CN103187381A - Lead frame packaging structure - Google Patents

Lead frame packaging structure Download PDF

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Publication number
CN103187381A
CN103187381A CN2011104565017A CN201110456501A CN103187381A CN 103187381 A CN103187381 A CN 103187381A CN 2011104565017 A CN2011104565017 A CN 2011104565017A CN 201110456501 A CN201110456501 A CN 201110456501A CN 103187381 A CN103187381 A CN 103187381A
Authority
CN
China
Prior art keywords
lead frame
encapsulation structure
wire portion
chip
frame encapsulation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN2011104565017A
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Chinese (zh)
Other versions
CN103187381B (en
Inventor
白育彰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Novatek Microelectronics Corp
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Novatek Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Novatek Microelectronics Corp filed Critical Novatek Microelectronics Corp
Priority to CN201110456501.7A priority Critical patent/CN103187381B/en
Publication of CN103187381A publication Critical patent/CN103187381A/en
Application granted granted Critical
Publication of CN103187381B publication Critical patent/CN103187381B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45144Gold (Au) as principal constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements

Abstract

The invention discloses a lead frame packaging structure which comprises at least one bearing seat and at least one lead frame, wherein the bearing seats are used for bearing a chip, each lead frame comprises a first end which is electrically connected with a printed circuit board, a second end which is electrically connected with the chip and a lead part which is connected with the first end and the second end, and the height of the lead part is lower than the heights of the first end and the second end.

