CA2708594C - End cap voltage control of ion traps - Google Patents
End cap voltage control of ion traps Download PDFInfo
- Publication number
- CA2708594C CA2708594C CA2708594A CA2708594A CA2708594C CA 2708594 C CA2708594 C CA 2708594C CA 2708594 A CA2708594 A CA 2708594A CA 2708594 A CA2708594 A CA 2708594A CA 2708594 C CA2708594 C CA 2708594C
- Authority
- CA
- Canada
- Prior art keywords
- trap
- signal
- end cap
- ion trap
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
Abstract
An ion trap for a mass spectrometer has a conductive central electrode with an aperture extending from a first open end to a second open end. A conductive first electrode end cap is disposed proximate to the first open end thereby forming a first intrinsic capacitance between the first end cap and the central electrode. A
conductive second electrode end cap is disposed proximate to the second open end thereby forming a second intrinsic capacitance between the second end cap and the central electrode. A first circuit couples the second end cap to a reference potential. A signal source generating an AC trap signal is coupled to the central electrode. An excitation signal is impressed on the second end cap in response to a voltage division of the trap signal by the first intrinsic capacitance and the first circuit.
conductive second electrode end cap is disposed proximate to the second open end thereby forming a second intrinsic capacitance between the second end cap and the central electrode. A first circuit couples the second end cap to a reference potential. A signal source generating an AC trap signal is coupled to the central electrode. An excitation signal is impressed on the second end cap in response to a voltage division of the trap signal by the first intrinsic capacitance and the first circuit.
Description
MI
End Cap Voltage Control of Ion Traps TECHNICAL FIELD
This invention relates to ion traps, ion trap mass spectrometers, and more particularly to control signal generation for an ion trap used in mass spectrometric chemical analysis.
BACKGROUND
Using an ion trap is one method of performing mass spectrometric chemical analysis.
An ion trap dynamically traps ions from a measurement sample using a dynamic electric field generated by a driving signal or signals. The ions arc selectively ejected corresponding to their mass-charge ratio (mass (m)/charge (z)) by changing the characteristics of the electric field (e.g., amplitude, frequency, etc.) that is trapping them. More background information concerning ion trap mass spectrometry may be found in "Practical Aspects of Ion Trap Mass Spectrometry," by Raymond E. March et al.
Ramsey et al. in U.S. Patent Nos. 6,469,298 and 6,933,498 (hereafter the "Ramsey patents") disclosed a sub-millimeter ion trap and ion trap array for mass spectrometric chemical analysis of ions. The ion trap described in U.S. Patent No. 6,469,298 includes a central electrode having an aperture: a pair of insulators, each having an aperture; a pair of end cap electrodes, each having an aperture; a first electronic signal source coupled to the central electrode; and a second electronic signal source coupled to the end cap electrodes. The central electrode, insulators, and end cap electrodes arc united in a sandwich construction where their respective apertures are coaxially aligned and symmetric about an axis to form a partially enclosed cavity having an effective radius Ro and an effective length 2Z0, wherein Ro and/or Zo are less than 1.0 millimeter (mm), and a ratio Z0/R0 is greater than 0.83.
George Safford presents a "Method of Mass Analyzing a Sample by use of a Quadrupole Ion Trap" in U.S. Patent No. 4,540,884, which describes a complete ion trap based mass spectrometer system.
An ion trap internally traps ions in a dynamic quadrupole field created by the electrical signal applied to the center electrode relative to the end cap voltages (or signals).
Simply, h signal of constant frequency is applied to the center electrode and the two end cap electrodes are maintained at a static zero volts. The amplitude of the center electrode signal is ramped up linearly in order to selectively destabilize different masses of ions held within the ion trap. This amplitude ejection configuration does not result in optimal performance or resolution and may actually result in double peaks in the output spectra. This amplitude ejection method maybe improved upon by applying a second signal to one end cap of the ion trap. This second signal causes an axial excitation that results in the resonance ejection of ions from the ion trap when the ions' secular frequency of oscillation within the trap matches the end cap excitation frequency. Resonance ejection causes the ion to be ejected from the ion trap at a secular resonance point corresponding to a stability diagram beta value of less than one. A beta value of less than one is traditionally obtained by applying an end cap (axial) = frequency that is a factor of 1/n times the center electrode frequency, where n is typically an integer greater than or equal to 2.
.Moxoni et al. in "Double Resonance Ejection in a Micro Ion Trap Mass Spectrometer," Rapid Communication Mass Spectrometry 2002, 16: pages 755-760, describe increased mass spectroscopic resolution in the Ramsey patents device by the use of differential voltages on the end caps. Testing demonstrated that applying a differential voltage between end caps promotes resonance ejection at lower voltages than the earlier Ramsey patents and eliminates the "peak doubling" effect also inherent in the earlier Ramsey patents. This device requires a minimum of two separate voltage supplies: one that must control the radio frequency (RF) voltage signal applied to the central electrode and at least one that must control the end cap electrode (the first end cap electrode is grounded, or at zero volts, relative to the rest of the system).
Although performance of an ion trap may be increased by the application of an additional signal applied to one of the ion trap's end caps, doing so increases the complexity of the system. The second signal requires electronics in order to generate and drive the signal into the end cap of the ion trap. This signal optimally needs to be synchronized with the center electrode signal. These additional electronics increase the size, weight, and power consumption of the mass spectrometer system. This could be very important in a portable mass spectrometer application.
End Cap Voltage Control of Ion Traps TECHNICAL FIELD
This invention relates to ion traps, ion trap mass spectrometers, and more particularly to control signal generation for an ion trap used in mass spectrometric chemical analysis.
BACKGROUND
Using an ion trap is one method of performing mass spectrometric chemical analysis.
An ion trap dynamically traps ions from a measurement sample using a dynamic electric field generated by a driving signal or signals. The ions arc selectively ejected corresponding to their mass-charge ratio (mass (m)/charge (z)) by changing the characteristics of the electric field (e.g., amplitude, frequency, etc.) that is trapping them. More background information concerning ion trap mass spectrometry may be found in "Practical Aspects of Ion Trap Mass Spectrometry," by Raymond E. March et al.
Ramsey et al. in U.S. Patent Nos. 6,469,298 and 6,933,498 (hereafter the "Ramsey patents") disclosed a sub-millimeter ion trap and ion trap array for mass spectrometric chemical analysis of ions. The ion trap described in U.S. Patent No. 6,469,298 includes a central electrode having an aperture: a pair of insulators, each having an aperture; a pair of end cap electrodes, each having an aperture; a first electronic signal source coupled to the central electrode; and a second electronic signal source coupled to the end cap electrodes. The central electrode, insulators, and end cap electrodes arc united in a sandwich construction where their respective apertures are coaxially aligned and symmetric about an axis to form a partially enclosed cavity having an effective radius Ro and an effective length 2Z0, wherein Ro and/or Zo are less than 1.0 millimeter (mm), and a ratio Z0/R0 is greater than 0.83.
George Safford presents a "Method of Mass Analyzing a Sample by use of a Quadrupole Ion Trap" in U.S. Patent No. 4,540,884, which describes a complete ion trap based mass spectrometer system.
An ion trap internally traps ions in a dynamic quadrupole field created by the electrical signal applied to the center electrode relative to the end cap voltages (or signals).
Simply, h signal of constant frequency is applied to the center electrode and the two end cap electrodes are maintained at a static zero volts. The amplitude of the center electrode signal is ramped up linearly in order to selectively destabilize different masses of ions held within the ion trap. This amplitude ejection configuration does not result in optimal performance or resolution and may actually result in double peaks in the output spectra. This amplitude ejection method maybe improved upon by applying a second signal to one end cap of the ion trap. This second signal causes an axial excitation that results in the resonance ejection of ions from the ion trap when the ions' secular frequency of oscillation within the trap matches the end cap excitation frequency. Resonance ejection causes the ion to be ejected from the ion trap at a secular resonance point corresponding to a stability diagram beta value of less than one. A beta value of less than one is traditionally obtained by applying an end cap (axial) = frequency that is a factor of 1/n times the center electrode frequency, where n is typically an integer greater than or equal to 2.
.Moxoni et al. in "Double Resonance Ejection in a Micro Ion Trap Mass Spectrometer," Rapid Communication Mass Spectrometry 2002, 16: pages 755-760, describe increased mass spectroscopic resolution in the Ramsey patents device by the use of differential voltages on the end caps. Testing demonstrated that applying a differential voltage between end caps promotes resonance ejection at lower voltages than the earlier Ramsey patents and eliminates the "peak doubling" effect also inherent in the earlier Ramsey patents. This device requires a minimum of two separate voltage supplies: one that must control the radio frequency (RF) voltage signal applied to the central electrode and at least one that must control the end cap electrode (the first end cap electrode is grounded, or at zero volts, relative to the rest of the system).
Although performance of an ion trap may be increased by the application of an additional signal applied to one of the ion trap's end caps, doing so increases the complexity of the system. The second signal requires electronics in order to generate and drive the signal into the end cap of the ion trap. This signal optimally needs to be synchronized with the center electrode signal. These additional electronics increase the size, weight, and power consumption of the mass spectrometer system. This could be very important in a portable mass spectrometer application.
2 SUMMARY
According to an aspect of the present invention, there is provided an ion trap comprising: a conductive ring-shaped central electrode having a first aperture extending from a first open end to a second open end; a signal source for generating a trap signal having at least an alternating current (AC) component between a first and second terminal, wherein the first terminal is coupled to the central electrode and the second terminal is coupled to a source reference voltage potential; a conductive first electrode end cap disposed adjacent to the first open end of the central electrode and coupled to a first reference voltage potential, wherein a first intrinsic capacitance is formed between a surface of the first electrode end cap and a surface of the first open end of the central electrode; and a conductive second electrode end cap disposed adjacent to the second open end of the central electrode and coupled to a second reference voltage potential with a first electrical circuit means for impressing a fractional part of the trap signal on the conductive second electrode end cap,wherein a second intrinsic capacitance is formed between a surface of the second electrode end cap and a surface of the second open end of the central electrode, and wherein the fractional part of the trap signal is impressed on the second electrode end cap as an excitation voltage in response to a voltage division of the trap signal by the second intrinsic capacitance and an impedance of the first electrical circuit means.
According to another aspect of the present invention, there is provided an ion trap comprising: a central electrode having an aperture; a first end cap electrode having an aperture; a second end cap electrode having an aperture; an electronic signal source that generates a trap signal applied to the central electrode; a passive circuit means for impressing a fractional part of the trap signal on the first end cap electrode; an electrical connection between said first end cap electrode and said passive circuit means; and an electrical connection between said passive circuit means and a voltage potential, wherein said first end cap electrode, connected to said voltage potential via said passive circuit means, bears an excitation voltage due to capacitive coupling between said electronic signal source and said passive circuit means.
According to an aspect of the present invention, there is provided an ion trap comprising: a conductive ring-shaped central electrode having a first aperture extending from a first open end to a second open end; a signal source for generating a trap signal having at least an alternating current (AC) component between a first and second terminal, wherein the first terminal is coupled to the central electrode and the second terminal is coupled to a source reference voltage potential; a conductive first electrode end cap disposed adjacent to the first open end of the central electrode and coupled to a first reference voltage potential, wherein a first intrinsic capacitance is formed between a surface of the first electrode end cap and a surface of the first open end of the central electrode; and a conductive second electrode end cap disposed adjacent to the second open end of the central electrode and coupled to a second reference voltage potential with a first electrical circuit means for impressing a fractional part of the trap signal on the conductive second electrode end cap,wherein a second intrinsic capacitance is formed between a surface of the second electrode end cap and a surface of the second open end of the central electrode, and wherein the fractional part of the trap signal is impressed on the second electrode end cap as an excitation voltage in response to a voltage division of the trap signal by the second intrinsic capacitance and an impedance of the first electrical circuit means.
According to another aspect of the present invention, there is provided an ion trap comprising: a central electrode having an aperture; a first end cap electrode having an aperture; a second end cap electrode having an aperture; an electronic signal source that generates a trap signal applied to the central electrode; a passive circuit means for impressing a fractional part of the trap signal on the first end cap electrode; an electrical connection between said first end cap electrode and said passive circuit means; and an electrical connection between said passive circuit means and a voltage potential, wherein said first end cap electrode, connected to said voltage potential via said passive circuit means, bears an excitation voltage due to capacitive coupling between said electronic signal source and said passive circuit means.
3 =
In some embodiments, an ion trap comprises a conductive ring-shaped central electrode having a first aperture extending from a first open end to a second open end. A
signal source generates a trap signal having at least an alternating current (AC) component between a first and second terminal. The first terminal is coupled to the central electrode and the second terminal is coupled to a reference voltage potential. A conductive first electrode end cap is disposed adjacent to the first open end of the central electrode and coupled to the reference voltage potential. A first intrinsic capacitance is formed between a surface of the first electrode end cap and a surface of the first open end of the central electrode.
