CN102636499B - Material performance parameter acquisition device and viscoelastometer - Google Patents
Material performance parameter acquisition device and viscoelastometer Download PDFInfo
- Publication number
- CN102636499B CN102636499B CN201210093114.6A CN201210093114A CN102636499B CN 102636499 B CN102636499 B CN 102636499B CN 201210093114 A CN201210093114 A CN 201210093114A CN 102636499 B CN102636499 B CN 102636499B
- Authority
- CN
- China
- Prior art keywords
- data
- value
- strain value
- tested material
- external force
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Abstract
The invention provides a material performance parameter acquisition device and system. The material performance parameter acquisition device comprises a microwave frequency divider, a first data collector and a first data processor, wherein the first data processor is used for obtaining stress value and loss angle value of the tested material in the microwaves signals according to frequency divided data obtained by frequency division processing of microwave signals of preset frequency carried out by the microwave frequency divider and reaction data of the tested material under the action of a preset external force obtained by the first data collector using the microwave signals; and the device further comprises a preprocessor, a second data collector and a second data processor for obtaining the strain value of tested material. The stress value, the loss angle value and the strain value of the tested material can be accurately obtained through the embodiment of the invention, and therefore the usage of the tested material is judged based on dynamic mechanical parameters and thermodynamic performance parameters of elastic modulus, loss modulus and the like obtained according to the stress value, loss angle value and strain value.
Description
Technical field
The present invention relates to material property detects and data processing field, particularly a kind of material property parameter acquisition device and viscoelastic spectrometer.
Background technology
Before to material, particularly high-end material is applied, need to test the practical use that judges material according to material property parameter to its material property, wherein, material property parameter generally has stress value, strain value, loss angle value, elastic modulus, loss modulus, dissipation factor, Young modulus, compliance, storage modulus, modulus of shearing and viscosity etc.
In the time that material can not produce displacement under external force in uniform temperature, certain frequency, will there is deformation in its geometric configuration and size, and this deformation is called strain.When material generation deformation, inside has produced equal and opposite in direction but the acting force opposing external force of opposite direction, and this reacting force in unit area is called stress.And response lag stress exists phase differential between the two, this phase differential is loss angle.
But at present, do not have a kind of material property parameter acquisition device can be under higher bandwidth (as 1000hz) condition the high-end material of Obtaining Accurate as performance parameters such as stress value, strain value and loss angle values, thereby carry out can obtaining after data processing dynamic mechanical and the thermodynamic property parameter of the materials such as elastic modulus, loss modulus, dissipation factor, Young modulus, compliance, storage modulus, modulus of shearing and viscosity according to parameters such as stress value, strain value and loss angle values, judge the practical use of this high-end material.
Summary of the invention
Technical matters to be solved by this invention is to provide a kind of material property parameter acquisition device and viscoelastic spectrometer, in prior art, cannot realize under higher bandwidth condition macromolecular material as performance parameters such as stress value, strain value and loss angle values in order to solve, thereby obtain the technical matters of the dynamic mechanicals of material such as elastic modulus, loss modulus, dissipation factor, Young modulus, compliance, storage modulus, modulus of shearing and viscosity and the Obtaining Accurate of thermodynamic property parameter.
The invention provides a kind of material property parameter acquisition device, this device comprises:
Microwave divider, for the microwave signal of preset frequency is carried out to frequency division processing, generates the frequency division data corresponding with the frequency of described microwave signal;
The first data acquisition unit, for utilizing described microwave signal to obtain the response data of tested material under predetermined external force effect;
The first data processor, for obtaining stress value and the loss angle value of described tested material in described microwave signal according to described frequency division data and described response data.
Said apparatus, preferably, described device also comprises:
Pretreater, for obtaining the default displacement controlling value corresponding with described predetermined external force, and for drawing the standard strain value corresponding with described displacement controlling value according to described displacement controlling value with the relation of standard strain value;
The second data acquisition unit, for obtaining the test strain value of described tested material under described predetermined external force effect;
The second data processor, for described displacement controlling value, described standard strain value and described test strain value are calculated, draws actual strain value.
Said apparatus, preferably, described device also comprises:
Lik-Sang is grown up to be a useful person, and for generating predetermined external force, and described predetermined external force is put on to tested material.
Said apparatus, preferably, described the first data processor comprises:
The first data extractor, for extracting the intermediate data of described response data, obtains intermediate data array;
The second data extractor, extracts for described intermediate data array being carried out to even number data and odd number data, obtains respectively the first intermediate data array and the second intermediate data array;
The first data calculator, for described frequency division data, described the first intermediate data array and described the second intermediate data array are calculated, obtains stress value and loss angle value.
