CN105445353A - Electrochemical combinatorial material chip - Google Patents
Electrochemical combinatorial material chip Download PDFInfo
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- CN105445353A CN105445353A CN201410816018.9A CN201410816018A CN105445353A CN 105445353 A CN105445353 A CN 105445353A CN 201410816018 A CN201410816018 A CN 201410816018A CN 105445353 A CN105445353 A CN 105445353A
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Abstract
The invention relates to the field of experimental technology of material science and particularly relates to an electrochemical combinatorial material chip. A substrate is integrated with a sample area array, and a collector electrode and a to-be-tested sample are arranged in the area; the collector electrode is electrically connected with a connecting finger through an electrode lead, each sample independently forms a current path through the collector electrode, the electrode lead, a connecting finger interface and an external electrochemical tester, and follow-up electrochemical performance analysis is performed; and moreover, the efficiency of the electrochemical performance test can be greatly improved, and the need for a high-throughput electrochemical performance test is completely met.
Description
Technical field
The present invention relates to Experiment of Material Science technical field, refer more particularly to a kind of electrochemistry material chip.
Background technology
Combinatorial material chip approach is [" ACombinatorialApproachtoMaterialsDiscovery " X.-D.Xiang since the mid-90 in last century is invented, XiaodongSun, GabrielBriceno, YulinLou, Kai-AnWang, HauyeeChang, WilliamGregoryWallace-Freedman, Sung-WeiChen, PeterG.Schultz, Science268,1738 (1995)], obtain extensive and huge success in material science research field.Researchers develop numerous high flux experimental study instrument [CombinatorialApproachesasEffectiveToolsintheStudyofPhase DiagramsandComposition-structure-propertyRelationships for various functional material, structured material, Ji-ChengZhao, Prog.Mater.Sci.51,557 (2006)].But the development at present for the high flux experimental technique of functional material chemical property is comparatively delayed.High flux for a certain military service performance of material is studied, launch based on the combined material chip sample obtained by high flux combined material preparation means often, therefore, for the high flux experimental technique of development for functional material chemical property, the combined material chip for Electrochemical Properties first should be developed.Existing combinatorial material chip approach, as the combined material chip for fluorescent material, dielectric material, structured material, only need realize integrated compared with a large amount of samples in zonule, pass through external probe again, as microcell Fluorescence spectrum probe, near-field microwave scanning probe microscopy, nano impress microcell probe etc., the high flux experimental study for its a certain feature can be completed.But the electrochemical property test of material in most cases needs to build electrochemical device or galvanochemistry half device, can be realized by the signal collecting, understand the current collector place contacted with material sample.Early stage combinatorial material chip approach, does not substantially relate to the device comprising electrode structure or half device configuration, therefore cannot realize high flux Electrochemical Properties.Some combinatorial material chip approach for semiconductor material high flux screening [" HighThroughputCombinatorialScreeningofSemiconductorMater ials " SamuelS.Mao of recent new development, Appl.Phys.A105,283 (2011)], although introduce device or half device architecture, but owing to lacking the targeted design for electrochemical property test, be also difficult to the requirement meeting high flux electrochemical property test completely.
Summary of the invention
In view of the above problems, the invention provides a kind of electrochemistry material chip, to solve the defect that the characteristic test of high flux material electrochemical lacks targeted design.
The present invention solves the problems of the technologies described above adopted technical scheme:
A kind of electrochemistry material chip, comprising:
Substrate;
Some sample area, are integrated in described upper surface of substrate and in array distribution, are provided with current collector, and cover the sample of described current collector upper surface in each described sample area;
Interface, is positioned at the side of described substrate;
Non-touching some contact conductors, described contact conductor is located at the upper surface of described substrate and interface, realizes the electrical connection of each described current collector and described interface;
Wherein, described substrate at least have bi-material composition or the different sample of structure.
Preferably, above-mentioned electrochemistry material chip, wherein, is also provided with a restraining barrier between described current collector and described sample.
