CN104237579A - Four-line test probe device and application method thereof - Google Patents
Four-line test probe device and application method thereof Download PDFInfo
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- CN104237579A CN104237579A CN201410475371.5A CN201410475371A CN104237579A CN 104237579 A CN104237579 A CN 104237579A CN 201410475371 A CN201410475371 A CN 201410475371A CN 104237579 A CN104237579 A CN 104237579A
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- 238000003825 pressing Methods 0.000 claims description 3
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Abstract
The invention relates to a four-line test probe device. The four-line test probe device comprises a traction mechanism, a body fixing base, two test probes and a photoelectric sensor. The two test probes are arranged on the two sides of the body fixing base respectively and respectively comprise an elastic support and a probe head arranged on the elastic support, and the elastic support of one test probe is provided with a protruding light-shielding block. The side, close to the test probe with the light-shielding block, of the photoelectric sensor is provided with a notch, and the photoelectric sensor has catadioptric light emitted from one side of the notch to the other side of the notch. The elastic supports deform in the testing process so that the amount of the catadioptric light shielded by the light-shielding block can be changed, and a changed output voltage is generated through the photoelectric sensor so as to control the pressure on a printed circuit board from the test probes. The four-line test probe device has the advantage that the contact force between the four-line test probe device and the printed circuit board can be effectively controlled. The invention further provides an application method of the four-line test probe device.
Description
Technical field
The present invention relates to printed circuit board (PCB) proving installation, particularly relate to a kind of four line test probe apparatus and application processes thereof.
Background technology
Probe tester is generally used for and detects printed circuit board (PCB) (PCB), during detection, needs with test probe and circuit board contacts.Two wires and four lines, two kinds of test probe apparatus are had according to the difference of method of testing.Four line test probe apparatus are for testing the less demanding occasion of resistance accuracy, and four line test probe apparatus then require high low-resistance test occasion for testing resistance.
Four traditional line test probe apparatus test time, probe usually with pin under the speed of 10 ~ 50 times per second with lift pin to contact different test point.For reaching the requirement of test reliably, probe needs firmly to prick on test board.Simultaneously also will ensure that the contact force of probe and test print circuit board is suitable, avoids printed circuit board surface by embroider, this just requires its spring suppport to need to vibrate in suitable rigidity and test process little.But because movement velocity is fast, the test probe apparatus pressure applied on a printed circuit is difficult to control, and after test probe contacts with printed circuit board (PCB), contact force is excessive, causes printed circuit board (PCB) to have scratch or indenture, causes printed circuit board (PCB) to be scrapped.
Summary of the invention
Based on this, be necessary to provide a kind of four line test probe apparatus and application processes thereof that effectively can control the contact forces of test probe and printed circuit board (PCB).
A kind of four line test probe apparatus, for testing printed circuit board (PCB), comprising:
Haulage gear;
Main body holder, is fixed on described haulage gear, and described main body holder can move under the drive of haulage gear;
Two test probes, be arranged at the both sides of described main body holder respectively, two described test probes are symmetrical arranged, described test probe comprises the elastic support be fixed on described main body holder and the probe be arranged on elastic support, and described in one of them, the elastic support of test probe is provided with the light shielding block of protrusion;
Photoelectric sensor, be arranged on described main body holder, and communicate to connect with described haulage gear, described photoelectric sensor offers recess near the side of the described test probe being provided with light shielding block, described photoelectric sensor has by the correlation light of the side transmitting of described recess to the opposite side of described recess, the light quantity of the described correlation light received by described photoelectric sensor is used for measuring in real time, and the output voltage producing that the light quantity with described correlation light changes;
Wherein, described light shielding block can stretch into described recess and block described correlation light, described elastic support produces distortion when testing, changing of the light quantity of the described correlation light blocked to make described light shielding block, and by the output voltage that photoelectric sensor changes, described haulage gear controls described test probe applying pressure on the printed circuit board according to the value of described output voltage.
Wherein in an embodiment, also comprise two rack fixing seats, two described rack fixing seats are arranged at the both sides of described main body holder respectively, and two described elastic supports are individually fixed on two described rack fixing seats.
Wherein in an embodiment, described rack fixing seat also comprises limited block, and described limited block contacts with the end of described elastic support away from described main body holder.
Wherein in an embodiment, also comprise sensor adjusting seat, described sensor adjusting seat is slidably disposed on described main body holder, and described photoelectric sensor is fixed in described sensor adjusting seat.
