CN103983354A - Double-beam splitting system - Google Patents
Double-beam splitting system Download PDFInfo
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- CN103983354A CN103983354A CN201410182251.6A CN201410182251A CN103983354A CN 103983354 A CN103983354 A CN 103983354A CN 201410182251 A CN201410182251 A CN 201410182251A CN 103983354 A CN103983354 A CN 103983354A
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- entrance slit
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Abstract
The invention provides a double-beam splitting system, and belongs to the field of spectrum instrument design. The double-beam splitting system aims at solving the problems that in the prior art, the size is large, the cost is high, and measurement errors are caused by spectrum overlapping. The double-beam splitting system comprises an entrance slit I, an entrance slit II, a diffraction grating and a detector, wherein the entrance slit I and the entrance slit II are arrayed in the length direction, chromatic dispersion is conducted on sample light input through the entrance slit I and reference light input through the entrance slit II respectively through the diffraction grating, and the spectrum of the sample light beam where chromatic dispersion is conducted through the diffraction grating and the spectrum of the reference light beam where chromatic dispersion is conducted through the diffraction grating are arrayed on the detector side by side. According to the double-beam splitting system, the sample light input through the entrance slit I and the reference light input through the entrance slit II are arrayed in the length direction side by side, the spectrum of the sample light beam and the spectrum of the reference light beam are obtained through the diffraction grating and the detector, and therefore the functions of two beam splitting systems are achieved through one beam splitting system, overlapping or crosstalk can not happen to the two light beams, and the problem of measurement errors caused by light beam overlapping is avoided.
Description
Technical field
The invention belongs to spectral instrument design field, be specifically related to a kind of twin-beam beam splitting system.
Background technology
Spectrophotometer is spectroscopic instruments and photometric a kind of combination, is the spectral instrument being most widely used.Utilize spectrophotometer to carry out qualitative and quantitative analysis work, there is the advantages such as the physicochemical characteristic that analysis precision is high, measurement range is wide, analysis speed is fast, analytical sample consumption is few and do not destroy, do not change sample, in the fields such as industrial agricultural production and biochemistry, medical treatment, be widely used, become the powerful of exploring nature, nature remodeling, developing science and technology and produce.
The typical ingredient of spectrophotometer has: light source and illuminator, beam splitting system and detector system etc.Beam splitting system plays decisive role for performance and the version of whole system, not only needs to meet certain index request, and the miniaturization of system is particularly important in some applications.
Press the difference of instrument principle of work, spectrophotometric divides in respect of single beam spectrophotometer and double beam spectrophotometer.Single beam spectrophotometer only has a photometry passage, when use, in this unique light path, successively reference coupon and sample to be tested is measured, and obtains final Specimen Determination result.Wherein, double beam spectrophotometer is made up of two photometry passages, when use, in these two light paths, reference coupon and sample to be tested is measured simultaneously, obtains final Specimen Determination result.Compared with single beam, double beam spectrophotometer can be launched the unstable impact on measurement result by compensatory light, improves the reappearance of measuring accuracy and data.Conventionally double beam spectrophotometer is made up of two independences and identical beam splitting system, and this method for designing can increase volume and the cost of instrument undoubtedly, is unfavorable for instrument miniaturization, lightweight.
Publication number is that the United States Patent (USP) of US5251007 discloses a technical scheme that denomination of invention is Dual-beam spectrometer (double beam spectrophotometer), a kind of method for designing of twin-beam beam splitting system is proposed in this spectrophotometer, it is the slit that slit width direction is arranged side by side by dispersion direction that this beam splitting system has two, incident sample light and reference light respectively, two-beam is distributed in the zones of different of same linear array detector after dispersion, measures thereby realize twin-beam in a beam splitting system simultaneously.The shortcoming of the method is, if entering the spectral range of every Shu Guang of beam splitting system limits not strict, two-beam spectrum easily occurs overlapping and causes measuring error, in addition, wherein the secondary of light beam and multi-level diffraction light spectrum also easily and another Shu Guangpu overlap phenomenon and cause measuring error.
Summary of the invention
The object of the invention is to propose a kind of twin-beam beam splitting system, solve that prior art exists volume this height of great achievement and the problem of the measuring error that causes due to spectra overlapping, make a beam splitting system realize the function of twin-beam beam splitting system.
