CN104599933A - Electron ionization source - Google Patents
Electron ionization source Download PDFInfo
- Publication number
- CN104599933A CN104599933A CN201510010268.8A CN201510010268A CN104599933A CN 104599933 A CN104599933 A CN 104599933A CN 201510010268 A CN201510010268 A CN 201510010268A CN 104599933 A CN104599933 A CN 104599933A
- Authority
- CN
- China
- Prior art keywords
- cartridge
- ion
- electron
- annular element
- electron ionization
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
Abstract
The invention provides an electron ionization source, including an electron source, a repulsion electrode and an ion lens, and further including a first cylindrical component, an annular component and a second cylindrical component, wherein the electron source is arranged at the side part of the first cylindrical component, the repulsion electrode is arranged in the first cylindrical component with two open ends, the annular component is arranged on one side of the first cylindrical component, one side, far away from the first cylindrical component, of the annular component is provided with an outlet, and the inner diameter of the hollow inner part of the annular component is gradually reduced along the emitting direction of ions, the second cylindrical component is arranged in the outlet, and the iron lens is arranged on one side of the second cylindrical component along the emitting direction of the ions. The electron ionization source has the advantage of being high in ion emitting efficiency.
Description
Technical field
The present invention relates to mass spectral analysis, particularly electron ionization sources.
Background technology
Gas chromatography-mass spectrometry instrument is one of important member of field of analytic instrument, the organic molecule of mixing enters mass spectrum after gas chromatographic column is separated, mass spectrum makes organic molecule ionization, and make various ion under the effect in electric field or magnetic field, be separated according to mass-to-charge ratio size, and detecting its corresponding intensity, the mass signal obtained can carry out Qualitative Identification and quantitative analysis to material.
The ion source mainly electron ionization sources (EI) of chromatography of gases-mass spectrometry instrument, EI source is made up of a semi-enclosed ion box and one group of lens, from gas chromatographic column along with the chemical combination material that carrier gas is flowed out enters a semi-enclosed ion box, ion box two ends are placed with a kind of heating can overflow the filament of electronics, electronics enters in ion box and collides with compound molecule, by the chemical bond generation cracking making compound of energy trasfer and electro transfer, thus produce the fragment ion of compound.Under fragment ion is applied with the effect of the lens of direct voltage at one group, transmission enters level Four bar mass analyzer, and selected by level Four bar, the ionic bombardment finally filtered out according to mass analyzer produces the mass signal of response to detector.
The efficiency of transmission of compound molecule in ion box and set of lenses thereof is the most important factor affecting sensitivity of mass spectrometry, the ion box of current commercial gas chromatograph-mass spectrometer device is all adopt columniform tubular structure, ion is under the effect of repeller electrode voltage, set of lenses is entered by the aperture of bottom ion box, because ion box is placed in high vacuum, in order to maintain in ion box, there is certain compound density, on ion box, the hole of ion exit can not be opened too large, generally between 2-4mm.By Ion optics simulation software, electric field simulation is carried out to the ion box on current commercial mass spectrum, show due to the less cause of ion box perforate, outer lens is difficult to the electric field having influence on ion box inside, the electric field of ion box inside is mainly subject to the impact of repeller electrode, Ion optics simulation shows, major part ion all hits on ion box wall, and only have small part ion (only 40%) to enter ionogenic set of lenses by aperture, ion transmission efficiency is low.
Summary of the invention
In order to solve the deficiency in above-mentioned prior art, the invention provides the electronic and ionic source that a kind of ion exit efficiency is high, contributing to the Ionization Efficiency improving compound, improving the sensitivity of mass spectrometer.
The object of the invention is to be achieved through the following technical solutions:
A kind of electron ionization sources, described ionization source comprises electron source, repulsion electrode, ion lens; Described electron ionization sources comprises further:
First cartridge, described electron source is arranged on the sidepiece of described first cartridge; Described repulsion electrode is arranged in the first cartridge of both ends open;
Annular element, described annular element is arranged on the side of described first cartridge, and the side wherein away from described first cartridge has outlet, and the internal diameter along ion exit direction of the empty internal of described annular element shrinks gradually;
Second cartridge, described second cartridge is arranged in described outlet; Described ion lens be arranged on described second cartridge side along on ion exit direction.