Wherein in an embodiment, described main body holder offers draw-in groove; Described sensor adjusting seat offers the first screw; Described four line test probe apparatus also comprise set screw, the nut of described set screw is fastened in described draw-in groove, and described set screw and described first screw are screwed, screw thread pair structure is jointly formed to make described set screw and described sensor adjusting seat, rotate described set screw, the position of the relatively described main body holder of adjustable described sensor adjusting seat.
Wherein in an embodiment, described sensor adjusting seat offers bar hole, described main body holder offers the second screw, described four line test probe apparatus also comprise gib screw, described gib screw is arranged in described bar hole, and coordinate with described second screw, and described gib screw can move in described bar hole, is slidably disposed on described main body holder to make sensor adjusting seat.
Wherein in an embodiment, it is trapezoidal probe fixed part that described main body holder comprises xsect, and two described test probes are arranged on the two sides of described probe fixed part respectively, and form angle between two described test probes.
Wherein in an embodiment, described probe comprises linking arm and is arranged at the contact needle on described linking arm one end, and described linking arm is located on described elastic support.
Wherein in an embodiment, described contact needle is blade-shaped structure or needle-like structures.
An application process for four line test probe apparatus, comprises the following steps:
Above-mentioned four line test probe apparatus are provided;
Two test probes on described four line test probe apparatus to be pricked on correction plate on any pad;
Described four line test probe apparatus move to adjust its test probe and put on contact force on correction plate;
The displacement of four line test probe apparatus described in Real-time Obtaining and the output voltage of described photoelectric sensor, to associate described contact force with described output voltage;
According to the relation between described contact force and described output voltage, described four line test probe apparatus are regulated.
Above-mentioned four line test probe apparatus are when testing; test probe brings pressure to bear on printed circuit board (PCB); elastic support can produce distortion; changing of the light quantity of the correlation light blocked to make light shielding block; and by output voltage that photoelectric sensor changes; haulage gear controls test probe applying pressure on a printed circuit according to the value of output voltage; achieve the control of the contact forces to test probe and printed circuit board (PCB); avoid printed circuit board surface by embroider, available protecting printed circuit board (PCB).Further, this control procedure achieves Automated condtrol, saves manpower.
Accompanying drawing explanation
Fig. 1 is the structural representation of four line test probe apparatus in an embodiment;
Fig. 2 is the three-dimensional exploded view of four line test probe apparatus shown in Fig. 1;
Fig. 3 is the concrete structure figure of test probe in four line test probe apparatus shown in Fig. 1;
Fig. 4 is the concrete structure figure of the test probe of another embodiment;
Fig. 5 is the process flow diagram of the application process of four line test probe apparatus in an embodiment;
Fig. 6 is the schematic diagram of the application process of four line test probe apparatus shown in Fig. 5.
Embodiment
For the ease of understanding the present invention, below with reference to relevant drawings, the present invention is described more fully.Better embodiment of the present invention is given in accompanying drawing.But the present invention can realize in many different forms, is not limited to embodiment described herein.On the contrary, provide the object of these embodiments be make to disclosure of the present invention understand more thorough comprehensively.
It should be noted that, when element is called as " being fixed on " another element, directly can there is element placed in the middle in it on another element or also.When an element is considered to " connection " another element, it can be directly connected to another element or may there is centering elements simultaneously.Term as used herein " vertical ", " level ", "left", "right" and similar statement just for illustrative purposes, do not represent it is unique embodiment.
Unless otherwise defined, all technology used herein and scientific terminology are identical with belonging to the implication that those skilled in the art of the present invention understand usually.The object of term used in the description of the invention herein just in order to describe concrete embodiment, is not intended to be restriction the present invention.Term as used herein " and/or " comprise arbitrary and all combinations of one or more relevant Listed Items.
Refer to Fig. 1, four line test probe apparatus 10 in an embodiment, for testing printed circuit board (PCB) (not shown).Four line test probe apparatus 10 comprise haulage gear (not shown), main body holder 100, test probe 200 and photoelectric sensor 300.
Main body holder 100 is fixed on haulage gear, and main body holder 100 can move under the drive of haulage gear.
Test probe 200 is two, and two test probes 200 are arranged at the both sides of main body holder 100 respectively, and two test probes 200 are symmetrical arranged.See also Fig. 2, test probe 200 comprises the elastic support 210 be fixed on main body holder 100 and the probe 230 be arranged on elastic support 210.Elastic support 210 is made of plastics, and has possessed certain elasticity.The elastic support 210 of one of them test probe 200 is provided with the light shielding block 211 of protrusion.
