CN102865924B - Slit assembly for adjusting and testing hyperspectral imaging spectrometer - Google Patents
Slit assembly for adjusting and testing hyperspectral imaging spectrometer Download PDFInfo
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- CN102865924B CN102865924B CN201210299291.XA CN201210299291A CN102865924B CN 102865924 B CN102865924 B CN 102865924B CN 201210299291 A CN201210299291 A CN 201210299291A CN 102865924 B CN102865924 B CN 102865924B
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Abstract
The invention discloses a slit assembly for adjusting and testing a hyperspectral imaging spectrometer. Light emitted from a testing light source enters via an optical fiber end surface, is conducted via an optical fiber bundle, is emitted out via an output end of the optical fiber bundle, illuminates circular small holes, and enters the imaging spectrometer via the circular small holes, and the testing light source is a suitable light source for adjusting and testing the spectrometer. Consistency and uniformity of intensity of the light emitted in the circular small holes are guaranteed under the condition that the conventional light source is used for illumination, the problem that light sources are insufficient in adjusting and testing processes of the hyperspectral imaging spectrometer is solved, and suitable incidence light sources are provided for the imaging spectrometer by combining different light sources.
Description
Technical field
The present invention relates to a kind of Hyper spectral Imaging spectrometer debugs, tests and use slit assembly.
Background technology
General object imaging comprises two-dimensional space information, and Hyper spectral Imaging has recorded the radiation intensity information that pixel changes with wavelength variations comprising simultaneously on the basis of spatial information, pixel has three-dimensional information, it is space dimension, x, y and spectrum dimension λ, imaging spectrometer has been widely used in the fields such as satellite remote sensing, geology detecting, precision agriculture, the manufacturing and military surveillance.
General its spectral resolution of Hyper spectral Imaging spectrometer is that Subnano-class is other, and spatial resolution is pixel level, and this precision has proposed very high requirement to debugging.Require on the one hand the inner grating of spectrum, eyeglass to need high-precision debugging device, detector face to need high-precision debuging, also require the light source that provides suitable for debuging simultaneously, the present invention designs and has researched and developed special-purpose imaging spectrometer and debug, test and use slit assembly, and this assembly can provide suitable incident light source for imaging spectrometer in conjunction with different light sources.
Summary of the invention
The object of the invention is exactly in order to make up the defect of prior art, provides a kind of imaging spectrometer of special use to debug, tests and use slit assembly, has solved the problem that Hyper spectral Imaging spectrometer is debug, test process lacks suitable sources.
The present invention is achieved by the following technical solutions:
A kind of Hyper spectral Imaging spectrometer is debug, is tested and use slit assembly, include entrance slit, on described entrance slit, have the circular aperture of a series of different spacing, can test the situation of whole image planes, because slit is 1:1, be imaged in image planes, on slit, open the aperture of different spacing, import incident light, can be imaged in whole image planes, observe the situation of whole image planes; The width of the entrance slit described in the diameter of described circular aperture equals, the spacing of described circular aperture has three kinds: equal the theoretical spatial resolution of Hyper spectral Imaging spectrometer, be greater than the theoretical spatial resolution of Hyper spectral Imaging spectrometer and be less than the theoretical spatial resolution of Hyper spectral Imaging spectrometer, can clearly find out like this spatial resolution of spectrometer.
A kind of Hyper spectral Imaging spectrometer is debug, is tested and use slit assembly, include entrance slit, also include optical fiber incident end face, fibre bundle and fibre bundle output terminal, the light that testing light source sends enters in fibre bundle from described optical fiber incident end face, and from described fibre bundle output terminal output; On described entrance slit, have the circular aperture of a series of different spacing, the width of the entrance slit described in the diameter of described circular aperture equals, the spacing of described circular aperture has three kinds: equal the theoretical spatial resolution of Hyper spectral Imaging spectrometer, be greater than the theoretical spatial resolution of Hyper spectral Imaging spectrometer and be less than the theoretical spatial resolution of Hyper spectral Imaging spectrometer; Use from the light of described fibre bundle output terminal output and remove to illuminate different circular apertures, the luminous energy of from then on optic fibre hole output of the size requirements of the fiber optic aperture on described fibre bundle output terminal illuminates two adjacent circular apertures.
