CN101688893B - 用于薄膜太阳能电池模块的自动质量控制的测试设备 - Google Patents
用于薄膜太阳能电池模块的自动质量控制的测试设备 Download PDFInfo
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- CN101688893B CN101688893B CN2008800124651A CN200880012465A CN101688893B CN 101688893 B CN101688893 B CN 101688893B CN 2008800124651 A CN2008800124651 A CN 2008800124651A CN 200880012465 A CN200880012465 A CN 200880012465A CN 101688893 B CN101688893 B CN 101688893B
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- photovoltaic cell
- solar module
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- 238000003908 quality control method Methods 0.000 title description 2
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Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Abstract
Description
Claims (22)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US91279907P | 2007-04-19 | 2007-04-19 | |
US60/912,799 | 2007-04-19 | ||
US94369407P | 2007-06-13 | 2007-06-13 | |
US60/943,694 | 2007-06-13 | ||
PCT/EP2008/054762 WO2008129010A2 (en) | 2007-04-19 | 2008-04-18 | Test equipment for automated quality control of thin film solar modules |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101688893A CN101688893A (zh) | 2010-03-31 |
CN101688893B true CN101688893B (zh) | 2012-08-08 |
Family
ID=39773113
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2008800124651A Expired - Fee Related CN101688893B (zh) | 2007-04-19 | 2008-04-18 | 用于薄膜太阳能电池模块的自动质量控制的测试设备 |
Country Status (7)
Country | Link |
---|---|
US (1) | US7554346B2 (zh) |
EP (1) | EP2137543B1 (zh) |
JP (1) | JP2010525311A (zh) |
CN (1) | CN101688893B (zh) |
AT (1) | ATE545036T1 (zh) |
TW (1) | TWI429925B (zh) |
WO (1) | WO2008129010A2 (zh) |
Families Citing this family (51)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5236858B2 (ja) * | 2005-02-01 | 2013-07-17 | 日清紡ホールディングス株式会社 | 太陽電池の出力特性の測定方法。 |
US7906980B1 (en) * | 2008-02-19 | 2011-03-15 | William Ray Cravey | Rapid sweeping load testing circuit and method |
US9082673B2 (en) | 2009-10-05 | 2015-07-14 | Zena Technologies, Inc. | Passivated upstanding nanostructures and methods of making the same |
US8507840B2 (en) | 2010-12-21 | 2013-08-13 | Zena Technologies, Inc. | Vertically structured passive pixel arrays and methods for fabricating the same |
US8229255B2 (en) | 2008-09-04 | 2012-07-24 | Zena Technologies, Inc. | Optical waveguides in image sensors |
US9000353B2 (en) | 2010-06-22 | 2015-04-07 | President And Fellows Of Harvard College | Light absorption and filtering properties of vertically oriented semiconductor nano wires |
US9343490B2 (en) | 2013-08-09 | 2016-05-17 | Zena Technologies, Inc. | Nanowire structured color filter arrays and fabrication method of the same |
US8519379B2 (en) | 2009-12-08 | 2013-08-27 | Zena Technologies, Inc. | Nanowire structured photodiode with a surrounding epitaxially grown P or N layer |
US8835831B2 (en) | 2010-06-22 | 2014-09-16 | Zena Technologies, Inc. | Polarized light detecting device and fabrication methods of the same |
US8274039B2 (en) | 2008-11-13 | 2012-09-25 | Zena Technologies, Inc. | Vertical waveguides with various functionality on integrated circuits |
US8889455B2 (en) | 2009-12-08 | 2014-11-18 | Zena Technologies, Inc. | Manufacturing nanowire photo-detector grown on a back-side illuminated image sensor |
US8299472B2 (en) | 2009-12-08 | 2012-10-30 | Young-June Yu | Active pixel sensor with nanowire structured photodetectors |
US8791470B2 (en) | 2009-10-05 | 2014-07-29 | Zena Technologies, Inc. | Nano structured LEDs |
US8890271B2 (en) | 2010-06-30 | 2014-11-18 | Zena Technologies, Inc. | Silicon nitride light pipes for image sensors |
US9515218B2 (en) | 2008-09-04 | 2016-12-06 | Zena Technologies, Inc. | Vertical pillar structured photovoltaic devices with mirrors and optical claddings |
US9299866B2 (en) | 2010-12-30 | 2016-03-29 | Zena Technologies, Inc. | Nanowire array based solar energy harvesting device |
