CA2565472A1 - Electronic thermometer with flex circuit location - Google Patents

Electronic thermometer with flex circuit location Download PDF

Info

Publication number
CA2565472A1
CA2565472A1 CA002565472A CA2565472A CA2565472A1 CA 2565472 A1 CA2565472 A1 CA 2565472A1 CA 002565472 A CA002565472 A CA 002565472A CA 2565472 A CA2565472 A CA 2565472A CA 2565472 A1 CA2565472 A1 CA 2565472A1
Authority
CA
Canada
Prior art keywords
deformable
circuit element
set forth
locating member
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA002565472A
Other languages
French (fr)
Other versions
CA2565472C (en
Inventor
Ricky A. Sisk
Joseph T. Gierer
Mark Davis
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Cardinal Health 529 LLC
Original Assignee
Ricky A. Sisk
Joseph T. Gierer
Mark Davis
Sherwood Services Ag
Covidien Ag
Cardinal Health Ireland Unlimited Company
Cardinal Health 529, Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricky A. Sisk, Joseph T. Gierer, Mark Davis, Sherwood Services Ag, Covidien Ag, Cardinal Health Ireland Unlimited Company, Cardinal Health 529, Llc filed Critical Ricky A. Sisk
Publication of CA2565472A1 publication Critical patent/CA2565472A1/en
Application granted granted Critical
Publication of CA2565472C publication Critical patent/CA2565472C/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
    • G01K1/14—Supports; Fastening devices; Arrangements for mounting thermometers in particular locations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K13/00—Thermometers specially adapted for specific purposes
    • G01K13/20—Clinical contact thermometers for use with humans or animals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
    • G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49117—Conductor or circuit manufacturing
    • Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
    • Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.

Abstract

An electronic thermometer is configured for ease and accuracy in construction. A probe of the thermometer includes a flex circuit containing electronic components used to measure temperature and transmit signals to a calculating unit of the thermometer. A locating member supported by the probe can function to pre-position the flex circuit prior to final fixation so that the electronic components are reliably positioned in manufacture.

Claims (30)

