CN102419206A - Bidirectional observation and full spectrum direct reading light path system for spectrograph - Google Patents
Bidirectional observation and full spectrum direct reading light path system for spectrograph Download PDFInfo
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- CN102419206A CN102419206A CN2011102619031A CN201110261903A CN102419206A CN 102419206 A CN102419206 A CN 102419206A CN 2011102619031 A CN2011102619031 A CN 2011102619031A CN 201110261903 A CN201110261903 A CN 201110261903A CN 102419206 A CN102419206 A CN 102419206A
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Abstract
The invention discloses a bidirectional observation and full spectrum direct reading light path system for a spectrograph. The light path system comprises a bidirectional observation front lighting system and a crossed dispersion main light path system, wherein the bidirectional observation front lighting system is located in the horizontal direction, the crossed dispersion main light path system is located in the vertical direction, and two systems form a T-shaped structure; the bidirectional observation front lighting system is used for imaging a target on a slit and light rays from the front lighting system enter the crossed dispersion main light path system through the slit to obtain a two-dimensional spectrograph which is received by a plane array detector, so that full spectrum direct reading is realized. The bidirectional observation and full spectrum direct reading light path system for the spectrograph has the following characteristics that: the bidirectional observation front lighting system and the vertical crossed dispersion main light path system form the T-shaped structure, so that the structure is compact and the space is saved; by adoption of the vertical light path, the dispersion main light path system is capable of improving coma aberration and astigmatism favorably, increasing imaging quality, improving resolution, dispensing with any moving component and reducing loss of elements; and the light path system disclosed by the invention has the advantages of few simple optical elements, no special aspherical mirror, easy processing and low cost.
Description
Technical field
The invention belongs to the spectral technique field, relate in particular to high resolving power, the fast echelle spectrometer of test speed, the direct-reading light path system is composed in concrete a kind of two-way observation that is used for spectrometer that relates to entirely.
Background technology
Echelle spectrometer belongs to spectrometric instrument; Compare with traditional single-channel scanning spectrometer; Echelle spectrometer has that detection limit is low, wide waveband, monochromator do not have moving-member, compact conformation, need not repeatedly the characteristics such as instantaneous measurement that scan exposure just can be realized multielement spectrum; Be beneficial to and realize high-intelligentization and robotization, represented the development trend of spectral technique.
The former optical system extensively adopts Czerney-Turner (C-T) version structure, and dispersion element adopts common blazed grating, hangs down the order of diffraction time (as-1 grade or-2 grades) for fear of level time overlapping can only the use.After the advanced light that sends from light source passes entrance slit, reflex on the rotary grating, this grating with optical dispersion after, through reflection the light of a certain specific wavelength is projected on the photomultiplier through exit slit and detects.Grating only allows the light of a specific wavelength through this exit slit when turning to a certain fixed angle, with the variation of grating angle, spectral line from this slit successively through and get into detecting device and detect, accomplish once full spectrum scanning; Compare with multichannel spectrometer, it is more flexible that the single-channel scanning spectrometer wavelength is selected, and analytic sample wider is applicable to the wavelength coverage of broad.But need certain hour owing to accomplish single pass, so analysis speed receives certain limitation.Latter's optical system adopts echelle grating and prism crossed dispersion optical texture, and dispersion element adopts echelle grating and prism.Owing to adopted the inferior echelle grating of high diffracting grade; Its diffraction spectra exists serious level inferior overlapping; Therefore need to come with at different levels the spectral separation that a low dispersion element (prism or plane grating) will overlap; Promptly carry out crossed dispersion (with respect to the dispersion direction of echelle grating or be called as horizontal chromatic dispersion), make the incident single beam be decomposed into two-dimension spectrum, focus on the detector target surface by focus lamp by the order of wavelength and level time; Therefore, echelle spectrometer can obtain very broadband spectral signal in single exposure.This optical texture spectrometer has advantages such as miniaturization, high resolving power, quick measurement, has represented the development trend of spectrometer.