Preferably, above-mentioned electrochemistry material chip, wherein, the material on restraining barrier is one or more combinations in Ti-N, Ti, Ta.
Preferably, above-mentioned electrochemistry material chip, wherein, described interface is golden finger interface.
Preferably, above-mentioned electrochemistry material chip, wherein, the thickness of described substrate is less than 5mm, and the spacing of adjacent described sample room is greater than 1mm.
Preferably, above-mentioned electrochemistry material chip, wherein, the material of described substrate is low thermal conductivity solid material.
Preferably, above-mentioned electrochemistry material chip, wherein, the array of described sample area be m capable × n row,
M and n is positive integer.
Preferably, above-mentioned electrochemistry material chip, wherein, the material of described current collector and described contact conductor is metal.
Preferably, above-mentioned electrochemistry material chip, wherein, also comprises a thermopair; Described thermopair is located at lower surface or the sample upper surface of described substrate, to monitor the temperature of described sample.
Preferably, above-mentioned electrochemistry material chip, wherein, described thermopair is located in described substrate, sample or current collector, to monitor the temperature of described sample.
Technique scheme tool has the following advantages or beneficial effect:
1, the invention discloses a kind of electrochemistry material chip, can be the research sampling basis of high flux material electrochemical performance, in compared with the integrated preparation and the Electrochemical Properties that the substrate of small size realize a large amount of sample, and according to Research Requirements, the density of sample preparation in combined material chip can adjust in dirigibility, and Efficiency can be increased to several order of magnitude.
2, the invention discloses a kind of electrochemistry material chip, wherein each sample pass through current collector, contact conductor, golden finger interface and an outside electrochemical test independently forms current path, high flux electrochemical property test can be realized by an electric signal scan mode, compared with common probe scanning mode, which mechanism is simple, and testing efficiency is higher.
3, for the high flux research test having discrete thermodynamic condition requirement, electrochemistry material chip disclosed by the invention, by selecting suitable base material and underlying structure, coordinates microcell heating tool substantially can realize sample room adiabatic condition.
Concrete accompanying drawing explanation
By reading the detailed description done non-limiting example with reference to the following drawings, the present invention and feature, profile and advantage will become more apparent.Mark identical in whole accompanying drawing indicates identical part, and also proportionally can not draw accompanying drawing, it focuses on purport of the present invention is shown simultaneously.
Fig. 1 is the vertical view of electrochemistry material chip in the present invention;
Fig. 2 is the partial side view of electrochemistry material chip in the present invention.
Embodiment
Core concept of the present invention is: integrated sample area array in a substrate, and in this region, be provided with current collector and sample to be tested, and the electrical connection of current collector and golden finger is realized by a contact conductor, and then realize each sample independently form current path by current collector, contact conductor, golden finger interface and an outside electro-chemical test instrument, and carry out follow-up test technology.
Below in conjunction with accompanying drawing and specific embodiment, the present invention is further illustrated, but not as limiting to the invention.
Lacking the defect of targeted design for solving the characteristic test of high flux material electrochemical, the invention discloses a kind of electrochemistry material chip, as depicted in figs. 1 and 2.
Fig. 1 is the vertical view of electrochemistry material chip, and wherein this electrochemistry material chip comprises is the substrate 1 of a combined material chip, and this substrate 1 provides space and the mechanical support of preparation for sample; Some uniform sample area 2 are integrated with at the upper surface of this substrate, some sample area 2 is capable in m × distribution of n column array, wherein m, n are positive integer.
In an embodiment of the present invention, as shown in Figure 2, this electrochemistry material chip also includes some current collectors 22, and each current collector 22 is all located in above-mentioned each sample region 2, and is positioned at substrate 1 upper surface; The upper surface of each current collector 22 is also coated with a sample 21 simultaneously, this sample 21 is electrically connected with current collector 22, and preferably, each sample 21 is of a size of 0.5cm × 0.5cm, and the spacing between the neighboring samples 21 of any a line and/or any row is greater than 1mm, is preferably 0.5cm.