A conductive second electrode end cap is disposed adjacent to the second open end of the central electrode and coupled to the reference voltage potential with a first electrical circuit. A second intrinsic capacitance is formed between a surface of the second electrode end cap and a surface of the second open end of the central electrode. An excitation voltage that is a fractional part of the trap signal is impressed on the second end cap in response to a voltage division of the trap signal by the second intrinsic capacitance and an impedance of the first electrical circuit.
In one embodiment, the electrical circuit is a parallel circuit of a capacitor and a resistor. The resistor is sized to prevent the second end cap from charging thereby preventing possible charge build up or uncontrolled voltage drift. The resistor is also sized to have an impedance much greater than an impedance of the capacitor at an operating frequency of the trap signal. In this manner, the excitation voltage division remains substantially constant with changing excitation voltage frequency, and the excitation voltage is substantially in phase with the signal impressed on the central electrode.
Embodiments herein are directed to generation of a trap signal and impressing a fractional part of the trap signal on the second end cap of an ion trap used for mass spectrometric chemical analysis in order to increase performance without significant added complexity, cost, or power consumption.
Embodiments operate to improve spectral resolution and eliminate double peaks in the output spectra that could otherwise be present.
3a , .
Other embodiments employ switching circuits that may be employed to connect the end cap electrodes to different circuits of passive components and/or voltages at different times. In some embodiments, the electrical circuit may employ passive components that 3b =
include inductors, transformers, or other passive circuit elements used to change the characteristics (such as phase) of the second end cap signal.
Some embodiments are directed to improving ion trap performance by applying an additional excitation voltage across the end caps of an ion trap. Unlike the typical resonance ejection technique, this excitation voltage has a frequency equal to the center electrode excitation frequency.
The generation of this excitation voltage can be accomplished using only passive components without the need for an additional signal generator or signal driver.
The details of one or more embodiments are set forth in the accompanying drawings and the description below. Other features and advantages of some embodiments of the invention will be apparent from the description of the drawing.
BRIEF DESCRIPTION OF DRAWINGS
FIG. 1 is a circuit block diagram of a prior art ion trap signal driving method showing two signal sources;
FIG. 2 is a circuit block diagram of one embodiment using a single signal source;
1 5 FIG. 3A is a cross-section view illustrating a quadrupole ion trap during one polarity of an excitation source;
FIG. 3B is a cross-section view illustrating a quadrupole ion trap during the other polarity of the excitation source; and FIG. 4 is a circuit block diagram of another embodiment using a single signal source and switch circuits to couple passive components.
Like reference symbols in the various drawings may indicate like elements.
DETAILED DESCRIPTION
Embodiments herein provide an electrical excitation for the end cap of an ion trap to improve ion trap operation. Embodiments provide a simple electrical circuit that derives the electrical excitation signal from the signal present on the center electrode of an ion trap.
In one embodiment, passive electrical components are used to apply a signal to the second end cap of an ion trap in order to increase performance. The added components serve to apply a percentage of the central electrode excitation signal to the second end cap. This results in an axial excitation within the ion trap that improves performance with negligible power loss, minimal complexity while having a minimum impact on system size. In some embodiments, the added components may cause an increase in the impedance seen at the
In some embodiments, an ion trap comprises a conductive ring-shaped central electrode having a first aperture extending from a first open end to a second open end. A
signal source generates a trap signal having at least an alternating current (AC) component between a first and second terminal. The first terminal is coupled to the central electrode and the second terminal is coupled to a reference voltage potential. A conductive first electrode end cap is disposed adjacent to the first open end of the central electrode and coupled to the reference voltage potential. A first intrinsic capacitance is formed between a surface of the first electrode end cap and a surface of the first open end of the central electrode.
A conductive second electrode end cap is disposed adjacent to the second open end of the central electrode and coupled to the reference voltage potential with a first electrical circuit. A second intrinsic capacitance is formed between a surface of the second electrode end cap and a surface of the second open end of the central electrode. An excitation voltage that is a fractional part of the trap signal is impressed on the second end cap in response to a voltage division of the trap signal by the second intrinsic capacitance and an impedance of the first electrical circuit.
In one embodiment, the electrical circuit is a parallel circuit of a capacitor and a resistor. The resistor is sized to prevent the second end cap from charging thereby preventing possible charge build up or uncontrolled voltage drift. The resistor is also sized to have an impedance much greater than an impedance of the capacitor at an operating frequency of the trap signal. In this manner, the excitation voltage division remains substantially constant with changing excitation voltage frequency, and the excitation voltage is substantially in phase with the signal impressed on the central electrode.
Embodiments herein are directed to generation of a trap signal and impressing a fractional part of the trap signal on the second end cap of an ion trap used for mass spectrometric chemical analysis in order to increase performance without significant added complexity, cost, or power consumption.
Embodiments operate to improve spectral resolution and eliminate double peaks in the output spectra that could otherwise be present.
3a , .
Other embodiments employ switching circuits that may be employed to connect the end cap electrodes to different circuits of passive components and/or voltages at different times. In some embodiments, the electrical circuit may employ passive components that 3b =
include inductors, transformers, or other passive circuit elements used to change the characteristics (such as phase) of the second end cap signal.
Some embodiments are directed to improving ion trap performance by applying an additional excitation voltage across the end caps of an ion trap. Unlike the typical resonance ejection technique, this excitation voltage has a frequency equal to the center electrode excitation frequency.
The generation of this excitation voltage can be accomplished using only passive components without the need for an additional signal generator or signal driver.
The details of one or more embodiments are set forth in the accompanying drawings and the description below. Other features and advantages of some embodiments of the invention will be apparent from the description of the drawing.
BRIEF DESCRIPTION OF DRAWINGS
FIG. 1 is a circuit block diagram of a prior art ion trap signal driving method showing two signal sources;
FIG. 2 is a circuit block diagram of one embodiment using a single signal source;
1 5 FIG. 3A is a cross-section view illustrating a quadrupole ion trap during one polarity of an excitation source;
FIG. 3B is a cross-section view illustrating a quadrupole ion trap during the other polarity of the excitation source; and FIG. 4 is a circuit block diagram of another embodiment using a single signal source and switch circuits to couple passive components.
Like reference symbols in the various drawings may indicate like elements.
DETAILED DESCRIPTION
Embodiments herein provide an electrical excitation for the end cap of an ion trap to improve ion trap operation. Embodiments provide a simple electrical circuit that derives the electrical excitation signal from the signal present on the center electrode of an ion trap.
In one embodiment, passive electrical components are used to apply a signal to the second end cap of an ion trap in order to increase performance. The added components serve to apply a percentage of the central electrode excitation signal to the second end cap. This results in an axial excitation within the ion trap that improves performance with negligible power loss, minimal complexity while having a minimum impact on system size. In some embodiments, the added components may cause an increase in the impedance seen at the
4 central electrode due to the circuit configuration of the added components, which results in an actual reduction in overall system power consumption.
In embodiments, the frequency of the signal applied to the second end cap is the same as the frequency of the center electrode. The performance increase is afforded without performing conventional resonance ejection, since the frequency of the applied signal is equal to the frequency of the center electrode. Note that this method may be performed in tandem Nvith conventional resonance ejection methods in order to optimize ion trap performance. This = may be accomplished by additionally driving one or both end caps with a conventional resonance ejection signal source through a passive element(s) so that both the conventional resonance ejection signal and the previously described signal are simultaneously impressed upon the ion trap. One embodiment comprises applying a conventional resonance ejection signal to either end cap, and the previously described signal having the same frequency as the center electrode to the remaining end cap.
Sonic embodiments herein may not require retuning or adjustment when the frequency of operation is varied. Variable frequency operation without retuning is possible because the signal impressed on the second end cap is derived from the signal coupled to the central electrode through the use of a capacitive voltage divider that is substantially independent of frequency and depending only on actual capacitance values. This holds true as long as the resistance shunting the added capacitor is significantly larger than the impedance of the capacitor in the frequency range of operation.
FIGS. 3A and 3B illustrate a cross-section of a prior art quadrupole ion trap 300. The ion trap 300 comprises two hyperbolic metal electrodes (end caps) 303a, 303b and a hyperbolic ring electrode 302 disposed half-way between the end cap electrodes 303a and 303b. The positively charged ions 304 are trapped between these three electrodes by electric fields 305. Ring electrode 302 is electrically coupled to one temiinal of a radio frequency (RF) AC voltage source 301. The second terminal of AC voltage source 301 is coupled to hyperbolic end cap electrodes 303a and 303b. As AC voltage source 301 alternates polarity, =
the electric field lines 305 alternate. The ions 304 within the ion trap 300 are confined by this dynamic quadrupole field as well as fractional higher order (hcxapole, octapole, etc.) electric fields.
FIG. 1 is a schematic block diagram 100 illustrating cross-sections of electrodes coupled to a prior art signal driving method for an ion trap having two signal sources. The first ion trap electrode (end cap) 101 is connected to ground or zero volts.
The ion trap central
In embodiments, the frequency of the signal applied to the second end cap is the same as the frequency of the center electrode. The performance increase is afforded without performing conventional resonance ejection, since the frequency of the applied signal is equal to the frequency of the center electrode. Note that this method may be performed in tandem Nvith conventional resonance ejection methods in order to optimize ion trap performance. This = may be accomplished by additionally driving one or both end caps with a conventional resonance ejection signal source through a passive element(s) so that both the conventional resonance ejection signal and the previously described signal are simultaneously impressed upon the ion trap. One embodiment comprises applying a conventional resonance ejection signal to either end cap, and the previously described signal having the same frequency as the center electrode to the remaining end cap.
Sonic embodiments herein may not require retuning or adjustment when the frequency of operation is varied. Variable frequency operation without retuning is possible because the signal impressed on the second end cap is derived from the signal coupled to the central electrode through the use of a capacitive voltage divider that is substantially independent of frequency and depending only on actual capacitance values. This holds true as long as the resistance shunting the added capacitor is significantly larger than the impedance of the capacitor in the frequency range of operation.
FIGS. 3A and 3B illustrate a cross-section of a prior art quadrupole ion trap 300. The ion trap 300 comprises two hyperbolic metal electrodes (end caps) 303a, 303b and a hyperbolic ring electrode 302 disposed half-way between the end cap electrodes 303a and 303b. The positively charged ions 304 are trapped between these three electrodes by electric fields 305. Ring electrode 302 is electrically coupled to one temiinal of a radio frequency (RF) AC voltage source 301. The second terminal of AC voltage source 301 is coupled to hyperbolic end cap electrodes 303a and 303b. As AC voltage source 301 alternates polarity, =
the electric field lines 305 alternate. The ions 304 within the ion trap 300 are confined by this dynamic quadrupole field as well as fractional higher order (hcxapole, octapole, etc.) electric fields.
FIG. 1 is a schematic block diagram 100 illustrating cross-sections of electrodes coupled to a prior art signal driving method for an ion trap having two signal sources. The first ion trap electrode (end cap) 101 is connected to ground or zero volts.
The ion trap central
5 =
electrode 102 is driven by a first signal source 106. The second ion trap end cap 103 is driven by a second signal source 107. First end cap 101 has an aperture 110. Central electrode 102 is ring shaped with an aperture Ill and second end cap 103 has an aperture 114.
FIG 2 is a schematic block diagram 200 illustrating cross-sections of electrodes according to one embodiment wherein an ion trap is actively driven by only one external signal source 206. First end cap 201 has an aperture 210, central electrode 202 has an aperture 211 and second end cap 203 has an aperture 214. The first ion trap end cap 201 is coupled to ground or zero volts, however, other embodiments may use other than zero volts.
For example, in another embodiment the first end cap 201 may be connected to a variable DC
voltage or other signal. The ion trap central electrode 202 is driven by signal source 206.
The second ion trap end cap 203 is connected to zero volts by the parallel combination of a capacitor 204 and a resistor 205.
The embodiment illustrated in FIG. 2 operates in the following manner: an intrinsic capacitance 208 naturally exists between central electrode 202 and the second end cap 203.
IS Capacitance 208 in series with the capacitance of capacitor 204 form a capacitive voltage divider thereby impressing a potential derived from signal source 206 at second end cap 203.
When signal source 206 impresses a varying voltage on central electrode 202, a varying voltage of lesser amplitude is impressed, upon the second end cap 203 through action of the capacitive voltage divider. Naturally, there exists a corresponding intrinsic capacitance between central electrode 202 and first end cap 201. According to one embodiment, a discrete resistor 205 is added between second end cap 203 and zero volts.
