CN103837818A - Gapless two-part structure for PCB testing - Google Patents

Gapless two-part structure for PCB testing Download PDF

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Publication number
CN103837818A
CN103837818A CN201210488552.2A CN201210488552A CN103837818A CN 103837818 A CN103837818 A CN 103837818A CN 201210488552 A CN201210488552 A CN 201210488552A CN 103837818 A CN103837818 A CN 103837818A
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China
Prior art keywords
probe
support plate
test
needle plate
tested
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CN201210488552.2A
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Chinese (zh)
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CN103837818B (en
Inventor
肖秋生
郑建生
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Kunshan Wisdom Electronics Co Ltd
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Kunshan Wisdom Electronics Co Ltd
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Priority to CN201210488552.2A priority Critical patent/CN103837818B/en
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Abstract

The invention discloses a gapless two-part structure for PCB testing. The gapless two-part structure comprises an upper pin plate, an upper carrier plate, a lower carrier plate and a lower pin plate which are arranged vertically from top down. A space for vacuum closing is arranged between the upper pin plate and the upper carrier plate as well as between the lower carrier plate and the lower pin plate. A PCB to be tested is arranged between the upper carrier plate and the lower carrier plate. During vacuum closing, long probing pins and short probing pins can pass through probing pin through holes and meanwhile contact pin points to be tested. A hanger mechanism is also provided, wherein the hanger mechanism is capable of only enabling the long probing pins to pass through the probing pin through holes and contact the pin points to be tested during vacuum releasing. The gapless two-part structure has the advantages of being simple in structure and convenient to operate and implement, and can guarantee the probing pins causing interference or need not to be tested to be separated conveniently according to the test requirements after a first test, so that a second test can be carried out conveniently and results of the second test are guaranteed; and the two-part test of the PCB can be finished with only one vacuum absorbing process, thereby improving test efficiency and saving test cost.