Concrete, it is trapezoidal probe fixed part 160 that main body holder 100 comprises xsect.Two test probes 200 are arranged on the two sides of probe fixed part 160 respectively, and form angle between two test probes 200.
Photoelectric sensor 300 is arranged on main body holder 100, and communicates to connect with haulage gear.Photoelectric sensor 300 offers recess 310 near the side of the test probe 200 being provided with light shielding block 211, and photoelectric sensor 300 has by the correlation light of the side transmitting of recess 310 to the opposite side of recess 310.The light quantity of photoelectric sensor 300 real-time reception correlation light, when the light quantity received by photoelectric sensor 300 changes, the output voltage of photoelectric sensor 300 also can change accordingly.Concrete, the output signal of photoelectric sensor 300 is analog voltage signal, the linear variation relation of light quantity of itself and received correlation light.
Light shielding block 211 can stretch into recess 310 and block correlation light.When testing printed circuit board (PCB), test probe 200 brings pressure to bear on printed circuit board (PCB), elastic support 210 can produce distortion, changing of the light quantity of the correlation light blocked to make light shielding block 211, and by output voltage that photoelectric sensor 300 changes.Haulage gear applies pressure on a printed circuit according to the value control test probe 200 of output voltage.
Concrete, because test probe 200 pairs of printed circuit board (PCB)s apply pressure, the deformation of elastic support 210 can be brought, and the deformation of elastic support 210 can bring the displacement of light shielding block 211 in recess 310, then the control to light shielding block 211 displacement is convertible into the control of the contact forces of test probe 200 and printed circuit board (PCB).Further, the change of the light quantity that the displacement due to light shielding block 211 can bring photoelectric sensor 300 to receive, and then the output voltage changing photoelectric sensor 300.The output voltage of external software to photoelectric sensor 300 is analyzed, when the change of output voltage exceedes threshold value, namely illustrate that the pressure that test probe 200 puts on printed circuit board (PCB) is enough large, haulage gear is stop motion at once, to control the contact forces of test probe 200 and printed circuit board (PCB).Because photoelectric sensor 300 is monitored the light quantity of correlation light in real time, and then can control in real time the contact forces of test probe 200 and printed circuit board (PCB), ensure that the degree of accuracy of contact force size.
Four line test probe apparatus 10 also can comprise two rack fixing seats 400.Two rack fixing seats 400 are arranged at the both sides of main body holder 100 respectively, and two elastic supports 210 are individually fixed on two rack fixing seats 400.
Rack fixing seat 400 also comprises limited block 410, and limited block 410 contacts with the end of elastic support 210 away from main body holder 100.Limited block 410 contacts with the end of elastic support 210, elastic support 210 is made to create certain predeformation, when there is vibration due to high-speed motion in elastic support 210, due to the existence of limited block 410, the vibration that elastic support 210 produces soon can be suppressed, the vibration that during to reduce to test, test probe 200 occurs, improves the degree of accuracy of test.
Be appreciated that in other embodiments, elastic support 210 is directly fixed on main body holder 100, and now, rack fixing seat 400 can omit.
Owing to likely there is error at four line test probe apparatus 10 in assembling or use procedure, thus make photoelectric sensor 300 likely offset voltage initial point.In order to reduce error, make test more accurate, four line test probe apparatus 10 also can comprise sensor adjusting seat 500.Sensor adjusting seat 500 is slidably disposed on main body holder 100.Photoelectric sensor 300 is fixed in sensor adjusting seat 500.By regulating the position of sensor adjusting seat 500 on main body holder 100, the distance between adjustable photoelectric sensor 300 and elastic support 210, and then can to the adjustment of the voltage initial point of photoelectric sensor 300.
Main body holder 100 offers draw-in groove 120.Sensor adjusting seat 500 offers the first screw (not shown).Four line test probe apparatus 10 also comprise set screw 600, and the nut of set screw 600 is fastened in draw-in groove 120, and set screw 600 and the first screw are screwed, and jointly form screw thread pair structure to make set screw 600 and sensor adjusting seat 500.Rotate set screw 600, the position of adjustable sensor adjusting seat 500 opposing body holder 100.
Sensor adjusting seat 500 offers bar hole 510, main body holder 100 offers the second screw 140, four line test probe apparatus 10 also comprise gib screw 700, gib screw 700 is arranged in bar hole 510, and coordinate with the second screw 140, and gib screw 700 can move in bar hole 510, be slidably disposed on main body holder 100 to make sensor adjusting seat 500.