In inductive coupling plasma emission spectrograph, mainly contain at present axially, radially, two-way three kinds of observed patterns, radial survey is that the torch pipe is vertically observed; Axial observation is the quarter bend horizontal positioned, and observation flame end promptly axially; Two-way observation is the quarter bend horizontal positioned, can observe radial and axial.In plasma emission spectroscopy; Its intensity that transmits depends primarily on the length of light source passage; And the restriction that receives slit height of radial survey, the length of its light source passage is limited more than axial observation, thereby causes its detection limit to exceed several times with respect to axial observation; Detecting device inevitably receives the stronger radiation background of annulus when adopting radial survey simultaneously, has reduced the signal-to-background ratio when measuring.And level observation can be accepted more intense transmitting; Guarantee lower detection limit and background intensity (being that the background EPC is smaller); Advantage with higher signal-to-background ratio and low detection limit; But light intensity is the order of magnitude during owing to level observation increase, can only select time sensitive line when measuring the high-load element, cause measuring accuracy like this and be restricted.Therefore contrast the relative merits of the two, two kinds of methods can be covered the shortage each other, develop the technology of two-way observation, merge axially, characteristics radially, have certain dirigibility, have increased the adaptability of measuring complex sample.
Summary of the invention
The present invention aims to provide a kind of high resolving power, big visual field, wide spectral range and the little two-way observation that is used for spectrometer of optical texture compact volume and composes the direct-reading light path system entirely.
For realizing above-mentioned technical purpose, reach above-mentioned technique effect, the present invention realizes through following technical scheme:
The direct-reading light path system is composed in a kind of two-way observation that is used for spectrometer entirely; It comprises a preposition illuminator of a two-way observation and a crossed dispersion main optical path system; The preposition illuminator of said two-way observation is positioned at horizontal direction; Said crossed dispersion main optical path system is positioned at vertical direction, and two systems constitute a T shape structure.
Further; The preposition illuminator of said two-way observation comprises a level crossing, a radial spherical mirror, a deviation mirror, a slit and an axial spherical mirror; Said level crossing with radially become 45 °; Said radial spherical mirror has common object plane and image planes with axial spherical mirror, and said slit is positioned on the image planes of said radial spherical mirror, and said deviation mirror is rotatable; Target level is placed in the preposition illuminator of said two-way observation; From axial and radially daylighting; The rayed of radial direction is on said level crossing; Transfer axial direction to through said level crossing and shine on the said axial spherical mirror, behind said radial spherical mirror, project said deviation mirror, through being imaged on behind the said deviation mirror on the said slit; The rayed of axial direction projects said deviation mirror behind said axial spherical mirror, through being imaged on the said slit behind the said deviation mirror.
Further, said crossed dispersion main optical path system comprises a sphere collimating mirror, refracting prisms, an echelle grating, a spherical surface focusing mirror and a planar array detector, and said detector is positioned on the focal plane of said spherical surface focusing mirror; Said slit also is positioned on the focal plane of said sphere collimating mirror; The light of outgoing arrives said echelle grating through said refracting prisms refraction back behind said sphere collimating mirror from said slit; After the light behind the said scala media optical grating diffraction is once more through said refracting prisms chromatic dispersion, arrive said spherical surface focusing mirror; After said spherical surface focusing mirror converges, receive by said planar array detector.
Compared with prior art, the present invention has following beneficial effect:
1, in the preposition illumination optical system of two-way observation of the present invention, the commentaries on classics through deviation mirror is respectively with the photoimaging on the both direction is realized on slit axially and the radial survey mode is switched purpose.
2, crossed dispersion main optical path of the present invention system, through prism, the purpose that realize increasing dispersive power, improves resolution; Prism is vertical with the grating dispersion direction, can realize the full spectrogram of two dimension in conjunction with level is inferior with band selection, realizes the purpose of continuous wide spectral range; Light path system is vertical light path, and all elements are realized correcting coma and astigmatism not in same plane, improve picture element, improve the purpose of resolution; And no any moving-member and special optical element in the light path reduce the element loss, realize practicing thrift the purpose of cost.
3, the two-way observation that is used for spectrometer of the present invention composes entirely that the direct-reading light path system has the resolution height, the visual field is big, spectral range is wide and characteristics such as the optical texture compact volume is little, is particularly suitable for the spectrometric instrument system.
Above-mentioned explanation only is the general introduction of technical scheme of the present invention, understands technological means of the present invention in order can more to know, and can implement according to the content of instructions, below with preferred embodiment of the present invention and conjunction with figs. detailed description.Embodiment of the present invention is provided by following examples and accompanying drawing thereof in detail.
