CN101305381A - 支付卡信号表征方法及电路 - Google Patents
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Abstract
提供了一种用于测试非接触式电子支付卡的基准读卡器,该电子支付卡通过小负载调制RF载波信号发送数据。基准读卡器包括读卡器天线和耦合共模抑制电路。该共模抑制电路被配置成对读卡器天线所接收的载波信号进行解调以检索具有低调制指数的支付卡数据信号。
Description
相关申请的交叉引用
本申请要求2004年7月15日提交的美国临时专利申请No.60/588,270的优先权。本申请也相关于同一天共同提交的序列号为__,__,__,和__的美国专利申请,其中所有这些申请要求上述专利申请No.60/588,270的优先权。所有上述专利申请都通过引用全部结合于此。
背景技术
射频识别(RFID)标签是连接到天线的小集成电路(IC),该天线取决于于IC的尺寸用简单标识信息或更复杂的信号来对询问RF信号作出响应。RFID技术不要求用于通信的接触或瞄准线。例如,现今射频识别技术变得经济可行,并且越来越多的工商业应用中采用了这项技术。例如,现在RFID技术广泛地在仓库、商店的商品、ID或门卡等中用作标签。另外,RFID技术也以嵌有RFID标签的“非接触式”支付或信用卡的形式被引入到支付卡行业中(例如,MasterCard、AmericanExpress和Visa信用卡)。这些非接触式支付卡可被用来经由与可用RFID的支付终端的无线通信进行电子支付交易。非接触式支付卡可在例如零售店、商店或超级市场中为消费者提供简单、快速且方便的购物方式及服务。
一些RFID技术可被用于非接触式支付卡和读卡器/终端。非接触式系统的基本元件包括非接触式读卡器(例如接近耦合设备(PCD))和应答器。非接触式读卡器是连接到电子电路的天线。应答器由感应天线与连接到此天线端部的集成电路构成。读卡器-应答器的组合用作变压器。交变电流流经产生电磁场的初级线圈(读卡器天线),该电磁场在次级线圈(应答器天线)中感生电流。应答器通过二极管整流器将由非接触式读卡器(PCD)发送的电磁场(或RF场)转换成DC电压。此DC电压对应答器的内部电路上电。根据不同的设备,两个天线的配置和调谐决定了耦合效率。应答器可以是非接触式支付卡。
为了使非接触式支付卡在经济上更为可行并在商业上获得认同,甚至在卡和终端具有专用于供卡商/发卡行、供应商或终端制造商的专利技术特性时,非接触式支付卡就必须能在所有或大多数可用RFID的支付终端上可互操作。期望在整个行业内具有可互操作性。为此,行业标准化组织和团体(例如,国际标准化组织(ISO)和国际电工技术委员会(IEC))已经制订了用于实现非接触式支付技术的非官方行业标准。已由ISO/IEC定义的三个这种示例性标准是分别适用于紧密耦合、接近式和邻近式卡的ISO/IEC 10536、ISO/IEC 14443和ISO/IEC 15693标准。
ISO/IEC 14443接近式卡标准(ISO 14443)已经在全世界范围内用于一些非接触式卡使用。ISO 14443接近式卡的操作目标范围最高达到10cm,尽管此范围取决于功率要求、存储器尺寸、CPU、以及协同处理器而有所变化。
ISO 14443标准文件具有四个不同的部分:
·第1部分:物理特性,限定用于接近式集成电路卡(PICC)的物理尺寸。该卡是ID-1大小(85.6mm×54.0mm×0.76mm)。这与银行信用卡的尺寸相同。
·第2部分:射频功率和信号接口,限定非接触式IC芯片的关键技术特性,包括诸如频率、数据传输速率、调制和位编码程序的项。第二部分详细描述了A类接口与B类接口两种。这两种接口都在相同频率上运行、并使用相同的数据传输速率,但是它们在调制和位编码方面彼此不同。