See also Fig. 3, elastic support 210 specifically comprises fixed part 212, first arm of force 214, second arm of force 216 and probe installation portion 218.
First arm of force 214 and second arm of force 216 are strip structure.One end of first arm of force 214 and second arm of force 216 is all arranged on fixed part 212.First arm of force 214 and second arm of force 216 are separately.
Probe installation portion 218 is arranged at first arm of force 214 and second arm of force 216 one end away from fixed part 212.Probe installation portion 218 offers probe mounting groove 218a, the bearing of trend of probe mounting groove 218a is vertical with the bearing of trend of first arm of force 214.First arm of force 214, second arm of force 216 all offers groove 213a with the junction 213 of fixed part 212 and installation portion 218 of popping one's head in.
Probe 230 comprises linking arm 232 and is arranged at the contact needle 234 on linking arm 232 one end, and linking arm 232 is arranged in probe mounting groove 218a.Concrete linking arm 232 is trapezium structure in the present embodiment, and probe mounting groove 218a is also the trapezium structure corresponding with linking arm 232.Fastened by the linking arm of trapezium structure 232 and the trapezium structure mounting groove 218a that pops one's head in, probe 230 is better connected on elastic support 210.
In above-mentioned test probe 200; first arm of force 214, second arm of force 216 all offers groove 213a with the junction 213 of fixed part 212 and installation portion 218 of popping one's head in; these grooves 213a reduces the rigidity of elastic support 210 entirety; utilize the pliability of elastic support 210 self; to avoid in test process test probe 200 and printed circuit board (PCB) hard contact, available protecting printed circuit board (PCB).
The direction extended with first arm of force 214 and second arm of force 216 is for short transverse.The direction extended with the mounting groove 218a that pops one's head in is for Width.Be thickness direction with short transverse and all vertical direction of Width.
Concrete in the present embodiment, each junction 213 of first arm of force 214, second arm of force 216 and fixed part 212 and installation portion 218 of popping one's head in all offers two relative groove 213a.Groove 213a is U-lag, is " work " character form structure to make first arm of force 214, second arm of force 216 with each junction 213 of fixed part 212 and installation portion 218 of popping one's head in.
During due to test, test probe 200 movement velocity is very fast, and the vibration that result in test probe 200 is inevitable, and violent vibration can cause test probe 200 unstable with the contact of printed circuit board (PCB).Test probe 200 can not ensure that in stressed fallback procedures it can move in parallel.After being subject to reaction thrust effect, test probe 200 height in retrogressing moving process can decrease, and side-play amount is comparatively large, thus may occur pricking inclined situation in test process, has a strong impact on the measuring accuracy of test probe 200 device.
Each junction 213 all offers two relative groove 213a, to make junction 213 form " work " character form structure, reduce further the rigidity of elastic support 210.First arm of force 214 and second arm of force 216 effectively can distribute the size of the power suffered by elastic support 210.First arm of force 214 and second arm of force 216 are by distributing the size of the power obtained, each junction 213 offering groove 213a is made to produce corresponding distortion, to make up the deficiency of test probe 200 height, ensure that test probe 200 moves in parallel in fallback procedures, excessive angle of inclination can not be produced, and then ensure that retreating testing needle in moving process can keep geo-stationary with surface of contact, can not there is excessive beat in test probe 200, ensure that the precision of test.
In addition, junction 213 is " work " character form structure, relative to traditional form offering separately arc groove, the stress distribution of its groove 213a inside is more even, stress is not concentrated on a certain bar line, but distribution on the whole, advantageously in the raising in the serviceable life of elastic support 210.
First arm of force 214 and second arm of force 216 arrange in the width direction.Relative second arm of force 216 of first arm of force 214 is closer to contact needle 234, and the length of first arm of force 214 is greater than the length of second arm of force 216.Fixed part 212 is in step-like structure.The second step portion 212b that fixed part 212 comprises first step portion 212a and is connected with first step portion 212a.The height of second step portion 212b is higher than first step portion 212a.First arm of force 214 is connected with first step portion 212a, and second arm of force 216 is connected with second step portion 212b.
The length of first arm of force 214 and second arm of force 216 is all drawn by FEM (finite element) calculation.Elastic support 210 adopts the length of first arm of force 214 to be longer than the form of second arm of force 216, both can ensure that the junction 213 offering groove 213a easily produced distortion, to ensure that contact force between test probe 200 and printed circuit board (PCB) is suitable and operate steadily, can ensure that again elastic support 210 effectively can resist the vibration of Width.