1. An electronic thermometer comprising:
a probe tip adapted to be heated to a temperature by an object for use in measuring the temperature of the object;
a deformable circuit element including a deformable electrical conductor and at least one temperature sensor electrically connected to the electrical conductor for detecting the temperature of the probe tip;
a probe shaft supporting the probe tip and deformable circuit element and including an end portion;
a locating member supported by the probe shaft formed for at least temporarily locating the deformable circuit element.
2. An electronic thermometer as set forth in claim 1 wherein the locating member has locating structure engaging the deformable circuit element to position the deformable circuit element.
3. An electronic thermometer as set forth in claim 2 wherein said locating structure of the locating member comprises a nub projecting outward from the locating member and engaging the deformable circuit element.
4. An electronic thermometer as set forth in claim 3 wherein the deformable electrical conductor comprises a deformable substrate having an opening therein receiving the nub of the locating member.
5. An electronic thermometer as set forth in claim 2 wherein said locating structure comprises a platform formed with the locating member, a portion of the deformable circuit element being held on the platform.
6. An electronic thermometer as set forth in claim 5 wherein the platform is formed with at least one protrusion extending upward from the platform, the protrusion capturing a portion of the deformable electrical conductor of the deformable circuit element.
7. An electronic thermometer as set forth in claim 6 wherein the deformable electrical conductor comprises a deformable substrate including at least one notch, the protrusion being received in the notch to hold the deformable substrate in position on the locating member.
8. An electronic thermometer as set forth in claim 1 wherein the locating member includes a bridge located generally at an end of the probe shaft, the bridge engaging a portion of the deformable circuit element.
9. An electronic thermometer as set forth in claim 8 wherein the deformable circuit element further comprises at least one other electrical device electrically connected to the deformable electrical conductor, and wherein the locating member biases said other electrical device against an interior wall of the separator.
10. An electronic thermometer as set forth in claim 9 wherein the locating member includes a resilient locator extending into the separator, the locator biasing said other electrical device against the interior wall of the separator.
11. An electronic thermometer as set forth in claim wherein the locating member includes a cavity located to permit resilient deformation by the locator.
12. An electronic thermometer as set forth in claim 1 wherein the deformable circuit element further comprises at least one other electrical device electrically connected to the deformable electrical conductor, and wherein the locating member biases said other electrical device against an interior wall of the separator.
13. An electronic thermometer as set forth in claim 1 wherein the locating member comprises an isolator made of thermally insulating material.
14. An electronic thermometer as set forth in claim 1 further comprising a base unit and a cord connecting the probe shaft to the base unit.
15. A probe for an electronic thermometer comprising:
a probe tip adapted to be heated to the temperature by an object for use in measuring the temperature of the object;
a deformable circuit element including a deformable electrical conductor and at least one temperature sensor electrically connected to the electrical conductor for detecting the temperature of the probe tip;
a probe shaft supporting the probe tip and deformable circuit element and including an end portion;
a separator supported by the probe shaft;
a locating member supported by the probe shaft formed for at least temporarily locating the deformable circuit element.
16. A probe as set forth in claim 15 wherein the locating member has locating structure engaging the deformable circuit element to position the deformable circuit element.
17. A probe as set forth in claim 16 wherein said locating structure of the locating member comprises a nub projecting outward from the locating member and engaging the deformable circuit element.
18. A probe as set forth in claim 17 wherein the deformable electrical conductor comprises a deformable substrate having an opening therein receiving the nub of the locating member.
19. A probe as set forth in claim 16 wherein said locating structure comprises a platform formed with the locating member, a portion of the deformable circuit element being held on the platform.
20. A probe as set forth in claim 19 wherein the platform is formed with at least one protrusion extending from the platform, the protrusion capturing a portion of the deformable electrical conductor of the deformable circuit element.
21. An electronic thermometer as set forth in claim 19 wherein the deformable electrical conductor comprises a deformable substrate including at least one notch, the protrusion being received in the notch to hold the deformable substrate in position on the locating member.
22. A probe as set forth in claim 15 wherein the locating member includes a bridge located generally at an end of the probe shaft, the bridge engaging a portion of the deformable circuit element.
23. A probe as set forth in claim 22 wherein the deformable circuit element further comprises at least one other electrical device electrically connected to the deformable electrical conductor, and wherein the locating member biases said other electrical device against an interior wall of the separator.
24. A probe as set forth in claim 23 wherein the locating member includes a resilient locator extending into the separator, the locator biasing said other electrical device against the interior wall of the separator.
25. A probe as set forth in claim 24 wherein the locating member includes a cavity located to permit resilient deformation by the locator.
26. A probe as set forth in claim 15 wherein the deformable circuit element further comprises at least one other electrical device electrically connected to the deformable electrical conductor, and wherein the locating member biases said other electrical device against an interior wall of the separator.
27. A method of making a probe for an electronic thermometer comprising:
positioning a deformable circuit element together with a probe shaft;
deforming the deformable circuit element;
connecting a separator to the probe shaft;
connecting a locating member to the probe shaft;

interconnecting the deformable circuit element and locating member for use in locating the deformable circuit element.
28. A method as set forth in claim 27 wherein interconnecting the deformable circuit element and locating member comprises inserting an opening in the deformable circuit element onto a nub associated with the locating member.
29. A method as set forth in claim 27 wherein interconnecting the deformable circuit element and locating member comprises inserting a receiving portion of the locating member into notches formed on the deformable circuit element.
30. A method as set forth in claim 27 further comprising biasing with the locating member a portion of the deformable circuit element against the separator.
CA2565472A 2005-11-03 2006-10-24 Electronic thermometer with flex circuit location Active CA2565472C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/265,984 2005-11-03
US11/265,984 US7316507B2 (en) 2005-11-03 2005-11-03 Electronic thermometer with flex circuit location

Publications (2)

Publication Number Publication Date
CA2565472A1 true CA2565472A1 (en) 2007-05-03
CA2565472C CA2565472C (en) 2010-06-29

Family

ID=37685736

Family Applications (1)

Application Number Title Priority Date Filing Date
CA2565472A Active CA2565472C (en) 2005-11-03 2006-10-24 Electronic thermometer with flex circuit location

Country Status (15)

Country Link
US (4) US7316507B2 (en)
EP (1) EP1783469B1 (en)
JP (1) JP4291845B2 (en)
KR (2) KR20070048122A (en)
CN (1) CN101081163B (en)
AU (1) AU2006233267B2 (en)
BR (1) BRPI0604523A (en)
CA (1) CA2565472C (en)
ES (1) ES2441793T3 (en)
IL (1) IL178902A (en)
MX (1) MXPA06012622A (en)
NO (1) NO20065010L (en)
NZ (1) NZ550949A (en)
SG (1) SG131923A1 (en)
TW (1) TWI309713B (en)

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