CN104391004A - Device and method for testing heat radiation performance of lossless lamp - Google Patents
Device and method for testing heat radiation performance of lossless lamp Download PDFInfo
- Publication number
- CN104391004A CN104391004A CN201410713336.2A CN201410713336A CN104391004A CN 104391004 A CN104391004 A CN 104391004A CN 201410713336 A CN201410713336 A CN 201410713336A CN 104391004 A CN104391004 A CN 104391004A
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- insulating box
- thermal insulating
- light fixture
- temperature
- heat insulating
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Abstract
The invention provides a device and a method for testing heat radiation performance of a lossless lamp. The device comprises a heat insulating box body, a lamp bracket, a heat insulating baffle plate and a temperature measuring device, wherein the heat insulating box body is divided into two parts from the baffle plate, a white total-reflection coating coats at the inner part of the left side of the heat insulating box body, a black coating capable of absorbing light rays coats the inner part of the right side of the heat insulating box body, so that the influence of light radiation to a testing result is prevented, an air circulating system is arranged inside the heat insulating box body, and uniform temperature in the box body is ensured. The method comprises the following steps: firstly, opening the heat insulating baffle plate, turning on the lamp for a short time and then turning off, rapidly closing the heat insulating baffle plate, and measuring the temperature of the left side of the heat insulating box body, wherein the higher the temperature is, the better the heat radiation performance of the lamp is, and the lower the temperature is, the poorer the heat radiation performance is. By adopting the method and the device, rapid measurement in a case of no damage of the lamp can be ensured, the required equipment is simple and is easy to operate; and the quality of the heat radiation performance of the lamp can be accurately tested.
Description
Technical field
The invention belongs to lighting field, be specifically related to a kind of proving installation and method of harmless light fixture heat dispersion.
Background technology
In the LED course of work, the electric energy of 15 ~ 25% converts luminous energy to, and remaining electric energy nearly all converts heat energy to, and the temperature of LED is raised, and when junction temperature is increased beyond maximum temperature (150 DEG C), LED component will be damaged because of overheated.The measuring technique of great power LED cooling performance has a lot, as infrared microfacies instrument method, terminal voltage parametric method, spectroscopic methodology, pin temperature method etc.Infrared microfacies instrument method advantage is that measurement is more convenient, shortcoming is the impact being easy to be subject to LED encapsulation structure, measuring error is larger, response speed is slow, and the state not encapsulating or break a seal should be in when requiring that device is measured, therefore adopt the method to measure LED heat dispersion and can produce LED destructive.Spectroscopic methodology is when utilizing LED junction temperature to raise, and the predominant wavelength of LED will measure LED heat dispersion to the phenomenon of long wavelength's drift, but its practicality and accuracy have to be assessed.Pin temperature method is the thermotransport character utilizing LED component, and by measuring the thermal power of pin temperature and chip dissipation, and thermal resistivity determines LED heat dispersion quality.Pin temperature can adopt thermal infrared imager accurately to obtain, as long as know that the encapsulating structure of LED just can calculate the junction temperature of tested LED.The advantage of pin temperature method can accurately obtain the Temperature Distribution of pin and the dissipated power of chip by other method, and the precision of junction temperature test is also higher, has non-destructive equally, but computation process more complicated.Terminal voltage parametric method is LED heat dispersion measuring method the most frequently used at present.Its principle is according to junction temperature and the proportional characteristic of LED two ends forward voltage, measures LED junction temperature by measuring forward voltage values.First to determine that great power LED flows down the corresponding relation of (generally getting 10mA) terminal voltage and temperature in small electric, then LED is made to be in normal operating conditions, often at regular intervals, deenergization, to LED measuring current pulse, measure the LED two ends forward operating voltage under now junction temperature, then according to the corresponding relation of voltage and temperature, measure the junction temperature of tested LED.The feature of terminal voltage parametric method be testing apparatus simple, there is non-destructive, measuring accuracy is high and transient response good.But measure under small area analysis state due to junction temperature, the virtual junction temperature of the LED that can not run in understanding system in time in Practical Project.