First arm of force 214 and second arm of force 216 are rectangular cylindrical structures.First arm of force 214 comprises the first body of rod 214a and the second body of rod 214b that are connected, and the first body of rod 214a is connected with fixed part 212, and the second body of rod 214b is connected with probe installation portion 218, and the thickness of the first body of rod 214a is greater than the thickness of the second body of rod 214b.
Second arm of force 216 comprises the 3rd body of rod 216a and the 4th body of rod 216b that are connected, and the 3rd body of rod 216a is connected with fixed part 212, and the 4th body of rod 216b is connected with probe installation portion 218, and the thickness of the 3rd body of rod 216a is greater than the thickness of the 4th body of rod 216b.
The form that first arm of force 214 and second arm of force 216 all adopt side thicker than opposite side, effectively can alleviate the quality of elastic support 210 head, and the vibration advantageously in the vibration resistance of test probe 200, particularly Width.
Be appreciated that first arm of force 214 and second arm of force 216 are not limited to rectangular cylindrical structures, also can be the structures such as cylindric.
Specifically in the present embodiment, contact needle 234 is blade-shaped structure.The contact needle 234 of blade-shaped structure, the size of its needle point 234a is about more than 60 microns, and manufacturing cost is lower, is generally used for common printed circuit board (PCB).
The needle point 234a of contact needle 234 is positioned at elastic support 210 on the center line of thickness direction, can avoid the generation of moment in test process, improves the vibration resistance of test probe 200 further.
Be appreciated that in other embodiments, such as, shown in accompanying drawing 4, contact needle 234 also can be needle-like structures.The contact needle 234 of needle-like structures, the size of its needle point 234a is about 20 microns, and manufacturing cost is higher, is applicable to high-density printed circuit board.
Above-mentioned four line test probe apparatus 10 are when testing; test probe 200 brings pressure to bear on printed circuit board (PCB); elastic support 210 can produce distortion; changing of the light quantity of the correlation light blocked to make light shielding block 211; and by output voltage that photoelectric sensor 300 changes; haulage gear applies pressure on a printed circuit according to the value control test probe 200 of output voltage; achieve the control of the contact forces to test probe 200 and printed circuit board (PCB); avoid printed circuit board surface by embroider, available protecting printed circuit board (PCB).Further, this control procedure achieves Automated condtrol, saves manpower.
In addition, see also Fig. 5, additionally provide a kind of application process of four line test probe apparatus, comprise the following steps:
Step S110, provides above-mentioned four line test probe apparatus.
Two test probes on four line test probe apparatus to be pricked on correction plate on any pad by step S120.
See also Fig. 6, two test probes 200 of four line test probe apparatus 10 are pricked on any pad of correction plate 60.Correction plate 60 is an intact printed circuit board (PCB).
Step S130, four line test probe apparatus move to adjust its test probe and put on contact force on correction plate.
Four line test probe apparatus 10 move to adjust its test probe 200 and put on contact force on correction plate 60.When displacement that time of two test probe 200 test signal UNICOMs is designated as zero.
Step S140, the displacement of Real-time Obtaining four line test probe apparatus and the output voltage of photoelectric sensor, to associate contact force with output voltage.
When four line test probe apparatus 10 travel forward a segment distance, the voltage that Real-time Obtaining displacement and photoelectric sensor 300 export.The relation of the output voltage of the deflection after test probe 200 and test print circuit board contacts and photoelectric sensor can be obtained by above-mentioned test, in conjunction with the result that contact force and deflection are tested, contact force is associated with the output voltage of photoelectric sensor.
Step S150, regulates four line test probe apparatus according to the relation between contact force and output voltage.
Contact force is associated with the output voltage of photoelectric sensor, when needing to control contact force, the control that can will convert to again the control of contact force voltage signal.During specific works, a voltage threshold can be set, when the output voltage of photoelectric sensor changes, when reaching voltage threshold, stop the movement of four line test probe apparatus 10, and then control the contact force between test probe 200 and printed circuit board (PCB).
The above embodiment only have expressed several embodiment of the present invention, and it describes comparatively concrete and detailed, but therefore can not be interpreted as the restriction to the scope of the claims of the present invention.It should be pointed out that for the person of ordinary skill of the art, without departing from the inventive concept of the premise, can also make some distortion and improvement, these all belong to protection scope of the present invention.Therefore, the protection domain of patent of the present invention should be as the criterion with claims.