For solving the problems of the technologies described above, twin-beam beam splitting system of the present invention comprises entrance slit I, entrance slit II, diffraction grating and detector, described entrance slit I and entrance slit II are pressed length direction and are arranged, respectively through the sample light of entrance slit I and entrance slit II input and reference light respectively through diffraction grating dispersion, sample beam spectrum and reference beam spectrum after diffraction grating dispersion are arranged side by side on detector.
Described diffraction grating is concave grating, and described detector is planar array detector, and described sample beam spectrum and reference beam spectrum are arranged side by side on planar array detector.
Described diffraction grating is concave grating, described detector comprises linear array detector I and linear array detector II, described linear array detector I and linear array detector II are arranged side by side, and described sample beam spectrum and reference beam spectrum are arranged respectively in linear array detector I and linear array detector II.
Described diffraction grating is plane grating, and described detector is planar array detector, and described beam splitting system also comprises collimating mirror and imaging lens; Incide on plane grating with directional light after collimating mirror from sample light and the reference light of entrance slit I and the incident of entrance slit II, through plane grating dispersion, converge through imaging lens, sample beam spectrum and reference beam spectrum are arranged side by side respectively on planar array detector again.
Described diffraction grating is plane grating, and described detector comprises linear array detector I and linear array detector II, and described beam splitting system also comprises collimating mirror and imaging lens; Described linear array detector I and linear array detector II are arranged side by side, incide on plane grating with directional light after collimating mirror from sample light and the reference light of entrance slit I and the incident of entrance slit II, through plane grating dispersion, after imaging lens converges, sample beam spectrum and reference beam spectrum are arranged respectively in linear array detector I and linear array detector II again.
Beneficial effect of the present invention is: twin-beam beam splitting system of the present invention is by the entrance slit I and entrance slit II incident sample light and the reference light that are arranged side by side on length direction, and obtain sample beam spectrum and reference beam spectrum through diffraction grating and detector, make a beam splitting system realize the function of twin-beam beam splitting system, adopt the spectrophotometer of twin-beam beam splitting system to reduce a whole set of beam splitting system than traditional double beam spectrophotometer, thereby volume is significantly dwindled; Be beneficial to miniaturization and the lightweight of instrument, and two-beam can overlappingly not crosstalk, avoid the problem of the measuring error bringing because light beam is overlapping.
Brief description of the drawings
Fig. 1 is the twin-beam beam splitting system that adopts concave grating and a planar array detector;
Fig. 2 is the twin-beam beam splitting system that adopts concave grating and two linear array detectors;
Fig. 3 is the twin-beam beam splitting system that adopts plane grating and a planar array detector;
Fig. 4 is the twin-beam beam splitting system that adopts plane grating and two linear array detectors;
Wherein: 1, entrance slit I, 2, entrance slit II, 3, concave grating, 4, planar array detector, 5, sample beam spectrum, 6, reference beam spectrum, 7, linear array detector I, 8, linear array detector II, 9, collimating mirror, 10, plane grating, 11, imaging lens.
Embodiment
Below in conjunction with accompanying drawing, embodiments of the present invention are described further.
Embodiment mono-: referring to accompanying drawing 1, twin-beam beam splitting system of the present invention comprises entrance slit I 1, entrance slit II 2, diffraction grating and detector, described entrance slit I 1 and entrance slit II 2 are arranged side by side by length direction, perpendicular to dispersion direction, the sample light of inputting through entrance slit I 1 and entrance slit II 2 respectively and reference light are respectively through diffraction grating dispersion, sample beam spectrum 5 and reference beam spectrum 6 after diffraction grating dispersion are arranged side by side on detector, do not interfere with each other, thereby make a beam splitting system realize the function of twin-beam beam splitting system.
Described diffraction grating is concave grating 3, and described detector is planar array detector 4.