Resistor 205 provides an electrical path that acts to prevent second end cap 203 from developing a floating DC potential that could cause voltage drift or excess charge build-up. In one embodiment, the value of resistor 205 is sized to be in the range of Ito 10 Mega-ohms (MO) to ensure that the impedance of resistor 205 is much greater than the impedance of added capacitor 204 at an operating frequency of signal source 206. If the resistance value of resistor 205 is not much greater than the impedance Of CA 204, then there will be a phase shift between the signal at central electrode 202 and signal impressed on second end cap 203 by the capacitive voltage divider. lithe resistance value of resistor 205 not much greater than the impedance of CA 204, the amplitude of the signal impressed on second end cap 203 will vary as a function of frequency. Without resistor 205, the capacitive voltage divider (Cs and CA) is substantially independent of frequency. in one embodiment, the value of the added capacitor
electrode 102 is driven by a first signal source 106. The second ion trap end cap 103 is driven by a second signal source 107. First end cap 101 has an aperture 110. Central electrode 102 is ring shaped with an aperture Ill and second end cap 103 has an aperture 114.
FIG 2 is a schematic block diagram 200 illustrating cross-sections of electrodes according to one embodiment wherein an ion trap is actively driven by only one external signal source 206. First end cap 201 has an aperture 210, central electrode 202 has an aperture 211 and second end cap 203 has an aperture 214. The first ion trap end cap 201 is coupled to ground or zero volts, however, other embodiments may use other than zero volts.
For example, in another embodiment the first end cap 201 may be connected to a variable DC
voltage or other signal. The ion trap central electrode 202 is driven by signal source 206.
The second ion trap end cap 203 is connected to zero volts by the parallel combination of a capacitor 204 and a resistor 205.
The embodiment illustrated in FIG. 2 operates in the following manner: an intrinsic capacitance 208 naturally exists between central electrode 202 and the second end cap 203.
IS Capacitance 208 in series with the capacitance of capacitor 204 form a capacitive voltage divider thereby impressing a potential derived from signal source 206 at second end cap 203.
When signal source 206 impresses a varying voltage on central electrode 202, a varying voltage of lesser amplitude is impressed, upon the second end cap 203 through action of the capacitive voltage divider. Naturally, there exists a corresponding intrinsic capacitance between central electrode 202 and first end cap 201. According to one embodiment, a discrete resistor 205 is added between second end cap 203 and zero volts.
Resistor 205 provides an electrical path that acts to prevent second end cap 203 from developing a floating DC potential that could cause voltage drift or excess charge build-up. In one embodiment, the value of resistor 205 is sized to be in the range of Ito 10 Mega-ohms (MO) to ensure that the impedance of resistor 205 is much greater than the impedance of added capacitor 204 at an operating frequency of signal source 206. If the resistance value of resistor 205 is not much greater than the impedance Of CA 204, then there will be a phase shift between the signal at central electrode 202 and signal impressed on second end cap 203 by the capacitive voltage divider. lithe resistance value of resistor 205 not much greater than the impedance of CA 204, the amplitude of the signal impressed on second end cap 203 will vary as a function of frequency. Without resistor 205, the capacitive voltage divider (Cs and CA) is substantially independent of frequency. in one embodiment, the value of the added capacitor
6 204 is made variable so that it may be adjusted to have an optimized value for a given system characteristics.
FIG. 4 is a schematic block diagram 400 illustrating cross-sections of electrodes according to one embodiment wherein an ion trap is actively driven by only one external =
signal source 406. Again, first end cap 401 has an aperture 410, central electrode 402 has an aperture 411 and second end cap 403 has an aperture 414. The first ion trap end cap 401 is coupled, in response to control signals from controller 422, to passive components 427 with switching circuits 421. Various components in passive components 427 may be coupled to reference voltage 428 which in some embodiments may be ground or zero volts.
In another ID embodiment, the reference voltage 428 may be a DC or a variable voltage.
The combination of switching circuits 421 and passive components 427 serve to control and modify the potential on first end cap 401 to improve the operation of the ion trap.
The second ion trap end cap 403 is coupled, in response to control signals from controller 422. to passive components 425 with switching circuits 423. Various components 15 in passive components 423 may be coupled to reference voltage 426, which in some embodiments may be ground or zero volts. In another embodiment, the reference voltage 426 may be a DC or a variable voltage. The combination of switching circuits 423 and passive components 425 server to control and modify the potential on first end cap 402 to improve the operation of' the ion trap. Capacitances 408 and 409 combine with the passive =
20 components 425 and 427 to couple a portion of signal source 406 when switched in by switching circuits 423 and 421, respectively.
A number of embodiments of the invention have been described. Nevertheless, it will be understood that various modifications may be made without departing from the scope of the invention.
FIG. 4 is a schematic block diagram 400 illustrating cross-sections of electrodes according to one embodiment wherein an ion trap is actively driven by only one external =
signal source 406. Again, first end cap 401 has an aperture 410, central electrode 402 has an aperture 411 and second end cap 403 has an aperture 414. The first ion trap end cap 401 is coupled, in response to control signals from controller 422, to passive components 427 with switching circuits 421. Various components in passive components 427 may be coupled to reference voltage 428 which in some embodiments may be ground or zero volts.
In another ID embodiment, the reference voltage 428 may be a DC or a variable voltage.
The combination of switching circuits 421 and passive components 427 serve to control and modify the potential on first end cap 401 to improve the operation of the ion trap.
The second ion trap end cap 403 is coupled, in response to control signals from controller 422. to passive components 425 with switching circuits 423. Various components 15 in passive components 423 may be coupled to reference voltage 426, which in some embodiments may be ground or zero volts. In another embodiment, the reference voltage 426 may be a DC or a variable voltage. The combination of switching circuits 423 and passive components 425 server to control and modify the potential on first end cap 402 to improve the operation of' the ion trap. Capacitances 408 and 409 combine with the passive =
20 components 425 and 427 to couple a portion of signal source 406 when switched in by switching circuits 423 and 421, respectively.
A number of embodiments of the invention have been described. Nevertheless, it will be understood that various modifications may be made without departing from the scope of the invention.
7 =
Claims (25)
1. An ion trap comprising:
a conductive ring-shaped central electrode having a first aperture extending from a first open end to a second open end;
a signal source for generating a trap signal having at least an alternating current (AC) component between a first and second terminal, wherein the first terminal is coupled to the central electrode and the second terminal is coupled to a source reference voltage potential;
a conductive first electrode end cap disposed adjacent to the first open end of the central electrode and coupled to a first reference voltage potential, wherein a first intrinsic capacitance is formed between a surface of the first electrode end cap and a surface of the first open end of the central electrode; and a conductive second electrode end cap disposed adjacent to the second open end of the central electrode and coupled to a second reference voltage potential with a first electrical circuit means for impressing a fractional part of the trap signal on the conductive second electrode end cap, wherein a second intrinsic capacitance is formed between a surface of the second electrode end cap and a surface of the second open end of the central electrode, and wherein the fractional part of the trap signal is impressed on the second electrode end cap as an excitation voltage in response to a voltage division of the trap signal by the second intrinsic capacitance and an impedance of the first electrical circuit means.
a conductive ring-shaped central electrode having a first aperture extending from a first open end to a second open end;
a signal source for generating a trap signal having at least an alternating current (AC) component between a first and second terminal, wherein the first terminal is coupled to the central electrode and the second terminal is coupled to a source reference voltage potential;
a conductive first electrode end cap disposed adjacent to the first open end of the central electrode and coupled to a first reference voltage potential, wherein a first intrinsic capacitance is formed between a surface of the first electrode end cap and a surface of the first open end of the central electrode; and a conductive second electrode end cap disposed adjacent to the second open end of the central electrode and coupled to a second reference voltage potential with a first electrical circuit means for impressing a fractional part of the trap signal on the conductive second electrode end cap, wherein a second intrinsic capacitance is formed between a surface of the second electrode end cap and a surface of the second open end of the central electrode, and wherein the fractional part of the trap signal is impressed on the second electrode end cap as an excitation voltage in response to a voltage division of the trap signal by the second intrinsic capacitance and an impedance of the first electrical circuit means.
2. The ion trap of claim 1, wherein the first electrical circuit means comprises a capacitor in parallel with a resistor.
3. The ion trap of claim 2, wherein an impedance of the resistor is greater than one fourth of an impedance of the capacitor at a frequency of the trap signal.
4. The ion trap of claim 2, where the resistor has a resistance greater than the impedance of the capacitor in a frequency range of operation of the signal source in generating the trap signal.
5. The ion trap of claim 2, 3 or 4, wherein the capacitor is a variable capacitor adjustable to optimize an operating characteristic of the ion trap.
6. The ion trap of any one of claims 1 to 5, wherein the source reference voltage potential is ground or zero volts.
7. The ion trap of any one of claims 1 to 6, wherein the ion trap is a mass analyzer, and wherein the first reference voltage potential, the second reference voltage potential, or both are an adjustable DC voltage.
8. The ion trap of any one of claims 1 to 7, wherein the first and second reference voltage potentials are generated by corresponding DC voltage sources.
9. The ion trap of any one of claims 1 to 8, wherein the ion trap is configured to impress the fractional part of the trap signal only on the conductive second electrode end cap.
10. The ion trap of any one of claims 1 to 9, wherein the ion trap is configured to receive a resonance ejection signal.
11. The ion trap of any one of claims 1 to 10 , wherein the amplitude of the fractional part of the trap signal is substantially independent of the frequency of the trap signal.
12. The ion trap of any one of claims 1 to 11, wherein the phase difference between the fractional part of the trap signal and the trap signal is substantially independent of the frequency of the trap signal.
13. The ion trap of any one of claims 1 to 8, wherein a fractional part of the trap signal is also impressed on the conductive first electrode end cap.
14. The ion trap of any one of claims 1 to 7, further comprising a second electrical circuit coupled between the conductive first electrode end cap and the first reference voltage potential, wherein a fractional part of the trap signal is impressed on the conductive first electrode end cap in response to a voltage division of the trap signal by the first intrinsic capacitance and an impedance of the second electrical circuit.
15. The ion trap of any one of claims 1 to 14, wherein the excitation voltage is generated by a parasitic signal that is formed from the trap signal applied to the central electrode.
16. An ion trap comprising:
a central electrode having an aperture;
a first end cap electrode having an aperture;
a second end cap electrode having an aperture;
an electronic signal source that generates a trap signal applied to the central electrode;
a passive circuit means for impressing a fractional part of the trap signal on the first end cap electrode;
an electrical connection between said first end cap electrode and said passive circuit means; and an electrical connection between said passive circuit means and a voltage potential, wherein said first end cap electrode, connected to said voltage potential via said passive circuit means, bears an excitation voltage due to capacitive coupling between said electronic signal source and said passive circuit means.
a central electrode having an aperture;
a first end cap electrode having an aperture;
a second end cap electrode having an aperture;
an electronic signal source that generates a trap signal applied to the central electrode;
a passive circuit means for impressing a fractional part of the trap signal on the first end cap electrode;
an electrical connection between said first end cap electrode and said passive circuit means; and an electrical connection between said passive circuit means and a voltage potential, wherein said first end cap electrode, connected to said voltage potential via said passive circuit means, bears an excitation voltage due to capacitive coupling between said electronic signal source and said passive circuit means.
17. The ion trap of claim 16, further comprising a switching circuit that electrically connects and disconnects said first end cap electrode to said passive circuit means.
18. The ion trap of claims 16 or 17, wherein the ion trap is configured to receive a resonance ejection signal.
19. The ion trap of any one of claims 16 to 18, wherein the amplitude of the fractional part of the trap signal is substantially independent of the frequency of the trap signal.
20. The ion trap of any one of claims 16 to 19, wherein the phase difference between the fractional part of the trap signal and the trap signal is substantially independent of the frequency of the trap signal.
21. The ion trap of any one of claims 16 to 20, wherein a fractional part of the trap signal is also impressed on the conductive first electrode end cap.
22. The ion trap of any one of claims 16 to 21, wherein the excitation voltage is generated by a parasitic signal that is formed from the trap signal applied to the central electrode.
23. The ion trap of any one of claims 16 to 20, wherein said voltage potential is a first voltage potential, and said ion trap further comprises:
a second passive circuit means for impressing a fractional part of the trap signal on the second end cap electrode;
an electrical connection between said the second end cap electrode and the second passive circuit means; and an electrical connection between the second passive circuit means and a second voltage potential, wherein the second end cap electrode, connected to the second voltage potential via the second passive circuit means, bears an excitation voltage due to capacitive coupling between the electronic signal source and the second passive circuit means.
a second passive circuit means for impressing a fractional part of the trap signal on the second end cap electrode;
an electrical connection between said the second end cap electrode and the second passive circuit means; and an electrical connection between the second passive circuit means and a second voltage potential, wherein the second end cap electrode, connected to the second voltage potential via the second passive circuit means, bears an excitation voltage due to capacitive coupling between the electronic signal source and the second passive circuit means.
24. The ion trap of claim 23, wherein the first and second voltage potentials are generated by corresponding DC voltage sources.