Description of drawings
Accompanying drawing described herein is used to provide further understanding of the present invention, constitutes the application's a part, and illustrative examples of the present invention and explanation thereof are used to explain the present invention, do not constitute improper qualification of the present invention.In the accompanying drawings:
Fig. 1 composes the structural representation of direct-reading light path system entirely for the two-way observation that is used for spectrometer of the present invention.
Label declaration among the figure: 1, level crossing, 2, the radial spherical mirror, 3, deviation mirror, 4, slit, 5, axial spherical mirror, 6, the sphere collimating mirror, 7, refracting prisms, 8, echelle grating, 9, the spherical surface focusing mirror, 10, focal plane detector, 11, target.
Embodiment
Below with reference to accompanying drawing and combine embodiment, specify the present invention.
As shown in Figure 1, the two-way observation that is used for spectrometer of the present invention is composed the direct-reading light path system entirely and is made up of level crossing 1, radial spherical mirror 2, deviation mirror 3, slit 4 and axial spherical mirror 5, sphere collimating mirror 6, refracting prisms 7, echelle grating 8, spherical surface focusing mirror 9 and planar array detector 10.
Embodiment 1:
Horizontal bidirectional observation light path system is imaged on target 11 on the slit 4; Rotation through level crossing 1 realizes axially and the switching of radial survey; Slit 4 is positioned on the focal plane of sphere collimating mirror 6; Light through slit 4 after sphere collimating mirror 6 becomes directional light and impinges upon refracting prisms 7 and in the horizontal direction chromatic dispersion takes place, again through echelle grating 8 in the vertical direction chromatic dispersion, after the light after echelon grating 8 chromatic dispersions is once more through prism 7 along continuous straight runs chromatic dispersions, impinge upon on the spherical surface focusing mirror 9; Focal plane detector 10 is positioned on the focal plane of focus lamp 9, and the light of line focus mirror forms the full spectrogram of two dimension on the target surface of focal plane detector 10.IMAQ control and signal Processing adopt microcomputer system.
Embodiment 2:
Two-way observation is composed full the light channel structure of direct-reading and build in inductive coupling plasma emission spectrograph, sample is sampled, sample is the mixed solution that contains the Na element.
Behind the igniting sample introduction, the plasma flame horizontal positioned, this example is from radially daylighting; The rayed of radial direction is on level crossing 1; Transfer axial direction to through level crossing 1 and shine on the axial spherical mirror 2, behind radial spherical mirror 2, project deviation mirror 3, through rotation deviation mirror 3 photoimaging that will directly make progress respectively on slit 4; Behind sphere collimating mirror 6, arrive echelle grating 8 from the light of slit 4 outgoing through refracting prisms 7 refraction backs;,,, spherical surface focusing mirror 9 receives after converging once more through arriving spherical surface focusing mirror 9 after refracting prisms 7 chromatic dispersions through the light behind echelon grating 8 diffraction by planar array detector 10.The big face battle array CID of high sensitivity HDR is adopted in the focal plane, and IMAQ and signal Processing adopt microcomputer system, demonstrate full spectrogram, demonstrates the inferior and characteristic wavelength of characteristic wavelength, respective stages of the element of surveying, and analyzes constituent content.
The above is merely preferred case study on implementation of the present invention, is not limited to the present invention, and for a person skilled in the art, the present invention can have various changes and variation.All within spirit of the present invention and principle, any modification of being done, be equal to replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (3)
1. the direct-reading light path system is composed in a two-way observation that is used for spectrometer entirely; It is characterized in that: comprise a preposition illuminator of a two-way observation and a crossed dispersion main optical path system; The preposition illuminator of said two-way observation is positioned at horizontal direction; Said crossed dispersion main optical path system is positioned at vertical direction, and two systems constitute a T shape structure.
2. the direct-reading light path system is composed in the two-way observation that is used for spectrometer according to claim 1 entirely; It is characterized in that: the preposition illuminator of said two-way observation comprises a level crossing (1), a radial spherical mirror (2), a deviation mirror (3), a slit (4) and an axial spherical mirror (5); Said level crossing (1) with radially become 45 °; Said radial spherical mirror (2) and axial spherical mirror (5) have common object plane and image planes; Said slit (4) is positioned on the image planes of said radial spherical mirror (2), and said deviation mirror (3) is rotatable; Target (11) horizontal positioned in the preposition illuminator of said two-way observation; From axial and radially daylighting; The rayed of radial direction is on said level crossing (1); Transfer axial direction to through said level crossing (1) and shine on the said axial spherical mirror (2), behind said radial spherical mirror (2), project said deviation mirror (3), through being imaged on behind the said deviation mirror (3) on the said slit (4); The rayed of axial direction projects said deviation mirror (3) behind said axial spherical mirror (5), through being imaged on the said slit (4) behind the said deviation mirror (3).