Summary of the invention
The object of the present invention is to provide a kind of proving installation and method of harmless light fixture heat dispersion.
For achieving the above object, present invention employs following technical scheme:
A kind of proving installation of harmless light fixture heat dispersion, comprise body of thermal insulating box and be arranged at the demountable insulating barrier in body of thermal insulating box, body of thermal insulating box is divided into two parts by described insulating barrier, temperature measuring equipment is provided with in the body of thermal insulating box of insulating barrier side, and the inwall of this side body of thermal insulating box is provided with reflection layer, be provided with the lamp bracket for fixing light fixture in the body of thermal insulating box of insulating barrier opposite side, and the inwall of this side body of thermal insulating box is provided with light absorbing zone.
Described reflection layer adopts white total reflection paint coatings, and described light absorbing zone adopts black coating.
Also air circulation system is provided with in described body of thermal insulating box.
A method of testing for harmless light fixture heat dispersion, comprises the following steps:
1) make a body of thermal insulating box, then reflection layer is set on the side inwall of body of thermal insulating box, the opposite side inwall of body of thermal insulating box arranges light absorbing zone;
2) through step 1) after, the light fixture being arranged at light absorbing zone side in body of thermal insulating box is lighted, lighting time≤10min;
3) through step 2) after, close light fixture, and utilize insulating barrier that body of thermal insulating box is divided into two parts from the intersection of reflection layer and light absorbing zone, then utilize temperature measuring equipment to measure the temperature of reflection layer side in body of thermal insulating box.
Described reflection layer adopts white total reflection paint coatings, and described light absorbing zone adopts black coating.
Described step 2) front, utilize air circulation system to make temperature in body of thermal insulating box reach even, then light described light fixture.
Beneficial effect of the present invention is embodied in:
In the closed environment that the present invention provides at body of thermal insulating box, light fixture is lighted the short period, and utilize reflection layer and light absorbing zone to eliminate the impact of optical radiation, then air themperature in measurement space, temperature height illustrates light fixture good heat dispersion performance, and adopt the present invention can measure rapidly the quality of its heat dispersion when not breaking and changing light fixture, equipment needed thereby is simple, processing ease, can measure the quality of light fixture heat dispersion exactly.
Accompanying drawing explanation
Fig. 1 is that timer schematic diagram lighted by light fixture;
Fig. 2 is for measuring timer schematic diagram;
In figure: 1 is body of thermal insulating box, 2 is lamp bracket, and 3 is insulating barrier, and 4 is temperature measuring equipment, and 5 is reflection layer, and 6 is light absorbing zone.
Embodiment
Below in conjunction with drawings and Examples, the present invention is elaborated.
See Fig. 1 and Fig. 2, the proving installation of harmless light fixture heat dispersion of the present invention comprises body of thermal insulating box 1 and is arranged at the demountable insulating barrier 3 in body of thermal insulating box, body of thermal insulating box 1 is divided into two parts by described insulating barrier, temperature measuring equipment 4 is provided with in the body of thermal insulating box of insulating barrier side, and the inwall of this side body of thermal insulating box is provided with reflection layer 5, the lamp bracket 2 for fixing light fixture is provided with in the body of thermal insulating box of insulating barrier opposite side, and the inwall of this side body of thermal insulating box is provided with light absorbing zone 6, described reflection layer adopts white total reflection paint coatings, described light absorbing zone adopts black coating, also air circulation system is provided with in described body of thermal insulating box 1.
