CA2179233A1 - Galvanometer and camera system - Google Patents

Galvanometer and camera system

Info

Publication number
CA2179233A1
CA2179233A1 CA002179233A CA2179233A CA2179233A1 CA 2179233 A1 CA2179233 A1 CA 2179233A1 CA 002179233 A CA002179233 A CA 002179233A CA 2179233 A CA2179233 A CA 2179233A CA 2179233 A1 CA2179233 A1 CA 2179233A1
Authority
CA
Canada
Prior art keywords
workpiece
camera
galvanometer
utilized
information
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA002179233A
Other languages
French (fr)
Other versions
CA2179233C (en
Inventor
Kurt Rueb
Andrew Ka-Ching Wong
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Virtek Vision International ULC
Original Assignee
Virtek Vision Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Virtek Vision Corp filed Critical Virtek Vision Corp
Publication of CA2179233A1 publication Critical patent/CA2179233A1/en
Application granted granted Critical
Publication of CA2179233C publication Critical patent/CA2179233C/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques

Abstract

A system combines a galvanometer system with a camera to provide information from a workpiece to the camera. The galvanometer rotates mirrors to change the image that is directed from the workpiece into the camera. The inventive method allows the use of the camera to identify the location of points on the workpiece. Further, the system facilitates the use of the camera to store information about a pattern on a workpiece. Also, the system can be utilized to create a computer aided design file of the surface of a workpiece. The system is utilized in the last two methods to serially store bit by bit information about the workpiece in a memory.
CA002179233A 1995-06-27 1996-06-17 Galvanometer and camera system Expired - Lifetime CA2179233C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/495,190 US5615013A (en) 1995-06-27 1995-06-27 Galvanometer and camera system
US08/495,190 1995-06-27

Publications (2)

Publication Number Publication Date
CA2179233A1 true CA2179233A1 (en) 1996-12-28
CA2179233C CA2179233C (en) 2007-04-03

Family

ID=23967634

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002179233A Expired - Lifetime CA2179233C (en) 1995-06-27 1996-06-17 Galvanometer and camera system

Country Status (4)

Country Link
US (1) US5615013A (en)
AU (1) AU5952996A (en)
CA (1) CA2179233C (en)
WO (1) WO1997001740A1 (en)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL1011664C2 (en) * 1999-03-24 2000-05-15 Datascan Group B V Apparatus and method for selecting and capturing an image that is part of an irradiated or emitting object.
US6633338B1 (en) * 1999-04-27 2003-10-14 Gsi Lumonics, Inc. Programmable illuminator for vision system
US6317616B1 (en) 1999-09-15 2001-11-13 Neil David Glossop Method and system to facilitate image guided surgery
AU2002362669A1 (en) * 2001-10-11 2003-04-22 Laser Projection Technologies Inc. A Delaware Corporation Method and system for visualizing surface errors
US8049135B2 (en) * 2004-06-18 2011-11-01 Electro Scientific Industries, Inc. Systems and methods for alignment of laser beam(s) for semiconductor link processing
US8110775B2 (en) * 2004-06-18 2012-02-07 Electro Scientific Industries, Inc. Systems and methods for distinguishing reflections of multiple laser beams for calibration for semiconductor structure processing
US7321421B2 (en) * 2004-07-30 2008-01-22 The Boeing Company Apparatus and methods for scanning conoscopic holography measurements
US8085388B2 (en) * 2005-02-01 2011-12-27 Laser Projection Technologies, Inc. Laser radar projection with object feature detection and ranging
WO2006104565A2 (en) * 2005-02-01 2006-10-05 Laser Projection Technologies, Inc. Laser projection with object feature detection
WO2006116859A1 (en) * 2005-05-04 2006-11-09 Stryker Canadian Management Inc. Vibrating patient support apparatus with a resonant referencing percussion device
JP5135672B2 (en) * 2005-09-30 2013-02-06 日産自動車株式会社 Laser irradiation state detection method and laser irradiation state detection system
US7621053B2 (en) * 2007-04-13 2009-11-24 Virtek Vision International Inc. Assembly apparatus
CN102944561B (en) * 2012-11-16 2015-07-29 北京金橙子科技有限公司 A kind of appearance detecting method of matrix form gadget and device
DE102014003348B4 (en) 2013-03-08 2019-05-23 Virtek Vision International Ulc Galvanometer scanning camera with variable focus and method
EP3030384A1 (en) 2013-08-06 2016-06-15 Laser Projection Technologies, Inc. Virtual laser projection system and method
DE102014016679A1 (en) 2014-11-12 2016-05-12 Cl Schutzrechtsverwaltungs Gmbh Method and device for exposure control of a selective laser sintering or laser melting device
US10211587B2 (en) 2015-03-31 2019-02-19 Versitech Limited Spatial chirped cavity for temporally stretching/compressing optical pulses
US10449624B2 (en) * 2015-10-02 2019-10-22 Board Of Regents, The University Of Texas System Method of fabrication for the repair and augmentation of part functionality of metallic components
US11691343B2 (en) 2016-06-29 2023-07-04 Velo3D, Inc. Three-dimensional printing and three-dimensional printers
US11752558B2 (en) 2021-04-16 2023-09-12 General Electric Company Detecting optical anomalies on optical elements used in an additive manufacturing machine

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4775235A (en) * 1984-06-08 1988-10-04 Robotic Vision Systems, Inc. Optical spot scanning system for use in three-dimensional object inspection
US5459794A (en) * 1993-07-15 1995-10-17 Ninomiya; Takanori Method and apparatus for measuring the size of a circuit or wiring pattern formed on a hybrid integrated circuit chip and a wiring board respectively

Also Published As

Publication number Publication date
US5615013A (en) 1997-03-25
WO1997001740A1 (en) 1997-01-16
CA2179233C (en) 2007-04-03
AU5952996A (en) 1997-01-30

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Legal Events

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Effective date: 20160617