sends test result data to test equipment.After test equipment receives test result data, it is judged that whether test result data is within default value scope.
Default value scope is set in advance, and default value scope meets following condition: when the first function of mainboard to be tested is normal, treats the first function of testing host and carries out test and obtain default value scope.Default value scope is referred to experience and determines.
If it is judged that test result data is within default value scope, it is determined that the first function of mainboard to be tested is normal.
If it is judged that test result data is not within default value scope, the first function then determining mainboard to be tested is abnormal, prove problematic owing at least one function of mainboard to be tested has been tested by result data, now, determine that mainboard to be tested is defective, namely determine that mainboard to be tested is abnormal.
If it is determined that the first function of mainboard to be tested is normal, judge that whether the first function is last function of testing sequence instruction, if it is judged that the first function is last function of testing sequence instruction, then illustrate that all functions indicated by testing sequence are all completed, and repertoire is all normal, now, it is determined that mainboard to be tested is qualified.
Alternatively, the control device of the test equipment that the embodiment of the present invention provides also includes transmitting element, second receives unit, the 3rd judging unit, the 4th judging unit and the 3rd determine unit.Transmitting element is used for after judging that test result data is unsatisfactory for default value scope, and before determining that mainboard to be tested is abnormal, again tests module to first and send control instruction.Second receives unit for receiving the test result data that the first test module sends again.3rd judging unit is for judging whether the test result data that the first test module sends again meets default value scope.4th judging unit is for if it is judged that the test result data that the first test module sends again is unsatisfactory for default value scope, it is judged that whether the number of times sending control instruction to the first test module has reached threshold value.3rd determines that unit is for if it is judged that test module to first and send the number of times of control instruction and reached threshold value, it is determined that mainboard to be tested is abnormal.
Sometimes, due to the interference factor that some are accidental, even if certain function of mainboard to be tested is normal, treat after this function of testing host carries out once test, test result data is not still within default value scope, at this time, if it is determined that this function of mainboard to be tested is problematic, it is judged that arise that error.
In order to avoid the situation of above-mentioned error in judgement, the embodiment of the present invention, after judging that test result data is unsatisfactory for default value scope, is again tested module to first and is sent control instruction；Receive the test result data that the first test module sends again；Judge whether the test result data that the first test module sends again meets default value scope；If it is judged that the test result data that the first test module sends again is unsatisfactory for default value scope, it is judged that whether the number of times sending control instruction to the first test module has reached threshold value；Send the number of times of control instruction reached threshold value if it is judged that test module to first, it is determined that mainboard to be tested is abnormal.
Namely, treat after certain function of testing host carries out once test, when test result data is not within default value scope, again send control instruction to the test module (i.e. above-mentioned first test module) corresponding to this function, after first test module receives control instruction, again the first function treating testing host is tested, if test result is not still within default value scope, then continue to test module to first and send control instruction, threshold value is reached until the number of times sending control instruction to the first test module, if the number of times sending control instruction to the first test module has equalized to threshold value, and test result data is not still within default value scope, now, determine this dysfunction of mainboard to be tested, determine that mainboard to be tested is abnormal.If certain test result data once is within default value scope, then this function stopping treating testing host is tested, and determines that this function of mainboard to be tested is normal.
Threshold value is the numerical value pre-set, and determines according to practical situation.Such as, threshold value can be 50,100,200, etc..
Threshold value is used to be equivalent to the full test number of times of certain function setting for mainboard to be tested, i.e. for some function, it is secondary that test can carry out at most N (N is above-mentioned threshold value).
If certain test result once is within default value scope in these n times, then no longer carries out test next time, and determine that this function is normal.
If test result in these n times each time is not within default value scope, then the n times of this function tested after terminating, no longer carry out test next time, and determine this dysfunction.
Other conditions can be used to replace threshold value, such as, after any one function is carried out once test, if test result data is not within default value scope, just this function once can be tested at an ensuing preset time period interval at regular intervals, if all test result data received in preset time period are not within default value scope, determine this dysfunction, if the test result data received in preset time period having one within default value scope, it is determined that this function is normal.Such as, preset time period can be 2 minutes, and interval can be 0.5 second.