The spacing of sample beam spectrum 5 and reference beam spectrum 6 is relevant with planar array detector 4 effective pixel area domain sizes, should make full use of planar array detector 4 pixel area domain sizes and prevent that again two-beam spectrum is overlapping.The spacing of entrance slit I 1 and entrance slit II 2, relevant with beam splitting system slit length direction lateral magnification with the spacing of sample beam spectrum 5 and reference beam spectrum 6, for example beam splitting system slit length direction lateral magnification is 1:1, the spacing of entrance slit I 1 and entrance slit II 2, equates with the spacing of sample beam spectrum 5 and reference beam spectrum 6.
Embodiment bis-:
Referring to accompanying drawing 2, the difference of the present embodiment and embodiment mono-is, described diffraction grating is concave grating 3, described detector comprises linear array detector I 7 and linear array detector II 8, linear array detector I 7 and linear array detector II 8 are arranged side by side, and described sample beam spectrum 5 and reference beam spectrum 6 are arranged respectively in linear array detector I 7 and linear array detector II 8.
From sample light and the reference light of entrance slit I 1 and 2 incidents of entrance slit II, after concave grating 3 dispersions, sample beam spectrum 5 and reference beam spectrum 6 are received by linear array detector I 7 and linear array detector II 8 respectively, sample beam spectrum 5 and reference beam spectrum 6 are arranged side by side, do not interfere with each other, thereby make a beam splitting system realize the function of twin-beam beam splitting system.
The spacing of sample beam spectrum 5 and reference beam spectrum 6 is relevant with the interval of linear array detector I 7 and linear array detector II 8, and the minimum interval of for example linear array detector I 7 and linear array detector II 8 is determined by the package dimension of linear array detector I 7 and linear array detector II 8.The spacing of entrance slit I 1 and entrance slit II 2, relevant with beam splitting system slit length direction lateral magnification with the spacing of sample beam spectrum 5 and reference beam spectrum 6, for example beam splitting system slit length direction lateral magnification is 1:1, the spacing of entrance slit I 1 and entrance slit II 2, equates with the spacing of sample beam spectrum 5 and reference beam spectrum 6.
Embodiment tri-:
Referring to accompanying drawing 3, the difference of the present embodiment and embodiment mono-is, described diffraction grating is plane grating 10, and described detector is planar array detector 4, and described beam splitting system also comprises collimating mirror 9 and imaging lens 11; Incide on plane grating 10 with directional light after collimating mirror 9 from sample light and the reference light of entrance slit I 1 and 2 incidents of entrance slit II, through plane grating 10 dispersions, again after imaging lens 11 converges, sample beam spectrum 5 and reference beam spectrum 6 are arranged side by side respectively on planar array detector 4, do not interfere with each other, thereby make a beam splitting system realize the function of twin-beam beam splitting system.
Embodiment tetra-:
Referring to accompanying drawing 4, the difference of the present embodiment and embodiment mono-is, described diffraction grating is plane grating 10, and described detector comprises linear array detector I 7 and linear array detector II 8, and described beam splitting system also comprises collimating mirror 9 and imaging lens 11; Described linear array detector I 7 and linear array detector II 8 are arranged side by side, incide on plane grating 10 with directional light after collimating mirror 9 from sample light and the reference light of entrance slit I 1 and 2 incidents of entrance slit II, through plane grating 10 dispersions, again after imaging lens 11 converges, sample beam spectrum 5 and reference beam spectrum 6 are arranged respectively in linear array detector I 7 and linear array detector II 8, do not interfere with each other, thereby make a beam splitting system realize the function of twin-beam beam splitting system.
The explanation of above embodiment is just for helping to understand method of the present invention and core concept thereof.It should be pointed out that for those skilled in the art, under the premise without departing from the principles of the invention, can also carry out some improvement and modification to the present invention, these improvement and modification also fall in the protection domain of the claims in the present invention.
Claims (5)
1. twin-beam beam splitting system, comprise entrance slit I (1), entrance slit II (2), diffraction grating and detector, it is characterized in that, described entrance slit I (1) and entrance slit II (2) are pressed length direction and are arranged, respectively through the sample light of entrance slit I (1) and entrance slit II (2) input and reference light respectively through diffraction grating dispersion, sample beam spectrum (5) and reference beam spectrum (6) after diffraction grating dispersion are arranged side by side on detector.