·第3部分:初始化和防冲突。初始化描述了对在卡进入读卡器的射频(RF)磁场时靠近耦合设备(PCD)(即读卡器)与卡以建立通信的要求。防冲突定义:当多个卡同时进入磁场时,标识系统如何确定在交易中使用哪个卡,并确保记录和处理所出现的所有卡。
·第4部分:传输协议,定义了在交易期间启用通信的数据格式和数据元。
对于顺应ISO 14443的非接触式支付卡和读卡器系统,它们必须达到非官方标准的至少一部分要求。除了在ISO 14443下标准化的非接触技术,许多专用的非接触式接口也被用于此行业中(例如,Cubic的Go-Card和索尼的FeliCa卡)。对于现有卡技术的使用,互操作性可能是个问题。市场上的供应商所使用的读卡器最好应当适用于若干种不同类型的卡。例如,期望的读卡器应当支持ISO 14443的A类与B类卡、ISO 15693卡和任何其它类的专用卡。
即使卡的使用基本顺应单个ISO标准(例如ISO 14443),也可能产生可互操作性问题。在ISO 14443标准中,与RF功率以及非接触式卡和读卡器系统的接口(即,此系统的开放式系统互连(OSI)模型图中的物理层)相关的所有要求和规范都使用对卡和读卡器的单独标准化测试来定义。ISO/IEC 10373标准的第6部分(ISO-10373-6)涉及测试方法,该方法专用于非接触式集成电路卡技术(接近式卡)。非接触卡和读卡器对ISO 14443的顺应性通过使用基准设备来校验。根据ISO10373-6,代表非接触式卡的特性的一组“基准”卡(即,基准PICC)被用于测定非接触式读卡器的规范顺应性。(例如,参见图1a)。例如,基准PICC被用来测试由PCD产生或传输的磁场,并测试PCD向PICC供电的能力。类似地,表示典型非接触式读卡器特性的“基准”读卡器(即,测试或基准PCD)被用来测定非接触式卡的规范顺应性。例如,连接有一对外部感应线圈的基准PCD被用来测试在测试期间由卡产生的负载调制。
虽然基于ISO 10373-6的卡和读卡器分别的顺应性测试程序可确保使用的产品设备各自具有落在所指定的卡或读卡器的规范范围内的特性,但是程序不能确保区域内的互操作性。校验为顺应性的卡和/或读卡器可以仅仅是边际顺应的(例如,通过具有指定规范范围的端部或边缘的特性值)。这种标准顺应性方式将导致现场内的操作失败。例如,使用仅为边际顺应的读卡器将可能不能读取或难以读取边际顺应的卡。
此外,相对于校验非接触式设备的重要数据发送和接收功能,ISO 10373-6仅提供由卡生成的负载调制数据信号的间接测量。由ISO 10373-6规定的用于测试成品卡的PCD测试组件具有在基准PCD读卡器外部的一对读出线圈。这些外部读出线圈被用来测定由测试中的卡生成并发送的负载调制信号。(例如,参见图1)。然而,由读出线圈所测量的负载调制信号与由基准PCD天线物理接收的信号之间并没有直接或明显的关系。因此,使用外部读出线圈测试成品卡的数据发送功能确实提供了直接保证:推定顺应于ISO的成品卡对数据信号的调制足以使成品读卡器正确接收或处理该经调制数据信号的能力,或与该能力兼容。
现在考虑提高用于非接触式电子支付系统中的电子支付设备的互操作性的方法。将注意力集中到减少与普遍认可的标准相一致的卡和读卡器特性中的改变。具体地,将注意力集中到改进规范顺应性过程和测试装备上以提高支付设备的互操作性。
发明内容
本发明提供了用于测试在电子支付系统中使用的交互支付卡和读卡器的数据发送和接收功能的信号表征方法。此信号表征方法使用CMR电路来解调由读卡器天线接收的载波信号,由此精确地恢复由卡发送的小振幅数据信号。对读卡器天线所接收的卡数据信号的分析将提供比现有技术更为精确的卡数据发送功能的表征,其中该现有技术使用外部读出线圈替代读卡器天线。
在诸如PayPass的示例性非接触式支付卡技术的实现中,基准PCD读卡器设备中设置有被指定用来测试成品支付卡功能的CMR电路。该CMR电路和基准PCD读卡器天线都可制造于同一块电路板上。
根据附图及以下的详细描述,本发明的其它特征、特性以及各种优点将变得更加显而易见。
附图说明