Alternatively, first test module is the test module indicated by testing sequence current location, and test module is following operational blocks which partition system: drive circuit test module, electromechanical testing module, voltage test module, relay contact analog control system module, communication test module, discharge test module.
Function indicated by testing sequence current location is the first function, and the first test module is treat the test module that the first function of testing host carries out testing.Test module be not limited to above enumerate several.
Different functions is carried out modularized design by the device that controls of the test equipment that the embodiment of the present invention provides, calling module is carried out by sending control instruction to module, multiple functions that disparate modules treats testing host in a certain order can be made to test, the multiple functions that can not only treat testing host are tested automatically, and disclosure satisfy that the diversified demand of test.
The invention described above embodiment sequence number, just to describing, does not represent the quality of embodiment.
In the above embodiment of the present invention, the description of each embodiment is all emphasized particularly on different fields, certain embodiment there is no the part described in detail, it is possible to referring to the associated description of other embodiments.
In several embodiments provided by the present invention, it should be understood that disclosed technology contents, can realize by another way.Wherein, device embodiment described above is merely schematic, the such as division of described unit, can be that a kind of logic function divides, actual can have other dividing mode when realizing, such as multiple unit or assembly can in conjunction with or be desirably integrated into another system, or some features can be ignored, or does not perform.Another point, shown or discussed coupling each other or direct-coupling or communication connection can be through INDIRECT COUPLING or the communication connection of some interfaces, unit or module, it is possible to be electrical or other form.
The described unit illustrated as separating component can be or may not be physically separate, and the parts shown as unit can be or may not be physical location, namely may be located at a place, or can also be distributed on multiple unit.Some or all of unit therein can be selected according to the actual needs to realize the purpose of the present embodiment scheme.
It addition, each functional unit in each embodiment of the present invention can be integrated in a processing unit, it is also possible to be that unit is individually physically present, it is also possible to two or more unit are integrated in a unit.Above-mentioned integrated unit both can adopt the form of hardware to realize, it would however also be possible to employ the form of SFU software functional unit realizes.
If described integrated unit is using the form realization of SFU software functional unit and as independent production marketing or use, it is possible to be stored in a computer read/write memory medium.Based on such understanding, part or all or part of of this technical scheme that prior art is contributed by technical scheme substantially in other words can embody with the form of software product, this computer software product is stored in a storage medium, including some instructions with so that a computer equipment (can for personal computer, server or the network equipment etc.) performs all or part of step of method described in each embodiment of the present invention.And aforesaid storage medium includes: USB flash disk, read only memory (ROM, Read-OnlyMemory), the various media that can store program code such as random access memory (RAM, RandomAccessMemory), portable hard drive, magnetic disc or CD.
The above is only the preferred embodiment of the present invention; it should be pointed out that, for those skilled in the art, under the premise without departing from the principles of the invention; can also making some improvements and modifications, these improvements and modifications also should be regarded as protection scope of the present invention.
Claims (10)
1. the control method testing equipment, it is characterised in that including:
Obtaining and treat the test logic that testing host carries out testing, wherein, described test logic includes the testing sequence that multiple functions of described mainboard to be tested are tested；
The test testing equipment being used for testing the plurality of function of described mainboard to be tested is controlled according to described testing sequence.
2. method according to claim 1, it is characterised in that described test equipment includes multiple test module, the test testing equipment controlling the plurality of function for testing described mainboard to be tested according to described testing sequence includes:
Obtaining for performing the first test module of test the first function in the plurality of test module, wherein, described first function is in the plurality of function indicated by described testing sequence；
Testing module to described first and send control instruction, wherein, described control instruction is used for controlling described first test module and described mainboard to be tested is tested.