Said apparatus, preferably, described the second data processor comprises:
Data markers device, for being designated as respectively um, by and cy by described displacement controlling value, described standard strain value and described test strain value;
The second data calculator, for obtaining the deviation cy-by of described test strain value cy and described standard strain value by, and obtains deviation ratio according to described deviation cy-by and described standard strain value by
Foundation
Obtain actual strain value;
Wherein,
for the deviation ratio of described test strain value is with respect to the deviate of described displacement controlling value, the wy calculating is described actual strain value.
Said apparatus, preferably, described the first data acquisition unit comprises power sensor.
Said apparatus, preferably, described the second data acquisition unit comprises displacement transducer and/or acceleration transducer.
Said apparatus, preferably, described device also comprises:
Temperature controller, for providing temperature control to the test environment of tested material.
Said apparatus, preferably, described device also comprises:
Signal generator, for generation of the microwave signal of described preset frequency.
The present invention also provides a kind of material viscoelastic spectrometer, comprises the material property parameter acquisition device as described in above-mentioned any one.
A kind of material property parameter acquisition device provided by the invention and viscoelastic spectrometer are by carrying out frequency division processing to the microwave signal of preset frequency, and utilize described microwave signal to obtain the response data of tested material under predetermined external force effect, obtain stress value and the loss angle value of described tested material in described microwave signal according to described frequency division data and described response data, simultaneously, obtain the displacement controlling value corresponding with described predetermined external force, draw the standard strain value corresponding with described displacement controlling value and obtain the test strain value of described tested material under described predetermined external force effect with the relation of standard strain value according to described displacement controlling value, to described displacement controlling value, described standard strain value and described test strain value calculate, draw actual strain value.Thereby according to described stress value, described loss angle value and described strain value, carry out obtaining dynamic mechanical and the thermodynamic property parameter of the materials such as elastic modulus, loss modulus, dissipation factor, Young modulus, compliance, storage modulus, modulus of shearing and viscosity after data processing, and then the purposes of tested material is judged.
Certainly, implement arbitrary product of the present invention and might not need to reach above-described all advantages simultaneously.
Brief description of the drawings
In order to be illustrated more clearly in the technical scheme in the embodiment of the present invention, below the accompanying drawing of required use during embodiment is described is briefly described, apparently, accompanying drawing in the following describes is only some embodiment of the application, for those of ordinary skill in the art, do not paying under the prerequisite of creative work, can also obtain according to these accompanying drawings other accompanying drawing.
Fig. 1 is the structural representation of a kind of material property parameter acquisition device embodiment mono-provided by the invention;
Fig. 2 is another structural representation of a kind of material property parameter acquisition device embodiment mono-provided by the invention;
Fig. 3 is the structural representation of a kind of material property parameter acquisition device embodiment bis-provided by the invention;
Fig. 4 is another structural representation of a kind of material property parameter acquisition device embodiment bis-provided by the invention;
Fig. 5 is the structural representation of a kind of material property parameter acquisition device embodiment tri-provided by the invention;
Fig. 6 is the structural representation of a kind of viscoelastic spectrometer provided by the invention.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, obviously, described embodiment is only the present invention's part embodiment, instead of whole embodiment.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtaining under creative work prerequisite, belong to the scope of protection of the invention.
With reference to figure 1, it shows the structural representation of a kind of material property parameter acquisition device of volume provided by the invention, and described device comprises:
Microwave divider 101, for the microwave signal of preset frequency is carried out to frequency division processing, generates the frequency division data corresponding with the frequency of described microwave signal.
Wherein, device embodiment mono-provided by the invention obtains for the performance parameter of tested material, the performance parameter of tested material comprises: under the microwave signal effect in a certain characteristic frequency, tested material is applied to predetermined external force but tested material displacement is constant, can there is deformation in its geometric configuration and size, the now deformation of tested material is called strain; In tested material in the time there is deformation, tested material internal can produce equal and opposite in direction but the acting force of opposite direction is resisted this predetermined external force, and this power in unit area is stress; , there is phase differential between the two in response lag stress, this phase differential is loss angle.
Wherein, tested material is being carried out before material property parameter obtains, to its residing environmental data information, carry out frequency division processing and obtain the frequency division data corresponding with the frequency of this microwave signal putting in advance the high-frequency microwave signal of tested material.
The first data acquisition unit 102, for utilizing described microwave signal to obtain the response data of tested material under predetermined external force effect.
Wherein, described microwave signal is acted on to tested material, tested material is applied to predetermined external force simultaneously, utilize described microwave signal to obtain the response data of tested material under predetermined external force effect by described the first data acquisition unit 102.