图1是根据ISO10373-6的基准读卡器测试组件的示图,该基准读卡器测试组件包括用于测定由支付卡生成的小振幅数据信号的一对外部读出线圈。
图2是由ISO 14443标准规定的非接触式支付卡与读卡器之间的数据传输的载波信号调制方案的示意图。
图3是由支付卡生成的低调制指数数据信号的示意图。
图4是根据本发明的原理、耦合到基准读卡器天线的共模抑制电路(CMR)的框图。该CMR电路被配置成解调在天线上接收到的载波信号以提取由测试中支付卡发送的额外数据信号。
图5是根据本发明的原理、耦合到基准读卡器天线的示例性CMR电路的电路图。
具体实施方式
提供了用于测试在非接触式电子支付系统中使用的交互支付卡与读卡器的数据发送和接收功能的信号表征方法。该信号表征方法使用CMR电路来解调由读卡器天线接收的载波信号,以及恢复由卡发送的负载调制数据信号。与载波信号的振幅相比,负载调制数据信号基本上可具有小振幅。对在读卡器天线上接收的负载调制信号的分析和测定将提供比现有技术方法更为精确的卡数据发送功能的表征,其中该技术使用外部读出线圈来替代读卡器天线。
在本文本发明的信号表征方法和电路在电子支付系统实现的环境中描述,其中非接触式支付设备规范旨在符合诸如ISO 14443标准的通用行业标准,该ISO14443标准还详细说明了用于单个非接触支付设备的规范校验的标准化测试方法(即,ISO 10373-6测试方法,接近式卡)。近来,专利受让人MaterCard InternationalIncorporated(“MasterCard”)已开发了用于实现接近支付卡技术(即,由卡和读卡器的发卡行、供应商或制造商来实现)的专用规范:MasterCard PayPassTM ISO/IEC14443实现规范(“PayPass”)。PayPass实现符合ISO 14443标准,并提供了示出本发明原理的一方便示例。应当理解:为了本文的说明目的,选择PayPass实现仅仅是示例性的,而本发明的原理可更一般地应用于在其它通用行业或专用标准下运行的电子支付设备和系统。
在符合诸如ISO 14443标准的通用行业电子支付系统中,非接触式读卡器与支付卡之间的功率和数据经由13.56MHz载波信号来发送。ISO 14443标准要求支付卡以在847.5kHz方波副载波以106Kbps发送位-编码数据。(参见图2)。支付卡通过接通或断开电路的感应负载,即通过负载调制来将低振幅(或低调制指数)数据信号叠加到读卡器生成的载波信号上。在卡操作的大多数实例中,调制振幅的范围为从约几mV到约100mv,该调制振幅被叠加到振幅范围为约几伏特的读卡器生成的载波信号上。对负载调制载波信号而言通常<1/100的低调制指数使得难以提取卡数据信号用于精确表征或测定。此精确表征或测定对于可靠地确保数据规范顺应性与确保支付设备的互操作性可能是必要的。ISO 10373-6推荐称为共模抑制(CMR)的技术,用于从载波信号中提取小值负载调制信号以便于PICC负载调制测试。
用于测试交互支付卡与读卡器的数据发送和接收功能的本发明信号表征方法也基于CMR技术。CMR电路设置在用于测试卡的功能的基准读卡器(即,PayPass-基准读卡器)中。读卡器天线连接到CMR电路的输入端。CMR电路处理在基准PCD自身上接收到的调制载波信号,并从大振幅载波信号中提取小振幅负载调制数据信号。
图4示出了一示例性CMR电路400的电路图,该CMR电路400可包括在基准PCD(例如PayPass-基准PCD,参见序列号为____的美国专利申请)中。CMR电路400包括锁相环(PLL)电路404、微分器404、放大器406和任选的A/D转换器408。CMR电路400的输入端连接到读卡器天线408的输出引线。PLL电路404被设计成对输入信号的小变化求平均以生成具有稳定频率、相位和振幅的输出信号。包括诸如相位检测器和振荡器的公知元件的PLL电路404可使用公知的电子电路设计原理方便地进行设计。(例如,参见http://en.wikipedia.org/wiki/Phase-locked_loop)。