In an embodiment of the present invention, this substrate 1 is a rectangle structure and this substrate 1 is of a size of 22.5cm × 7.5cm and the thickness of substrate 1 is less than 5mm, and as a preferred embodiment, this substrate 1 is of a size of 22.5cm × 7.5cm × 500um.Substrate 1 surface is also prepared has 6 row × 20 to arrange the rectangular-shaped sample array of (only partial array being shown in figure), amounts to the sample 21 of 120 kinds of material compositions or structure, measure-alike preferably with sample 21 of the size of this current collector 22.
The side being positioned at this substrate 1 is also integrated with golden finger interface 3, to realize the interfaces interconnect with outside electro-chemical test instrument, some non-touching contact conductors 4 are also provided with at the upper surface of this golden finger interface 3 and substrate 1, to realize the electrical connection of each current collector 22 and golden finger interface 3, chemical property analysis is carried out because current collector 22 and the existence of contact conductor 4 make the test signal of sample 21 generation in electro-chemical test transfer to the outside electro-chemical test instrument be connected with golden finger interface 3, certainly can according to the actual conditions of outside electro-chemical test instrument, select parallel signal acquisition pattern or scan channel pattern flexibly, such as: parallel signal acquisition pattern can be adopted when sample number matches on outside electro-chemical test instrument path and electrochemistry material chip, or scan channel pattern can be adopted based on single pass electro-chemical test instrument.
In addition, because sample on combined material chip 21 density is higher, the live width of contact conductor 4 and wiring pattern need design according to specific experiment demand, and preferably, the live width of each contact conductor 4 is 0.3mm, and the spacing between adjacent electrode lead-in wire 4 is 0.5mm.And in the combined material research of reality, the preparation of each sample 21 may need different thermodynamic conditions, be main research object at thermodynamic condition variable in some cases.Therefore, ideally should heat insulation between each sample 21 on combined material chip.Existing scientific and technological level, is difficult to realize heat insulation in combined material chip as described in the present invention.Therefore, when the thermodynamic condition needing each sample in strict differentiation electrochemistry material chip to prepare, approach heat insulation state as much as possible by following 3 approach: 1) use the thermal source that thermal output area and sample 21 are area matched, make other samples outside heat target sample can only by the heat transfer acquisition heat in chip plane, 2) substrate 1 of electrochemistry material chip selects the alap material of coefficient of heat conductivity to make, 3) due in combined material sample preparation, chemical reaction is provided to sample 21, the available heat conductive process of mass transfer diffusion or crystallization institute energy requirement mostly is and carries out along the direction perpendicular to combined material chip plane, therefore in the preparation of electrochemistry material chip, thinning as much as possible substrate 1 and sample 21 thickness, heat is made to be passed to the path of another sample much larger than chip thickness by a sample in combined material chip plane, reduction electrochemistry material chip thickness also further increases the thermal resistance in chip plane, be conducive to material sample and obtain institute's heat requirement within a short period of time, now thermal source can be cut off, heat is not yet transmitted to other sample places.But as a preferred embodiment, for the CMS (Ca of Choice of substrate materials low thermal conductivity in the present invention
0.5mg
0.25sr
0.25zr
4(PO
4)
6) ceramic as main material, other low thermal conductivity solid materials also can be selected as stupalith, fibrous material, plastic material and Inorganic Non-metallic Materials etc.
In an embodiment of the present invention, the material of current collector 22 and contact conductor 4 is metal, is preferably metal molybdenum, to ensure the stability of electrode material in sample 21 thermal treatment, characterization test and Reusability process.Certainly the material that other meet the metal (as aluminium, copper or gold) of the requirement of Electrochemical characteriration, alloy can also be used for current collector 22 in electrochemistry material chip.