Description

Lead frame encapsulation structure
Technical field
The present invention relates to a kind of lead frame encapsulation structure, relate in particular to the lead frame encapsulation structure of the low electromagnetism of a kind of tool and low cross-talk.
Background technology
Integrated circuit (integrated circuit, IC) encapsulation can be according to the loading material of chip, be divided into leaded package (lead frame package), rigid plastics support plate encapsulation (laminate substratepackage), soft support plate encapsulation (tape package), and ceramic substrate encapsulation (ceramic package).Wherein, leaded package possesses features such as low cost and low speed signal transmission requirement (be inapplicable at the high speed transmission of signals interface, as DDR3-1333Mbps, HDMI or USB3).
Please refer to Fig. 1, Fig. 2 and Fig. 3, Fig. 1 is the vertical view of existing lead frame encapsulation structure 10 for schematic appearance, Fig. 2 of existing lead frame encapsulation structure 10, and Fig. 3 is the structural map of existing lead frame encapsulation structure 10.As shown in Figure 1, 2, lead frame encapsulation structure 10 comprises a plurality of lead frames 100 and chip 11.Lead frame 100 includes outer pin 102, interior pin 104 and wire portion 106.Wherein, outer pin 102 electrically connects printed circuit board (PCB) (being not shown among the figure), interior pin 104 electrically connects chip 11 by wire bonds mode (gold thread 103 as shown in Figure 2), and wire portion 106 is connected between interior pin 102 and the outer pin 104.As shown in Figure 3, lead frame encapsulation structure 10 also includes the load bearing seat 12 of carries chips 11, and is used for the packing colloid (molding) 13 of coated wire frame 100 and chip 11.
From the above, lead frame encapsulation structure 10 non-multilayer board architectures (multi-layer), therefore do not have reference ground plane (the reference ground plane) design on the picture printed circuit board (PCB), thereby have impedance Control difficulty, cross-talk (crosstalk) problem, and distribution network (power distributionnetwork, height circulation inductance value disappearances such as (loop inductance) PDN).For solving above-mentioned disappearance, in the prior art, lead frame encapsulation structure 10 is provided with an earth connection between each lead frame 100, but this mode can reduce the quantity that arranges of lead frame 100, thereby causes the quantity of signal output (pin out) to reduce.
Summary of the invention
Therefore, main purpose of the present invention is to provide a kind of conducting wire frame structure, uses addressing the above problem.
The present invention discloses a kind of lead frame encapsulation structure, and this lead frame encapsulation structure includes: at least one load bearing seat is used for carrying a chip; And at least one lead frame, comprise one first end that electrically connects a printed circuit board (PCB), one second end that electrically connects this chip, and a wire portion that connects this first end and this second end; Wherein, the height of this wire portion is lower than the height of this first end and this second end.
Description of drawings
Fig. 1 is the outside drawing of an existing lead frame encapsulation structure.
Fig. 2 is the vertical view of an existing lead frame encapsulation structure.
Fig. 3 is the structural map of an existing lead frame encapsulation structure.
Fig. 4 is the schematic diagram of the embodiment of the invention one lead frame encapsulation structure.
Fig. 5 is arranged on the schematic diagram of printed circuit board (PCB) for the embodiment of the invention one lead frame encapsulation structure.
Fig. 6 is the schematic diagram of the embodiment of the invention one signal entrance loss.
Fig. 7 is the schematic diagram of the embodiment of the invention one signal reflex loss.
Fig. 8 is the schematic diagram of the embodiment of the invention one long-range cross-talk.
Fig. 9 is the schematic diagram that the embodiment of the invention one near-end crosstalk is disturbed.
Wherein, description of reference numerals is as follows:
10,40 lead frame encapsulation structure
100,400 lead frames
11,41 chips
12,42 load bearing seats
13,43 packing colloids
102,402 outer pins
104,404 interior pins
106,406 wire portions
103,403 gold threads
50 ground planes
Port 1 first end
Port 2 second ends
Port 3 the 3rd end
Port 4 the 4th end
The CL current cycle
Embodiment
Please refer to Fig. 4, Fig. 4 is the schematic diagram of the embodiment of the invention one lead frame encapsulation structure 40.Lead frame encapsulation structure 40 comprises lead frame 400, chip 41, load bearing seat 42 and packing colloid 43.Lead frame 400 includes outer pin 402, interior pin 404 and wire portion 406.Wherein, outer pin 402 electrically connects printed circuit board (PCB) (not being indicated among Fig. 4), interior pin 404 electrically connects chip 41 by gold thread 403, and wire portion 406 electrically connects interior pin 402 and outer pin 404.Load bearing seat 42 is used for carries chips 41.Packing colloid 43 is used for coated wire frame 400 and chip 41.In this embodiment, outer pin 402 can be sea-gull aerofoil profile (Gull-Wing) pin.
It should be noted that wire portion 406 height of the embodiment of the invention need be lower than the height of outer pin 402 and interior pin 404, to form the wire portion 406 of concave shape.Comparison diagram 3 and Fig. 4 can know the wire portion 406 of finding out the embodiment of the invention simultaneously, are the shapes that are to lower recess compared to existing wire portion 106.Other please refer to Fig. 5, and Fig. 5 is arranged on the schematic diagram of printed circuit board (PCB) for the lead frame encapsulation structure 40 of the embodiment of the invention.As shown in Figure 5, when lead frame encapsulation structure 40 is arranged on printed circuit board (PCB), wire portion 406 is compared to existing wire portion 106, more press close to the ground plane 50 on the printed circuit board (PCB), therefore, signal flows and current cycle (current loop) CL that forms is concentrated in the below of wire portion 406 and flows at wire portion 406, uses and reduces cross-talk (crosstalk).In addition, because wire portion 406 is pressed close to the ground plane 50 of printed circuit board (PCB), the electric field scope that wire portion 406 produces also concentrates between wire portion 406 and the ground plane 50, therefore can reduce the influence of lead frame 400 on every side, and reduce electromagnetic interference.In simple terms, the lead frame encapsulation structure 40 of the embodiment of the invention is to utilize the ground plane 50 of printed circuit board (PCB) as the ground connection of lead frame 400, uses and reduces signal and electromagnetic interference.
Please refer to Fig. 6, Fig. 7, Fig. 8 and Fig. 9, Fig. 6 is the schematic diagram of the embodiment of the invention one signal entrance loss (Insertion Loss), Fig. 7 is the schematic diagram of the embodiment of the invention one signal reflex loss (ReturnLoss), Fig. 8 is the schematic diagram of the embodiment of the invention one long-range string news (Far-End Crosstalk), and Fig. 9 is the schematic diagram of embodiment of the invention near-end crosstalk news (Near-End Crosstalk).In Fig. 6, suppose that signal is that the first end Port 1 from lead frame 400 transfers to the second end Port 2.As shown in Figure 6, compared to the structure of existing lead frame 100, the signal entrance loss of the lead frame 400 of the embodiment of the invention is a little less than the signal entrance loss of existing lead frame 100.In Fig. 7, compared to the structure of existing lead frame 100, the lead frame 400 of the embodiment of the invention also is lower than the signal reflex loss of existing lead frame 100 in the signal reflex loss of the first end Port 1.For instance, under frequency 3000MHz, the signal reflex loss late of lead frame 400 reduces 6dB approximately.In addition, in Fig. 8, suppose that signal is that the first end Port 1 from lead frame 400 transfers to the second end Port 2.Another lead frame 400 of adjacent wires frame 400 can be subjected to cross-talk in lead frame encapsulation structure 40; In another lead frame 400, the 3rd end Port 3 of the first end Port 1 of adjacent wires frame 400 is called near-end in string news phenomenon, and is called long-range in string news phenomenon from the 4th end Port 4 of the first end Port 1 away from.As shown in Figure 8, compared to the structure of existing lead frame 100, the lead frame 400 of the embodiment of the invention is lower than the long-range cross-talk of existing lead frame 100 in long-range cross-talk.For instance, under frequency 1500MHz, long-range cross-talk reduces 10dB approximately.In addition, in Fig. 9, the lead frame 400 of the embodiment of the invention also is lower than existing lead frame 100 in the cross-talk of near-end.For instance, under frequency 1500MHz, near-end crosstalk is disturbed and is reduced 3dB approximately.
From the above, compared to the wire portion 106 of existing lead frame 100 for level connect in pin 104 with outside pin 102, thereby can't arrange the ground plane of printed circuit, cause problems such as string news and electromagnetic interference, the wire portion 406 of the lead frame 400 of the embodiment of the invention connects interior pin 104 and outer pin 102 for concave shape, lead frame 400 can be arranged press close to ground plane, and then effectively reduce problems such as string news and electromagnetic interference.It should be noted that at encapsulating structure in appearance the lead frame encapsulation structure 40 of the embodiment of the invention can be identical with the outward appearance of existing lead frame encapsulation structure, and need not change the making mould of present lead frame, therefore can save cost of manufacture.For instance, after producing lead frame 100, can carry out punching press to wire portion 106, to form the wire portion 406 to recessed folding.
In sum, the present invention proposes a kind of new lead frame encapsulation structure, and compared to known conducting wire frame structure, the lead frame of the embodiment of the invention is depressed the ground plane of printed circuit board (PCB), therefore can effectively reduce the circulation inductance value, to reduce problems such as string news, electromagnetic interference.
The above is the preferred embodiments of the present invention only, is not limited to the present invention, and for a person skilled in the art, the present invention can have various changes and variation.Within the spirit and principles in the present invention all, any modification of doing, be equal to replacement, improvement etc., all should be included within protection scope of the present invention.

