CA2499021A1 - System and method of measuring an optical path difference in a sensing interferometer - Google Patents

System and method of measuring an optical path difference in a sensing interferometer Download PDF

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Publication number
CA2499021A1
CA2499021A1 CA002499021A CA2499021A CA2499021A1 CA 2499021 A1 CA2499021 A1 CA 2499021A1 CA 002499021 A CA002499021 A CA 002499021A CA 2499021 A CA2499021 A CA 2499021A CA 2499021 A1 CA2499021 A1 CA 2499021A1
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CA
Canada
Prior art keywords
optical path
sensing interferometer
path difference
measuring
light
Prior art date
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Granted
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CA002499021A
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French (fr)
Other versions
CA2499021C (en
Inventor
Richard Van Neste
Claude Belleville
Daniel Pronovost
Alain Proulz
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Fiso Technologies Inc
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Individual
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Publication of CA2499021A1 publication Critical patent/CA2499021A1/en
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Publication of CA2499021C publication Critical patent/CA2499021C/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02012—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal intensity variation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02007—Two or more frequencies or sources used for interferometric measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02015—Interferometers characterised by the beam path configuration
    • G01B9/02023—Indirect probing of object, e.g. via influence on cavity or fibre
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02075—Reduction or prevention of errors; Testing; Calibration of particular errors
    • G01B9/02078—Caused by ambiguity
    • G01B9/02079—Quadrature detection, i.e. detecting relatively phase-shifted signals
    • G01B9/02081—Quadrature detection, i.e. detecting relatively phase-shifted signals simultaneous quadrature detection, e.g. by spatial phase shifting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/25—Fabry-Perot in interferometer, e.g. etalon, cavity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45—Multiple detectors for detecting interferometer signals

Abstract

An apparatus and a method of measuring an optical path difference in a sensing interferometer. Light from a source is directed in the sensing interferometer.
The light reflected from the sensing interferometer is splitted into first and second beams respectively directed into two reference interferometers having optical path differences greater than the coherence length of the source and such that the optical signals are in quadrature. The intensities of the light transmitted by the reference interferometers and recombined light reflected from the reference interferometers are detected for measuring the optical path difference in the sensing interferometer. Additional light sources allow for correction of internal perturbations and absolute measurement of the optical path difference in the sensing interferometer.
CA002499021A 2002-10-16 2003-10-07 System and method of measuring an optical path difference in a sensing interferometer Expired - Lifetime CA2499021C (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/270,647 2002-10-16
US10/270,647 US6842254B2 (en) 2002-10-16 2002-10-16 System and method for measuring an optical path difference in a sensing interferometer
PCT/CA2003/001547 WO2004036164A2 (en) 2002-10-16 2003-10-07 System and a method of measuring an optical path difference in a sensing interferometer

Publications (2)

Publication Number Publication Date
CA2499021A1 true CA2499021A1 (en) 2004-04-29
CA2499021C CA2499021C (en) 2007-05-01

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CA002499021A Expired - Lifetime CA2499021C (en) 2002-10-16 2003-10-07 System and method of measuring an optical path difference in a sensing interferometer

Country Status (4)

Country Link
US (1) US6842254B2 (en)
AU (1) AU2003273694A1 (en)
CA (1) CA2499021C (en)
WO (1) WO2004036164A2 (en)

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Publication number Publication date
US6842254B2 (en) 2005-01-11
US20040075841A1 (en) 2004-04-22
CA2499021C (en) 2007-05-01
AU2003273694A1 (en) 2004-05-04
WO2004036164A2 (en) 2004-04-29
WO2004036164A3 (en) 2004-07-01
AU2003273694A8 (en) 2004-05-04

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