3. method according to claim 2, it is characterised in that after sending control instruction to described first test module, described method also includes:
Receiving the test result data that described first test module sends, wherein, described test result data is obtain after described first test module performs described first function of test；
Judge whether described test result data meets default value scope；
If it is judged that described test result data meets described default value scope, then judge that whether described first function is last function of described testing sequence instruction, and when judging last function that described first function is not the instruction of described testing sequence, control the indicated by described testing sequence corresponding to the second function second test module and perform test；When judging last function that described first function is the instruction of described testing sequence, it is determined that described mainboard to be tested is qualified；
If it is judged that described test result data is unsatisfactory for described default value scope, it is determined that described mainboard to be tested is abnormal.
4. method according to claim 3, it is characterised in that after judging that described test result data is unsatisfactory for described default value scope, and before determining that described mainboard to be tested is abnormal, described method also includes:
Again test module to described first and send described control instruction；
Receive the test result data that described first test module sends again；
Judge whether the test result data that described first test module sends again meets described default value scope；
If it is judged that the test result data that described first test module sends again is unsatisfactory for described default value scope, it is judged that whether the number of times sending described control instruction to described first test module has reached threshold value；
Send the number of times of described control instruction reached described threshold value if it is judged that test module to described first, it is determined that described mainboard to be tested is abnormal.
5. the method according to any one of claim 2 to 4, it is characterised in that
Described first test module is the test module indicated by described testing sequence current location, and described test module is following operational blocks which partition system: drive circuit test module, electromechanical testing module, voltage test module, relay contact analog control system module, communication test module, discharge test module.
6. the control device testing equipment, it is characterised in that including:
Acquiring unit, treats, for obtaining, the test logic that testing host carries out testing, and wherein, described test logic includes the testing sequence that multiple functions of described mainboard to be tested are tested；
Test cell, for controlling the test testing equipment of the plurality of function for testing described mainboard to be tested according to described testing sequence.
7. device according to claim 6, it is characterised in that described test equipment includes multiple test module, and described test cell includes:
Obtaining subelement, for obtaining for performing the first test module of test the first function in the plurality of test module, wherein, described first function is in the plurality of function indicated by described testing sequence；
Sending subelement, send control instruction for testing module to described first, wherein, described control instruction is used for controlling described first test module and described mainboard to be tested is tested.
8. device according to claim 7, it is characterised in that described device also includes:
First receives unit, for after sending control instruction to described first test module, receiving the test result data that described first test module sends, wherein, described test result data is obtain after described first test module performs described first function of test；
First judging unit, is used for judging whether described test result data meets default value scope；
Second judging unit, for if it is judged that described test result data meets described default value scope, then judges that whether described first function is last function of described testing sequence instruction,
Control unit, for when judging last function that described first function is not the instruction of described testing sequence, controlling the indicated by described testing sequence corresponding to the second function second test module and perform test；
First determines unit, for when judging last function that described first function is the instruction of described testing sequence, it is determined that described mainboard to be tested is qualified；
Second determines unit, for if it is judged that described test result data is unsatisfactory for described default value scope, it is determined that described mainboard to be tested is abnormal.
9. device according to claim 8, it is characterised in that described device also includes:
Transmitting element, is used for after judging that described test result data is unsatisfactory for described default value scope, and before determining that described mainboard to be tested is abnormal, again tests module to described first and send described control instruction；
Second receives unit, for receiving the test result data that described first test module sends again；
3rd judging unit, for judging whether the test result data that described first test module sends again meets described default value scope；
4th judging unit, for if it is judged that the test result data that described first test module sends again is unsatisfactory for described default value scope, it is judged that whether the number of times sending described control instruction to described first test module has reached threshold value；
3rd determines unit, for if it is judged that test module to described first and send the number of times of described control instruction and reached described threshold value, it is determined that described mainboard to be tested is abnormal.
10. the device according to any one of claim 7 to 9, it is characterised in that
Described first test module is the test module indicated by described testing sequence current location, and described test module is following operational blocks which partition system: drive circuit test module, electromechanical testing module, voltage test module, relay contact analog control system module, communication test module, discharge test module.
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Application publication date: 20160713 |