CN102253751A - Wiring structure and positioning method of single-layer ITO (Indium Tin Oxide) - Google Patents

Wiring structure and positioning method of single-layer ITO (Indium Tin Oxide) Download PDF

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Publication number
CN102253751A
CN102253751A CN2011102069987A CN201110206998A CN102253751A CN 102253751 A CN102253751 A CN 102253751A CN 2011102069987 A CN2011102069987 A CN 2011102069987A CN 201110206998 A CN201110206998 A CN 201110206998A CN 102253751 A CN102253751 A CN 102253751A
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China
Prior art keywords
row
influence value
touch
localization method
layer ito
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Pending
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CN2011102069987A
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Chinese (zh)
Inventor
樊永召
朱建锋
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Suzhou Pixcir Microelectronics Co Ltd
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Suzhou Pixcir Microelectronics Co Ltd
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Priority to CN2011102069987A priority Critical patent/CN102253751A/en
Publication of CN102253751A publication Critical patent/CN102253751A/en
Pending legal-status Critical Current

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Abstract

The invention relates to a wiring structure of a single-layer ITO (Indium Tin Oxide), composed of a plurality of positive touch-control electrodes and a plurality of negative touch-control electrodes, wherein the positive touch-control electrodes and the negative touch-control electrodes are arranged face to face, and the electrodes in one direction are respectively positioned in a gap area between the electrodes in another direction. The wiring structure of the single-layer ITO provided by the invention has the advantages that: compared with wiring of a double-layer ITO, the manufacturing process of the wiring structure of the single-layer ITO is much more simple, so the cost is cheap, and a touch screen has good mutual matching performance in function because the thickness of the touch screen formed by the single-layer ITO is thinner.