Wherein, described the first data acquisition unit 102 can comprise power sensor, for obtaining the response data under predetermined external force effect under described microwave signal.
The first data processor 103, for obtaining stress value and the loss angle value of described tested material in described microwave signal according to described frequency division data and described response data.
Wherein, described the first data processor 103 can comprise computer system, and the response data that the frequency division data that send for the described microwave divider 101 of foundation and described the first data acquisition unit 102 send carries out data computing and obtains stress value and the loss angle value of described tested material in described preset frequency microwave signal.
From such scheme, a kind of material property parameter acquisition device embodiment mono-provided by the invention is by carrying out frequency division processing to the microwave signal of preset frequency, and utilize described microwave signal to obtain the response data of tested material under predetermined external force effect, obtain stress value and the loss angle value of described tested material in described microwave signal according to described frequency division data and described response data, thereby carry out obtaining elastic modulus after data processing according to described stress value and described loss angle value, loss modulus, dissipation factor, Young modulus, compliance, storage modulus, the dynamic mechanical of the material such as modulus of shearing and viscosity and thermodynamic property parameter, purposes to tested material judges.
Based on above-described embodiment, with reference to figure 2, it shows another structural representation of a kind of material property parameter acquisition device embodiment mono-provided by the invention, and described the first data processor 103 comprises the first data extractor 131, the second data extractor 132 and the first data calculator 133, wherein:
Described the first data extractor 131, for extracting the intermediate data of described response data, obtains intermediate data array.
Wherein, before described frequency division data and described response data are calculated, the accuracy of calculating for improving data, need described the first data extractor 131 to carry out data extraction to described response data, can be according to default extracting rule, extract the intermediate data of described response data, and form intermediate data array by the intermediate data of described extraction, its array size is determined according to described extracting rule.
For example, the array of described response data composition is made up of 1000 data item, in the time that intermediate data is extracted, extracts 700 data item of the 301st data item to the in described response data array, as intermediate data array.
Described the second data extractor 132, extracts for described intermediate data array being carried out to even number data and odd number data, obtains respectively the first intermediate data array and the second intermediate data array.
Wherein, the intermediate data array of being extracted by described response data is carried out again to data to be extracted, be divided into two groups, described intermediate data array being carried out to even number data extracts, the the first intermediate data array that obtains being made up of even number data, forms the second intermediate data array by remaining odd number data in described intermediate data array.
For example, extract carrying out again data by the intermediate data array that in above-mentioned response data array, 700 data item of the 301st data item to the form, extract even number data in 700 data item of described the 301st data item to the, form the first intermediate data array, extract odd number data in 700 data item of described the 301st data item to the, composition the second intermediate data array.
The first data calculator 133, for described frequency division data, described the first intermediate data array and described the second intermediate data array are calculated, obtains stress value and loss angle value.
Wherein, described the first data calculator 133 is divided into multiple arrays by described frequency division data and described the first intermediate data array respectively, and the data after described frequency division data and described the first intermediate data array grouping are calculated, and obtains the first stress data array.
For example, described frequency division data, described the first intermediate data array, described the second intermediate data array are designated as respectively to wt[n1], y1Data[n3] and y2Data[n4], wherein, n1, n3 and n4 are respectively data amount check in described frequency division data, described the first intermediate data array and described the second intermediate data array.
By described the first data calculator 133 respectively by wt[n1] and y1Data[n3] be divided into multiple arrays, to wt[n1] and y1Data[n3] grouping after data calculate, obtain the first stress data array, can be designated as deg yi[n8], wherein, n8 is data amount check in described the first stress data array.
For example, described the first data calculator 133 is respectively by wt[n1] and y1Data[n3] multiple arrays be divided into, form multiple array composite sets that formed by two arrays respectively, for example, by wt[n1] and y1Data[n3] be divided into 10 arrays, extract wherein one group of array combination wt1[n5] and yData1[n6];
Wherein, n5 and n6 are respectively array wt1[n5] and array yData1[n6] middle data amount check;
Foundation
And
obtain respectively the first mediant x1[n5], array x2[n5 in the middle of second] and the 3rd in the middle of array y[n6];
Wherein, i ∈ [0, n5-1], wt[i] be wt[n1] i data, yData1[i] be yData1[n6] i data;
Foundation
By x1[n5], x2[n5] and y[n6] obtain the first intermediate variable a and the second intermediate variable b;
Wherein,
X1[i], x2[i] and y[i] be respectively x1[n5], x2[n5] and y[n6] I data;
Foundation
to a square with square the summing up of b after get the square root that this adds and is worth, obtain the 3rd intermediate variable A1;
Judge the value of a and b, obtain the 5th intermediate variable degree1 as deg yi[n8 according to a and b] the first data;
Wherein, if a ﹥ 0 and b ﹤ 0, the 4th intermediate variable
if a ﹥ 0 and b ﹥ 0,
If a ﹤ 0 and b ﹤ 0,
If a ﹤ 0 and b ﹥ 0,
Foundation
obtain the 5th intermediate variable degree1 as degyi[n8] the first data;
Other arrays combination in described array composite set is calculated according to said method, obtains deg yi[n8] in other data.