Claims (10)
1. four line test probe apparatus, for testing printed circuit board (PCB), is characterized in that, comprising:
Haulage gear;
Main body holder, is fixed on described haulage gear, and described main body holder can move under the drive of haulage gear;
Two test probes, be arranged at the both sides of described main body holder respectively, two described test probes are symmetrical arranged, described test probe comprises the elastic support be fixed on described main body holder and the probe be arranged on elastic support, and described in one of them, the elastic support of test probe is provided with the light shielding block of protrusion; And
Photoelectric sensor, be arranged on described main body holder, and communicate to connect with described haulage gear, described photoelectric sensor offers recess near the side of the described test probe being provided with light shielding block, described photoelectric sensor has by the correlation light of the side transmitting of described recess to the opposite side of described recess, the light quantity of the described correlation light received by described photoelectric sensor is used for measuring in real time, and the output voltage producing that the light quantity with described correlation light changes;
Wherein, described light shielding block can stretch into described recess and block described correlation light, described elastic support produces distortion when testing, changing of the light quantity of the described correlation light blocked to make described light shielding block, and by the output voltage that photoelectric sensor changes, described haulage gear controls described test probe applying pressure on the printed circuit board according to the value of described output voltage.
2. four line test probe apparatus according to claim 1, it is characterized in that, also comprise two rack fixing seats, two described rack fixing seats are arranged at the both sides of described main body holder respectively, and two described elastic supports are individually fixed on two described rack fixing seats.
3. four line test probe apparatus according to claim 2, it is characterized in that, described rack fixing seat also comprises limited block, and described limited block contacts with the end of described elastic support away from described main body holder.
4. four line test probe apparatus according to claim 1, is characterized in that, also comprise sensor adjusting seat, and described sensor adjusting seat is slidably disposed on described main body holder, and described photoelectric sensor is fixed in described sensor adjusting seat.
5. four line test probe apparatus according to claim 4, is characterized in that, described main body holder offers draw-in groove; Described sensor adjusting seat offers the first screw; Described four line test probe apparatus also comprise set screw, the nut of described set screw is fastened in described draw-in groove, and described set screw and described first screw are screwed, screw thread pair structure is jointly formed to make described set screw and described sensor adjusting seat, rotate described set screw, the position of the relatively described main body holder of adjustable described sensor adjusting seat.
6. four line test probe apparatus according to claim 5, it is characterized in that, described sensor adjusting seat offers bar hole, described main body holder offers the second screw, described four line test probe apparatus also comprise gib screw, and described gib screw is arranged in described bar hole, and coordinate with described second screw, and described gib screw can move in described bar hole, be slidably disposed on described main body holder to make sensor adjusting seat.
7. four line test probe apparatus according to claim 1, it is characterized in that, it is trapezoidal probe fixed part that described main body holder comprises xsect, and two described test probes are arranged on the two sides of described probe fixed part respectively, and form angle between two described test probes.
8. four line test probe apparatus according to claim 1, is characterized in that, described probe comprises linking arm and is arranged at the contact needle on described linking arm one end, and described linking arm is located on described elastic support.
9. four line test probe apparatus according to claim 8, is characterized in that, described contact needle is blade-shaped structure or needle-like structures.
10. an application process for four line test probe apparatus, is characterized in that, comprise the following steps:
Four line test probe apparatus described in claim 1 to claim 9 any one are provided;
Two test probes on described four line test probe apparatus to be pricked on correction plate on any pad;
Described four line test probe apparatus move to adjust its test probe and put on contact force on correction plate;
The displacement of four line test probe apparatus described in Real-time Obtaining and the output voltage of described photoelectric sensor, to associate described contact force with described output voltage;
According to the relation between described contact force and described output voltage, described four line test probe apparatus are regulated.
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| CN201410475371.5A CN104237579B (en) | 2014-09-17 | 2014-09-17 | Four-line test probe device and application method thereof |
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| CN201410475371.5A CN104237579B (en) | 2014-09-17 | 2014-09-17 | Four-line test probe device and application method thereof |
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| CN110658427A (en) * | 2019-10-21 | 2020-01-07 | 南方电网科学研究院有限责任公司 | System and method for detecting liquid discharge characteristic |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110658427A (en) * | 2019-10-21 | 2020-01-07 | 南方电网科学研究院有限责任公司 | System and method for detecting liquid discharge characteristic |
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