Compared with prior art, the beneficial effect that the present invention has is:
Change the Electric Field Distribution in annular element, make the most of ion produced can focus on ion outlet place, make most of ion can export out from ion box, improve ion exit efficiency, and then the sensitivity that improve gas chromatograph-mass spectrometer device be to meet the demand of trace detection.
Accompanying drawing explanation
With reference to accompanying drawing, disclosure of the present invention will be easier to understand.Those skilled in the art it is easily understood that: these accompanying drawings only for illustrating technical scheme of the present invention, and and are not intended to be construed as limiting protection scope of the present invention.In figure:
Fig. 1 is the cutaway view of the electron ionization sources according to the embodiment of the present invention.
Embodiment
Fig. 1 and following description describe Alternate embodiments of the present invention and how to implement to instruct those skilled in the art and to reproduce the present invention.In order to instruct technical solution of the present invention, simplifying or having eliminated some conventional aspects.Those skilled in the art should understand that the modification that is derived from these execution modes or replace will within the scope of the invention.Those skilled in the art should understand that following characteristics can combine to form multiple modification of the present invention in every way.Thus, the present invention is not limited to following Alternate embodiments, and only by claim and their equivalents.
Embodiment:
Fig. 1 schematically illustrates the cutaway view of the electron ionization sources of the embodiment of the present invention, and as shown in Figure 1, described electronic and ionic source comprises:
Electron source, repulsion electrode 12, ion lens 15;
First cartridge 11, described electron source is arranged on the sidepiece of described first cartridge; Described repulsion electrode is arranged in the first cartridge of both ends open;
Annular element 13, described annular element is arranged on the side of described first cartridge, side wherein away from described first cartridge is dull and stereotyped, dull and stereotyped center has ion outlet, the internal diameter along ion exit direction of the empty internal of described annular element shrinks gradually, and hollow space is frustum;
Second cartridge 14, described second cartridge is arranged in described outlet; Described ion lens be arranged on described second cartridge side along on ion exit direction.
The course of work in above-mentioned electronic and ionic source is:
Power supply is that the different parts in electronic and ionic source apply different direct voltages, and e.g., the magnitude of voltage that repeller electrode, the first cartridge, annular element, the second cartridge and ion lens apply is respectively: 2V, 0V, 1V ,-15V ,-20V ,-120V;
Compound analysis enters in the first cartridge, the electronics that electron source produces enters in the first cartridge, clash into compound molecule and make its ionization, ion focusing at described ion outlet place, enters in mass analyzer by the electric field that annular element produces after ion lens focuses on.
By simulative display, 60 mass-to-charge ratioes are the ion of 100, and only have 5 ions to be knocked on ion box body, other ion can be focused and be transferred in mass analyzer.
Claims (3)
1. an electron ionization sources, described ionization source comprises electron source, repulsion electrode, ion lens; It is characterized in that: described electron ionization sources comprises further:
First cartridge, described electron source is arranged on the sidepiece of described first cartridge; Described repulsion electrode is arranged in the first cartridge of both ends open;
Annular element, described annular element is arranged on the side of described first cartridge, and the side wherein away from described first cartridge has outlet, and the internal diameter along ion exit direction of the empty internal of described annular element shrinks gradually;
Second cartridge, described second cartridge is arranged in described outlet; Described ion lens be arranged on described second cartridge side along on ion exit direction.
2. electron ionization sources according to claim 1, is characterized in that: the side away from described first cartridge of described annular element is tabular.