Described the first data calculator 133 is in getting described the first stress data array, respectively described frequency division data and described the second intermediate data array are divided into multiple arrays, data after described frequency division data and described the second intermediate data array grouping are calculated, obtained the second stress data array and tertiary stress data array.
Wherein, respectively by wt[n1] and yData2[n4] calculate the second stress data array Ali[n7].
Wherein, respectively by wt[n1] and yData2[n4] calculate tertiary stress data array degli[n8].
Described the first data calculator 133 sorts to the every data in described the second stress data array, obtains stress value.
For example,, to Ali[n7] in every data sort, its ordering rule can be selected ordering rule from large to small, and the 4th data after described sequence are calculated to the stress value that obtains described tested material.
Described the first data calculator 133, in obtaining stress value, obtains intermediate stress data array according to described the first stress data array and described tertiary stress data array.
For example, according to degi[j]=| degli[j]-degyi[j] | to degli[n8] and degyi[n8] calculate, obtain degi[n8], wherein, j ∈ [0, n8-1], degi[j] be degi[n8] in j data, degli[j] be degli[n8] in j data, degyi[j] be degyi[n8] in j data.
Described the first data calculator 133 is in the time getting described intermediate stress data array according to described the first stress data and described tertiary stress data array, judge in described intermediate stress data array, whether every data are greater than 270 degree, if, obtain described data and be greater than the data item of 270 degree and the absolute difference of 360 degree, and using described absolute value data item corresponding with described data item in intermediate stress data array, otherwise, using described data item data item corresponding with described data item in described intermediate stress data array.
For example, judge degi[n8] in every data whether be greater than 270 degree, if, obtain described data and be greater than the data item of 270 degree and the absolute difference of 360 degree, and using described absolute value as deg[n8] middle data item, otherwise, using described data item as deg[n8] in the data item corresponding with described data item.
Described the first data calculator 133 gets after described intermediate stress data array, and the every data in described intermediate stress data array are sorted, and obtains loss angle value.
Wherein, to deg[n8] in every data sort, its ordering rule can be selected ordering rule from large to small, and chooses the 4th data after the sequence loss angle value as tested material.
From such scheme, a kind of material property parameter acquisition device embodiment mono-provided by the invention is by carrying out frequency division processing to the microwave signal of preset frequency, generate the frequency division data corresponding with the frequency of described microwave signal, utilize described microwave signal to obtain the response data of tested material under predetermined external force effect, and described response data is carried out to data extraction, response data according to described frequency division data and extraction obtains stress value and loss angle value, has ensured the accuracy of stress value and loss angle value.Thereby carry out data processing according to described stress value and described loss angle value, obtain dynamic mechanical and the thermodynamic property parameter of the materials such as elastic modulus, loss modulus, dissipation factor, Young modulus, compliance, storage modulus, modulus of shearing and viscosity, and then the purposes of tested material is judged.
With reference to figure 3, it shows the structural representation of a kind of material property parameter acquisition device embodiment bis-provided by the invention, based on apparatus of the present invention embodiment mono-, described device also comprises pretreater 104, the second data acquisition unit 105 and the second data processor 106, wherein:
Described pretreater 104, for obtaining the default displacement controlling value corresponding with described predetermined external force, and for drawing the standard strain value corresponding with described displacement controlling value according to described displacement controlling value with the relation of standard strain value.
Wherein, preset the corresponding relation that tested material externally applied forces is pre-seted to displacement controlling value with it, in the time that the tested material in described microwave signal is applied to described predetermined external force, obtain the displacement controlling value corresponding with described predetermined external force by described pretreater 104.
Wherein, before the material property parameter that carries out described tested material obtains, set the relation between described displacement controlling value and standard strain value.And while setting being related between described displacement controlling value and standard strain value, can set according to the historical data of carrying out parameter acquiring to tested material.Thus, draw with described displacement controlling value corresponding standard strain value according to described displacement controlling value with the relation of standard strain value by described pretreater 104.