Description

Gapless two-part structure for pcb board test
Technical field
The present invention relates to a kind of pcb board proving installation, specifically relate to a kind of pcb board test gapless two-part structure.
Background technology
Pcb board needs to experience a lot of links in process of production, wherein each link needs to carry out corresponding quality of testing testing product, the test that pcb board measurement jig is pcb board provides a good platform, basic functional principle is to utilize the tested point on pcb board to be connected with the corresponding point in test machine, realizes final test by corresponding program.
Vacuum tool is that pcb board is tested conventional tool, mainly comprise, counterdie and underframe three parts, on, counterdie mainly comprises, lower needle plate, on, lower support plate, probe assembly and seal assembly, underframe includes interface version, on, lower support plate is for the protection of pcb board to be measured and correcting test pin mark, on, lower needle plate is for probe assemblies such as fixing elongated probe and common probes, seal assembly for upper and lower mould in conjunction with time guarantee that tool inside is in sealing state, on, the test pin mark of counterdie is connected with wire with the pin mark in interface plate, pin mark in interface plate is corresponding one by one with the pin mark on test machine again, but, along with pcb board function is more and more stronger, line construction is also more complicated, need the point of test also more and more, and the test probe of corresponding vacuum tool is also more and more, therefore, often can run in some test processs exists some can disturb the situation that contacts pcb board with the probe that does not need test, and then affect the test result of other probes, prior art solution to the problems described above is to use the probe of manually pulling out one by one these interference and not needing test, test again, while needs, again turn back to again, this mode can cause cover rate deficiency the containing of test part to product test, and in plug probe process, easily make needle guard skew, cause probe cannot prepare engaged test point, affect test result.Also there is the measurement jig that adopts two-part, fixing needle plate and movable needle plate are set, all the time the probe that touches test pin mark while repeatedly test is made as stationary probe, be fixed on fixing needle plate, in some test processs can disturb or do not need test probe to be made as movable probe, be fixed on movable needle plate, adjust probe and whether contact with test point by adjusting the distance of the relative test point of movable needle plate, thereby having solved to a certain extent in test process all probes contacts pcb board simultaneously and affects the problem of test result, but this mode need to arrange fixing needle plate and movable needle plate, movable needle plate drives by certain driving mechanism, this structure is comparatively complicated, implement and bring a lot of inconvenience.
Summary of the invention
In order to solve the problems of the technologies described above, the present invention proposes a kind of pcb board test gapless two-part structure, have simple in structure, the advantage that convenient operation is implemented, and by length is set, short probe is in conjunction with the accurate positioning action of hitch gear, needle plate and support plate spacing can accurately control vacuum relieving time, thereby can guarantee after once testing, require will disturb very easily or do not need the probe of test to depart from according to measuring, facilitate the carrying out of second test, guarantee the result of second test, the present invention only need once inhale vacuum process can complete the test of pcb board two-part, therefore, can improve testing efficiency, and then saving testing cost.
Technical scheme of the present invention is achieved in that
A kind of gapless two-part structure for pcb board test, to use direction as benchmark, comprise the vertical upper needle plate that from top to bottom order arranges, upper support plate, lower support plate and lower needle plate, between described upper support plate and described upper needle plate and between described lower support plate and described lower needle plate, there is the space for vacuum engagement, between described upper support plate and described lower support plate, pcb board to be measured is set, while repeatedly test on corresponding pcb board to be measured, need all the time the pin mark to be tested of probe contact, on described upper needle plate He on described lower needle plate, be vertically equipped with respectively long probe, the pin mark to be tested that does not need probe to contact all the time while repeatedly test on corresponding pcb board to be measured, on described upper needle plate He on described lower needle plate, be vertically equipped with respectively short probe, corresponding each probe, described upper support plate and described lower support plate are provided with the probe through hole of probe described in correcting, when vacuum engagement, described long probe and described short probe can touch described pin mark to be tested through described probe through hole simultaneously, separately be provided with hitch gear, described hitch gear can only make described long probe touch described pin mark to be tested through described probe through hole in the time that vacuum is decontroled.
As a further improvement on the present invention, the structure that described hitch gear can only make described long probe touch described pin mark to be tested through described probe through hole in the time that vacuum is decontroled is: described hitch gear comprises upper hanging hook assembly, lower draw-bar and driving mechanism, the upper support plate hook that described upper hanging hook assembly comprises hook and arranges with described upper hook interlock, described driving mechanism is installed on described upper needle plate, on described upper needle plate, be installed with fixed block, described upper hanging hook assembly middle part is hinged with described fixed block, described lower draw-bar is fixedly connected with described lower needle plate, described driving mechanism can drive hook portion that described upper hanging hook assembly makes described upper hook towards with the hook portion that departs from described lower draw-bar, the hook portion that makes described upper support plate hook towards with depart from described upper support plate.
As a further improvement on the present invention, described driving mechanism is cylinder.
The invention has the beneficial effects as follows: the present invention proposes a kind of pcb board test gapless two-part structure, to use direction as benchmark, comprise the vertical upper needle plate that from top to bottom order arranges, upper support plate, lower support plate and lower needle plate, between described upper support plate and described upper needle plate and between described lower support plate and described lower needle plate, there is the space for vacuum engagement, between described upper support plate and described lower support plate, pcb board to be measured is set, while repeatedly test on corresponding pcb board to be measured, need all the time the pin mark to be tested of probe contact, on described upper needle plate He on described lower needle plate, be vertically equipped with respectively long probe, the pin mark to be tested that does not need probe to contact all the time while repeatedly test on corresponding pcb board to be measured, on described upper needle plate He on described lower needle plate, be vertically equipped with respectively short probe, corresponding each probe, described upper support plate and described lower support plate are provided with the probe through hole of probe described in correcting, when vacuum engagement, described long probe and described short probe can touch described pin mark to be tested through described probe through hole simultaneously, separately be provided with hitch gear, described hitch gear can only make described long probe touch described pin mark to be tested through described probe through hole in the time that vacuum is decontroled, like this, in pcb board vacuum tool test process, by the control positioning action in conjunction with hitch gear that arranges of long probe and short probe, the pin mark to be tested that the pin mark to be tested that can need all the time contact when repeatedly testing does not need when repeatedly testing to contact is all the time divided into two sections to be tested, thereby can guarantee after once testing, require will disturb very easily or do not need the probe of test to depart from according to measuring, facilitate the carrying out of second test, guarantee the result of second test, because this structure only need once be inhaled vacuum process and can be completed pcb board two-part test, therefore, can improve testing efficiency, save testing cost, and the present invention has simple in structure, the advantage that convenient operation is implemented.