25. The ion trap of claim 23 or 24, wherein the ion trap is a mass analyzer, and wherein the voltage potential, the second voltage potential, or both are an adjustable DC voltage.
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US1266007P | 2007-12-10 | 2007-12-10 | |
US61/012,660 | 2007-12-10 | ||
US12/329,787 | 2008-12-08 | ||
US12/329,787 US8334506B2 (en) | 2007-12-10 | 2008-12-08 | End cap voltage control of ion traps |
PCT/US2008/086241 WO2009076444A1 (en) | 2007-12-10 | 2008-12-10 | End cap voltage control of ion traps |
Publications (2)
Publication Number | Publication Date |
---|---|
CA2708594A1 CA2708594A1 (en) | 2009-06-18 |
CA2708594C true CA2708594C (en) | 2017-09-12 |
Family
ID=40720638
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA2708594A Expired - Fee Related CA2708594C (en) | 2007-12-10 | 2008-12-10 | End cap voltage control of ion traps |
Country Status (6)
Country | Link |
---|---|
US (2) | US8334506B2 (en) |
EP (1) | EP2232522B1 (en) |
JP (2) | JP5613057B2 (en) |
CN (1) | CN101971290A (en) |
CA (1) | CA2708594C (en) |
WO (1) | WO2009076444A1 (en) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8334506B2 (en) | 2007-12-10 | 2012-12-18 | 1St Detect Corporation | End cap voltage control of ion traps |
US7973277B2 (en) * | 2008-05-27 | 2011-07-05 | 1St Detect Corporation | Driving a mass spectrometer ion trap or mass filter |
US8309912B2 (en) * | 2008-11-21 | 2012-11-13 | Applied Nanotech Holdings, Inc. | Atmospheric pressure ion trap |
CN103367094B (en) | 2012-03-31 | 2016-12-14 | 株式会社岛津制作所 | Ion trap analyzer and ion trap mass spectrometry method |
WO2014164198A1 (en) * | 2013-03-11 | 2014-10-09 | David Rafferty | Automatic gain control with defocusing lens |
US9214321B2 (en) * | 2013-03-11 | 2015-12-15 | 1St Detect Corporation | Methods and systems for applying end cap DC bias in ion traps |
US8610055B1 (en) * | 2013-03-11 | 2013-12-17 | 1St Detect Corporation | Mass spectrometer ion trap having asymmetric end cap apertures |
US8878127B2 (en) * | 2013-03-15 | 2014-11-04 | The University Of North Carolina Of Chapel Hill | Miniature charged particle trap with elongated trapping region for mass spectrometry |
US8969794B2 (en) | 2013-03-15 | 2015-03-03 | 1St Detect Corporation | Mass dependent automatic gain control for mass spectrometer |
CA2935011A1 (en) * | 2014-01-02 | 2015-07-09 | Dh Technologies Development Pte. Ltd. | Homogenization of the pulsed electric field created in a ring stack ion accelerator |
US9728392B2 (en) * | 2015-01-19 | 2017-08-08 | Hamilton Sundstrand Corporation | Mass spectrometer electrode |
US10242857B2 (en) | 2017-08-31 | 2019-03-26 | The University Of North Carolina At Chapel Hill | Ion traps with Y-directional ion manipulation for mass spectrometry and related mass spectrometry systems and methods |
RU2740176C1 (en) * | 2019-10-14 | 2021-01-12 | Федеральное государственное казенное военное образовательное учреждение высшего образования "Рязанское гвардейское высшее воздушно-десантное ордена Суворова дважды Краснознаменное командное училище имени генерала армии В.Ф. Маргелова" Министерства обороны Российской Федерации | Contact potential difference determining device |
CN110783165A (en) * | 2019-11-01 | 2020-02-11 | 上海裕达实业有限公司 | End cover electrode structure of ion introduction side of linear ion trap |
Family Cites Families (368)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2373737A (en) | 1943-02-22 | 1945-04-17 | Rca Corp | Amplitude modulation |
US2531050A (en) | 1946-11-30 | 1950-11-21 | Sylvania Electric Prod | Ion trap |
US2555850A (en) | 1948-01-28 | 1951-06-05 | Nicholas D Glyptis | Ion trap |
US2575067A (en) | 1948-05-13 | 1951-11-13 | Clarostat Mfg Co Inc | Ion trap |
GB676238A (en) | 1948-10-29 | 1952-07-23 | British Thomson Houston Co Ltd | Improvements relating to phase-control circuits |
US2507721A (en) | 1948-12-21 | 1950-05-16 | Rca Corp | Amplitude modulation |
US2539156A (en) | 1949-01-19 | 1951-01-23 | Tele Tone Radio Corp | Ion trap magnet |
US2604533A (en) | 1949-03-08 | 1952-07-22 | Rca Corp | Amplitude modulation |
US2553792A (en) | 1949-10-01 | 1951-05-22 | Indiana Steel Products Co | Ion trap and centering magnet assembly |
US2549602A (en) | 1949-10-01 | 1951-04-17 | Indiana Steel Products Co | Applicator for ion traps |
US2580355A (en) | 1949-10-08 | 1951-12-25 | Du Mont Allen B Lab Inc | Ion trap magnet |
BE502947A (en) | 1950-05-02 | |||
US2663815A (en) | 1950-09-26 | 1953-12-22 | Clarostat Mfg Co Inc | Ion trap |
US2582402A (en) | 1950-09-29 | 1952-01-15 | Rauland Corp | Ion trap type electron gun |
US2642546A (en) | 1950-10-10 | 1953-06-16 | Louis J Patla | Ion trap |
US2661436A (en) | 1951-11-07 | 1953-12-01 | Rca Corp | Ion trap gun |
US2756392A (en) | 1952-01-11 | 1956-07-24 | Rca Corp | Amplitude modulation |
DE1074163B (en) | 1953-05-30 | 1960-01-28 | Standard Elektrik Lorenz Aktiengesellschaft, Stuttgart-Zuffenhausen | Cathode ray tube with an ion trap beam generation system |
US2974253A (en) | 1953-10-05 | 1961-03-07 | Varian Associates | Electron discharge apparatus |
IT528250A (en) | 1953-12-24 | |||
US2810091A (en) | 1954-03-31 | 1957-10-15 | Rca Corp | Ion trap |
US2903612A (en) | 1954-09-16 | 1959-09-08 | Rca Corp | Positive ion trap gun |
US3114877A (en) | 1956-10-30 | 1963-12-17 | Gen Electric | Particle detector having improved unipolar charging structure |
US3065640A (en) | 1959-08-27 | 1962-11-27 | Thompson Ramo Wooldridge Inc | Containment device |
US3188472A (en) | 1961-07-12 | 1965-06-08 | Jr Elden C Whipple | Method and apparatus for determining satellite orientation utilizing spatial energy sources |
US3307332A (en) | 1964-12-11 | 1967-03-07 | Du Pont | Electrostatic gas filter |
US3526583A (en) | 1967-03-24 | 1970-09-01 | Eastman Kodak Co | Treatment for increasing the hydrophilicity of materials |
US3631280A (en) | 1969-10-06 | 1971-12-28 | Varian Associates | Ionic vacuum pump incorporating an ion trap |
US4075533A (en) | 1976-09-07 | 1978-02-21 | Tektronix, Inc. | Electron beam forming structure utilizing an ion trap |
DE3120196C2 (en) | 1981-05-21 | 1985-02-14 | Leybold-Heraeus GmbH, 5000 Köln | High frequency generator for the supply of a mass spectrometer |
US4423385A (en) | 1981-06-10 | 1983-12-27 | Intersil, Inc. | Chopper-stabilized amplifier |
US4499339A (en) | 1982-11-24 | 1985-02-12 | Baptist Medical Center Of Oklahoma, Inc. | Amplitude modulation apparatus and method |
US4540884A (en) | 1982-12-29 | 1985-09-10 | Finnigan Corporation | Method of mass analyzing a sample by use of a quadrupole ion trap |
US4621213A (en) | 1984-07-02 | 1986-11-04 | Imatron, Inc. | Electron gun |
US4650999A (en) | 1984-10-22 | 1987-03-17 | Finnigan Corporation | Method of mass analyzing a sample over a wide mass range by use of a quadrupole ion trap |
NL8403537A (en) | 1984-11-21 | 1986-06-16 | Philips Nv | CATHODE JET TUBE WITH ION TRAP. |
JPS61177006A (en) | 1985-01-31 | 1986-08-08 | Sony Corp | Am modulator |
EP0202943B2 (en) | 1985-05-24 | 2004-11-24 | Thermo Finnigan LLC | Method of operating an ion trap |
JPS61296650A (en) * | 1985-06-25 | 1986-12-27 | Anelva Corp | Power source for quadrupole type mass analyzer |
US4686367A (en) | 1985-09-06 | 1987-08-11 | Finnigan Corporation | Method of operating quadrupole ion trap chemical ionization mass spectrometry |
DE3538407A1 (en) | 1985-10-29 | 1987-04-30 | Spectrospin Ag | ION CYCLOTRON RESONANCE SPECTROMETER |
NL8600098A (en) | 1986-01-20 | 1987-08-17 | Philips Nv | CATHODE JET TUBE WITH ION TRAP. |
US5107109A (en) | 1986-03-07 | 1992-04-21 | Finnigan Corporation | Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer |
US4761545A (en) | 1986-05-23 | 1988-08-02 | The Ohio State University Research Foundation | Tailored excitation for trapped ion mass spectrometry |
US4749860A (en) | 1986-06-05 | 1988-06-07 | Finnigan Corporation | Method of isolating a single mass in a quadrupole ion trap |
US4755670A (en) * | 1986-10-01 | 1988-07-05 | Finnigan Corporation | Fourtier transform quadrupole mass spectrometer and method |
US4867939A (en) | 1987-04-03 | 1989-09-19 | Deutch Bernhard I | Process for preparing antihydrogen |
US4818869A (en) | 1987-05-22 | 1989-04-04 | Finnigan Corporation | Method of isolating a single mass or narrow range of masses and/or enhancing the sensitivity of an ion trap mass spectrometer |
US4771172A (en) | 1987-05-22 | 1988-09-13 | Finnigan Corporation | Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer operating in the chemical ionization mode |
DE3733853A1 (en) | 1987-10-07 | 1989-04-27 | Spectrospin Ag | METHOD FOR PUTTING IONS INTO THE ION TRAP OF AN ION CYCLOTRON RESONANCE SPECTROMETER AND ION CYCLOTRON RESONANCE SPECTROMETER DESIGNED TO CARRY OUT THE METHOD |
EP0321819B2 (en) | 1987-12-23 | 2002-06-19 | Bruker Daltonik GmbH | Method for the massspectrometric analysis of a gas mixture, and mass sprectrometer for carrying out the method |
DE3821998A1 (en) | 1988-06-30 | 1990-01-04 | Spectrospin Ag | ICR ION TRAP |
US4931639A (en) | 1988-09-01 | 1990-06-05 | Cornell Research Foundation, Inc. | Multiplication measurement of ion mass spectra |
US4945234A (en) | 1989-05-19 | 1990-07-31 | Extrel Ftms, Inc. | Method and apparatus for producing an arbitrary excitation spectrum for Fourier transform mass spectrometry |
US5051582A (en) | 1989-09-06 | 1991-09-24 | The United States Of America As Represented By The Secretary Of The Air Force | Method for the production of size, structure and composition of specific-cluster ions |
US5118950A (en) | 1989-12-29 | 1992-06-02 | The United States Of America As Represented By The Secretary Of The Air Force | Cluster ion synthesis and confinement in hybrid ion trap arrays |
US4982088A (en) | 1990-02-02 | 1991-01-01 | California Institute Of Technology | Method and apparatus for highly sensitive spectroscopy of trapped ions |
US5055678A (en) | 1990-03-02 | 1991-10-08 | Finnigan Corporation | Metal surfaces for sample analyzing and ionizing apparatus |
JP2888258B2 (en) | 1990-11-30 | 1999-05-10 | 東京エレクトロン株式会社 | Substrate processing apparatus and substrate processing method |
US5171991A (en) | 1991-01-25 | 1992-12-15 | Finnigan Corporation | Quadrupole ion trap mass spectrometer having two axial modulation excitation input frequencies and method of parent and neutral loss scanning |
US5075547A (en) | 1991-01-25 | 1991-12-24 | Finnigan Corporation | Quadrupole ion trap mass spectrometer having two pulsed axial excitation input frequencies and method of parent and neutral loss scanning and selected reaction monitoring |
US5162650A (en) | 1991-01-25 | 1992-11-10 | Finnigan Corporation | Method and apparatus for multi-stage particle separation with gas addition for a mass spectrometer |