For example, the displacement size of formulating wish control is the relation of displacement controlling value and standard strain value, as: the corresponding 5 μ m of numerical value 600, getting after the displacement controlling value corresponding with described predetermined external force, draw standard strain value according to above-mentioned both sides relation, the i.e. standard strain value corresponding with described displacement controlling value of 600* displacement controlling value/5 μ m.
Wherein, in apparatus of the present invention embodiment, with reference to deformation range be :-1000 μ m～+ 1000 μ m
Described the second data acquisition unit 105, for obtaining the test strain value of described tested material under described predetermined external force effect.
Wherein, described the second data acquisition unit 105 comprises displacement transducer and/or acceleration transducer, carry out data acquisition for the strain that tested material is produced under described predetermined external force effect, wherein, described displacement transducer is for obtaining the test strain value under the microwave signal effect of tested material in low frequency, and described acceleration transducer is for obtaining the test strain value under the microwave signal effect of tested material in high frequency.
Wherein, acceleration transducer is a kind of electronic equipment that can measure accelerating force, can measure the acceleration that predetermined external force produces.Adopt piezoelectric acceleration transducer, its frequency range 50Hz～2KHz, corresponding displacement sensitivity ± 1mv/ μ m at acceleration transducer described in apparatus of the present invention embodiment.
Described the second data processor 106, for described displacement controlling value, described standard strain value and described test strain value are calculated, draws actual strain value.
Wherein, with reference to figure 4, it shows the another kind of structural representation of apparatus of the present invention embodiment bis-, and based on the invention described above device embodiment, described the second data processor 106 comprises data markers device 161 and the second data calculator 162, wherein:
Described data markers device 161, for being designated as respectively um, by and cy by described displacement controlling value, described standard strain value and described test strain value.
Described the second data calculator 162, for obtaining the deviation cy-by of described test strain value cy and described standard strain value by, and obtains deviation ratio according to described deviation cy-by and described standard strain value by
And foundation
Obtain actual strain value;
Wherein,
for the deviation ratio of described test strain value is with respect to the deviate of described displacement controlling value, the wy calculating is described actual strain value.
From such scheme, a kind of material property parameter acquisition device embodiment bis-provided by the invention is by obtaining the displacement controlling value corresponding with described predetermined external force, draw the standard strain value corresponding with described displacement controlling value and obtain the test strain value of described tested material under described predetermined external force effect with the relation of standard strain value according to described displacement controlling value, described displacement controlling value, described standard strain value and described test strain value are calculated, draw actual strain value.Thereby carry out data processing according to described stress value and described loss angle value, obtain dynamic mechanical and the thermodynamic property parameter of the materials such as elastic modulus, loss modulus, dissipation factor, Young modulus, compliance, storage modulus, modulus of shearing and viscosity, and then the purposes of tested material is judged.
With reference to figure 5, it shows the structural representation of a kind of material property parameter acquisition device embodiment tri-provided by the invention, based on apparatus of the present invention embodiment bis-, described device can also comprise that Lik-Sang grows up to be a useful person 107, signal generator 108 and temperature controller 109, wherein:
Described Lik-Sang grows up to be a useful person 107, for generating predetermined external force, and described predetermined external force is put on to tested material.
Wherein, the described Lik-Sang energisation mode that 107 pairs of tested materials apply described predetermined external force of growing up to be a useful person is the modes such as stretching, compression, shearing or three-point bending.
Described signal generator 108, for generating the microwave signal of preset frequency, and is sent to described microwave divider 101 by described microwave signal.
Wherein, the frequency range of described microwave signal is: 1～1000Hz, 50 frequency test points can be set, generated the microwave signal of 50 Frequency points in described 1～1000Hz frequency range by described signal generator 108, respectively described microwave signal is carried out to frequency division processing by described microwave divider 101, obtain corresponding frequency division data.
Described temperature controller 109, for providing temperature control to the test environment of tested material, ensures the temperature requirements in the performance parameter acquisition process of tested material.
Wherein, described temperature controller 109 can be made up of temperature sensor, heating wire, temperature controller, liquid nitrogen container, holding furnace, air compressor etc.The dut temperature range of control of tested material is :-150 DEG C～450 DEG C, carrying out in temperature controlled processes, the elevation rate of temperature is: 1～10 DEG C/min.
Based on above-described embodiment; apparatus of the present invention embodiment tri-can also comprise protection system; for example, for other compositions of this device embodiment being carried out to many-side protection: power overload protection, amplitude protection, left and right position limitation protection, overvoltage protection, low-voltage protection etc.
Above-described embodiment in actual applications, can realize by being integrated in circuit control system, described circuit control system comprises power detection circuitry, deformation detection circuitry, high-temperature control Circuits System, low temperature control circuit system, frequency drives control circuit system and Computer interface circuit etc.