Brief description of the drawings
Fig. 1 is the structural representation (vacuum engagement after, long probe and short probe simultaneously touch the to be tested pin mark of to be measured pcb board) of the present invention while testing for the first time;
Fig. 2 is the structural representation of the present invention while testing for the second time (vacuum decontrol after, only long probe touches the pin mark to be tested of pcb board to be measured).
By reference to the accompanying drawings, make the following instructions:
1---upper needle plate 2---upper support plate
3---lower support plate 4---lower needle plate
5---space 6---pcb board to be measured
7---long probe 8---short probe
9---hitch gear 91---lower draw-bar
The upper hook of 92---driving mechanisms 93---
94---upper support plate hook
Embodiment
As depicted in figs. 1 and 2, a kind of gapless two-part structure for pcb board test, to use direction as benchmark, comprise the vertical upper needle plate 1 that from top to bottom order arranges, upper support plate 2, lower support plate 3 and lower needle plate 4, between described upper support plate and described upper needle plate and between described lower support plate and described lower needle plate, there is the space 5 for vacuum engagement, between described upper support plate and described lower support plate, pcb board 6 to be measured is set, while repeatedly test on corresponding pcb board to be measured, need all the time the pin mark to be tested of probe contact, on described upper needle plate He on described lower needle plate, be vertically equipped with respectively long probe 7, the pin mark to be tested that does not need probe to contact all the time while repeatedly test on corresponding pcb board to be measured, on described upper needle plate He on described lower needle plate, be vertically equipped with respectively short probe 8, corresponding each probe, described upper support plate and described lower support plate are provided with the probe through hole of probe described in correcting, when vacuum engagement, described long probe and described short probe can touch described pin mark to be tested through described probe through hole simultaneously, separately be provided with hitch gear 9, described hitch gear can only make described long probe touch described pin mark to be tested through described probe through hole in the time that vacuum is decontroled, like this, in pcb board vacuum tool test process, by the control positioning action in conjunction with hitch gear that arranges of long probe and short probe, the pin mark to be tested that the pin mark to be tested that can need all the time contact when repeatedly testing does not need when repeatedly testing to contact is all the time divided into two sections to be tested, thereby can guarantee after once testing, require will disturb very easily or do not need the probe of test to depart from according to measuring, facilitate the carrying out of second test, guarantee the result of second test, because this structure only need once be inhaled vacuum process and can be completed pcb board two-part test, therefore, can improve testing efficiency, save testing cost.
Preferably, the structure that described hitch gear can only make described long probe touch described pin mark to be tested through described probe through hole in the time that vacuum is decontroled is: described hitch gear comprises upper hanging hook assembly, lower draw-bar 91 and driving mechanism 92, the upper support plate hook 94 that described upper hanging hook assembly comprises hook 93 and arranges with described upper hook interlock, described driving mechanism is installed on described upper needle plate, on described upper needle plate, be installed with fixed block, described upper hanging hook assembly middle part is hinged with described fixed block, described lower draw-bar is fixedly connected with described lower needle plate, described driving mechanism can drive hook portion that described upper hanging hook assembly makes described upper hook towards with the hook portion that departs from described lower draw-bar, the hook portion that makes described upper support plate hook towards with depart from described upper support plate.
Preferably, described driving mechanism is cylinder.
Pcb board test of the present invention is applicable to pcb board vacuum tool by gapless two-part structure, and specific works principle is as follows:
Before pcb board test, upper needle plate, upper support plate, lower support plate and lower needle plate order arrange, pcb board is placed between upper support plate and lower support plate, now, between upper support plate and upper needle plate and between lower support plate and lower needle plate, there is the space for vacuum engagement, long probe and short probe all do not touch the tested point of PCB to be measured, and driving mechanism cylinder is connected with upper hanging hook assembly, not start of hitch gear, while test for the first time, not start of hitch gear, carry out vacuum engagement, under the effect of vacuum engagement, space contraction between the space between upper support plate and upper needle plate and lower support plate and lower needle plate, make long probe and short probe touch the pin mark to be tested of pcb board to be measured through probe through hole simultaneously, complete after long and short probe engaged test, need to test for the second time time, hitch gear start, driving mechanism drives upper hanging hook assembly rotation, make the hook portion of upper hook of hanging hook assembly towards the hook portion of lower draw-bar, the hook portion of the upper support plate hook of upper hanging hook assembly is towards upper support plate, start afterwards to let out vacuum, now, upper support plate and lower support plate move toward one another, upper needle plate is gone up support plate motion dorsad, lower needle plate descends support plate motion dorsad, make the space between space and lower needle plate and the lower support plate between support plate and upper needle plate start to widen, simultaneously, the motion of upper needle plate drives the upper hanging hook assembly being hinged with it to go up dorsad support plate motion, the motion of lower needle plate drives the lower draw-bar being connected with it to descend dorsad support plate motion, going up the hook portion of the upper hook of hanging hook assembly moves towards the hook portion of lower draw-bar, the hook portion of the upper support plate hook of upper hanging hook assembly is moved towards upper support plate, therefore, can be by pre-set upper hook and the move distance of upper support plate hook and the drop distance of long probe and short probe, realize and in the time that vacuum is decontroled, only make described long probe touch pin mark to be tested through probe through hole, and short probe does not touch pin mark to be tested, test for the second time, after having tested for the second time, the reverse start of driving mechanism, hanging hook assembly rotation in reverse drive, make the hook portion automatic trip of upper hook of hanging hook assembly from the hook portion of lower draw-bar, the hook portion automatic trip of the upper support plate hook of upper hanging hook assembly is from upper support plate.
Above embodiment is with reference to accompanying drawing; to a preferred embodiment of the present invention will be described in detail; those skilled in the art is by above-described embodiment being carried out to amendment or the change on various forms, but do not deviate from the situation of essence of the present invention, within all dropping on protection scope of the present invention.