Claims (4)

1. lead frame encapsulation structure includes:
At least one load bearing seat is used for carrying a chip; And
At least one lead frame comprises one first end that electrically connects a printed circuit board (PCB), one second end that electrically connects this chip, and a wire portion that connects this first end and this second end;
Wherein, the height of this wire portion is lower than the height of this first end and this second end.
2. lead frame encapsulation structure as claimed in claim 1 is characterized in that, this wire portion is to form the height that highly is lower than this first end and this second end by an impact style.
3. lead frame encapsulation structure as claimed in claim 1 is characterized in that, this first end is a sea-gull aerofoil profile pin.
4. lead frame encapsulation structure as claimed in claim 1 is characterized in that, this second end electrically connects this chip by a wire bonds mode.
CN201110456501.7A 2011-12-30 2011-12-30 Lead frame encapsulation structure Expired - Fee Related CN103187381B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201110456501.7A CN103187381B (en) 2011-12-30 2011-12-30 Lead frame encapsulation structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201110456501.7A CN103187381B (en) 2011-12-30 2011-12-30 Lead frame encapsulation structure

Publications (2)

Publication Number Publication Date
CN103187381A true CN103187381A (en) 2013-07-03
CN103187381B CN103187381B (en) 2015-09-16

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Application Number Title Priority Date Filing Date
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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5157480A (en) * 1991-02-06 1992-10-20 Motorola, Inc. Semiconductor device having dual electrical contact sites
CN1153997A (en) * 1995-12-29 1997-07-09 Lg半导体株式会社 Improved integrated chip package with reduced dimensions
US20030209810A1 (en) * 2002-05-07 2003-11-13 Mk Electon Co., Ltd Gold-silver bonding wire for semiconductor device
US6865804B2 (en) * 1999-08-20 2005-03-15 Cardiac Pacemakers, Inc. Method for integrated EMI shielding
CN1697172A (en) * 2004-05-12 2005-11-16 宏连国际科技股份有限公司 Die set for wire frame of wafer

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5157480A (en) * 1991-02-06 1992-10-20 Motorola, Inc. Semiconductor device having dual electrical contact sites
CN1153997A (en) * 1995-12-29 1997-07-09 Lg半导体株式会社 Improved integrated chip package with reduced dimensions
US6865804B2 (en) * 1999-08-20 2005-03-15 Cardiac Pacemakers, Inc. Method for integrated EMI shielding
US20030209810A1 (en) * 2002-05-07 2003-11-13 Mk Electon Co., Ltd Gold-silver bonding wire for semiconductor device
CN1697172A (en) * 2004-05-12 2005-11-16 宏连国际科技股份有限公司 Die set for wire frame of wafer

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Publication number Publication date
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Granted publication date: 20150916

Termination date: 20201230