US8735797B2 (en) | 2009-12-08 | 2014-05-27 | Zena Technologies, Inc. | Nanowire photo-detector grown on a back-side illuminated image sensor |
US8269985B2 (en) | 2009-05-26 | 2012-09-18 | Zena Technologies, Inc. | Determination of optimal diameters for nanowires |
US8546742B2 (en) | 2009-06-04 | 2013-10-01 | Zena Technologies, Inc. | Array of nanowires in a single cavity with anti-reflective coating on substrate |
US9478685B2 (en) | 2014-06-23 | 2016-10-25 | Zena Technologies, Inc. | Vertical pillar structured infrared detector and fabrication method for the same |
US8748799B2 (en) | 2010-12-14 | 2014-06-10 | Zena Technologies, Inc. | Full color single pixel including doublet or quadruplet si nanowires for image sensors |
US8866065B2 (en) | 2010-12-13 | 2014-10-21 | Zena Technologies, Inc. | Nanowire arrays comprising fluorescent nanowires |
US8384007B2 (en) | 2009-10-07 | 2013-02-26 | Zena Technologies, Inc. | Nano wire based passive pixel image sensor |
US9406709B2 (en) | 2010-06-22 | 2016-08-02 | President And Fellows Of Harvard College | Methods for fabricating and using nanowires |
WO2010039500A2 (en) * | 2008-09-23 | 2010-04-08 | Applied Materials, Inc. | Light soaking system and test method for solar cells |
LU91561B1 (en) * | 2009-04-30 | 2010-11-02 | Univ Luxembourg | Electrical and opto-electrical characterisation oflarge-area semiconductor devices. |
JPWO2011024750A1 (ja) * | 2009-08-25 | 2013-01-31 | 株式会社アルバック | 太陽電池の評価方法及び評価装置 |
DE102009049704B4 (de) * | 2009-10-18 | 2012-09-20 | Harrexco Ag | Vorrichtung zur Prüfung der Isolationseigenschaften einer Photovoltaikmodulplatte, Prüfmittel sowie Verfahren zur Prüfung |
ES2389219B1 (es) * | 2009-12-09 | 2013-04-03 | Aplicaciones Técnicas de la Energía, S.L. | Procedimiento y sistema de verificación de un conjunto de células solares fotovoltaicas. |
US20110220182A1 (en) * | 2010-03-12 | 2011-09-15 | Rfmarq, Inc. | Solar Panel Tracking and Performance Monitoring Through Wireless Communication |
US8614787B2 (en) * | 2010-05-12 | 2013-12-24 | Intermolecular, Inc. | High throughput quantum efficiency combinatorial characterization tool and method for combinatorial solar test substrates |
WO2012000533A1 (de) * | 2010-06-28 | 2012-01-05 | Sma Solar Technology Ag | Vorrichtung und verfahren zur überwachung einer photovoltaikanlage |
TW201208087A (en) * | 2010-08-13 | 2012-02-16 | Schmid Yaya Technology Co Ltd | Solar panel testing machine |
JP5562762B2 (ja) * | 2010-08-20 | 2014-07-30 | 株式会社東芝 | 開放電圧制御システム |
CN101915890B (zh) * | 2010-08-20 | 2012-07-04 | 武汉理工大学 | 用于船用太阳能电池板电力特性测试的海洋环境模拟装置 |
US9658252B2 (en) * | 2011-02-21 | 2017-05-23 | United Microelectronics Corp. | Probe insertion auxiliary and method of probe insertion |
TW201244117A (en) * | 2011-03-23 | 2012-11-01 | Pasan Sa | Systems and methods for making at least a detachable electrical contact with at least a photovoltaic device |
CN103858271B (zh) * | 2011-09-05 | 2016-08-17 | 日本麦可罗尼克斯股份有限公司 | 片状电池的评价装置以及评价方法 |
US20130249580A1 (en) * | 2012-03-26 | 2013-09-26 | Primestar Solar, Inc. | Apparatus and method for evaluating characteristics of a photovoltaic device |
US20140012520A1 (en) * | 2012-07-03 | 2014-01-09 | Mersen Usa Newburyport-Ma, Llc | Photovoltaic string monitor |
US20140139249A1 (en) * | 2012-11-20 | 2014-05-22 | Primestar Solar, Inc. | Apparatus and a method for detecting defects within photovoltaic modules |
CN104184413A (zh) * | 2013-05-27 | 2014-12-03 | 新科实业有限公司 | 太阳能电池板的测试方法及测试装置 |
US20150318822A1 (en) * | 2014-04-30 | 2015-11-05 | Xiuwen Tu | Reducing unequal biasing in solar cell testing |
CN104241160A (zh) * | 2014-09-28 | 2014-12-24 | 中国建材国际工程集团有限公司 | 太阳能电池组件局部光学性能测试方法与装置 |
CA2999939C (en) * | 2015-09-24 | 2019-09-10 | Hee Solar, L.L.C. | System for testing photosensitive device degradation |