US5381007A (en) | 1991-02-28 | 1995-01-10 | Teledyne Mec A Division Of Teledyne Industries, Inc. | Mass spectrometry method with two applied trapping fields having same spatial form |
US5134286A (en) | 1991-02-28 | 1992-07-28 | Teledyne Cme | Mass spectrometry method using notch filter |
US5200613A (en) | 1991-02-28 | 1993-04-06 | Teledyne Mec | Mass spectrometry method using supplemental AC voltage signals |
US5436445A (en) | 1991-02-28 | 1995-07-25 | Teledyne Electronic Technologies | Mass spectrometry method with two applied trapping fields having same spatial form |
US5451782A (en) | 1991-02-28 | 1995-09-19 | Teledyne Et | Mass spectometry method with applied signal having off-resonance frequency |
US5105081A (en) | 1991-02-28 | 1992-04-14 | Teledyne Cme | Mass spectrometry method and apparatus employing in-trap ion detection |
US5449905A (en) | 1992-05-14 | 1995-09-12 | Teledyne Et | Method for generating filtered noise signal and broadband signal having reduced dynamic range for use in mass spectrometry |
US5187365A (en) | 1991-02-28 | 1993-02-16 | Teledyne Mec | Mass spectrometry method using time-varying filtered noise |
US5274233A (en) | 1991-02-28 | 1993-12-28 | Teledyne Mec | Mass spectrometry method using supplemental AC voltage signals |
US5256875A (en) | 1992-05-14 | 1993-10-26 | Teledyne Mec | Method for generating filtered noise signal and broadband signal having reduced dynamic range for use in mass spectrometry |
US5196699A (en) | 1991-02-28 | 1993-03-23 | Teledyne Mec | Chemical ionization mass spectrometry method using notch filter |
US5182451A (en) | 1991-04-30 | 1993-01-26 | Finnigan Corporation | Method of operating an ion trap mass spectrometer in a high resolution mode |
US5248883A (en) | 1991-05-30 | 1993-09-28 | International Business Machines Corporation | Ion traps of mono- or multi-planar geometry and planar ion trap devices |
US5179278A (en) | 1991-08-23 | 1993-01-12 | Mds Health Group Limited | Multipole inlet system for ion traps |
DE4139037C2 (en) | 1991-11-27 | 1995-07-27 | Bruker Franzen Analytik Gmbh | Method of isolating ions of a selectable mass |
US5206509A (en) | 1991-12-11 | 1993-04-27 | Martin Marietta Energy Systems, Inc. | Universal collisional activation ion trap mass spectrometry |
DE4142871C1 (en) | 1991-12-23 | 1993-05-19 | Bruker - Franzen Analytik Gmbh, 2800 Bremen, De | |
DE4142869C1 (en) | 1991-12-23 | 1993-05-19 | Bruker - Franzen Analytik Gmbh, 2800 Bremen, De | |
DE4142870C2 (en) | 1991-12-23 | 1995-03-16 | Bruker Franzen Analytik Gmbh | Process for in-phase measurement of ions from ion trap mass spectrometers |
DE4202123C2 (en) | 1992-01-27 | 1995-04-06 | Bruker Franzen Analytik Gmbh | Device for the mass spectrometric analysis of fast organic ions |
US5272337A (en) | 1992-04-08 | 1993-12-21 | Martin Marietta Energy Systems, Inc. | Sample introducing apparatus and sample modules for mass spectrometer |
US5306910A (en) | 1992-04-10 | 1994-04-26 | Millipore Corporation | Time modulated electrified spray apparatus and process |
US5340983A (en) | 1992-05-18 | 1994-08-23 | The State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Oregon State University | Method and apparatus for mass analysis using slow monochromatic electrons |
US5248882A (en) | 1992-05-28 | 1993-09-28 | Extrel Ftms, Inc. | Method and apparatus for providing tailored excitation as in Fourier transform mass spectrometry |
US5479012A (en) | 1992-05-29 | 1995-12-26 | Varian Associates, Inc. | Method of space charge control in an ion trap mass spectrometer |
US5198665A (en) | 1992-05-29 | 1993-03-30 | Varian Associates, Inc. | Quadrupole trap improved technique for ion isolation |
US5521380A (en) | 1992-05-29 | 1996-05-28 | Wells; Gregory J. | Frequency modulated selected ion species isolation in a quadrupole ion trap |
US5457315A (en) | 1994-01-11 | 1995-10-10 | Varian Associates, Inc. | Method of selective ion trapping for quadrupole ion trap mass spectrometers |
US5302826A (en) | 1992-05-29 | 1994-04-12 | Varian Associates, Inc. | Quadrupole trap improved technique for collisional induced disassociation for MS/MS processes |
US5448061A (en) | 1992-05-29 | 1995-09-05 | Varian Associates, Inc. | Method of space charge control for improved ion isolation in an ion trap mass spectrometer by dynamically adaptive sampling |
US5352892A (en) | 1992-05-29 | 1994-10-04 | Cornell Research Foundation, Inc. | Atmospheric pressure ion interface for a mass analyzer |
GB2267385B (en) | 1992-05-29 | 1995-12-13 | Finnigan Corp | Method of detecting the ions in an ion trap mass spectrometer |
US5527731A (en) | 1992-11-13 | 1996-06-18 | Hitachi, Ltd. | Surface treating method and apparatus therefor |
US5475227A (en) | 1992-12-17 | 1995-12-12 | Intevac, Inc. | Hybrid photomultiplier tube with ion deflector |
US5291017A (en) | 1993-01-27 | 1994-03-01 | Varian Associates, Inc. | Ion trap mass spectrometer method and apparatus for improved sensitivity |
DE4316737C1 (en) | 1993-05-19 | 1994-09-01 | Bruker Franzen Analytik Gmbh | Method for digitally generating an additional alternating voltage for the resonance excitation of ions in ion traps |
DE4316738C2 (en) | 1993-05-19 | 1996-10-17 | Bruker Franzen Analytik Gmbh | Ejection of ions from ion traps using combined electrical dipole and quadrupole fields |
US5399857A (en) | 1993-05-28 | 1995-03-21 | The Johns Hopkins University | Method and apparatus for trapping ions by increasing trapping voltage during ion introduction |
US5324939A (en) | 1993-05-28 | 1994-06-28 | Finnigan Corporation | Method and apparatus for ejecting unwanted ions in an ion trap mass spectrometer |
DE4324233C1 (en) | 1993-07-20 | 1995-01-19 | Bruker Franzen Analytik Gmbh | Procedure for the selection of the reaction pathways in ion traps |
DE4324224C1 (en) | 1993-07-20 | 1994-10-06 | Bruker Franzen Analytik Gmbh | Quadrupole ion traps with switchable multipole components |
DE4326549C1 (en) | 1993-08-07 | 1994-08-25 | Bruker Franzen Analytik Gmbh | Method for a regulation of the space charge in ion traps |
US5448062A (en) | 1993-08-30 | 1995-09-05 | Mims Technology Development Co. | Analyte separation process and apparatus |
US6005245A (en) | 1993-09-20 | 1999-12-21 | Hitachi, Ltd. | Method and apparatus for ionizing a sample under atmospheric pressure and selectively introducing ions into a mass analysis region |
US5663560A (en) | 1993-09-20 | 1997-09-02 | Hitachi, Ltd. | Method and apparatus for mass analysis of solution sample |
JP3367719B2 (en) | 1993-09-20 | 2003-01-20 | 株式会社日立製作所 | Mass spectrometer and electrostatic lens |
US5396064A (en) | 1994-01-11 | 1995-03-07 | Varian Associates, Inc. | Quadrupole trap ion isolation method |
US6897439B1 (en) | 1994-02-28 | 2005-05-24 | Analytica Of Branford, Inc. | Multipole ion guide for mass spectrometry |
US5479815A (en) | 1994-02-24 | 1996-01-02 | Kraft Foods, Inc. | Method and apparatus for measuring volatiles released from food products |
US6011259A (en) | 1995-08-10 | 2000-01-04 | Analytica Of Branford, Inc. | Multipole ion guide ion trap mass spectrometry with MS/MSN analysis |
EP1533829A3 (en) | 1994-02-28 | 2006-06-07 | Analytica Of Branford, Inc. | Multipole ion guide for mass spectrometry |
US5689111A (en) | 1995-08-10 | 1997-11-18 | Analytica Of Branford, Inc. | Ion storage time-of-flight mass spectrometer |
US5608217A (en) | 1994-03-10 | 1997-03-04 | Bruker-Franzen Analytik Gmbh | Electrospraying method for mass spectrometric analysis |
US5420549A (en) | 1994-05-13 | 1995-05-30 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Extended linear ion trap frequency standard apparatus |
US5420425A (en) | 1994-05-27 | 1995-05-30 | Finnigan Corporation | Ion trap mass spectrometer system and method |
GB2291200A (en) | 1994-07-15 | 1996-01-17 | Ion Track Instr | Ion mobility spectrometer and method of operation for enhanced detection of narotics |
DE4425384C1 (en) | 1994-07-19 | 1995-11-02 | Bruker Franzen Analytik Gmbh | Process for shock-induced fragmentation of ions in ion traps |
US5451781A (en) | 1994-10-28 | 1995-09-19 | Regents Of The University Of California | Mini ion trap mass spectrometer |
DE19501835C2 (en) | 1995-01-21 | 1998-07-02 | Bruker Franzen Analytik Gmbh | Process for excitation of the vibrations of ions in ion traps with frequency mixtures |
DE19501823A1 (en) | 1995-01-21 | 1996-07-25 | Bruker Franzen Analytik Gmbh | Process for controlling the generation rates for mass-selective storage of ions in ion traps |
US5623144A (en) | 1995-02-14 | 1997-04-22 | Hitachi, Ltd. | Mass spectrometer ring-shaped electrode having high ion selection efficiency and mass spectrometry method thereby |
US5572022A (en) | 1995-03-03 | 1996-11-05 | Finnigan Corporation | Method and apparatus of increasing dynamic range and sensitivity of a mass spectrometer |
DE19523859C2 (en) | 1995-06-30 | 2000-04-27 | Bruker Daltonik Gmbh | Device for reflecting charged particles |
DE19511333C1 (en) | 1995-03-28 | 1996-08-08 | Bruker Franzen Analytik Gmbh | Method and device for orthogonal injection of ions into a time-of-flight mass spectrometer |
GB9506695D0 (en) | 1995-03-31 | 1995-05-24 | Hd Technologies Limited | Improvements in or relating to a mass spectrometer |
JP3509267B2 (en) | 1995-04-03 | 2004-03-22 | 株式会社日立製作所 | Ion trap mass spectrometry method and apparatus |
DE19517507C1 (en) | 1995-05-12 | 1996-08-08 | Bruker Franzen Analytik Gmbh | High frequency ion transfer guidance system for transfer of ions into vacuum of e.g. ion trap mass spectrometer |
US5569917A (en) | 1995-05-19 | 1996-10-29 | Varian Associates, Inc. | Apparatus for and method of forming a parallel ion beam |
US5572025A (en) | 1995-05-25 | 1996-11-05 | The Johns Hopkins University, School Of Medicine | Method and apparatus for scanning an ion trap mass spectrometer in the resonance ejection mode |
DE19520319A1 (en) | 1995-06-02 | 1996-12-12 | Bruker Franzen Analytik Gmbh | Method and device for introducing ions into quadrupole ion traps |
JPH095298A (en) | 1995-06-06 | 1997-01-10 | Varian Assoc Inc | Method of detecting kind of selected ion in quadrupole ion trap |
DE19523860A1 (en) | 1995-06-30 | 1997-01-02 | Bruker Franzen Analytik Gmbh | Ion trap mass spectrometer with vacuum-external ion generation |
JP3361528B2 (en) * | 1995-07-03 | 2003-01-07 | 株式会社 日立製作所 | Mass spectrometer |
EP0843887A1 (en) | 1995-08-11 | 1998-05-27 | Mds Health Group Limited | Spectrometer with axial field |
US5811800A (en) | 1995-09-14 | 1998-09-22 | Bruker-Franzen Analytik Gmbh | Temporary storage of ions for mass spectrometric analyses |
US5633497A (en) | 1995-11-03 | 1997-05-27 | Varian Associates, Inc. | Surface coating to improve performance of ion trap mass spectrometers |
