CA2159642A1 - Method for Fabricating Suspension Members for Micromachined Sensors - Google Patents
Method for Fabricating Suspension Members for Micromachined SensorsInfo
- Publication number
- CA2159642A1 CA2159642A1 CA2159642A CA2159642A CA2159642A1 CA 2159642 A1 CA2159642 A1 CA 2159642A1 CA 2159642 A CA2159642 A CA 2159642A CA 2159642 A CA2159642 A CA 2159642A CA 2159642 A1 CA2159642 A1 CA 2159642A1
- Authority
- CA
- Canada
- Prior art keywords
- wafers
- etch stop
- stop layer
- mass
- support frame
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/0802—Details
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/012—Bonding, e.g. electrostatic for strain gauges
Abstract
A method for fabricating a connecting spring member (24) of an arbitrary shape extending between a central mass (21) and an outer support frame (23) of a sensor as shown in Figure 7 is disclosed. Each of a pair of generally identical silicon wafers (10, 12) has an inner etch stop layer (16) applied to one face with an outer epitaxial layer (18) formed over such etch stop layer (16). A photosensitive oxide layer (30) is applied to the other face of each of the wafers (10, 12). Next, a pattern of the central mass (21) and outer support frame (23) as shown in Figure 2 is photographically imposed on the photosensitive oxide layers (18) of each wafer (10, 12). After wet chemical etching of the wafers (10, 12) removes silicon material to the etch stop layer, and the etch stop layer is itself removed in the space between the mass and the frame, the two wafers (10, 12) are bonded to each other as shown in Figure 5. Next, the spring shape, of any arbitrary shape is formed by plasma etching from the outer surfaces of the bonded wafers (10, 12) in the area between the mass and the frame. Accordingly the spring members (24) extend between the central mass (21) and the outer support frame (23).
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/218,363 US5484073A (en) | 1994-03-28 | 1994-03-28 | Method for fabricating suspension members for micromachined sensors |
US218,363 | 1994-03-28 | ||
PCT/US1995/003377 WO1995026567A1 (en) | 1994-03-28 | 1995-03-16 | Method for fabricating suspension members for micromachined sensors |
Publications (2)
Publication Number | Publication Date |
---|---|
CA2159642A1 true CA2159642A1 (en) | 1995-09-29 |
CA2159642C CA2159642C (en) | 1999-08-17 |
Family
ID=22814808
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA002159642A Expired - Lifetime CA2159642C (en) | 1994-03-28 | 1995-03-16 | Method for fabricating suspension members for micromachined sensors |
Country Status (8)
Country | Link |
---|---|
US (1) | US5484073A (en) |
EP (1) | EP0700580B1 (en) |
JP (2) | JP3741723B2 (en) |
AU (1) | AU2102195A (en) |
CA (1) | CA2159642C (en) |
DE (1) | DE69531580T2 (en) |
HK (1) | HK1004876A1 (en) |
WO (1) | WO1995026567A1 (en) |
Families Citing this family (50)
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DE19603829A1 (en) * | 1996-02-02 | 1997-08-07 | Daimler Benz Ag | Silicon@ based micromechanical structure manufacturing method |
US5971527A (en) * | 1996-10-29 | 1999-10-26 | Xerox Corporation | Ink jet channel wafer for a thermal ink jet printhead |
FR2763745B1 (en) * | 1997-05-23 | 1999-08-27 | Sextant Avionique | PROCESS FOR MANUFACTURING A FACTORY SILICON MICRO SENSOR |
US6379989B1 (en) * | 1998-12-23 | 2002-04-30 | Xerox Corporation | Process for manufacture of microoptomechanical structures |
US6871544B1 (en) * | 1999-03-17 | 2005-03-29 | Input/Output, Inc. | Sensor design and process |
WO2000055652A1 (en) | 1999-03-17 | 2000-09-21 | Input/Output, Inc. | Calibration of sensors |
DE69925837T2 (en) * | 1999-10-29 | 2005-10-27 | Sensonor Asa | Micromechanical sensor |
US6805008B2 (en) | 2000-06-21 | 2004-10-19 | Input/Output, Inc. | Accelerometer with folded beams |
GB2371119A (en) * | 2000-09-25 | 2002-07-17 | Marconi Caswell Ltd | Micro electro-mechanical systems |
US6479315B1 (en) | 2000-11-27 | 2002-11-12 | Microscan Systems, Inc. | Process for manufacturing micromechanical and microoptomechanical structures with single crystal silicon exposure step |
US6506620B1 (en) | 2000-11-27 | 2003-01-14 | Microscan Systems Incorporated | Process for manufacturing micromechanical and microoptomechanical structures with backside metalization |