Description

The wire structures of individual layer ITO and localization method
Technical field
The present invention relates to the wire structures of ITO, refer in particular to wire structures and the localization method of individual layer ITO.
Background technology
So-called ITO(indium tin oxide) be a kind of critical material that is used for the production LCD, at present, it has all had in fields such as instrument and meter, computing machine, electronic watch, game machine and household electrical appliance very widely uses.The capacitive touch screen of big heat also is to utilize ITO to finish the action that detecting touches on the market in recent years, and the wiring of ITO generally is double-deck on the capacitance touch screen, its cardinal principle is: utilize people's bulk electric field, when the user touches, the mutual capacitance (also claiming coupling capacitance) of the infall sensing unit of surface row or column can change, and finally can detect the particular location of touch point according to above-mentioned variation.
The structure of common double-deck ITO is a diamond structure, its double-deck ITO is laid in respectively on the ipsilateral of glass substrate, for fear of the mutual conduction between the electrode,, so just double-deck ITO can be laid on the same side of glass substrate so bridge contact need be set on glass substrate.Though said method has been realized the action that detecting touches, the touch screen structure of the double-deck ITO of this employing, not only complex process, and bridge joint place damages easily, and the product yield is low, causes cost to raise.In order to overcome above-mentioned shortcoming, part manufacturer is arranged to rectangle with the structure of ITO, two-sidedly then be arranged on the two-layer of glass substrate, so, really simple much of technology, and improved the product yield, but what still adopt is the wire structures of double-deck ITO, the cost of ITO own is just higher, adds structure of two layers, and the thickness that forms touch-screen has thus also just been increased.If can overcome the limitation that double-deck ITO layouts brings, so no matter be to consider that from the cost or the structure of touch-screen individual layer ITO all has more advantages.
Therefore need solve above problem for users provide the wire structures of a kind of easier ITO.
Summary of the invention
The actual technical matters to be solved of the present invention is how to provide a kind of technology simple, the wire structures of individual layer ITO with low cost.
In order to realize above-mentioned purpose of the present invention, the invention provides a kind of
The wire structures of individual layer ITO of the present invention, the wiring of double-deck relatively ITO, manufacturing process is simpler, thus with low cost, moreover by the touch-screen thinner thickness that individual layer ITO forms, matching performance is good mutually on the function.
Description of drawings
Fig. 1 is first kind of embodiment according to individual layer ITO wiring of the present invention.
Fig. 2 schemes over time according to induction amount behind the touch-control of the present invention.
Embodiment
The present invention is further illustrated below in conjunction with drawings and Examples.
Please refer to shown in Figure 1ly, invention relates to the wire structures of individual layer ITO, and described ITO layer 1 is made up of several touch-control electrode blocks 10, forms some stringers and file, and promptly each stringer or file are by a plurality of touch-control electrode blocks 10 compositions; Each touch-control electrode block 10 is all rectangular, and square all is arranged in the position of calculating touch points for convenience, and all electrode blocks 10 all are wired on the respective pins of touch-control chip 11.
When described ITO layer 1 scans, scan stringer and file one by one, scan two rows or two columns at every turn simultaneously, and obtain its difference.If individual layer ITO layer 1 has the capable B row of A, during scanning stringer earlier, at first respectively all touch-control electrode blocks 10 in first row and second row are arranged to the conducting form at chip internal, all electrode blocks 10 that are about in first row are arranged to the conducting form, then all electrode blocks 10 in second row are arranged to the conducting form.When scanning for the first time, if first row is set to the scanning end, then second row that order is adjacent successively is set to reference edge, all unsettled or ground connection of other electrode block 10 this moment; When scanning for the second time, continue respectively all touch-control electrode blocks 10 in second row and the third line to be arranged to the conducting form at chip internal, if second row is set to the scanning end, then the third line that order is adjacent successively is a reference edge just, all unsettled or ground connection of other electrode block 10 this moment; Sequential scanning ends until scanning the A-1 behavior successively.
Data according to the each scanning of above-mentioned scan method record back acquisition, just formed the para-curve of responding to the numerical quantity variation as described in Figure 2 by above-mentioned data, at first detect the data that described electrode block 10 scanning backs produce, find out the maximum in the data, the minimum influence value of producing on the sweep trace that described electrode block 10 connected respectively, do further to judge and handle according to the maximum that is obtained, minimum influence value then.Be located on the sweep trace that the electrode block 10 on the described electrode layer 1 connected and all detected data, and maximum influence value M and minimum influence value N have occurred, wherein, maximum influence value M be on the occasion of, minimum influence value N is a negative value; Then judge then with sweep trace that electrode block 10 is connected on the maximum influence value M that produced whether greater than the positive threshold influence value M0 of preset in advance, whether the minimum influence value N that is produced is less than the negative threshold influence value N0 of preset in advance, whether promptly judge maximum influence value M greater than positive threshold influence value M0, whether minimum influence value N is less than negative threshold influence value N0 simultaneously; If satisfy above-mentioned two conditions, then continue again to check whether pass through zero influence value between above-mentioned maximum, minimum influence value M, the N; If passed through zero influence value between adjacent arbitrarily maximum, minimum influence value M, the N, then show the touch object touching is arranged, and the point that passes through zero influence value is exactly the touch points position coordinates, as can be seen from Figure 2, having only influence value is to have satisfied the condition of passing through zero influence value between the maximum of M and N, the minimum influence value, illustrate that then there is the touch object touching this position, and this position of passing through zero influence value promptly is the position coordinates that touch object is touched described individual layer ITO.
Because in the present invention, each electrode block 10 all has the scanning end, and be connected on the respective pins of touch-control chip 11, just when scanning, all electrode blocks 10 in every row just all are configured to the conducting form, therefore, just can determine the particular location of touch object, and above-mentioned zero to pass through a little position be exactly particular location coordinate after touch object is touched according to each electrode block 10.
After obtaining the particular location coordinate of above-mentioned touch object, need utilize above-mentioned same principle to continue sequential scanning file successively, be used to eliminate outside noise, make anti-interference process.When promptly scanning the B row of individual layer ITO layer, when scanning for the first time, all electrode blocks 10 in first row all are set to conducting, this moment first, row were set to the scanning end, and all electrode blocks 10 in the secondary series that order is adjacent successively also all are set to conducting, this moment, secondary series was set to reference edge, meanwhile, and all unsettled or ground connection of other electrode block 10; Sequential scanning is only classified as until scanning B-1 successively.
According to above-mentioned steps, we just can determine the particular location of touch points on individual layer ITO, and have effectively eliminated outside noise, thereby can judge the particular location of touch points fast and accurately.Because the present invention has adopted wire structures and the localization method of individual layer ITO, thus not only simpler, with low cost on the structure, and also the speed of detecting location is rapider and accurately, and can support many finger touch-controls.