3. electron ionization sources according to claim 1, is characterized in that: described annular element inside is in hollow frustum.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510010268.8A CN104599933B (en) | 2015-01-08 | 2015-01-08 | A kind of electron ionization sources |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510010268.8A CN104599933B (en) | 2015-01-08 | 2015-01-08 | A kind of electron ionization sources |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104599933A true CN104599933A (en) | 2015-05-06 |
| CN104599933B CN104599933B (en) | 2017-12-15 |
Family
ID=53125632
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510010268.8A Active CN104599933B (en) | 2015-01-08 | 2015-01-08 | A kind of electron ionization sources |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104599933B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112106170A (en) * | 2018-05-16 | 2020-12-18 | 英国质谱公司 | Impact ionization spray ion source or electrospray ionization ion source |
| EP3607576A4 (en) * | 2017-04-03 | 2020-12-30 | Perkinelmer Health Sciences Inc. | Ion transfer from electron ionization sources |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6107628A (en) * | 1998-06-03 | 2000-08-22 | Battelle Memorial Institute | Method and apparatus for directing ions and other charged particles generated at near atmospheric pressures into a region under vacuum |
| CN1961403A (en) * | 2003-11-12 | 2007-05-09 | 美国热电集团 | Carbon nanotube electron ionization sources |
| CN102290315A (en) * | 2011-07-21 | 2011-12-21 | 厦门大学 | Ion source suitable for flight time mass spectrometer |
| CN102768936A (en) * | 2006-11-07 | 2012-11-07 | 塞莫费雪科学（不来梅）有限公司 | Ion transfer arrangement |
| CN204464234U (en) * | 2015-01-08 | 2015-07-08 | 聚光科技(杭州)股份有限公司 | A kind of electron ionization sources |
-
2015
- 2015-01-08 CN CN201510010268.8A patent/CN104599933B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6107628A (en) * | 1998-06-03 | 2000-08-22 | Battelle Memorial Institute | Method and apparatus for directing ions and other charged particles generated at near atmospheric pressures into a region under vacuum |
| CN1961403A (en) * | 2003-11-12 | 2007-05-09 | 美国热电集团 | Carbon nanotube electron ionization sources |
| CN102768936A (en) * | 2006-11-07 | 2012-11-07 | 塞莫费雪科学（不来梅）有限公司 | Ion transfer arrangement |
| CN102290315A (en) * | 2011-07-21 | 2011-12-21 | 厦门大学 | Ion source suitable for flight time mass spectrometer |
| CN204464234U (en) * | 2015-01-08 | 2015-07-08 | 聚光科技(杭州)股份有限公司 | A kind of electron ionization sources |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3607576A4 (en) * | 2017-04-03 | 2020-12-30 | Perkinelmer Health Sciences Inc. | Ion transfer from electron ionization sources |
| CN112106170A (en) * | 2018-05-16 | 2020-12-18 | 英国质谱公司 | Impact ionization spray ion source or electrospray ionization ion source |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104599933B (en) | 2017-12-15 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104241075B (en) | Utilize the electron ionization of different electron ionization energies | |
| EP2006882B1 (en) | Ionizing device | |
| JP2014506718A (en) | Method, apparatus and system for mass spectrometry | |
| CN104241076B (en) | Axial magnetic ion source and related ionization method | |
| CN102299038B (en) | Compound ion source | |
| CN105632877A (en) | Double-ion-source quadrupole mass spectrometer based on single-photon ionization and electron bombardment ionization | |
| CN202172061U (en) | Compound ion source | |
| CN103594326A (en) | Double-ionization ion source | |
| CN104599933A (en) | Electron ionization source | |
| US9570282B2 (en) | Ionization within ion trap using photoionization and electron ionization | |
| Ebata et al. | Development of laser ionization mass nanoscope (LIMAS) | |
| CN204464234U (en) | A kind of electron ionization sources | |
| CN103346060A (en) | Vacuum ultraviolet light ionization source and application thereof | |
| CN103295872A (en) | Compound ion source device and mass spectrometer | |
| CN101866811B (en) | Ion source of small-sized magnetic deflection mass spectrometer | |
| CN112424902B (en) | Ionization source and system and method for using the same | |
| CN104412356A (en) | An ion deflector for a mass spectrometer | |
| CN203733758U (en) | Automatic correction device for ion source electrical parameter quality discrimination | |
| CN104425203B (en) | Mass spectrometer | |
| CN103000479B (en) | Novel electronic gun | |
| JP2015502645A (en) | Improvements in or related to mass spectrometry | |
| US6617771B2 (en) | Electron ionization ion source | |
| CN110176385B (en) | High-efficiency ion source for magnetic mass spectrometer | |
| CN202454525U (en) | Compound ion source device and mass spectrometer | |
| Arbelo et al. | Tabletop extreme ultraviolet time‐of‐flight spectrometry for trace analysis of high ionization energy samples |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20171030 Address after: Hangzhou City, Zhejiang province Binjiang District 310052 shore road 760 Applicant after: Focused Photonics (Hangzhou) Inc. Applicant after: Hangzhou Pu Yu development in science and technology Co., Ltd Address before: Hangzhou City, Zhejiang province Binjiang District 310052 shore road 760 Applicant before: Focused Photonics (Hangzhou) Inc. |
|
| GR01 | Patent grant | ||
| GR01 | Patent grant |