在操作中,测试中的PICC 410被放置在PayPass-基准PCD的放卡盘上。在测试条件下,PICC 410生成叠加于天线402接收到的13.56MHz载波信号上的负载调制数据信号。PLL 404处理接收到的载波信号420以对所接收的信号420中的小振幅小变化求平均,以生成作为未经调制的13.56MHz载波信号(即,未经卡的负载调制)的精确副本的“载波-副本”信号422。载波-副本信号422和所接收的信号420被馈送到微分器404,该微分器404将后一信号减去前一信号以精确地复制由PICC 410在测试条件下生成的小振幅数据信号424。然后,数据信号424可进一步由放大器414放大,并在测定或分析之前直接显示在示波器上以便图形测定或通过任选的模-数转换器416进行处理。
本发明信号检测方法和电路可结合共同待批的序列号为__的美国专利申请所公开的系统和方法一起使用,用于提高非接触式支付设备(即,向消费者发行的成品卡和商家所使用的产品读卡器)的互操作性。所公开的系统和方法确保在比ISO 14443标准下操作所容许的更严格规范范围内操作或运行单个产品卡和读卡器。该系统和方法包括交叉校准基准设备(例如序列号为__的共同待批美国专利申请中所公开的PayPass-基准PICC和PayPass-基准PCD设备),这些基准设备被用来测试各个成品读卡器和卡与ISO 14443和ISO 10373-6的规范顺应性。基准PCD被用来确定基准PICC的观测到的功能特性或参数的范围。成品读卡器需要具有落在由基准PCD测定的标称卡范围内的功能特性或参数。相反,基准PICC被用来建立基准PCD观测到的功能特性或参数(“标称读卡器范围”)的范围。成品读卡器需要具有落在读取基准卡时的标称读卡器范围内的功能特性。
用于确保成品非接触式支付设备的数据传送互操作性的示例性过程可包括以下步骤:
(a)通过基准PICC生成不同信号来测试PCD的数据接收(例如,负载调制灵敏度)。首先相关于基准PCD校准PayPass-基准PICC以确定由基准PICC生成的不同信号的电平和特性,以及
(b)在基准PCD上测定由PICC进行的数据发送,且基准PCD向PICC发送“平均”值命令并提供“平均”功率电平。相关于基准PICC基准由基准PCD生成的功率电平和命令特性。
设置于基准PCD中、耦合到读卡器天线的CMR电路提供了对读卡器接收的PICC数据信号的直接访问,并由此更精确地测定PICC设备的数据发送功能。CMR电路可与其它电子电路一起设置于PayPass-基准PCD设备中,该PayPass-基准PCD设备被设计成测试与电子支付系统中所使用的若干读卡器一起使用的支付卡。PayPass-基准PCD电子电路被配置成展现外部特性,该外部特性代表电子支付系统中所使用的若干读卡器与交互卡的特性。此电子电路包括直径为约7mm、共振频率为13.56MHz的印刷电路板天线。
图5示出了一示例性CMR电路500的电路图,该示例性CMR电路500可与PayPass-基准PCD天线一起用来隔离由PICC调制生成的弱信号。在操作中,从PCD天线输入到CMR电路500的信号可以是约1Vpp 13.56MHz的调幅载波。调制卡信号是847.5KHz的方波副载波。因为调制指数极低,所以CMR电路400显著地减小残余载波振幅(例如,约40dB),这将使所接收信号的调制指数增加相同的量,从而可以实用且有益的方式对847.5KHz的数据信号进行采样。采样和测定可通过模-数转换器来有效地执行,该模-数转换器可以是独立单元或按需构造于示波器内。
虽然已经参考多个示例性实施例对本发明进行了具体描述,但是应当理解:本领域技术人员可进行各种更改和改变而不背离本发明的精神和范围。因此,本发明所公开的实施例仅仅被视为是示例性的,而且本发明仅如附加权利要求中所述地来限定范围。
Claims (15)
1.一种用于测试可与电子支付系统中使用的数个读卡器的任一个一起使用的支付卡的基准读卡器,所述基准读卡器包括:
电子电路,其外部特性代表所述电子支付系统中使用的数个读卡器的特性,且其中所述电子电路被配置成向测试中的支付卡显现代表性的外部特性;以及
CMR电路,用于对所述读卡器所接收的调幅数据信号进行解调。
2.如权利要求1所述的基准卡,其特征在于,所述数个读卡器是非接触式支付卡读卡器,其中所述基准读卡器电子电路包括谐振频率约为13.56MHz的天线,且其中所述天线的输出引线被连接到所述CMR电路。
3.如权利要求1所述的基准读卡器,其特征在于,所述天线、电子电路和CMR电路制造于印刷电路板上。
4.如权利要求1所述的基准读卡器,其特征在于,所述CMR电路包括:
锁相环(PLL)电路;
微分器;以及
放大器。
5.如权利要求1所述的基准读卡器,其特征在于,所述CMR电路还包括模-数转换器。
6.一种用于测试可与电子支付系统中使用的数个读卡器的任一个一起使用的支付卡的基准读卡器,所述基准读卡器包括:
调谐到RF载波频率的天线,其中测试中的支付卡生成叠加于由所述天线接收的RF载波信号上的负载调制数据信号;以及
耦合CMR电路,所述耦合CMR电路对由所述天线所接收的所述负载调制卡信号进行解调。
7.如权利要求6所述的基准读卡器,其特征在于,所述RF载波信号是13.56MHz载波信号,且其中所述负载调制卡数据信号是847.5kHz的副载波。
8.如权利要求6所述的基准读卡器,其特征在于,所述天线和所述CMR电路制造于印刷电路板上。
9.如权利要求6所述的基准读卡器,其特征在于,所述CMR电路包括:
锁相环(PLL)电路;
微分器;以及
放大器。
10.如权利要求9所述的基准读卡器,其特征在于,所述CMR电路还包括模-数转换器。
11.一种用于测试可与电子支付系统中使用的数个读卡器的任一个一起使用的非接触式支付卡的数据发送功能的方法,其中所述支付卡通过对RF载波信号的副载波进行负载调制来发送数据,所述方法包括以下步骤:
(a)使用调谐到所述RF载波信号频率的基准天线来接收由所述支付卡生成的负载调制数据信号;以及
(b)使用CMR电路来对所接收的负载调制数据信号进行解调,并提取所述负载调制副载波数据信号。
12.如权利要求11所述的方法,其特征在于,还包括使用基准天线在RF载波信号上将功率和数据命令从所述基准读卡器发送到所述支付卡的步骤(c)。
13.如权利要求12所述的方法,其特征在于,所述步骤(c)包括使用所述基准天线来发送具有平均值的功率,并向所述PICC发送作为平均值命令的数据命令,其中所述平均值指代表电子支付系统中使用的所述数个读卡器与交互卡的特性的值。
14.如权利要求11所述的方法,其特征在于,使用CMR电路来对所接收的负载调制数据信号进行解调并提取所述负载调制副载波数据信号的步骤(b)包括减小所述载波信号的振幅以增大所接收信号的调制指数。
15.如权利要求11所述的方法,其特征在于,还包括使用模-数转换器来采样所提取的信号的步骤(d)。
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CN101833817B (zh) * | 2009-03-11 | 2014-08-13 | 中兴通讯股份有限公司 | 一种非接触电子支付中实现应用选择的方法及终端 |
CN104426544A (zh) * | 2013-08-30 | 2015-03-18 | 恩智浦有限公司 | 用于调准远程装置的时钟同步器 |
CN104426544B (zh) * | 2013-08-30 | 2018-05-25 | 恩智浦有限公司 | 用于调准远程装置的时钟同步器 |
CN104636771A (zh) * | 2013-11-12 | 2015-05-20 | 上海华虹集成电路有限责任公司 | 非接触模块的测试电路和方法 |
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