2. twin-beam beam splitting system according to claim 1, it is characterized in that, described diffraction grating is concave grating (3), described detector is planar array detector (4), and described sample beam spectrum (5) and reference beam spectrum (6) are arranged side by side on planar array detector.
3. twin-beam beam splitting system according to claim 1, it is characterized in that, described diffraction grating is concave grating (3), described detector comprises linear array detector I (7) and linear array detector II (8), described linear array detector I (7) and linear array detector II (8) are arranged side by side, and described sample beam spectrum (5) and reference beam spectrum (6) are respectively in linear array detector I (7) and the upper arrangement of linear array detector II (8).
4. twin-beam beam splitting system according to claim 1, it is characterized in that, described diffraction grating is plane grating (10), and described detector is planar array detector (4), and described beam splitting system also comprises collimating mirror (9) and imaging lens (11); Incide on plane grating (10) with directional light after collimating mirror (9) from sample light and the reference light of entrance slit I (1) and entrance slit II (2) incident, through plane grating (10) dispersion, converge through imaging lens (11), sample beam spectrum (5) and reference beam spectrum (6) are arranged side by side respectively on planar array detector (4) again.
5. twin-beam beam splitting system according to claim 1, it is characterized in that, described diffraction grating is plane grating (10), described detector comprises linear array detector I (7) and linear array detector II (8), and described beam splitting system also comprises collimating mirror (9) and imaging lens (11); Described linear array detector I (7) and linear array detector II (8) are arranged side by side, incide on plane grating (10) with directional light after collimating mirror (9) from sample light and the reference light of entrance slit I (1) and entrance slit II (2) incident, through plane grating (10) dispersion, converge through imaging lens (11), sample beam spectrum (5) and reference beam spectrum (6) are respectively in linear array detector I (7) and the upper arrangement of linear array detector II (8) again.
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| CN201410182251.6A CN103983354A (en) | 2014-04-30 | 2014-04-30 | Double-beam splitting system |
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Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104296871A (en) * | 2014-10-22 | 2015-01-21 | 清华大学深圳研究生院 | Method for designing double-entrance slit spectrograph and double-entrance slit spectrograph |
| CN104977085A (en) * | 2015-06-29 | 2015-10-14 | 海宁艾可炫照明电器有限公司 | Method for obtaining measurement spectrum |
| CN105444885A (en) * | 2014-07-22 | 2016-03-30 | 联想(北京)有限公司 | Light detection method and electronic equipment |
| WO2016058287A1 (en) * | 2014-10-15 | 2016-04-21 | 清华大学深圳研究生院 | Design method for spectrograph and spectrograph |
| WO2016070494A1 (en) * | 2014-11-07 | 2016-05-12 | 清华大学深圳研究生院 | Design method for high-resolution spectrograph and spectrograph |
| CN107923795A (en) * | 2015-08-04 | 2018-04-17 | 浜松光子学株式会社 | Optical splitter |
| CN110346042A (en) * | 2019-08-01 | 2019-10-18 | 南京邮电大学 | A kind of multisensor stray light elimination spectrometer |
| CN107588851B (en) * | 2016-07-06 | 2019-11-08 | 福州高意光学有限公司 | A kind of folding spectrometer |
| CN110926612A (en) * | 2019-12-18 | 2020-03-27 | 复旦大学 | Multi-channel broadband high-resolution spectrometer |
| WO2023193287A1 (en) * | 2022-04-06 | 2023-10-12 | 杭州佰腾电子科技有限公司 | Dual-optical-path spectrometer, color measurement apparatus, and calibration method |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4172637A (en) * | 1977-12-23 | 1979-10-30 | Beckman Instruments, Inc. | Common beam aperture for dual beam spectrophotometers |