Wherein, circuit control system comprises wave filter, described wave filter is for adjusting the precision of circuit control, and apparatus of the present invention embodiment on the basis of existing wave filter by Circuit tuning parameter, the advantage such as make described wave filter have that input signal amplitude equates substantially with output signal amplitude, frequency band is narrow, frequency input signal is identical with output signal frequency and input signal phase place is consistent with phase of output signal.
In the computer system that is integrated with described first processor 103, can realize by function control device is set the performance parameter collection control of tested material, control described the first data acquisition unit 102 response data of tested material is controlled.
A kind of material property parameter acquisition device embodiment tri-provided by the invention carries out frequency division processing by the microwave signal of the preset frequency to signal generator generation, and utilize described microwave signal to obtain the response data that tested material is grown up to be a useful person under the predetermined external force effect producing at described Lik-Sang, obtain stress value and the loss angle value of described tested material in described microwave signal according to described frequency division data and described response data, simultaneously, obtain the displacement controlling value corresponding with described predetermined external force, draw the standard strain value corresponding with described displacement controlling value and obtain the test strain value of described tested material under described predetermined external force effect with the relation of standard strain value according to described displacement controlling value, to described displacement controlling value, described standard strain value and described test strain value calculate, draw actual strain value.Further, by temperature controller and protection system, the acquisition process of tested material property parameter is carried out to temperature control and safeguard protection.Thereby carry out data processing according to described stress value and described loss angle value, obtain dynamic mechanical and the thermodynamic property parameter of the materials such as elastic modulus, loss modulus, dissipation factor, Young modulus, compliance, storage modulus, modulus of shearing and viscosity, and then the purposes of tested material is judged.
With reference to figure 6, it shows the structural representation of a kind of viscoelastic spectrometer provided by the invention, and based on the various embodiments described above, described viscoelastic spectrometer comprises material property parameter acquisition device 601, drive unit 602 and bracing or strutting arrangement 603, wherein:
The function of described material property parameter device 601 refers to illustrating of said apparatus embodiment, and this is no longer set forth;
Described drive unit 602, for the function of described material property parameter device is driven, thereby the performance parameter that realizes tested material is obtained.
Wherein, described drive unit comprises vibrator, power amplifier, drive link and nipper etc.
Wherein, the amplitude accuracy of described vibrator is 1 μ m, and peak swing is ± 10mm that frequency of utilization scope is: 0～2KHz.
Wherein, described bracing or strutting arrangement 603 comprises tool housing, support etc., for keeping the globality of viscoelastic spectrometer of the present invention.
A kind of viscoelastic spectrometer provided by the invention is by carrying out frequency division processing to the microwave signal of preset frequency, and utilize described microwave signal to obtain the response data of tested material under predetermined external force effect, obtain stress value and the loss angle value of described tested material in described microwave signal according to described frequency division data and described response data, simultaneously, obtain the displacement controlling value corresponding with described predetermined external force, draw the standard strain value corresponding with described displacement controlling value and obtain the test strain value of described tested material under described predetermined external force effect with the relation of standard strain value according to described displacement controlling value, to described displacement controlling value, described standard strain value and described test strain value calculate, draw actual strain value.Thereby carry out data processing according to described stress value and described loss angle value, obtain dynamic mechanical and the thermodynamic property parameter of the materials such as elastic modulus, loss modulus, dissipation factor, Young modulus, compliance, storage modulus, modulus of shearing and viscosity, and then the purposes of tested material is judged.
It should be noted that, each embodiment in this instructions all adopts the mode of going forward one by one to describe, and what each embodiment stressed is and the difference of other embodiment, between each embodiment identical similar part mutually referring to.
Finally, also it should be noted that, in this article, relational terms such as the first and second grades is only used for an entity or operation to separate with another entity or operational zone, and not necessarily requires or imply and between these entities or operation, have the relation of any this reality or sequentially.And, term " comprises ", " comprising " or its any other variant are intended to contain comprising of nonexcludability, thereby make to comprise that the article of a series of key elements or equipment not only comprise those key elements, but also comprise other key elements of clearly not listing, or be also included as this article or the intrinsic key element of equipment.The in the situation that of more restrictions not, the key element being limited by statement " comprising ... ", and be not precluded within and comprise in the article of described key element or equipment and also have other identical element.
Certainly, in the time that enforcement is of the present invention, the function of each several part can be realized in same or multiple software and/or hardware.
