CN102590339A - Ultrasonic flaw detection equipment with zero-clearance multi-probe array - Google Patents
Ultrasonic flaw detection equipment with zero-clearance multi-probe array Download PDFInfo
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- CN102590339A CN102590339A CN2012100475410A CN201210047541A CN102590339A CN 102590339 A CN102590339 A CN 102590339A CN 2012100475410 A CN2012100475410 A CN 2012100475410A CN 201210047541 A CN201210047541 A CN 201210047541A CN 102590339 A CN102590339 A CN 102590339A
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Abstract
The invention discloses ultrasonic flaw detection equipment with a zero-clearance multi-probe array, comprising a plurality of probes arranged in a single row manner, and a main controller, wherein each probe comprises a plurality of sub-probes arranged in the single row manner, and all the sub-probes of the probes are arranged in the single row manner; the master controller is respectively connected with each sub-probe by a signal wire, the master controller sequentially stimulate different sub-probe combinations, so that a certain phase difference exists during scanning and phased array scanning can be realized. According to the invention, only the single-row arranged probes are adopted, the full covering of a detection zone can be completed by one-time scanning, the scanning detection speed can be remarkably increased or the technical complexity of double-row arranged probes is reduced.
Description
Technical field
The present invention relates to the defect-detecting equipment of plane such as a kind of sheet material, tubing or curved surface shape material, the many linear transducer arrays scanning in particularly a kind of no gap ultrasonic test equipment.
Background technology
In the prior art, adopt the arrangement of single array probe, have the scanning blind area between the probe; Adopt in the mode of dislocation complementary scan, increased by 1 times scanning probe distance and scanned detection time; Adopt in the double probe arrangement mode, increased by 1 times probe number, and significantly increased the size of probe along the direction of scanning; Also increased the asynchronous process requirement of scan image along the direction of scanning; If but the repetition ratio of the adjacent acoustic beam that requires is high or owing to adopt the narrow acoustic beam that focuses on, then possibly need to adopt three rows even more rows' probe, not only can cause the loaded down with trivial details further and lengthy and jumbled of arrangement; Cause unnecessary waste, increase technical complexity.
Summary of the invention
The purpose of this invention is to provide a kind of no gap many linear transducer arrays scanning ultrasonic test equipment, only adopt single probe, can single pass accomplish all standing of surveyed area, can significantly improve speed that scanning detects or the technical sophistication degree that reduces double probe.
In order to realize above purpose, the present invention realizes through following technical scheme:
The many linear transducer array scanning in a kind of no gap ultrasonic test equipment comprises:
The probe of several single-row arrangements, described each probe comprise the son probe of several single-row arrangements, the single-row arrangement of all son probes that described several probes comprise;
Master controller, described master controller link to each other through signal wire with each height probe respectively; Described master controller excites different son probe combinations successively, makes scanning have certain phase difference, realizes phased array scanning.
Described several probes adopt the mode of integrated encapsulation.
Described each probe is for being divided into some wafer, and every of being partitioned into of described wafer is a son probe.
The signal wire that described son probe links to each other with master controller is a polycore cable.
Described master controller is a multiplexer.
The present invention compared with prior art has the following advantages:
Only adopt single probe, can single pass accomplish all standing of surveyed area, can significantly improve speed that scanning detects or the technical sophistication degree that reduces double probe.
Description of drawings
Fig. 1 does not have the son probe arrangement of the many linear transducer array scanning in gap ultrasonic test equipment for the present invention is a kind of;
Fig. 2 is divided into two overlapping principle schematic of the son adjacent acoustic beam with it of probe for probe of the present invention.
Embodiment
Below in conjunction with accompanying drawing,, the present invention is done further elaboration through specifying a preferable specific embodiment.
The many linear transducer array scanning in a kind of no gap ultrasonic test equipment comprises: the probe of master controller and several single-row arrangements.Wherein, each probe comprises the son probe of several single-row arrangements, the single-row arrangement of all son probes that several probes comprise; Master controller links to each other through signal wire with each height probe respectively.In the present embodiment, several probes adopt the mode of integrated encapsulation, and each probe is for being divided into some wafer, and each sheet that wafer is cut apart constitutes a son probe; The signal wire that the son probe links to each other with master controller is a shielded multiconductor cable, has improved the reliability of signal wire; Master controller is selected multiplexer for use, can make the passage that connects each son probe have switching function.
As depicted in figs. 1 and 2; In the present embodiment, be example to need overlapping 1/2 of the single beam angle that is covered as of acoustic beam, this defect-detecting equipment comprises two probes: probe 1, probe 2; Each is popped one's head in and is the wafer that is divided into two; Promptly comprise two son probes, be respectively: son probe 11,12 and son probe 21,22, its neutron probe 12 and the 21 adjacent arrangements of son probe.Each son probe all constitutes a passage, through multiplexer, can make scanning have certain phase difference through exciting different son probe combinations successively, realizes phased array scanning, and the consistance of array probe is well ensured.