Imaging spectrometer is debug the debugging that comprises spectral resolution and two indexs of imaging resolution, be embodied in X, the Y-direction of spectrometer imaging surface, and two kinds of restrictions mutually, therefore in debuging process, preferably can see the situation of Resolutions in whole image planes simultaneously, to reach good balance, meet the demand of two kinds.
The general element lamp (low pressure mercury lamp etc.) that adopts, as testing light source, if use traditional wire slit, only can embody the spectral resolution of certain row, cannot embody spectrum, the spatial resolution situation of whole image planes.
Principle of work of the present invention is: the light that testing light source sends is entered by fiber end face, through fibre bundle, conduct and penetrated by fibre bundle output terminal, illuminate circular aperture, and entered in imaging spectrometer by circular aperture, for the light source that provides suitable is debug, tested to spectrometer.
Advantage of the present invention is: the present invention is in the situation that using conventional light illumination, guaranteed to enter to inject the consistent homogeneity of the light intensity of circular aperture, having solved the situation that Hyper spectral Imaging spectrometer is debug, test process lacks suitable sources, is that imaging spectrometer improves suitable incident light source in conjunction with different light sources.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention.
Embodiment
As shown in Figure 1, a kind of Hyper spectral Imaging spectrometer is debug, is tested and use slit assembly, include entrance slit 4, on described entrance slit 4, have the circular aperture 7 of a series of different spacing, can test the situation of whole image planes, because entrance slit 4 is 1:1, be imaged in image planes, on entrance slit 4, open the circular aperture 7 of different spacing, import incident light, can be imaged in whole image planes, observe the situation of whole image planes; The width of the entrance slit 4 described in the diameter of described circular aperture 7 equals, the spacing of described circular aperture 7 has three kinds: equal the theoretical spatial resolution of Hyper spectral Imaging spectrometer 5, be greater than the theoretical spatial resolution of Hyper spectral Imaging spectrometer 5 and be less than the theoretical spatial resolution of Hyper spectral Imaging spectrometer 5, can clearly find out like this spatial resolution of spectrometer.
If only use the entrance slit 4 of opening a series of circular apertures 7, in the situation that using conventional light illumination, be difficult to guarantee that the light intensity of incident circular aperture 7 is consistent, because slit 4 has certain length, as 10mm, and general pointolite cannot guarantee in this length light intensity evenly, so just to debugging, brought difficulty, also cannot assess the response difference between different pixels, therefore, be improved further simultaneously.A kind of Hyper spectral Imaging spectrometer is debug, is tested and use slit assembly, include entrance slit 4, also include optical fiber incident end face 1, fibre bundle 2 and fibre bundle output terminal 3, the light that testing light source sends enters in fibre bundle 2 from described optical fiber incident end face 1, and from 3 outputs of described fibre bundle output terminal; On described entrance slit 4, have the circular aperture 7 of a series of different spacing, the width of the entrance slit 4 described in the diameter of described circular aperture 7 equals, the spacing of described circular aperture 7 has three kinds: equal the theoretical spatial resolution of Hyper spectral Imaging spectrometer 5, be greater than the theoretical spatial resolution of Hyper spectral Imaging spectrometer 5 and be less than the theoretical spatial resolution of Hyper spectral Imaging spectrometer 5; Use from the light of described fibre bundle output terminal 3 outputs and remove to illuminate different circular aperture 7, can guarantee incident uniformity of light like this, convenient debugging, the luminous energy of from then on optic fibre hole 6 outputs of the size requirements of the fiber optic aperture on described fibre bundle output terminal 3 illuminates two adjacent circular apertures 7.
Size, the spacing of aperture are exemplified below: the diameter of circular aperture 7 is the same with actual design entrance slit 4 width, and if design entrance slit 4 width are 60 microns, circular aperture 7 diameters need to be 60 microns; Circular aperture 7 spacing are relevant with imaging spectrometer 5 spatial resolutions, if its Theoretical Design spatial resolution is 78 microns, aperture pitch design can be designed to 78 microns, is greater than 78 microns (100 microns) and is less than 78 microns (60 microns) etc. three kinds, can clearly find out like this spatial resolution of spectrometer.