As seen through the above description of the embodiments, those skilled in the art can be well understood to the present invention and can add the essential mode of the hardware platform of development certainly by software and realize.Based on such understanding, the part that technical scheme of the present invention contributes to prior art in essence in other words can embody with the form of Some Key Technologies in software product and hardware platform.
Above a kind of material property parameter acquisition device provided by the present invention and viscoelastic spectrometer are described in detail, applied specific case herein principle of the present invention and embodiment are set forth, the explanation of above embodiment is just for helping to understand method of the present invention and core concept thereof; , for one of ordinary skill in the art, according to thought of the present invention, all will change in specific embodiments and applications, in sum, this description should not be construed as the restriction to the application meanwhile.
Claims (9)
1. a material property parameter acquisition device, is characterized in that, this device comprises:
Microwave divider, for the microwave signal of preset frequency is carried out to frequency division processing, generates the frequency division data corresponding with the frequency of described microwave signal;
The first data acquisition unit, for utilizing described microwave signal to obtain the response data of tested material under predetermined external force effect;
The first data processor, for obtaining stress value and the loss angle value of described tested material in described microwave signal according to described frequency division data and described response data;
Wherein, described device also comprises:
Pretreater, for obtaining the default displacement controlling value corresponding with described predetermined external force, and for drawing the standard strain value corresponding with described displacement controlling value according to described displacement controlling value with the relation of standard strain value;
The second data acquisition unit, for obtaining the test strain value of described tested material under described predetermined external force effect;
The second data processor, for described displacement controlling value, described standard strain value and described test strain value are calculated, draws actual strain value.
2. device according to claim 1, is characterized in that, described device also comprises:
Lik-Sang is grown up to be a useful person, and for generating predetermined external force, and described predetermined external force is put on to tested material.
3. device according to claim 1, is characterized in that, described the first data processor comprises:
The first data extractor, for extracting the intermediate data of described response data, obtains intermediate data array;
The second data extractor, extracts for described intermediate data array being carried out to even number data and odd number data, obtains respectively the first intermediate data array and the second intermediate data array;
The first data calculator, for described frequency division data, described the first intermediate data array and described the second intermediate data array are calculated, obtains stress value and loss angle value.
4. device according to claim 1, is characterized in that, described the second data processor comprises:
Data markers device, for being designated as respectively um, by and cy by described displacement controlling value, described standard strain value and described test strain value;
The second data calculator, for obtaining the deviation cy-by of described test strain value cy and described standard strain value by, and obtains deviation ratio according to described deviation cy-by and described standard strain value by
Foundation
Obtain actual strain value;
Wherein,
for the deviation ratio of described test strain value is with respect to the deviate of described displacement controlling value, the wy calculating is described actual strain value.
5. device according to claim 1, is characterized in that, described the first data acquisition unit comprises power sensor.
6. device according to claim 1, is characterized in that, described the second data acquisition unit comprises displacement transducer and/or acceleration transducer.
7. device according to claim 1, is characterized in that, described device also comprises:
Temperature controller, for providing temperature control to the test environment of tested material.
8. device according to claim 1, is characterized in that, described device also comprises:
Signal generator, for generation of the microwave signal of described preset frequency.
9. a viscoelastic spectrometer, is characterized in that, comprises the material property parameter acquisition device as described in claim 1 to 8 any one.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210093114.6A CN102636499B (en) | 2012-03-31 | 2012-03-31 | Material performance parameter acquisition device and viscoelastometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210093114.6A CN102636499B (en) | 2012-03-31 | 2012-03-31 | Material performance parameter acquisition device and viscoelastometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102636499A CN102636499A (en) | 2012-08-15 |
| CN102636499B true CN102636499B (en) | 2014-11-26 |
Family
ID=46620973