US6479311B1 (en) | 2000-11-27 | 2002-11-12 | Microscan Systems, Inc. | Process for manufacturing micromechanical and microoptomechanical structures with pre-applied patterning |
FI113704B (en) * | 2001-03-21 | 2004-05-31 | Vti Technologies Oy | A method for manufacturing a silicon sensor and a silicon sensor |
DE60232250D1 (en) * | 2001-08-20 | 2009-06-18 | Honeywell Int Inc | Arch-shaped spring elements for microelectromechanical acceleration sensor |
US20040240034A1 (en) * | 2001-11-30 | 2004-12-02 | Scharf Bruce R. | Diffraction compensation using a patterned reflector |
US7140250B2 (en) * | 2005-02-18 | 2006-11-28 | Honeywell International Inc. | MEMS teeter-totter accelerometer having reduced non-linearty |
US7687126B2 (en) | 2005-08-22 | 2010-03-30 | 3M Innovative Properties Company | Adhesive articles and release liners |
EP1921042A1 (en) * | 2006-11-10 | 2008-05-14 | ETA SA Manufacture Horlogère Suisse | Fabrication of multilevel micromechanical silicon components |
WO2012109266A2 (en) | 2011-02-07 | 2012-08-16 | Ion Geophysical Corporation | Method and apparatus for sensing underwater signals |
US8519515B2 (en) | 2011-04-13 | 2013-08-27 | United Microlectronics Corp. | TSV structure and method for forming the same |
US8481425B2 (en) | 2011-05-16 | 2013-07-09 | United Microelectronics Corp. | Method for fabricating through-silicon via structure |
US8822336B2 (en) | 2011-06-16 | 2014-09-02 | United Microelectronics Corp. | Through-silicon via forming method |
US8828745B2 (en) | 2011-07-06 | 2014-09-09 | United Microelectronics Corp. | Method for manufacturing through-silicon via |
US8518823B2 (en) | 2011-12-23 | 2013-08-27 | United Microelectronics Corp. | Through silicon via and method of forming the same |
US8609529B2 (en) | 2012-02-01 | 2013-12-17 | United Microelectronics Corp. | Fabrication method and structure of through silicon via |
US8691600B2 (en) | 2012-05-02 | 2014-04-08 | United Microelectronics Corp. | Method for testing through-silicon-via (TSV) structures |
US8691688B2 (en) | 2012-06-18 | 2014-04-08 | United Microelectronics Corp. | Method of manufacturing semiconductor structure |
US9275933B2 (en) | 2012-06-19 | 2016-03-01 | United Microelectronics Corp. | Semiconductor device |
US8900996B2 (en) | 2012-06-21 | 2014-12-02 | United Microelectronics Corp. | Through silicon via structure and method of fabricating the same |
US8525296B1 (en) | 2012-06-26 | 2013-09-03 | United Microelectronics Corp. | Capacitor structure and method of forming the same |
US8912844B2 (en) | 2012-10-09 | 2014-12-16 | United Microelectronics Corp. | Semiconductor structure and method for reducing noise therein |
DE102012219660B4 (en) * | 2012-10-26 | 2023-10-12 | Robert Bosch Gmbh | Mechanical component |
US9035457B2 (en) | 2012-11-29 | 2015-05-19 | United Microelectronics Corp. | Substrate with integrated passive devices and method of manufacturing the same |
US8716104B1 (en) | 2012-12-20 | 2014-05-06 | United Microelectronics Corp. | Method of fabricating isolation structure |
CN104045049A (en) * | 2013-03-12 | 2014-09-17 | 北京大学 | Processing method of high-precision accelerometer based on silicon layer transfer (SOLT) technology |
US8884398B2 (en) | 2013-04-01 | 2014-11-11 | United Microelectronics Corp. | Anti-fuse structure and programming method thereof |
US9287173B2 (en) | 2013-05-23 | 2016-03-15 | United Microelectronics Corp. | Through silicon via and process thereof |
US9123730B2 (en) | 2013-07-11 | 2015-09-01 | United Microelectronics Corp. | Semiconductor device having through silicon trench shielding structure surrounding RF circuit |
US9024416B2 (en) | 2013-08-12 | 2015-05-05 | United Microelectronics Corp. | Semiconductor structure |
US8916471B1 (en) | 2013-08-26 | 2014-12-23 | United Microelectronics Corp. | Method for forming semiconductor structure having through silicon via for signal and shielding structure |
US9048223B2 (en) | 2013-09-03 | 2015-06-02 | United Microelectronics Corp. | Package structure having silicon through vias connected to ground potential |
US9117804B2 (en) | 2013-09-13 | 2015-08-25 | United Microelectronics Corporation | Interposer structure and manufacturing method thereof |
US9343359B2 (en) | 2013-12-25 | 2016-05-17 | United Microelectronics Corp. | Integrated structure and method for fabricating the same |