Based on the method for testing of the harmless light fixture heat dispersion of the proving installation of above-mentioned harmless light fixture heat dispersion, comprise the following steps:
1) make a body of thermal insulating box 1, then reflection layer 5 is set on the side inwall of body of thermal insulating box, the opposite side inwall of body of thermal insulating box arranges light absorbing zone 6; Described reflection layer adopts white total reflection paint coatings, and described light absorbing zone adopts black coating;
2) through step 1) after, utilize air circulation system to make temperature in body of thermal insulating box 1 reach even, then the light fixture (being fixed on lamp bracket 2) be arranged near light absorbing zone side in body of thermal insulating box is lighted, lighting time≤10min;
3) through step 2) after, close light fixture, and utilize insulating barrier 3 that body of thermal insulating box is divided into two parts from reflection layer 5 and the intersection of light absorbing zone 6, then utilize temperature measuring equipment 4 to measure the temperature of reflection layer side in body of thermal insulating box (namely body of thermal insulating box is interior with in the part of reflection layer).
Embodiment
A measurement mechanism for harmless light fixture heat dispersion quality, comprises body of thermal insulating box 1, lamp bracket 2, insulating barrier 3, temperature measuring equipment 4.
Air circulation system should be installed in body of thermal insulating box inside, ensures to measure homogeneous temperature in front casing, and air circulation system can adopt fan, makes homogeneous temperature in casing by adding strong convection.
Casing should adopt thermal insulation material, avoids ambient temperature on the impact of measurement result; Body of thermal insulating box is two parts (the concrete mounting means of insulating barrier and casing can be: directly inserted the gap of casing by baffle plate) from insulating barrier punishment, inside, left side should fill white total reflection coating (temperature measuring equipment is arranged on the left of this), right side is inner should be filled the black coating of Absorbable rod light (lamp bracket is arranged on the right side of this, for fixing light fixture), optical radiation is absorbed by black coating after the reflection of white total reflection coating, avoids optical radiation on the impact of temperature test (utilizing described temperature measuring equipment) result.
Insulating barrier should adopt insulation material, avoids heat radiation to affect test result.
The present invention adopts thermal shock method to measure the heat dispersal situations of light fixture.Its measuring process is: see Fig. 1 and Fig. 2, first insulating barrier is opened, air circulation system is utilized to make homogeneous temperature in body of thermal insulating box, then close after light fixture being lighted the short period, rapid closedown insulating barrier, and measure the temperature in left side in body of thermal insulating box, temperature is higher, illustrates that the heat dispersion of light fixture is better; Temperature is lower, and heat dispersion is poorer.
Light fixture lighting time is short as far as possible, and reason avoids lighting for a long time making to reach heat balance in casing, impact test effect.Lighting time answers≤10min.
Claims (6)
1. the proving installation of a harmless light fixture heat dispersion, it is characterized in that: comprise body of thermal insulating box (1) and be arranged at the demountable insulating barrier (3) in body of thermal insulating box, body of thermal insulating box (1) is divided into two parts by described insulating barrier, temperature measuring equipment (4) is provided with in the body of thermal insulating box of insulating barrier side, and the inwall of this side body of thermal insulating box is provided with reflection layer (5), the lamp bracket (2) for fixing light fixture is provided with in the body of thermal insulating box of insulating barrier opposite side, and the inwall of this side body of thermal insulating box is provided with light absorbing zone (6).
2. the proving installation of a kind of harmless light fixture heat dispersion according to claim 1, is characterized in that: described reflection layer (5) adopts white total reflection paint coatings, and described light absorbing zone (6) adopts black coating.
3. the proving installation of a kind of harmless light fixture heat dispersion according to claim 1, is characterized in that: described body of thermal insulating box is also provided with air circulation system in (1).
4. a method of testing for harmless light fixture heat dispersion, is characterized in that: comprise the following steps:
1) make a body of thermal insulating box (1), then reflection layer (5) is set on the side inwall of body of thermal insulating box, the opposite side inwall of body of thermal insulating box arranges light absorbing zone (6);
2) through step 1) after, the light fixture being arranged at light absorbing zone side in body of thermal insulating box is lighted, lighting time≤10min;
3) through step 2) after, close light fixture, and utilize insulating barrier (3) that body of thermal insulating box is divided into two parts from reflection layer (5) and the intersection of light absorbing zone (6), then utilize temperature measuring equipment (4) to measure the temperature of reflection layer side in body of thermal insulating box.