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210093114.6A Active CN102636499B (en) | 2012-03-31 | 2012-03-31 | Material performance parameter acquisition device and viscoelastometer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102636499B (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5170666A (en) * | 1991-03-29 | 1992-12-15 | Larsen Lawrence E | Nondestructive evaluation of composite materials using acoustic emissions stimulated by absorbed microwave/radiofrequency energy |
| US20060037401A1 (en) * | 2003-08-12 | 2006-02-23 | Northwestern University | Scanning near field ultrasound holography |
| CN102184332A (en) * | 2011-05-17 | 2011-09-14 | 中国船舶重工集团公司第七二五研究所 | Method for expanding dynamic mechanical test data of viscous-elastic material out of test frequency |
-
2012
- 2012-03-31 CN CN201210093114.6A patent/CN102636499B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5170666A (en) * | 1991-03-29 | 1992-12-15 | Larsen Lawrence E | Nondestructive evaluation of composite materials using acoustic emissions stimulated by absorbed microwave/radiofrequency energy |
| US20060037401A1 (en) * | 2003-08-12 | 2006-02-23 | Northwestern University | Scanning near field ultrasound holography |
| CN102184332A (en) * | 2011-05-17 | 2011-09-14 | 中国船舶重工集团公司第七二五研究所 | Method for expanding dynamic mechanical test data of viscous-elastic material out of test frequency |
Non-Patent Citations (3)
| Title |
|---|
| design and performance of a microwave strain measuring system for materials tests;T.Roger Billeter 等;《Technical Report》;19751231;第6页倒数第1段至第11页第2段、第13页第3段、图3-4 * |
| Hyper-frequency viscoelastic spectroscopy of biomaterials;Anis Hadj Henni 等;《JOURNAL OF THE MECHANICAL BEHAVIOR OF BIOMEDICAL MATERIALS》;20110406;第4卷;全文 * |
| 聚合物液体的粘弹性能测定;花荣 等;《化学工程师》;19971231;全文 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102636499A (en) | 2012-08-15 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109408969B (en) | Method for identifying viscoelastic parameters of rubber by using finite element software to establish constitutive model | |
| CN107870074B (en) | A kind of non-linear internal resonance characterization test method of fiber composite plate and test macro | |
| CN103634099A (en) | Five-dimensional chaotic system and chaotic signal generator based on five-dimensional chaotic system | |
| CN102081359A (en) | DSP Builder-based time-varying delay hyperchaos digital circuit design method and circuit | |
| CN109085321B (en) | Calibration method of rock mesomechanics parameters and terminal equipment | |
| CN107622160A (en) | Excitation vibrating numerical analogy method based on reverse temperature intensity | |
| Wang et al. | Acceleration self-compensation mechanism and experimental research on shock wave piezoelectric pressure sensor | |
| CN111106783A (en) | Signal manufacturing method, signal manufacturing device, vibration motor and touch screen equipment | |
| CN105677973A (en) | Test spectrum clipping method achieving monaxial and triaxial random vibration stress equivalence | |
| CN106786567B (en) | A kind of online load modeling method based on PMU noise like data | |
| CN109507482B (en) | Three-phase alternating current circuit impedance test system and method | |
| CN108827455A (en) | A kind of jointed rock masses under blasting vibration attenuation parameter prediction technique and device | |
| CN102636499B (en) | Material performance parameter acquisition device and viscoelastometer | |
| CN105359419B (en) | Sending device, reception device and receive-transmit system | |
| CN209326983U (en) | A kind of engine static test system | |
| CN104699905B (en) | Governing system gear drive identification modeling method based on frequency domain response | |
| CN107727350B (en) | Micro-nano satellite vector vibration test method | |
| CN103199987A (en) | Three-dimensional chaotic system containing four parameters | |
| CN106643637B (en) | Inspection type principal strain measurement method for vibration measurement | |
| Prathap | Qualifying scholarly impact using an iCX (impact-Citations-Exergy) analysis | |
| Huang et al. | Charged scalar perturbations around a regular magnetic black hole | |
| Yang et al. | Chaotic and stochastic dynamics for a nonlinear structural system with hysteresis and degradation | |
| CN103227711A (en) | Three-dimensional chaotic system and device for producing two-winged, three-winged and four-winged attractors | |
| CN103152159A (en) | Three-dimensional chaotic system with only one balance point and device thereof | |
| CN109783760B (en) | Method for calculating initial speed of explosion and collapse fragments of reinforced concrete target plate |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20191230 Address after: Changzhou City, Jiangsu province Hehai road 213000 No. 9 Patentee after: Changzhou Institute of Energy Storage Materials & Devices Address before: 130000 No. 5625 Renmin Street, Jilin, Changchun Patentee before: Changchun Institue of Applied Chemistry, Chinese Academy of Sciences |
|
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20201104 Address after: 130022 Changchun people's street, Jilin, No. 5625 Patentee after: Changchun Institute of Applied Chemistry Chinese Academy of Sciences Address before: Changzhou City, Jiangsu province Hehai road 213000 No. 9 Patentee before: CHANGZHOU INSTITUTE OF ENERGY STORAGE MATERIALS & DEVICES |
|
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20201231 Address after: 341000 No.36, Huangjin Avenue, Ganzhou economic and Technological Development Zone, Ganzhou City, Jiangxi Province Patentee after: Jiangxi Rare Earth Research Institute, Chinese Academy of Sciences Address before: 130022 No. 5625 Renmin Street, Jilin, Changchun Patentee before: Changchun Institute of Applied Chemistry Chinese Academy of Sciences |