Claims (3)

1. a gapless two-part structure for pcb board test, it is characterized in that: to use direction as benchmark, comprise the vertical upper needle plate (1) that from top to bottom order arranges, upper support plate (2), lower support plate (3) and lower needle plate (4), between described upper support plate and described upper needle plate and between described lower support plate and described lower needle plate, there is the space (5) for vacuum engagement, between described upper support plate and described lower support plate, pcb board to be measured (6) is set, while repeatedly test on corresponding pcb board to be measured, need all the time the pin mark to be tested of probe contact, on described upper needle plate He on described lower needle plate, be vertically equipped with respectively long probe (7), the pin mark to be tested that does not need probe to contact all the time while repeatedly test on corresponding pcb board to be measured, on described upper needle plate He on described lower needle plate, be vertically equipped with respectively short probe (8), corresponding each probe, described upper support plate and described lower support plate are provided with the probe through hole of probe described in correcting, when vacuum engagement, described long probe and described short probe can touch described pin mark to be tested through described probe through hole simultaneously, separately be provided with hitch gear (9), described hitch gear can only make described long probe touch described pin mark to be tested through described probe through hole in the time that vacuum is decontroled.
2. pcb board test gapless two-part structure according to claim 1, it is characterized in that: the structure that described hitch gear can only make described long probe touch described pin mark to be tested through described probe through hole in the time that vacuum is decontroled is: described hitch gear comprises upper hanging hook assembly, lower draw-bar (91) and driving mechanism (92), the upper support plate hook (94) that described upper hanging hook assembly comprises hook (93) and arranges with described upper hook interlock, described driving mechanism is installed on described upper needle plate, on described upper needle plate, be installed with fixed block, described upper hanging hook assembly middle part is hinged with described fixed block, described lower draw-bar is fixedly connected with described lower needle plate, described driving mechanism can drive hook portion that described upper hanging hook assembly makes described upper hook towards with the hook portion that departs from described lower draw-bar, the hook portion that makes described upper support plate hook towards with depart from described upper support plate.
3. pcb board test gapless two-part structure according to claim 1, is characterized in that: described driving mechanism is cylinder.
CN201210488552.2A 2012-11-26 2012-11-26 Pcb board test gapless two-part structure Active CN103837818B (en)