As shown in Figure 2, when exciton probe 11 and son probe 12, form the detection acoustic beam that the dotted line that has a down dip is represented left; When exciton probe the 12 and the 3rd son probe 21, the formation detection acoustic beam that dotted line is represented that has a down dip to the right then; When exciton probe 21 and son probe 22, then form the detection acoustic beam that the dotted line that has a down dip is represented again left.Because probe 1 and pop one's head in and have the gap between 2; This gap is generally 0.1mm; And can find out significantly that from Fig. 2 adjacent two acoustic beam overlapping areas are near 1/2 of single detection beam width; Satisfy overlapping 1/2 the requirement that is covered as single beam angle of present acoustic beam fully, can be owing to the gap of detecting between the acoustic beam forms omission.For except that the son probe 11 and son probe 22 of linear transducer array both sides; Son probe 21 and son probe 12 all with adjacent son probe combination respectively; Accomplish twice emitting/reception, overlay area, the obtainable no gap of single pass is the linear transducer array width that all son probes are formed, and the surveyed area width decision that the total number of son probe need cover based on single pass; Width is big more, and the number of son probe is corresponding many more.
In sum, the many linear transducer arrays in a kind of no gap of the present invention scanning ultrasonic test equipment only adopts single probe, can single pass accomplishes all standing of surveyed area, can significantly improve speed that scanning detects or the technical sophistication degree that reduces double probe.
Although content of the present invention has been done detailed introduction through above-mentioned preferred embodiment, will be appreciated that above-mentioned description should not be considered to limitation of the present invention.After those skilled in the art have read foregoing, for multiple modification of the present invention with to substitute all will be conspicuous.Therefore, protection scope of the present invention should be limited appended claim.
Claims (5)
1. the many linear transducer array scanning in a no gap ultrasonic test equipment is characterized in that, comprises:
The probe of several single-row arrangements, described each probe comprise the son probe of several single-row arrangements, the single-row arrangement of all son probes that described several probes comprise;
Master controller, described master controller link to each other through signal wire with each height probe respectively; Described master controller excites different son probe combinations successively, makes scanning have certain phase difference, realizes phased array scanning.
2. the many linear transducer array scanning in no gap according to claim 1 ultrasonic test equipment is characterized in that described several probes adopt the mode of integrated encapsulation.
3. many linear transducer arrays scanning ultrasonic test equipment in no gap according to claim 1 and 2 is characterized in that, described each probe is for being divided into some wafer, and every of being partitioned into of described wafer is a son probe.
4. the many linear transducer array scanning in no gap according to claim 3 ultrasonic test equipment is characterized in that the signal wire that described son probe links to each other with master controller is a polycore cable.
5. the many linear transducer array scanning in no gap according to claim 4 ultrasonic test equipment is characterized in that described master controller is a multiplexer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012100475410A CN102590339A (en) | 2012-02-28 | 2012-02-28 | Ultrasonic flaw detection equipment with zero-clearance multi-probe array |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012100475410A CN102590339A (en) | 2012-02-28 | 2012-02-28 | Ultrasonic flaw detection equipment with zero-clearance multi-probe array |
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| CN102590339A true CN102590339A (en) | 2012-07-18 |
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| CN2012100475410A Pending CN102590339A (en) | 2012-02-28 | 2012-02-28 | Ultrasonic flaw detection equipment with zero-clearance multi-probe array |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4552021A (en) * | 1982-12-30 | 1985-11-12 | Fujitsu Limited | Electro-sound transducer eliminating acoustic multi-reflection, and ultrasonic diagnostic apparatus applying it |
| US4699009A (en) * | 1985-11-05 | 1987-10-13 | Acuson | Dynamically focused linear phased array acoustic imaging system |
| CN101726540A (en) * | 2009-12-23 | 2010-06-09 | 哈尔滨工业大学 | Portable ultraphonic phased array detection imager |
| CN202453328U (en) * | 2012-02-28 | 2012-09-26 | 上海斌瑞检测技术服务有限公司 | Gapless multi-probe array scanning ultrasonic inspection equipment |
-
2012
- 2012-02-28 CN CN2012100475410A patent/CN102590339A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4552021A (en) * | 1982-12-30 | 1985-11-12 | Fujitsu Limited | Electro-sound transducer eliminating acoustic multi-reflection, and ultrasonic diagnostic apparatus applying it |
| US4699009A (en) * | 1985-11-05 | 1987-10-13 | Acuson | Dynamically focused linear phased array acoustic imaging system |
| CN101726540A (en) * | 2009-12-23 | 2010-06-09 | 哈尔滨工业大学 | Portable ultraphonic phased array detection imager |
| CN202453328U (en) * | 2012-02-28 | 2012-09-26 | 上海斌瑞检测技术服务有限公司 | Gapless multi-probe array scanning ultrasonic inspection equipment |
Non-Patent Citations (1)
| Title |
|---|
| 李衍: "超声相控阵技术(第一部分: 基本概念)", 《无损探伤》 * |
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Application publication date: 20120718 |