Claims (10)

1. the wire structures of an individual layer ITO, it is made up of some electrode blocks, forms some stringers and file, is characterised in that: described touch-control electrode block all is wired on the respective pins of chip.
2. wire structures as claimed in claim 1 is characterized in that: described touch-control electrode block is rectangular.
3. wire structures as claimed in claim 1 is characterized in that: described touch-control electrode block is square.
4. utilize the localization method that wire structures adopted of aforesaid right requirement 1, its step is as follows:
At first, order scans two row simultaneously and obtains each data one by one, judges the particular location of touch points according to above-mentioned each data;
Secondly, continuing one by one, order scans two row simultaneously.
5. localization method as claimed in claim 4 is characterized in that: during the above-mentioned two rows or two columns of described scanning, and the equal conducting of some electrode blocks in every row or the every row.
6. localization method as claimed in claim 5 is characterized in that: during the above-mentioned two rows or two columns of described scanning, the electrode block in described every row or the every row is arranged to conducting at chip internal respectively.
7. as any described localization method in the claim 4 to 6, it is characterized in that: described any delegation or row are as scanning end, and another then adjacent successively row or another row are as the reference end.
8. localization method as claimed in claim 4 is characterized in that: described order one by one scans two row simultaneously and obtains each data, is determined the position coordinates of touch points by the maximum in the described data, minimum influence value.
9. localization method as claimed in claim 8, it is characterized in that: if described maximum influence value is greater than default positive threshold influence value, and minimum influence value is less than preset negative threshold influence value, and adjacent so arbitrarily maximum, the point that passes through zero influence value between the minimum influence value are exactly the touch points position coordinates.
10. localization method as claimed in claim 4 is characterized in that: described continuation scans two row one by one in proper order simultaneously and is used to eliminate ambient noise, makes anti-interference process.
CN2011102069987A 2011-07-22 2011-07-22 Wiring structure and positioning method of single-layer ITO (Indium Tin Oxide) Pending CN102253751A (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102750038A (en) * 2012-06-29 2012-10-24 苏州瀚瑞微电子有限公司 Scanning method of touch control chip
CN103076937A (en) * 2013-01-30 2013-05-01 福建科创光电有限公司 Electrode pin of capacitive touch screen
CN104142765A (en) * 2013-05-10 2014-11-12 胜华科技股份有限公司 Touch sensing unit and touch pad
CN107918235A (en) * 2013-12-31 2018-04-17 上海天马微电子有限公司 A kind of array base palte and display device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070008299A1 (en) * 2005-07-08 2007-01-11 Harald Philipp Two-Dimensional Position Sensor
CN101727242A (en) * 2009-12-21 2010-06-09 苏州瀚瑞微电子有限公司 Method for sensing multiclutch on touch panel
CN102073430A (en) * 2011-01-24 2011-05-25 苏州瀚瑞微电子有限公司 Method for capacitive screen to automatically adjust induction value

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070008299A1 (en) * 2005-07-08 2007-01-11 Harald Philipp Two-Dimensional Position Sensor
CN101727242A (en) * 2009-12-21 2010-06-09 苏州瀚瑞微电子有限公司 Method for sensing multiclutch on touch panel
CN102073430A (en) * 2011-01-24 2011-05-25 苏州瀚瑞微电子有限公司 Method for capacitive screen to automatically adjust induction value

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102750038A (en) * 2012-06-29 2012-10-24 苏州瀚瑞微电子有限公司 Scanning method of touch control chip
CN103076937A (en) * 2013-01-30 2013-05-01 福建科创光电有限公司 Electrode pin of capacitive touch screen
CN103076937B (en) * 2013-01-30 2016-04-27 福建科创光电有限公司 The electrode pin of capacitive touch screen
CN104142765A (en) * 2013-05-10 2014-11-12 胜华科技股份有限公司 Touch sensing unit and touch pad
CN104142765B (en) * 2013-05-10 2017-04-12 胜华科技股份有限公司 Touch sensing unit and touch pad
CN107918235A (en) * 2013-12-31 2018-04-17 上海天马微电子有限公司 A kind of array base palte and display device

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Application publication date: 20111123