3. the direct-reading light path system is composed in the two-way observation that is used for spectrometer according to claim 2 entirely; It is characterized in that: said crossed dispersion main optical path system comprises a sphere collimating mirror (6), refracting prisms (7), an echelle grating (8), a spherical surface focusing mirror (9) and a planar array detector (10), and said detector (10) is positioned on the focal plane of said spherical surface focusing mirror (9); Said slit (4) also is positioned on the focal plane of said sphere collimating mirror (6); The light of outgoing arrives said echelle grating (8) through said refracting prisms (7) refraction back behind said sphere collimating mirror (6) from said slit (4); After the light behind said scala media grating (8) diffraction is once more through said refracting prisms (7) chromatic dispersion, arrive said spherical surface focusing mirror (9); After said spherical surface focusing mirror (9) converges, receive by said planar array detector (10).
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102879091A (en) * | 2012-08-28 | 2013-01-16 | 中国科学院长春光学精密机械与物理研究所 | Echelle grating spectrometer, atomic emission spectrometer and spectrum testing method |
| CN104735321A (en) * | 2015-03-25 | 2015-06-24 | 北京空间机电研究所 | Optical bidirectional scanning system of space TDICCD remote sensor |
| CN106338506A (en) * | 2016-08-29 | 2017-01-18 | 钢研纳克检测技术有限公司 | Bi-directional observation light path structure applied to ICP spectrograph |
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| EP1417462A1 (en) * | 2001-08-16 | 2004-05-12 | Cymer, Inc. | Convolution method for measuring laser bandwidth |
| US20060164639A1 (en) * | 2005-01-21 | 2006-07-27 | Horn Jochen M M | Cross-dispersed spectrometer in a spectral domain optical coherence tomography system |
| WO2010086283A2 (en) * | 2009-01-30 | 2010-08-05 | Leibniz - Institut Für Analytische Wissenschaften - Isas - E.V. | Echelle spectrometer arrangement using internal predispersion |
| CN101968442A (en) * | 2010-09-19 | 2011-02-09 | 西安交通大学 | Crank block movable mirror scanning system for Fourier transform spectrometer |
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2011
- 2011-09-06 CN CN2011102619031A patent/CN102419206A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
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| WO2001061292A1 (en) * | 2000-02-15 | 2001-08-23 | Varian Australia Pty Ltd | Method and apparatus for spectrochemical analysis |
| EP1417462A1 (en) * | 2001-08-16 | 2004-05-12 | Cymer, Inc. | Convolution method for measuring laser bandwidth |
| US20060164639A1 (en) * | 2005-01-21 | 2006-07-27 | Horn Jochen M M | Cross-dispersed spectrometer in a spectral domain optical coherence tomography system |
| WO2010086283A2 (en) * | 2009-01-30 | 2010-08-05 | Leibniz - Institut Für Analytische Wissenschaften - Isas - E.V. | Echelle spectrometer arrangement using internal predispersion |
| CN101968442A (en) * | 2010-09-19 | 2011-02-09 | 西安交通大学 | Crank block movable mirror scanning system for Fourier transform spectrometer |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102879091A (en) * | 2012-08-28 | 2013-01-16 | 中国科学院长春光学精密机械与物理研究所 | Echelle grating spectrometer, atomic emission spectrometer and spectrum testing method |
| CN102879091B (en) * | 2012-08-28 | 2014-08-20 | 中国科学院长春光学精密机械与物理研究所 | Echelle grating spectrometer, atomic emission spectrometer and spectrum testing method |
| CN104735321A (en) * | 2015-03-25 | 2015-06-24 | 北京空间机电研究所 | Optical bidirectional scanning system of space TDICCD remote sensor |
| CN104735321B (en) * | 2015-03-25 | 2017-08-29 | 北京空间机电研究所 | A kind of space TDICCD remote sensors optical bi-directional scanning system |
| CN106338506A (en) * | 2016-08-29 | 2017-01-18 | 钢研纳克检测技术有限公司 | Bi-directional observation light path structure applied to ICP spectrograph |
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