JP3189652B2 (en) | 1995-12-01 | 2001-07-16 | 株式会社日立製作所 | Mass spectrometer |
US6259091B1 (en) | 1996-01-05 | 2001-07-10 | Battelle Memorial Institute | Apparatus for reduction of selected ion intensities in confined ion beams |
US5767512A (en) | 1996-01-05 | 1998-06-16 | Battelle Memorial Institute | Method for reduction of selected ion intensities in confined ion beams |
US5629519A (en) | 1996-01-16 | 1997-05-13 | Hitachi Instruments | Three dimensional quadrupole ion trap |
JPH09192586A (en) | 1996-01-17 | 1997-07-29 | Nippon Parkerizing Co Ltd | Electrostatic powder coating method |
US5714755A (en) * | 1996-03-01 | 1998-02-03 | Varian Associates, Inc. | Mass scanning method using an ion trap mass spectrometer |
JP3651106B2 (en) | 1996-04-03 | 2005-05-25 | 株式会社日立製作所 | Mass spectrometer |
US5625186A (en) * | 1996-03-21 | 1997-04-29 | Purdue Research Foundation | Non-destructive ion trap mass spectrometer and method |
JP3424431B2 (en) | 1996-03-29 | 2003-07-07 | 株式会社日立製作所 | Mass spectrometer |
US5734162A (en) | 1996-04-30 | 1998-03-31 | Hewlett Packard Company | Method and apparatus for selectively trapping ions into a quadrupole trap |
CA2253370C (en) | 1996-05-14 | 2006-11-07 | Analytica Of Branford, Inc. | Ion transfer from multipole ion guides into multipole ion guides and ion traps |
US5696376A (en) | 1996-05-20 | 1997-12-09 | The Johns Hopkins University | Method and apparatus for isolating ions in an ion trap with increased resolving power |
JP3294106B2 (en) | 1996-05-21 | 2002-06-24 | 株式会社日立製作所 | Three-dimensional quadrupole mass spectrometry and apparatus |
US5644131A (en) | 1996-05-22 | 1997-07-01 | Hewlett-Packard Co. | Hyperbolic ion trap and associated methods of manufacture |
US6177668B1 (en) | 1996-06-06 | 2001-01-23 | Mds Inc. | Axial ejection in a multipole mass spectrometer |
GB9612070D0 (en) | 1996-06-10 | 1996-08-14 | Micromass Ltd | Plasma mass spectrometer |
US5852294A (en) | 1996-07-03 | 1998-12-22 | Analytica Of Branford, Inc. | Multiple rod construction for ion guides and mass spectrometers |
US5756996A (en) | 1996-07-05 | 1998-05-26 | Finnigan Corporation | Ion source assembly for an ion trap mass spectrometer and method |
DE19628179C2 (en) | 1996-07-12 | 1998-04-23 | Bruker Franzen Analytik Gmbh | Device and method for injecting ions into an ion trap |
DE19629134C1 (en) | 1996-07-19 | 1997-12-11 | Bruker Franzen Analytik Gmbh | Device for transferring ions and measuring method carried out with the same |
US5650617A (en) | 1996-07-30 | 1997-07-22 | Varian Associates, Inc. | Method for trapping ions into ion traps and ion trap mass spectrometer system thereof |
US5726448A (en) | 1996-08-09 | 1998-03-10 | California Institute Of Technology | Rotating field mass and velocity analyzer |
US5693941A (en) | 1996-08-23 | 1997-12-02 | Battelle Memorial Institute | Asymmetric ion trap |
US5777214A (en) | 1996-09-12 | 1998-07-07 | Lockheed Martin Energy Research Corporation | In-situ continuous water analyzing module |
WO1998011428A1 (en) | 1996-09-13 | 1998-03-19 | Hitachi, Ltd. | Mass spectrometer |
US5900481A (en) | 1996-11-06 | 1999-05-04 | Sequenom, Inc. | Bead linkers for immobilizing nucleic acids to solid supports |
US5793038A (en) | 1996-12-10 | 1998-08-11 | Varian Associates, Inc. | Method of operating an ion trap mass spectrometer |
US5793091A (en) | 1996-12-13 | 1998-08-11 | International Business Machines Corporation | Parallel architecture for quantum computers using ion trap arrays |
CA2278556C (en) | 1997-01-23 | 2003-07-29 | Brax Group Limited | Characterising polypeptides |
US5747801A (en) | 1997-01-24 | 1998-05-05 | University Of Florida | Method and device for improved trapping efficiency of injected ions for quadrupole ion traps |
JP3648906B2 (en) | 1997-02-14 | 2005-05-18 | 株式会社日立製作所 | Analyzer using ion trap mass spectrometer |
JP3617662B2 (en) | 1997-02-28 | 2005-02-09 | 株式会社島津製作所 | Mass spectrometer |
DE19709086B4 (en) | 1997-03-06 | 2007-03-15 | Bruker Daltonik Gmbh | Method of space charge control of daughter ions in ion traps |
DE19709172B4 (en) | 1997-03-06 | 2007-03-22 | Bruker Daltonik Gmbh | Method of comparative analysis with ion trap mass spectrometers |
US6147348A (en) | 1997-04-11 | 2000-11-14 | University Of Florida | Method for performing a scan function on quadrupole ion trap mass spectrometers |
JP3570151B2 (en) | 1997-04-17 | 2004-09-29 | 株式会社日立製作所 | Ion trap mass spectrometer |
JPH10314624A (en) | 1997-05-14 | 1998-12-02 | Nippon Parkerizing Co Ltd | Electrostatic powder coating gun |
US6107625A (en) | 1997-05-30 | 2000-08-22 | Bruker Daltonics, Inc. | Coaxial multiple reflection time-of-flight mass spectrometer |
US6323482B1 (en) | 1997-06-02 | 2001-11-27 | Advanced Research And Technology Institute, Inc. | Ion mobility and mass spectrometer |
US5880466A (en) | 1997-06-02 | 1999-03-09 | The Regents Of The University Of California | Gated charged-particle trap |
US5905258A (en) | 1997-06-02 | 1999-05-18 | Advanced Research & Techology Institute | Hybrid ion mobility and mass spectrometer |
US6498342B1 (en) | 1997-06-02 | 2002-12-24 | Advanced Research & Technology Institute | Ion separation instrument |
JP3496458B2 (en) | 1997-06-10 | 2004-02-09 | 株式会社日立製作所 | Ion trap mass spectrometer and ion trap mass spectrometry method |
GB9717926D0 (en) | 1997-08-22 | 1997-10-29 | Micromass Ltd | Methods and apparatus for tandem mass spectrometry |
US6157030A (en) | 1997-09-01 | 2000-12-05 | Hitachi, Ltd. | Ion trap mass spectrometer |
JPH1183803A (en) | 1997-09-01 | 1999-03-26 | Hitachi Ltd | Mass marker correcting method |
US6157031A (en) | 1997-09-17 | 2000-12-05 | California Institute Of Technology | Quadropole mass analyzer with linear ion trap |
JP3413079B2 (en) | 1997-10-09 | 2003-06-03 | 株式会社日立製作所 | Ion trap type mass spectrometer |
DE19751401B4 (en) | 1997-11-20 | 2007-03-01 | Bruker Daltonik Gmbh | Quadrupole radio frequency ion traps for mass spectrometers |
US6015972A (en) | 1998-01-12 | 2000-01-18 | Mds Inc. | Boundary activated dissociation in rod-type mass spectrometer |
EP1050065A4 (en) | 1998-01-23 | 2004-03-31 | Analytica Of Branford Inc | Mass spectrometry from surfaces |
US6753523B1 (en) | 1998-01-23 | 2004-06-22 | Analytica Of Branford, Inc. | Mass spectrometry with multipole ion guides |
US6331702B1 (en) | 1999-01-25 | 2001-12-18 | University Of Manitoba | Spectrometer provided with pulsed ion source and transmission device to damp ion motion and method of use |
GB9802111D0 (en) | 1998-01-30 | 1998-04-01 | Shimadzu Res Lab Europe Ltd | Time-of-flight mass spectrometer |
US6428956B1 (en) | 1998-03-02 | 2002-08-06 | Isis Pharmaceuticals, Inc. | Mass spectrometric methods for biomolecular screening |
US6124592A (en) | 1998-03-18 | 2000-09-26 | Technispan Llc | Ion mobility storage trap and method |
US6414331B1 (en) | 1998-03-23 | 2002-07-02 | Gerald A. Smith | Container for transporting antiprotons and reaction trap |
JP3372862B2 (en) | 1998-03-25 | 2003-02-04 | 株式会社日立製作所 | Biological fluid mass spectrometer |
JP3904322B2 (en) | 1998-04-20 | 2007-04-11 | 株式会社日立製作所 | Analysis equipment |
US6069355A (en) | 1998-05-14 | 2000-05-30 | Varian, Inc. | Ion trap mass pectrometer with electrospray ionization |
JP4231123B2 (en) | 1998-06-15 | 2009-02-25 | 浜松ホトニクス株式会社 | Electron tubes and photomultiplier tubes |
JP2000028579A (en) | 1998-07-08 | 2000-01-28 | Hitachi Ltd | Sample gas collecting device and hazardous substance detecting device |
US6621077B1 (en) | 1998-08-05 | 2003-09-16 | National Research Council Canada | Apparatus and method for atmospheric pressure-3-dimensional ion trapping |
US6504149B2 (en) | 1998-08-05 | 2003-01-07 | National Research Council Canada | Apparatus and method for desolvating and focussing ions for introduction into a mass spectrometer |
JP2000067805A (en) | 1998-08-24 | 2000-03-03 | Hitachi Ltd | Mass spectro meter |
JP3345401B2 (en) | 1998-08-25 | 2002-11-18 | ユニバーシティ オブ ワシントン | Rapid quantitative analysis of proteins or protein functions in complex mixtures |
JP2002523114A (en) | 1998-08-31 | 2002-07-30 | ユニバーシテイ オブ ワシントン | Stable isotope metabolic labeling for biopolymer analysis |
US6392225B1 (en) | 1998-09-24 | 2002-05-21 | Thermo Finnigan Llc | Method and apparatus for transferring ions from an atmospheric pressure ion source into an ion trap mass spectrometer |
US6624408B1 (en) | 1998-10-05 | 2003-09-23 | Bruker Daltonik Gmbh | Method for library searches and extraction of structural information from daughter ion spectra in ion trap mass spectrometry |
US6124591A (en) | 1998-10-16 | 2000-09-26 | Finnigan Corporation | Method of ion fragmentation in a quadrupole ion trap |
CA2255188C (en) | 1998-12-02 | 2008-11-18 | University Of British Columbia | Method and apparatus for multiple stages of mass spectrometry |
US6196889B1 (en) | 1998-12-11 | 2001-03-06 | United Technologies Corporation | Method and apparatus for use an electron gun employing a thermionic source of electrons |
JP3785042B2 (en) | 1998-12-21 | 2006-06-14 | シマヅ リサーチ ラボラトリー(ヨーロッパ)リミティド | Method for fast start-up and / or fast exit of radio frequency resonator |
US6291820B1 (en) | 1999-01-08 | 2001-09-18 | The Regents Of The University Of California | Highly charged ion secondary ion mass spectroscopy |
US6342393B1 (en) | 1999-01-22 | 2002-01-29 | Isis Pharmaceuticals, Inc. | Methods and apparatus for external accumulation and photodissociation of ions prior to mass spectrometric analysis |
US6211516B1 (en) | 1999-02-09 | 2001-04-03 | Syagen Technology | Photoionization mass spectrometer |
DE19911801C1 (en) | 1999-03-17 | 2001-01-11 | Bruker Daltonik Gmbh | Method and device for matrix-assisted laser desorption ionization of substances |
US6629040B1 (en) | 1999-03-19 | 2003-09-30 | University Of Washington | Isotope distribution encoded tags for protein identification |
GB2349270B (en) | 1999-04-15 | 2002-02-13 | Hitachi Ltd | Mass analysis apparatus and method for mass analysis |
US6379970B1 (en) | 1999-04-30 | 2002-04-30 | The Arizona Board Of Regents On Behalf Of The University Of Arizona | Analysis of differential protein expression |
US6391649B1 (en) | 1999-05-04 | 2002-05-21 | The Rockefeller University | Method for the comparative quantitative analysis of proteins and other biological material by isotopic labeling and mass spectroscopy |
US6489609B1 (en) | 1999-05-21 | 2002-12-03 | Hitachi, Ltd. | Ion trap mass spectrometry and apparatus |
US6507019B2 (en) | 1999-05-21 | 2003-01-14 | Mds Inc. | MS/MS scan methods for a quadrupole/time of flight tandem mass spectrometer |
US6504148B1 (en) | 1999-05-27 | 2003-01-07 | Mds Inc. | Quadrupole mass spectrometer with ION traps to enhance sensitivity |