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Application Number Priority Date Filing Date Title
CN201210488552.2A CN103837818B (en) 2012-11-26 2012-11-26 Pcb board test gapless two-part structure

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Application Number Priority Date Filing Date Title
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CN103837818B CN103837818B (en) 2016-12-21

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
PL126882U1 (en) * 2017-12-15 2019-06-17 Fitech Spółka Z Ograniczoną Odpowiedzialnością Connection assembly of mechanical-electric adapter of the printed circuit boards tester

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4288745A (en) * 1980-07-22 1981-09-08 Ostby & Barton Company Printed circuit board testing means
US4667155A (en) * 1986-01-07 1987-05-19 Virginia Panel Corporation Modular molded vacuum test fixture
US5500606A (en) * 1993-09-16 1996-03-19 Compaq Computer Corporation Completely wireless dual-access test fixture
US6066957A (en) * 1997-09-11 2000-05-23 Delaware Capital Formation, Inc. Floating spring probe wireless test fixture
CN201278012Y (en) * 2008-08-25 2009-07-22 昆山鸿汉电子有限公司 Vacuum two phase type tool
CN101813712A (en) * 2009-02-19 2010-08-25 昆山威典电子有限公司 Connecting needle for wired fixture
CN202994971U (en) * 2012-11-26 2013-06-12 昆山威典电子有限公司 Gapless two-stage structure for PCB tests

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4288745A (en) * 1980-07-22 1981-09-08 Ostby & Barton Company Printed circuit board testing means
US4667155A (en) * 1986-01-07 1987-05-19 Virginia Panel Corporation Modular molded vacuum test fixture
US5500606A (en) * 1993-09-16 1996-03-19 Compaq Computer Corporation Completely wireless dual-access test fixture
US6066957A (en) * 1997-09-11 2000-05-23 Delaware Capital Formation, Inc. Floating spring probe wireless test fixture
CN201278012Y (en) * 2008-08-25 2009-07-22 昆山鸿汉电子有限公司 Vacuum two phase type tool
CN101813712A (en) * 2009-02-19 2010-08-25 昆山威典电子有限公司 Connecting needle for wired fixture
CN202994971U (en) * 2012-11-26 2013-06-12 昆山威典电子有限公司 Gapless two-stage structure for PCB tests

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
PL126882U1 (en) * 2017-12-15 2019-06-17 Fitech Spółka Z Ograniczoną Odpowiedzialnością Connection assembly of mechanical-electric adapter of the printed circuit boards tester

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Denomination of invention: Gapless two-part structure for PCB testing

Effective date of registration: 20170301

Granted publication date: 20161221

Pledgee: Bank of Suzhou Limited by Share Ltd Kunshan branch

Pledgor: KUNSHAN WISDOM ELECTRONICS CO., LTD.

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Date of cancellation: 20190429

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Pledgee: Bank of Suzhou Limited by Share Ltd Kunshan branch

Pledgor: KUNSHAN WISDOM ELECTRONICS CO., LTD.

Registration number: 2017320010011

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