TWI648947B (zh) * | 2017-09-01 | 2019-01-21 | 英穩達科技股份有限公司 | 太陽能電池片的檢測設備及方法 |
CN109088597A (zh) * | 2018-08-02 | 2018-12-25 | 海宁奇瑞特光电有限公司 | 一种可回收利用热量的光伏组件及其制造方法 |
CN109031146B (zh) * | 2018-08-16 | 2024-03-19 | 天津城建大学 | 一种便携式太阳能电池测试装置 |
CN109768770A (zh) * | 2019-01-10 | 2019-05-17 | 成都中建材光电材料有限公司 | 一种太阳能电池板检测装置 |
CN111030595B (zh) * | 2019-12-16 | 2022-08-30 | 凯盛光伏材料有限公司 | 一种太阳能薄膜组件子电池测试方法 |
CN112466768B (zh) * | 2020-11-12 | 2022-05-24 | 东营大海科林光电有限公司 | 一种光伏电池板的检测装置及检测方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1573348A (zh) * | 2003-06-16 | 2005-02-02 | 佳能株式会社 | 太阳能电池元件的光电变换特性的测定方法和测定装置 |
CN1769886A (zh) * | 2005-10-01 | 2006-05-10 | 中国科学院等离子体物理研究所 | 多路光伏电池性能实时测试方法 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3630627A (en) * | 1970-02-27 | 1971-12-28 | Nasa | Solar cell assembly test method |
JPS58104973U (ja) * | 1982-01-08 | 1983-07-16 | 日本電気株式会社 | 簡易型太陽電池特性チエツカ |
JPS5920870A (ja) * | 1982-07-27 | 1984-02-02 | Sharp Corp | 太陽電池アレ−の試験方法 |
US4712063A (en) * | 1984-05-29 | 1987-12-08 | The United States Of America As Represented By The United States Department Of Energy | Method and apparatus for measuring areas of photoelectric cells and photoelectric cell performance parameters |
JP3618865B2 (ja) * | 1996-01-05 | 2005-02-09 | キヤノン株式会社 | 光起電力素子の特性検査装置及び製造方法 |
NL1013204C2 (nl) * | 1999-10-04 | 2001-04-05 | Stichting Energie | Inrichting voor het lokaliseren van productiefouten in een fotovolta´sch element. |
JP2001274422A (ja) * | 2000-03-23 | 2001-10-05 | Kanegafuchi Chem Ind Co Ltd | ハイブリッド型薄膜光電変換装置 |
JP4804611B2 (ja) * | 2000-04-24 | 2011-11-02 | 株式会社カネカ | 集積型ハイブリッド薄膜太陽電池の製造方法 |
JP4461625B2 (ja) * | 2001-03-13 | 2010-05-12 | 富士電機ホールディングス株式会社 | 太陽電池セル特性の連続自動測定方法および装置 |
JP2002329879A (ja) * | 2001-05-02 | 2002-11-15 | Sumitomo Kinzoku Kozan Siporex Kk | 太陽電池アレイの欠陥検出方法 |
US20030122558A1 (en) * | 2001-12-28 | 2003-07-03 | Hacke Peter L. | System and method for measuring photovoltaic cell conductive layer quality and net resistance |
JP4233330B2 (ja) * | 2003-01-10 | 2009-03-04 | 三洋電機株式会社 | 光起電力装置の検査方法 |
JP4625941B2 (ja) * | 2003-02-04 | 2011-02-02 | 独立行政法人産業技術総合研究所 | 太陽電池の性能評価装置 |
JP4409323B2 (ja) * | 2004-03-24 | 2010-02-03 | シャープ株式会社 | 太陽電池セル評価装置及びそれを備えたソーラーシミュレータ |
JP2006118983A (ja) * | 2004-10-21 | 2006-05-11 | Sharp Corp | 太陽電池セルの測定治具 |
JP5148073B2 (ja) * | 2005-06-17 | 2013-02-20 | 日清紡ホールディングス株式会社 | ソーラシミュレータによる測定方法 |
US7309850B2 (en) * | 2005-08-05 | 2007-12-18 | Sinton Consulting, Inc. | Measurement of current-voltage characteristic curves of solar cells and solar modules |
-
2008
- 2008-04-18 AT AT08749611T patent/ATE545036T1/de active
- 2008-04-18 US US12/105,331 patent/US7554346B2/en not_active Expired - Fee Related
- 2008-04-18 EP EP08749611A patent/EP2137543B1/en not_active Not-in-force
- 2008-04-18 CN CN2008800124651A patent/CN101688893B/zh not_active Expired - Fee Related
- 2008-04-18 JP JP2010503525A patent/JP2010525311A/ja active Pending
- 2008-04-18 WO PCT/EP2008/054762 patent/WO2008129010A2/en active Application Filing
- 2008-04-21 TW TW097114443A patent/TWI429925B/zh not_active IP Right Cessation
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1573348A (zh) * | 2003-06-16 | 2005-02-02 | 佳能株式会社 | 太阳能电池元件的光电变换特性的测定方法和测定装置 |
CN1769886A (zh) * | 2005-10-01 | 2006-05-10 | 中国科学院等离子体物理研究所 | 多路光伏电池性能实时测试方法 |
Also Published As
Publication number | Publication date |
---|---|
US20080258747A1 (en) | 2008-10-23 |
EP2137543A2 (en) | 2009-12-30 |
WO2008129010A3 (en) | 2009-03-26 |
JP2010525311A (ja) | 2010-07-22 |
TW200900708A (en) | 2009-01-01 |
US7554346B2 (en) | 2009-06-30 |
ATE545036T1 (de) | 2012-02-15 |
EP2137543B1 (en) | 2012-02-08 |
WO2008129010A9 (en) | 2009-01-08 |
TWI429925B (zh) | 2014-03-11 |
WO2008129010A2 (en) | 2008-10-30 |
CN101688893A (zh) | 2010-03-31 |
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Granted publication date: 20120808 Termination date: 20140418 |