JP2003525515A (en) | 1999-06-11 | 2003-08-26 | パーセプティブ バイオシステムズ,インコーポレイテッド | Tandem time-of-flight mass spectrometer with attenuation in a collision cell and method for its use |
DE19930894B4 (en) | 1999-07-05 | 2007-02-08 | Bruker Daltonik Gmbh | Method for controlling the number of ions in ion cyclotron resonance mass spectrometers |
US6690004B2 (en) | 1999-07-21 | 2004-02-10 | The Charles Stark Draper Laboratory, Inc. | Method and apparatus for electrospray-augmented high field asymmetric ion mobility spectrometry |
DE19937438C2 (en) | 1999-08-07 | 2001-09-13 | Bruker Daltonik Gmbh | Coupling thin layer chromatography and mass spectrometry (TLC / MS) |
DE19937439C1 (en) | 1999-08-07 | 2001-05-17 | Bruker Daltonik Gmbh | Device for alternating operation of several ion sources |
JP2003507874A (en) | 1999-08-26 | 2003-02-25 | ユニバーシティ オブ ニュー ハンプシャー | Multi-stage mass spectrometer |
US6326615B1 (en) | 1999-08-30 | 2001-12-04 | Syagen Technology | Rapid response mass spectrometer system |
JP3650551B2 (en) | 1999-09-14 | 2005-05-18 | 株式会社日立製作所 | Mass spectrometer |
US6469298B1 (en) | 1999-09-20 | 2002-10-22 | Ut-Battelle, Llc | Microscale ion trap mass spectrometer |
DE19949978A1 (en) | 1999-10-08 | 2001-05-10 | Univ Dresden Tech | Electron impact ion source |
JP3756365B2 (en) | 1999-12-02 | 2006-03-15 | 株式会社日立製作所 | Ion trap mass spectrometry method |
JP3625265B2 (en) | 1999-12-07 | 2005-03-02 | 株式会社日立製作所 | Ion trap mass spectrometer |
JP3470671B2 (en) | 2000-01-31 | 2003-11-25 | 株式会社島津製作所 | Broadband signal generation method in ion trap type mass spectrometer |
EP1266395A2 (en) | 2000-03-14 | 2002-12-18 | National Research Council of Canada | Tandem faims/ion-trapping apparatus and method |
JP4416259B2 (en) | 2000-03-24 | 2010-02-17 | キヤノンアネルバ株式会社 | Mass spectrometer |
JP3655589B2 (en) | 2000-03-31 | 2005-06-02 | シマヅ リサーチ ラボラトリー(ヨーロッパ)リミティド | Radio frequency resonator |
US6545268B1 (en) | 2000-04-10 | 2003-04-08 | Perseptive Biosystems | Preparation of ion pulse for time-of-flight and for tandem time-of-flight mass analysis |
US6403955B1 (en) | 2000-04-26 | 2002-06-11 | Thermo Finnigan Llc | Linear quadrupole mass spectrometer |
US6762406B2 (en) | 2000-05-25 | 2004-07-13 | Purdue Research Foundation | Ion trap array mass spectrometer |
JP2001351571A (en) | 2000-06-07 | 2001-12-21 | Hitachi Ltd | Method and device for ion trap mass spectrometry |
DE10028914C1 (en) | 2000-06-10 | 2002-01-17 | Bruker Daltonik Gmbh | Mass spectrometer with HF quadrupole ion trap has ion detector incorporated in one of dome-shaped end electrodes of latter |
US6720554B2 (en) | 2000-07-21 | 2004-04-13 | Mds Inc. | Triple quadrupole mass spectrometer with capability to perform multiple mass analysis steps |
US6690005B2 (en) | 2000-08-02 | 2004-02-10 | General Electric Company | Ion mobility spectrometer |
EP1319945A4 (en) | 2000-09-20 | 2007-07-04 | Hitachi Ltd | Probing method using ion trap mass spectrometer and probing device |
JP2002150992A (en) | 2000-11-09 | 2002-05-24 | Anelva Corp | Ionizer and ionization method for mass spectrometry |
DE10058706C1 (en) | 2000-11-25 | 2002-02-28 | Bruker Daltonik Gmbh | Fragmentation of ions, especially biomolecules comprises capture of low energy electrons in high energy ion trap mass spectrometer with ring electrode to which high frequency voltage and end cap electrodes which are earthed, or vice-versa |
EP1366507B1 (en) | 2000-12-14 | 2009-10-28 | MKS Instruments, Inc. | Ion storage system |
GB0031342D0 (en) | 2000-12-21 | 2001-02-07 | Shimadzu Res Lab Europe Ltd | Method and apparatus for ejecting ions from a quadrupole ion trap |
US6573495B2 (en) | 2000-12-26 | 2003-06-03 | Thermo Finnigan Llc | High capacity ion cyclotron resonance cell |
US6683301B2 (en) | 2001-01-29 | 2004-01-27 | Analytica Of Branford, Inc. | Charged particle trapping in near-surface potential wells |
US6627883B2 (en) | 2001-03-02 | 2003-09-30 | Bruker Daltonics Inc. | Apparatus and method for analyzing samples in a dual ion trap mass spectrometer |
US6649907B2 (en) | 2001-03-08 | 2003-11-18 | Wisconsin Alumni Research Foundation | Charge reduction electrospray ionization ion source |
EP1245952B1 (en) | 2001-03-20 | 2012-09-19 | Morpho Detection, Inc. | Ion mobility spectrometer and its usage |
GB2404784B (en) | 2001-03-23 | 2005-06-22 | Thermo Finnigan Llc | Mass spectrometry method and apparatus |
US6777671B2 (en) | 2001-04-10 | 2004-08-17 | Science & Engineering Services, Inc. | Time-of-flight/ion trap mass spectrometer, a method, and a computer program product to use the same |
US6617577B2 (en) | 2001-04-16 | 2003-09-09 | The Rockefeller University | Method and system for mass spectroscopy |
US6627875B2 (en) | 2001-04-23 | 2003-09-30 | Beyond Genomics, Inc. | Tailored waveform/charge reduction mass spectrometry |
WO2002091427A2 (en) | 2001-05-08 | 2002-11-14 | Thermo Finnigan Llc | Ion trap |
US6608303B2 (en) | 2001-06-06 | 2003-08-19 | Thermo Finnigan Llc | Quadrupole ion trap with electronic shims |
JP3757820B2 (en) | 2001-06-13 | 2006-03-22 | 株式会社日立製作所 | Ion source and mass spectrometer using the same |
US6784421B2 (en) | 2001-06-14 | 2004-08-31 | Bruker Daltonics, Inc. | Method and apparatus for fourier transform mass spectrometry (FTMS) in a linear multipole ion trap |
US6744042B2 (en) | 2001-06-18 | 2004-06-01 | Yeda Research And Development Co., Ltd. | Ion trapping |
CA2391140C (en) | 2001-06-25 | 2008-10-07 | Micromass Limited | Mass spectrometer |
JP4631219B2 (en) | 2001-06-26 | 2011-02-16 | 株式会社島津製作所 | Ion trap mass spectrometer |
JP3620479B2 (en) | 2001-07-31 | 2005-02-16 | 株式会社島津製作所 | Method of ion selection in ion storage device |
US6610976B2 (en) | 2001-08-28 | 2003-08-26 | The Rockefeller University | Method and apparatus for improved signal-to-noise ratio in mass spectrometry |
WO2003019614A2 (en) | 2001-08-30 | 2003-03-06 | Mds Inc., Doing Busness As Mds Sciex | A method of reducing space charge in a linear ion trap mass spectrometer |
JP3990889B2 (en) | 2001-10-10 | 2007-10-17 | 株式会社日立ハイテクノロジーズ | Mass spectrometer and measurement system using the same |
US6787760B2 (en) | 2001-10-12 | 2004-09-07 | Battelle Memorial Institute | Method for increasing the dynamic range of mass spectrometers |
JP3690330B2 (en) * | 2001-10-16 | 2005-08-31 | 株式会社島津製作所 | Ion trap device |
US6787767B2 (en) | 2001-11-07 | 2004-09-07 | Hitachi High-Technologies Corporation | Mass analyzing method using an ion trap type mass spectrometer |
EP1315196B1 (en) | 2001-11-22 | 2007-01-10 | Micromass UK Limited | Mass spectrometer and method |
GB2389452B (en) | 2001-12-06 | 2006-05-10 | Bruker Daltonik Gmbh | Ion-guide |
AU2002350343A1 (en) | 2001-12-21 | 2003-07-15 | Mds Inc., Doing Business As Mds Sciex | Use of notched broadband waveforms in a linear ion trap |
US6777673B2 (en) | 2001-12-28 | 2004-08-17 | Academia Sinica | Ion trap mass spectrometer |
US6888133B2 (en) | 2002-01-30 | 2005-05-03 | Varian, Inc. | Integrated ion focusing and gating optics for ion trap mass spectrometer |
US6710336B2 (en) | 2002-01-30 | 2004-03-23 | Varian, Inc. | Ion trap mass spectrometer using pre-calculated waveforms for ion isolation and collision induced dissociation |
WO2003065405A1 (en) | 2002-01-31 | 2003-08-07 | Hitachi High-Technologies Corporation | Electro-spray ionization mass spectrometer and method therefor |
US6844547B2 (en) | 2002-02-04 | 2005-01-18 | Thermo Finnigan Llc | Circuit for applying supplementary voltages to RF multipole devices |
JP3653504B2 (en) | 2002-02-12 | 2005-05-25 | 株式会社日立ハイテクノロジーズ | Ion trap mass spectrometer |
FR2835964B1 (en) | 2002-02-14 | 2004-07-09 | Centre Nat Rech Scient | PERMANENT MAGNET ION TRAP AND MASS SPECTROMETER USING SUCH A MAGNET |
JP3752458B2 (en) | 2002-02-18 | 2006-03-08 | 株式会社日立ハイテクノロジーズ | Mass spectrometer |
JP3840417B2 (en) | 2002-02-20 | 2006-11-01 | 株式会社日立ハイテクノロジーズ | Mass spectrometer |
US6674067B2 (en) | 2002-02-21 | 2004-01-06 | Hitachi High Technologies America, Inc. | Methods and apparatus to control charge neutralization reactions in ion traps |
US6570151B1 (en) * | 2002-02-21 | 2003-05-27 | Hitachi Instruments, Inc. | Methods and apparatus to control charge neutralization reactions in ion traps |
JP3951741B2 (en) | 2002-02-27 | 2007-08-01 | 株式会社日立製作所 | Charge adjustment method and apparatus, and mass spectrometer |
DE10213652B4 (en) | 2002-03-27 | 2008-02-21 | Bruker Daltonik Gmbh | Method for irradiating ions in an ion cyclotron resonance trap with electrons and / or photons |
US7049580B2 (en) | 2002-04-05 | 2006-05-23 | Mds Inc. | Fragmentation of ions by resonant excitation in a high order multipole field, low pressure ion trap |
US6872939B2 (en) | 2002-05-17 | 2005-03-29 | Micromass Uk Limited | Mass spectrometer |
US6906319B2 (en) | 2002-05-17 | 2005-06-14 | Micromass Uk Limited | Mass spectrometer |
JP3791455B2 (en) | 2002-05-20 | 2006-06-28 | 株式会社島津製作所 | Ion trap mass spectrometer |
JP3971958B2 (en) | 2002-05-28 | 2007-09-05 | 株式会社日立ハイテクノロジーズ | Mass spectrometer |
US6703607B2 (en) | 2002-05-30 | 2004-03-09 | Mds Inc. | Axial ejection resolution in multipole mass spectrometers |
US6794641B2 (en) | 2002-05-30 | 2004-09-21 | Micromass Uk Limited | Mass spectrometer |
US7095013B2 (en) | 2002-05-30 | 2006-08-22 | Micromass Uk Limited | Mass spectrometer |
US6770871B1 (en) | 2002-05-31 | 2004-08-03 | Michrom Bioresources, Inc. | Two-dimensional tandem mass spectrometry |
JP3743717B2 (en) | 2002-06-25 | 2006-02-08 | 株式会社日立製作所 | Mass spectrometry data analysis method, mass spectrometry data analysis apparatus, mass spectrometry data analysis program, and solution providing system |
US6791078B2 (en) | 2002-06-27 | 2004-09-14 | Micromass Uk Limited | Mass spectrometer |
US6897438B2 (en) | 2002-08-05 | 2005-05-24 | University Of British Columbia | Geometry for generating a two-dimensional substantially quadrupole field |
US7045797B2 (en) | 2002-08-05 | 2006-05-16 | The University Of British Columbia | Axial ejection with improved geometry for generating a two-dimensional substantially quadrupole field |
US7071467B2 (en) | 2002-08-05 | 2006-07-04 | Micromass Uk Limited | Mass spectrometer |
US7102126B2 (en) | 2002-08-08 | 2006-09-05 | Micromass Uk Limited | Mass spectrometer |
DE10236346A1 (en) | 2002-08-08 | 2004-02-19 | Bruker Daltonik Gmbh | Ion-analyzing method for ions in ion traps with four pole rods alternately fed by both phases of a high-frequency working voltage in an O-frequency ejects ions on-axis or radially by bulk selection |
US6794642B2 (en) | 2002-08-08 | 2004-09-21 | Micromass Uk Limited | Mass spectrometer |
US6875980B2 (en) | 2002-08-08 | 2005-04-05 | Micromass Uk Limited | Mass spectrometer |
