CA2463570A1 - Method and system for visualizing surface errors - Google Patents

Method and system for visualizing surface errors Download PDF

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Publication number
CA2463570A1
CA2463570A1 CA002463570A CA2463570A CA2463570A1 CA 2463570 A1 CA2463570 A1 CA 2463570A1 CA 002463570 A CA002463570 A CA 002463570A CA 2463570 A CA2463570 A CA 2463570A CA 2463570 A1 CA2463570 A1 CA 2463570A1
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Prior art keywords
actual surface
deviations
actual
nominal
optical
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Granted
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CA002463570A
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French (fr)
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CA2463570C (en
Inventor
Steven P. Kaufman
Arkady Savikovsky
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Faro Technologies Inc
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Individual
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Publication of CA2463570C publication Critical patent/CA2463570C/en
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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B31/00—Associated working of cameras or projectors with sound-recording or sound-reproducing means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns

Abstract

A method and system for visualizing deviations on an actual surface (10) fro m a nominal, or designed, surface utilizes a system and method for mapping the spatial (e.g. x, y and z) coordinates of the actual surface (10) into a computer (13), comparing the mapped actual surface (10) to the nominal surfa ce to produce a three-dimensional distribution of deviation values (D), processing this distribution into a topographical pattern (34) of multiple contours or areas (34a ... 34n), each contour or area having the same, or generally the same, deviation value (D), and optically projecting this topographical pattern (34) onto the actual surface (10) in registry with the initial surface mapping to provide a display of the surface deviations (D) directly on the actual surface (10). The deviations are measured along a direction D normal to the actual surface so that the three-dimensional distribution is given in x, y, D coordinates. The optical projection is preferably a laser projection (38). The mapping and projection onto the actu al surface (10) are made, and coordinated with one another, with respect to thr ee reference points (32) on the surface (10).

Claims (17)

1. A method for visualizing deviations on an actual surface from a nominal surface comprising the steps of:
a. mapping the spatial coordinates of an actual surface, b. comparing said mapped spatial coordinates to the nominal surface to produce a three-dimensional distribution of values for deviations D of the actual surface from the nominal surface, c. generating from said distributions a topographical pattern of deviations having generally the same deviation value D, and d. optically projecting that topographical pattern onto the actual surface to visualize said deviations D.
2. The method of claim 1 wherein said deviations D are measured along a normal to the actual surface.
3. The method of claim 1 wherein said topographical pattern constitutes plural contours each including deviation values falling within a range of a different selected values of D.
4. The method of claim 1 wherein said mapping and optical projecting are made with reference to at least three fixed reference point on said actual surface.
5. The method of claim 1 wherein said optical projecting is laser projection.
6. The method of claim 1 wherein said generating comprises processing said distribution of sampled spatial coordinate data into a surface of points representative of the actual surface.
7. The method of claim 1 wherein said mapping comprises optical tracking.
8. The method of claim 2, 3, or 6 wherein said processor establishes a mesh grid of a preselected grid spacing and conforms said spatial coordinate data and said nominal data to said mesh grid.
9. The method of claim 3 wherein said generating also produces a gradient value and direction of increasing gradient between said contours, and said optically projecting includes a projection of a graphical representation of said gradient associated with said contours.
10. Apparatus for visualizing deviations in an actual surface from a nominal surface comprising:
a. a surface profiler that maps the spatial coordinates of an actual surface, b. a processor that i) compares said mapped spatial coordinates to the nominal surface to produce a three-dimensional distribution of values for deviations D
of the actual surface from the nominal surface, and ii) generates from said distributions a topographical pattern of deviation having generally the same deviation value D, and c. an optical projector that projects a topographical pattern onto the actual surface to visualize said deviations D.
11. The apparatus of claim 10 wherein said processor computes said deviation D
along a normal to the actual surface.
12. The apparatus of claim 10 wherein said topographical pattern constitutes plural contours each including deviation values falling within a range of a different selected values of D.
13. The apparatus of any of claims 10-12 wherein said actual surface has at least three reference points and said profiler and said optical projector operate with reference to said at least three fixed reference points.
14. The apparatus of claim 13 wherein said optical projector is a laser projector.
15 The apparatus of claim 13 wherein said processor also generates a gradient associated with said contours and said optical projector projects a visual display of said gradients.
16. The apparatus of claim 13 wherein said surface profiler is an optical tracker.
17. The apparatus of claim 13 wherein said processor establishes a mesh grid of preselected grid spacing and conforms said spatial coordinates and said actual normal surface to said grid.
CA2463570A 2001-10-11 2002-10-11 Method and system for visualizing surface errors Expired - Fee Related CA2463570C (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US32868501P 2001-10-11 2001-10-11
US60/328,686 2001-10-11
PCT/US2002/032520 WO2003032129A2 (en) 2001-10-11 2002-10-11 Method and system for visualizing surface errors

Publications (2)

Publication Number Publication Date
CA2463570A1 true CA2463570A1 (en) 2003-04-17
CA2463570C CA2463570C (en) 2012-06-19

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Family Applications (1)

Application Number Title Priority Date Filing Date
CA2463570A Expired - Fee Related CA2463570C (en) 2001-10-11 2002-10-11 Method and system for visualizing surface errors

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US (1) US7372558B2 (en)
EP (1) EP1476797B1 (en)
AU (1) AU2002362669A1 (en)
CA (1) CA2463570C (en)
ES (1) ES2399883T3 (en)
WO (1) WO2003032129A2 (en)

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WO2003032129A3 (en) 2004-03-11
EP1476797A4 (en) 2007-01-03
US20040189944A1 (en) 2004-09-30
CA2463570C (en) 2012-06-19
ES2399883T3 (en) 2013-04-04
WO2003032129A8 (en) 2012-02-02
US7372558B2 (en) 2008-05-13
AU2002362669A1 (en) 2003-04-22
WO2003032129A2 (en) 2003-04-17
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AU2002362669A8 (en) 2012-02-23

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