It is foundation that the selection of fiber optic aperture need to be take the size of entrance slit 4 circular apertures 7 and spacing and Machinability Evaluation, requirement can be illuminated two adjacent circular apertures 7, if circular aperture is 60 microns, spacing is 100 microns, fiber optic aperture requirement is 400 microns, and doing is like this convenience that guarantees processing, because, process the very close fibre bundle 2 of spacing very difficult, cost is very high.
Claims (2)
1. a Hyper spectral Imaging spectrometer is debug, is tested and use slit assembly, include entrance slit, it is characterized in that: the circular aperture that has a series of different spacing on described entrance slit, the width of the entrance slit described in the diameter of described circular aperture equals, the spacing of described circular aperture has three kinds: equal the theoretical spatial resolution of Hyper spectral Imaging spectrometer, be greater than the theoretical spatial resolution of Hyper spectral Imaging spectrometer and be less than the theoretical spatial resolution of Hyper spectral Imaging spectrometer.
2. a Hyper spectral Imaging spectrometer is debug, is tested and use slit assembly, include entrance slit, it is characterized in that: also include optical fiber incident end face, fibre bundle and fibre bundle output terminal, the light that testing light source sends enters in fibre bundle from described optical fiber incident end face, and from described fibre bundle output terminal output; On described entrance slit, have the circular aperture of a series of different spacing, the width of the entrance slit described in the diameter of described circular aperture equals, the spacing of described circular aperture has three kinds: equal the theoretical spatial resolution of Hyper spectral Imaging spectrometer, be greater than the theoretical spatial resolution of Hyper spectral Imaging spectrometer and be less than the theoretical spatial resolution of Hyper spectral Imaging spectrometer; Use from the light of described fibre bundle output terminal output and remove to illuminate different circular apertures, the luminous energy of from then on optic fibre hole output of the size requirements of the fiber optic aperture on described fibre bundle output terminal illuminates two adjacent circular apertures.
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CN106017679A (en) * | 2016-06-20 | 2016-10-12 | 中国科学院遥感与数字地球研究所 | Optical fiber bundle-based multichannel spectrograph system |
CN106525237A (en) * | 2016-10-24 | 2017-03-22 | 中国科学院国家空间科学中心 | Multi-slit multispectral system of crossed Czerny-Turner structure |
CN111258010B (en) * | 2020-02-21 | 2021-09-14 | 中国科学院合肥物质科学研究院 | Method and device for accurately realizing laser Thomson scattering signal collection |
CN112304871A (en) * | 2020-10-15 | 2021-02-02 | 中国科学院合肥物质科学研究院 | Ship smoke plume emission rapid remote measurement system based on imaging spectrometer |
Citations (3)
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US4375919A (en) * | 1979-04-25 | 1983-03-08 | Baylor University | Multiple entrance aperture dispersive optical spectrometer |
CN101365935A (en) * | 2005-08-18 | 2009-02-11 | 格路寇斯特斯国际私人有限公司 | An arrangement for a selection of a wavelength |
US7636158B1 (en) * | 2004-09-24 | 2009-12-22 | Romuald Pawluczyk | Optimal coupling of high performance line imaging spectrometer to imaging system |
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US8174694B2 (en) * | 2001-12-21 | 2012-05-08 | Bodkin Design And Engineering Llc | Hyperspectral imaging systems |
WO2007101163A2 (en) * | 2006-02-27 | 2007-09-07 | Chemimage Corporation | System and method for spectral unmixing in a fiber array spectral translator based polymorph screening system |
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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US4375919A (en) * | 1979-04-25 | 1983-03-08 | Baylor University | Multiple entrance aperture dispersive optical spectrometer |
US7636158B1 (en) * | 2004-09-24 | 2009-12-22 | Romuald Pawluczyk | Optimal coupling of high performance line imaging spectrometer to imaging system |
CN101365935A (en) * | 2005-08-18 | 2009-02-11 | 格路寇斯特斯国际私人有限公司 | An arrangement for a selection of a wavelength |
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