US6867414B2 (en) | 2002-09-24 | 2005-03-15 | Ciphergen Biosystems, Inc. | Electric sector time-of-flight mass spectrometer with adjustable ion optical elements |
JP3787549B2 (en) | 2002-10-25 | 2006-06-21 | 株式会社日立ハイテクノロジーズ | Mass spectrometer and mass spectrometry method |
JP3741097B2 (en) | 2002-10-31 | 2006-02-01 | 株式会社島津製作所 | Ion trap apparatus and method for adjusting the apparatus |
US7294832B2 (en) | 2002-12-02 | 2007-11-13 | Griffin Analytical Technologies, Llc | Mass separators |
US6914242B2 (en) | 2002-12-06 | 2005-07-05 | Agilent Technologies, Inc. | Time of flight ion trap tandem mass spectrometer system |
US20040119014A1 (en) | 2002-12-18 | 2004-06-24 | Alex Mordehai | Ion trap mass spectrometer and method for analyzing ions |
JP3936908B2 (en) | 2002-12-24 | 2007-06-27 | 株式会社日立ハイテクノロジーズ | Mass spectrometer and mass spectrometry method |
US6838666B2 (en) | 2003-01-10 | 2005-01-04 | Purdue Research Foundation | Rectilinear ion trap and mass analyzer system and method |
US6710334B1 (en) | 2003-01-20 | 2004-03-23 | Genspec Sa | Quadrupol ion trap mass spectrometer with cryogenic particle detector |
US6982415B2 (en) | 2003-01-24 | 2006-01-03 | Thermo Finnigan Llc | Controlling ion populations in a mass analyzer having a pulsed ion source |
WO2004068523A2 (en) | 2003-01-24 | 2004-08-12 | Thermo Finnigan Llc | Controlling ion populations in a mass analyzer |
US7019289B2 (en) | 2003-01-31 | 2006-03-28 | Yang Wang | Ion trap mass spectrometry |
CA2517700C (en) | 2003-03-19 | 2009-11-17 | Thermo Finnigan Llc | Obtaining tandem mass spectrometry data for multiple parent ions in an ion population |
US7064319B2 (en) | 2003-03-31 | 2006-06-20 | Hitachi High-Technologies Corporation | Mass spectrometer |
US6878932B1 (en) | 2003-05-09 | 2005-04-12 | John D. Kroska | Mass spectrometer ionization source and related methods |
US6858840B2 (en) | 2003-05-20 | 2005-02-22 | Science & Engineering Services, Inc. | Method of ion fragmentation in a multipole ion guide of a tandem mass spectrometer |
US7019290B2 (en) | 2003-05-30 | 2006-03-28 | Applera Corporation | System and method for modifying the fringing fields of a radio frequency multipole |
DE10325579B4 (en) | 2003-06-05 | 2007-10-11 | Bruker Daltonik Gmbh | Ion fragmentation by electron capture in linear ion traps |
EP1651941B1 (en) | 2003-06-27 | 2017-03-15 | Brigham Young University | Virtual ion trap |
US7119331B2 (en) | 2003-08-07 | 2006-10-10 | Academia Sinica | Nanoparticle ion detection |
US6800851B1 (en) | 2003-08-20 | 2004-10-05 | Bruker Daltonik Gmbh | Electron-ion fragmentation reactions in multipolar radiofrequency fields |
JP3912345B2 (en) | 2003-08-26 | 2007-05-09 | 株式会社島津製作所 | Mass spectrometer |
US6982413B2 (en) | 2003-09-05 | 2006-01-03 | Griffin Analytical Technologies, Inc. | Method of automatically calibrating electronic controls in a mass spectrometer |
US7161142B1 (en) | 2003-09-05 | 2007-01-09 | Griffin Analytical Technologies | Portable mass spectrometers |
JP5027507B2 (en) | 2003-09-25 | 2012-09-19 | エムディーエス インコーポレイテッド ドゥーイング ビジネス アズ エムディーエス サイエックス | Method and apparatus for providing a two-dimensional substantially quadrupole electric field having selected hexapole components |
JP2005108578A (en) | 2003-09-30 | 2005-04-21 | Hitachi Ltd | Mass spectroscope |
US7217919B2 (en) | 2004-11-02 | 2007-05-15 | Analytica Of Branford, Inc. | Method and apparatus for multiplexing plural ion beams to a mass spectrometer |
JP3960306B2 (en) * | 2003-12-22 | 2007-08-15 | 株式会社島津製作所 | Ion trap device |
JP4200092B2 (en) | 2003-12-24 | 2008-12-24 | 株式会社日立ハイテクノロジーズ | Mass spectrometer and calibration method thereof |
JP4033133B2 (en) | 2004-01-13 | 2008-01-16 | 株式会社島津製作所 | Mass spectrometer |
US7026613B2 (en) | 2004-01-23 | 2006-04-11 | Thermo Finnigan Llc | Confining positive and negative ions with fast oscillating electric potentials |
GB0404285D0 (en) | 2004-02-26 | 2004-03-31 | Shimadzu Res Lab Europe Ltd | A tandem ion-trap time-of flight mass spectrometer |
US6933498B1 (en) | 2004-03-16 | 2005-08-23 | Ut-Battelle, Llc | Ion trap array-based systems and methods for chemical analysis |
US6958473B2 (en) | 2004-03-25 | 2005-10-25 | Predicant Biosciences, Inc. | A-priori biomarker knowledge based mass filtering for enhanced biomarker detection |
JP4300154B2 (en) | 2004-05-14 | 2009-07-22 | 株式会社日立ハイテクノロジーズ | Ion trap / time-of-flight mass spectrometer and accurate mass measurement method for ions |
US7170051B2 (en) | 2004-05-20 | 2007-01-30 | Science & Engineering Services, Inc. | Method and apparatus for ion fragmentation in mass spectrometry |
JP4384542B2 (en) | 2004-05-24 | 2009-12-16 | 株式会社日立ハイテクノロジーズ | Mass spectrometer |
JP4506285B2 (en) * | 2004-05-28 | 2010-07-21 | 株式会社島津製作所 | Ion trap apparatus and method for adjusting the apparatus |
JP4653972B2 (en) | 2004-06-11 | 2011-03-16 | 株式会社日立ハイテクノロジーズ | Ion trap / time-of-flight mass spectrometer and mass spectrometry method |
US7270020B2 (en) | 2004-06-14 | 2007-09-18 | Griffin Analytical Technologies, Llc | Instrument assemblies and analysis methods |
US7361890B2 (en) | 2004-07-02 | 2008-04-22 | Griffin Analytical Technologies, Inc. | Analytical instruments, assemblies, and methods |
US7208726B2 (en) | 2004-08-27 | 2007-04-24 | Agilent Technologies, Inc. | Ion trap mass spectrometer with scanning delay ion extraction |
US6949743B1 (en) | 2004-09-14 | 2005-09-27 | Thermo Finnigan Llc | High-Q pulsed fragmentation in ion traps |
US7102129B2 (en) | 2004-09-14 | 2006-09-05 | Thermo Finnigan Llc | High-Q pulsed fragmentation in ion traps |
US7154088B1 (en) | 2004-09-16 | 2006-12-26 | Sandia Corporation | Microfabricated ion trap array |
US6972408B1 (en) | 2004-09-30 | 2005-12-06 | Ut-Battelle, Llc | Ultra high mass range mass spectrometer systems |
US20060163472A1 (en) | 2005-01-25 | 2006-07-27 | Varian, Inc. | Correcting phases for ion polarity in ion trap mass spectrometry |
WO2006086294A2 (en) | 2005-02-07 | 2006-08-17 | Purdue Research Foundation | Linear ion trap with four planar electrodes |
US7217922B2 (en) | 2005-03-14 | 2007-05-15 | Lucent Technologies Inc. | Planar micro-miniature ion trap devices |
US7838820B2 (en) | 2005-06-06 | 2010-11-23 | UT-Battlelle, LLC | Controlled kinetic energy ion source for miniature ion trap and related spectroscopy system and method |
US7279681B2 (en) | 2005-06-22 | 2007-10-09 | Agilent Technologies, Inc. | Ion trap with built-in field-modifying electrodes and method of operation |
US7323683B2 (en) | 2005-08-31 | 2008-01-29 | The Rockefeller University | Linear ion trap for mass spectrometry |
US7423262B2 (en) | 2005-11-14 | 2008-09-09 | Agilent Technologies, Inc. | Precision segmented ion trap |
US7582864B2 (en) | 2005-12-22 | 2009-09-01 | Leco Corporation | Linear ion trap with an imbalanced radio frequency field |
US7456389B2 (en) | 2006-07-11 | 2008-11-25 | Thermo Finnigan Llc | High throughput quadrupolar ion trap |
US7579778B2 (en) | 2006-07-11 | 2009-08-25 | L-3 Communications Electron Technologies, Inc. | Traveling-wave tube with integrated ion trap power supply |
US7446310B2 (en) | 2006-07-11 | 2008-11-04 | Thermo Finnigan Llc | High throughput quadrupolar ion trap |
US20080017794A1 (en) | 2006-07-18 | 2008-01-24 | Zyvex Corporation | Coaxial ring ion trap |
JP2009544356A (en) | 2006-07-21 | 2009-12-17 | プレサイエント メディカル, インコーポレイテッド | Adaptable tissue contact catheter |
US8334506B2 (en) | 2007-12-10 | 2012-12-18 | 1St Detect Corporation | End cap voltage control of ion traps |
JP5323384B2 (en) | 2008-04-14 | 2013-10-23 | 株式会社日立製作所 | Mass spectrometer and mass spectrometry method |
-
2008
- 2008-12-08 US US12/329,787 patent/US8334506B2/en active Active
- 2008-12-10 CA CA2708594A patent/CA2708594C/en not_active Expired - Fee Related
- 2008-12-10 EP EP08859432.0A patent/EP2232522B1/en not_active Not-in-force
- 2008-12-10 CN CN2008801265159A patent/CN101971290A/en active Pending
- 2008-12-10 JP JP2010538129A patent/JP5613057B2/en not_active Expired - Fee Related
- 2008-12-10 WO PCT/US2008/086241 patent/WO2009076444A1/en active Application Filing
-
2012
- 2012-12-17 US US13/717,169 patent/US8704168B2/en active Active
-
2014
- 2014-08-01 JP JP2014157332A patent/JP5895034B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20090146054A1 (en) | 2009-06-11 |
US8334506B2 (en) | 2012-12-18 |
EP2232522B1 (en) | 2018-01-24 |
WO2009076444A1 (en) | 2009-06-18 |
EP2232522A1 (en) | 2010-09-29 |
JP2014222673A (en) | 2014-11-27 |
JP5613057B2 (en) | 2014-10-22 |
CN101971290A (en) | 2011-02-09 |
JP2011507193A (en) | 2011-03-03 |
JP5895034B2 (en) | 2016-03-30 |
US20130099137A1 (en) | 2013-04-25 |
US8704168B2 (en) | 2014-04-22 |
CA2708594A1 (en) | 2009-06-18 |
EP2232522A4 (en) | 2011-08-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CA2708594C (en) | End cap voltage control of ion traps | |
JP3890088B2 (en) | Ion trap mass spectrometer method and apparatus for improved sensitivity | |
US10284154B1 (en) | System and method for generating high-voltage radio frequency signals using an electronically tuned resonator | |
EP0262928A2 (en) | Quadrupole mass spectrometer and method of operation thereof | |
JP2010530607A (en) | Digital differential electrical mobility separation method and apparatus | |
CN103282998A (en) | Methods and systems for providing a substantially quadrupole field with significant hexapole and octapole components | |
US6340814B1 (en) | Mass spectrometer with multiple capacitively coupled mass analysis stages | |
US5283436A (en) | Generation of an exact three-dimensional quadrupole electric field and superposition of a homogeneous electric field in trapping-exciting mass spectrometer (TEMS) | |
US7615743B2 (en) | Overcoming space charge effects in ion cyclotron resonance mass spectrometers | |
US7019290B2 (en) | System and method for modifying the fringing fields of a radio frequency multipole | |
US6191417B1 (en) | Mass spectrometer including multiple mass analysis stages and method of operation, to give improved resolution | |
CA2539603C (en) | Measuring cell for ion cyclotron resonance spectrometer | |
US20100320378A1 (en) | Method and apparatuses for ion cyclotron spectrometry | |
JP2002175774A (en) | Mass filter driving system | |
JP7028109B2 (en) | Mass spectrometer | |
CA2033753C (en) | Generation of an exact three-dimensional quadrupole electric field | |
CN113628952B (en) | Quadrupole rod mass analyzer based on single-path radio frequency drive | |
JPS59123155A (en) | Tetrode mass spectrograph | |
WO2013132308A1 (en) | Methods and systems for providing a substantially quadrupole field with a higher order component |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
EEER | Examination request |
Effective date: 20131209 |
|
MKLA | Lapsed |
Effective date: 20201210 |