The partial side view for electrochemistry material chip in the present invention as shown in Figure 2, wherein, each sample 21 is all by current collector 22, contact conductor 4 and golden finger interface 3, separately form circuit communication with outside electro-chemical test instrument, non-interfering electric signal sweep test can be realized, simultaneously for preventing the pollution of current collector 22 pairs of samples 21, also there is the restraining barrier (not shown) of a suitable thickness between sample and current collector, this restraining barrier is chosen as Ti-N, Ti, the material that one or more combine and other coefficient of diffusion are lower in Ta, and according to the demand of actual experiment, arrange that thermopair (not shown) is to monitor the temperature of sample in the substrate of combined material chip or the upper surface of sample, also in chip fabrication process, thermopair can be imbedded substrate 1, sample 21, in current collector 22 or above-mentioned restraining barrier.
For above-mentioned sample 21, suitable high Throughput Preparation can be adopted to be deposited in sample area 2, preferably based on the physical vapour deposition (PVD) of point shuttering, certainly the better high Throughput Preparation of result of use can be developed targetedly according to the different characteristics of material, the electrochemistry material chip that simultaneously the present invention relates to, the size of the sample area of its array distribution, shape and arrangement mode (such as annular array and other array way), the area of substrate 1, thickness, shape and material therefor, the area of sample 21, thickness, shape and density, the area of current collector, thickness, shape, density and material therefor, the live width of contact conductor 4 and wiring pattern, the concrete form of golden finger interface 3 all should carry out adjusted design targetedly according to the feature of concrete high-flux electric chemical research activity, and all to the present invention without materially affect, adapt to equally in actual applications.
In sum, a kind of electrochemistry material chip disclosed by the invention, by sample area array integrated in a substrate, and in this region, establish current collector and sample to be tested, and the electrical connection of current collector and golden finger is realized by a contact conductor, and then realize each sample independently form current path by current collector, contact conductor, golden finger interface and an outside electrochemical test, and carry out follow-up test technology, there is following beneficial effect simultaneously:
1, can be the research sampling basis of high flux material electrochemical performance, in compared with the integrated preparation and the Electrochemical Properties that the substrate of small size realize a large amount of sample, and according to Research Requirements, the density of sample preparation in combined material chip can adjust in dirigibility, and Efficiency can be increased to several order of magnitude.
2, each sample pass through current collector, contact conductor, golden finger interface and an outside electrochemical test independently forms current path, high flux electrochemical property test can be realized by an electric signal scan mode, compared with common probe scanning mode, which mechanism is simple, and testing efficiency is higher.
3, for the high flux research test having discrete thermodynamic condition requirement, electrochemistry material chip disclosed by the invention, by selecting suitable base material and underlying structure, coordinates microcell heating tool substantially can realize sample room adiabatic condition.
It should be appreciated by those skilled in the art that those skilled in the art are realizing described change case in conjunction with prior art and above-described embodiment, do not repeat at this.Such change case does not affect flesh and blood of the present invention, does not repeat them here.
Above preferred embodiment of the present invention is described.It is to be appreciated that the present invention is not limited to above-mentioned particular implementation, the equipment wherein do not described in detail to the greatest extent and structure are construed as to be implemented with the common mode in this area; Any those of ordinary skill in the art, do not departing under technical solution of the present invention ambit, the Method and Technology content of above-mentioned announcement all can be utilized to make many possible variations and modification to technical solution of the present invention, or being revised as the Equivalent embodiments of equivalent variations, this does not affect flesh and blood of the present invention.Therefore, every content not departing from technical solution of the present invention, according to technical spirit of the present invention to any simple modification made for any of the above embodiments, equivalent variations and modification, all still belongs in the scope of technical solution of the present invention protection.
Claims (10)
1. an electrochemistry material chip, is characterized in that, comprising:
Substrate;
Some sample area, are integrated in described upper surface of substrate and in array distribution, are provided with current collector, and cover the sample of described current collector upper surface in each described sample area;
Interface, is positioned at the side of described substrate;
Non-touching some contact conductors, described contact conductor is located at the upper surface of described substrate and interface, realizes the electrical connection of each described current collector and described interface;
Wherein, described substrate at least have bi-material composition or the different sample of structure.