| CN2105064U (en) * | 1991-08-25 | 1992-05-20 | 云南大学 | Multi-channel single probe dual light route simultaneous spectrum meter |
| US5251007A (en) * | 1989-11-27 | 1993-10-05 | Kernforschungszentrum Karlsruhe Gmbh | Dual-beam spectrometer |
| CN102141439A (en) * | 2010-12-24 | 2011-08-03 | 中国科学院长春光学精密机械与物理研究所 | Method for assembling convex grating imaging spectrometer |
| CN102879096A (en) * | 2012-09-04 | 2013-01-16 | 深圳汉谱光彩科技有限公司 | System and method for measuring diffuse illumination reflection spectrum of dual-light path single grating |
| CN103048046A (en) * | 2012-12-21 | 2013-04-17 | 浙江大学 | Double-beam spectrometer |
-
2014
- 2014-04-30 CN CN201410182251.6A patent/CN103983354A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4172637A (en) * | 1977-12-23 | 1979-10-30 | Beckman Instruments, Inc. | Common beam aperture for dual beam spectrophotometers |
| US5251007A (en) * | 1989-11-27 | 1993-10-05 | Kernforschungszentrum Karlsruhe Gmbh | Dual-beam spectrometer |
| CN2105064U (en) * | 1991-08-25 | 1992-05-20 | 云南大学 | Multi-channel single probe dual light route simultaneous spectrum meter |
| CN102141439A (en) * | 2010-12-24 | 2011-08-03 | 中国科学院长春光学精密机械与物理研究所 | Method for assembling convex grating imaging spectrometer |
| CN102879096A (en) * | 2012-09-04 | 2013-01-16 | 深圳汉谱光彩科技有限公司 | System and method for measuring diffuse illumination reflection spectrum of dual-light path single grating |
| CN103048046A (en) * | 2012-12-21 | 2013-04-17 | 浙江大学 | Double-beam spectrometer |
Cited By (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105444885A (en) * | 2014-07-22 | 2016-03-30 | 联想(北京)有限公司 | Light detection method and electronic equipment |
| US10345149B2 (en) | 2014-10-15 | 2019-07-09 | Graduate School At Shenzhen, Tsinghua University | Method of spectrometer and spectrometer |
| WO2016058287A1 (en) * | 2014-10-15 | 2016-04-21 | 清华大学深圳研究生院 | Design method for spectrograph and spectrograph |
| CN104296871B (en) * | 2014-10-22 | 2016-03-02 | 清华大学深圳研究生院 | The method for designing of a kind of pair of entrance slit spectrometer and two entrance slit spectrometer |
| WO2016061910A1 (en) * | 2014-10-22 | 2016-04-28 | 清华大学深圳研究生院 | Method for designing double-entrance slit spectrograph, and double-entrance slit spectrograph |
| CN104296871A (en) * | 2014-10-22 | 2015-01-21 | 清华大学深圳研究生院 | Method for designing double-entrance slit spectrograph and double-entrance slit spectrograph |
| WO2016070494A1 (en) * | 2014-11-07 | 2016-05-12 | 清华大学深圳研究生院 | Design method for high-resolution spectrograph and spectrograph |
| CN104977085A (en) * | 2015-06-29 | 2015-10-14 | 海宁艾可炫照明电器有限公司 | Method for obtaining measurement spectrum |
| CN104977085B (en) * | 2015-06-29 | 2017-08-25 | 杭州路弘科技有限公司 | The method for obtaining measure spectrum |
| CN107923795A (en) * | 2015-08-04 | 2018-04-17 | 浜松光子学株式会社 | Optical splitter |
| US10539461B2 (en) | 2015-08-04 | 2020-01-21 | Hamamatsu Photonics K.K. | Spectroscope |
| US10871397B2 (en) | 2015-08-04 | 2020-12-22 | Hamamatsu Photonics K.K. | Spectroscope |
| CN107588851B (en) * | 2016-07-06 | 2019-11-08 | 福州高意光学有限公司 | A kind of folding spectrometer |
| CN110346042A (en) * | 2019-08-01 | 2019-10-18 | 南京邮电大学 | A kind of multisensor stray light elimination spectrometer |
| CN110346042B (en) * | 2019-08-01 | 2022-03-08 | 南京邮电大学 | Multi-sensor stray light elimination spectrometer |
| CN110926612A (en) * | 2019-12-18 | 2020-03-27 | 复旦大学 | Multi-channel broadband high-resolution spectrometer |
| WO2023193287A1 (en) * | 2022-04-06 | 2023-10-12 | 杭州佰腾电子科技有限公司 | Dual-optical-path spectrometer, color measurement apparatus, and calibration method |
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Application publication date: 20140813 |