5. the method for testing of a kind of harmless light fixture heat dispersion according to claim 4, is characterized in that: described reflection layer (5) adopts white total reflection paint coatings, and described light absorbing zone (6) adopts black coating.
6. the method for testing of a kind of harmless light fixture heat dispersion according to claim 4, is characterized in that: described step 2) front, utilize air circulation system to make body of thermal insulating box (1) interior temperature reach even, then light described light fixture.
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CN201410713336.2A CN104391004B (en) | 2014-11-27 | 2014-11-27 | A kind of test device and method of lossless light fixture heat dispersion |
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CN201410713336.2A CN104391004B (en) | 2014-11-27 | 2014-11-27 | A kind of test device and method of lossless light fixture heat dispersion |
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CN104391004B CN104391004B (en) | 2016-11-16 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111473955A (en) * | 2020-05-20 | 2020-07-31 | 陈国辉 | Method for testing heat dispersion performance of infrared semiconductor light-emitting element |
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JPH09101277A (en) * | 1995-10-06 | 1997-04-15 | Hitachi Ltd | Heat loss measuring instrument |
US6039471A (en) * | 1996-05-22 | 2000-03-21 | Integrated Device Technology, Inc. | Device for simulating dissipation of thermal power by a board supporting an electronic component |
TWI315399B (en) * | 2006-11-01 | 2009-10-01 | Univ Nat Cheng Kung | |
CN101776727A (en) * | 2010-01-21 | 2010-07-14 | 北京工业大学 | Method for measuring working junction temperature and thermal resistance of electronic component by utilizing vacuum environment |
CN102288639A (en) * | 2011-07-14 | 2011-12-21 | 北京工业大学 | Power semiconductor light-emitting diode (LED) thermal resistance rapid batch screening device and method |
CN103076551A (en) * | 2013-01-01 | 2013-05-01 | 北京工业大学 | Thermal resistance composition test device and method for LED (light emitting diode) lamp |
CN103822940A (en) * | 2014-03-12 | 2014-05-28 | 南京航空航天大学 | Method and device for testing thermal performance of LED radiator |
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2014
- 2014-11-27 CN CN201410713336.2A patent/CN104391004B/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH09101277A (en) * | 1995-10-06 | 1997-04-15 | Hitachi Ltd | Heat loss measuring instrument |
US6039471A (en) * | 1996-05-22 | 2000-03-21 | Integrated Device Technology, Inc. | Device for simulating dissipation of thermal power by a board supporting an electronic component |
TWI315399B (en) * | 2006-11-01 | 2009-10-01 | Univ Nat Cheng Kung | |
CN101776727A (en) * | 2010-01-21 | 2010-07-14 | 北京工业大学 | Method for measuring working junction temperature and thermal resistance of electronic component by utilizing vacuum environment |
CN102288639A (en) * | 2011-07-14 | 2011-12-21 | 北京工业大学 | Power semiconductor light-emitting diode (LED) thermal resistance rapid batch screening device and method |
CN103076551A (en) * | 2013-01-01 | 2013-05-01 | 北京工业大学 | Thermal resistance composition test device and method for LED (light emitting diode) lamp |
CN103822940A (en) * | 2014-03-12 | 2014-05-28 | 南京航空航天大学 | Method and device for testing thermal performance of LED radiator |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN111473955A (en) * | 2020-05-20 | 2020-07-31 | 陈国辉 | Method for testing heat dispersion performance of infrared semiconductor light-emitting element |
CN111473955B (en) * | 2020-05-20 | 2022-03-11 | 星紫(上海)新材料技术开发有限公司 | Method for testing heat dispersion performance of infrared semiconductor light-emitting element |
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CN104391004B (en) | 2016-11-16 |
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