2. electrochemistry material chip as claimed in claim 1, is characterized in that, be also provided with a restraining barrier between described current collector and described sample.
3. electrochemistry material chip as claimed in claim 2, is characterized in that, the material on described restraining barrier is one or more combinations in Ti-N, Ti, Ta.
4. electrochemistry material chip as claimed in claim 1, it is characterized in that, described interface is golden finger interface.
5. electrochemistry material chip as claimed in claim 1, it is characterized in that, the thickness of described substrate is less than 5mm, and the spacing of adjacent described sample room is greater than 1mm.
6. electrochemistry material chip as claimed in claim 1, it is characterized in that, the material of described substrate is low thermal conductivity solid material.
7. electrochemistry material chip as claimed in claim 1, is characterized in that, the array of described sample area be m capable × n row,
M and n is positive integer.
8. electrochemistry material chip as claimed in claim 1, it is characterized in that, the material of described current collector and described contact conductor is metal.
9. electrochemistry material chip as claimed in claim 1, is characterized in that, also comprise a thermopair;
Described thermopair is located at lower surface or the sample upper surface of described substrate, to monitor the temperature of described sample.
10. electrochemistry material chip as claimed in claim 9, it is characterized in that, described thermopair is located in described substrate, sample or current collector, to monitor the temperature of described sample.
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Cited By (6)
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| CN105954591A (en) * | 2016-04-29 | 2016-09-21 | 宁波国际材料基因工程研究院有限公司 | Soft-magnetic film material surface resistance high flux testing method |
| CN106483469A (en) * | 2016-09-30 | 2017-03-08 | 成都英诺科技咨询有限公司 | A kind of circuit improving battery testing flux, device and method |
| CN107478694A (en) * | 2017-07-24 | 2017-12-15 | 南昌大学 | A kind of lithium battery material high flux test platform |
| CN110161401A (en) * | 2019-06-05 | 2019-08-23 | 中国科学院理化技术研究所 | A kind of superconduction chip low temperature test device |
| CN110335982A (en) * | 2019-07-28 | 2019-10-15 | 电子科技大学 | A kind of micro-nano integrated Solid State film lithium cell and preparation method thereof |
| CN110646468A (en) * | 2019-09-29 | 2020-01-03 | 天津职业技术师范大学(中国职业培训指导教师进修中心) | Method for characterizing high-throughput materials |
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105954591A (en) * | 2016-04-29 | 2016-09-21 | 宁波国际材料基因工程研究院有限公司 | Soft-magnetic film material surface resistance high flux testing method |
| CN106483469A (en) * | 2016-09-30 | 2017-03-08 | 成都英诺科技咨询有限公司 | A kind of circuit improving battery testing flux, device and method |
| CN106483469B (en) * | 2016-09-30 | 2020-09-01 | 成都亦道科技合伙企业（有限合伙） | Device for improving battery test flux |
| CN107478694A (en) * | 2017-07-24 | 2017-12-15 | 南昌大学 | A kind of lithium battery material high flux test platform |
| CN107478694B (en) * | 2017-07-24 | 2023-05-30 | 南昌大学 | High-flux testing platform for lithium battery material |
| CN110161401A (en) * | 2019-06-05 | 2019-08-23 | 中国科学院理化技术研究所 | A kind of superconduction chip low temperature test device |
| CN110335982A (en) * | 2019-07-28 | 2019-10-15 | 电子科技大学 | A kind of micro-nano integrated Solid State film lithium cell and preparation method thereof |
| CN110335982B (en) * | 2019-07-28 | 2021-04-27 | 电子科技大学 | Micro-nano integrated solid film lithium battery and preparation method thereof |
| CN110646468A (en) * | 2019-09-29 | 2020-01-03 | 天津职业技术师范大学(中国职业培训指导教师进修中心) | Method for characterizing high-throughput materials |
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