US10340203B2 (en) | 2014-02-07 | 2019-07-02 | United Microelectronics Corp. | Semiconductor structure with through silicon via and method for fabricating and testing the same |
US9755139B2 (en) * | 2014-06-30 | 2017-09-05 | Texas Instruments Incorporated | Piezoeletric wet etch process with reduced resist lifting and controlled undercut |
CN105445495B (en) * | 2014-07-16 | 2018-11-02 | 中国科学院地质与地球物理研究所 | A kind of symmetrical MEMS acceleration sensitives chip and its manufacturing process |
US10611628B2 (en) * | 2016-12-29 | 2020-04-07 | Epack, Inc. | MEMS isolation platform with three-dimensional vibration and stress isolation |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4021766A (en) * | 1975-07-28 | 1977-05-03 | Aine Harry E | Solid state pressure transducer of the leaf spring type and batch method of making same |
US4071838A (en) * | 1976-02-09 | 1978-01-31 | Diax Corporation | Solid state force transducer and method of making same |
US4106976A (en) * | 1976-03-08 | 1978-08-15 | International Business Machines Corporation | Ink jet nozzle method of manufacture |
US4144516A (en) * | 1976-03-29 | 1979-03-13 | Aine Harry E | Solid state transducer and method of making same |
US4597003A (en) * | 1983-12-01 | 1986-06-24 | Harry E. Aine | Chemical etching of a semiconductive wafer by undercutting an etch stopped layer |
JPS6197572A (en) * | 1984-10-19 | 1986-05-16 | Nissan Motor Co Ltd | Manufacture of semiconductor acceleration sensor |
US5000817A (en) * | 1984-10-24 | 1991-03-19 | Aine Harry E | Batch method of making miniature structures assembled in wafer form |
US4732647A (en) * | 1984-10-24 | 1988-03-22 | Aine Harry E | Batch method of making miniature capacitive force transducers assembled in wafer form |
US4679434A (en) * | 1985-07-25 | 1987-07-14 | Litton Systems, Inc. | Integrated force balanced accelerometer |
US4670092A (en) * | 1986-04-18 | 1987-06-02 | Rockwell International Corporation | Method of fabricating a cantilever beam for a monolithic accelerometer |
US4922756A (en) * | 1988-06-20 | 1990-05-08 | Triton Technologies, Inc. | Micro-machined accelerometer |
JPS6376483A (en) * | 1986-09-19 | 1988-04-06 | Fujitsu Ltd | Manufacture of semiconductor acceleration sensor |
US4805456A (en) * | 1987-05-19 | 1989-02-21 | Massachusetts Institute Of Technology | Resonant accelerometer |
US5195371A (en) * | 1988-01-13 | 1993-03-23 | The Charles Stark Draper Laboratory, Inc. | Semiconductor chip transducer |
JPH01301181A (en) * | 1988-05-30 | 1989-12-05 | Mitsubishi Electric Corp | Manufacture of semiconductor acceleration sensor |
JPH02218172A (en) * | 1989-02-18 | 1990-08-30 | Nippondenso Co Ltd | Manufacture of semiconductor acceleration sensor |
US5006487A (en) * | 1989-07-27 | 1991-04-09 | Honeywell Inc. | Method of making an electrostatic silicon accelerometer |
US5233213A (en) * | 1990-07-14 | 1993-08-03 | Robert Bosch Gmbh | Silicon-mass angular acceleration sensor |
JP2586359B2 (en) * | 1990-12-17 | 1997-02-26 | 日本電気株式会社 | Semiconductor acceleration sensor and method of manufacturing the same |
JPH05142247A (en) * | 1991-11-20 | 1993-06-08 | Hitachi Ltd | Semiconductor acceleration sensor |
-
1994
- 1994-03-28 US US08/218,363 patent/US5484073A/en not_active Expired - Lifetime
-
1995
- 1995-03-16 JP JP52519695A patent/JP3741723B2/en not_active Expired - Fee Related
- 1995-03-16 EP EP95913752A patent/EP0700580B1/en not_active Expired - Lifetime
- 1995-03-16 DE DE69531580T patent/DE69531580T2/en not_active Expired - Lifetime
- 1995-03-16 AU AU21021/95A patent/AU2102195A/en not_active Abandoned
- 1995-03-16 CA CA002159642A patent/CA2159642C/en not_active Expired - Lifetime
- 1995-03-16 WO PCT/US1995/003377 patent/WO1995026567A1/en active IP Right Grant
-
1998
- 1998-05-11 HK HK98104043A patent/HK1004876A1/en not_active IP Right Cessation
-
2005
- 2005-09-20 JP JP2005271996A patent/JP4267611B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69531580D1 (en) | 2003-10-02 |
JP4267611B2 (en) | 2009-05-27 |
EP0700580B1 (en) | 2003-08-27 |
EP0700580A1 (en) | 1996-03-13 |
WO1995026567A1 (en) | 1995-10-05 |
DE69531580T2 (en) | 2004-07-01 |
EP0700580A4 (en) | 1998-02-11 |
HK1004876A1 (en) | 1998-12-11 |
JP2006116693A (en) | 2006-05-11 |
JP3741723B2 (en) | 2006-02-01 |
JPH08511379A (en) | 1996-11-26 |
AU2102195A (en) | 1995-10-17 |
CA2159642C (en) | 1999-08-17 |
US5484073A (en) | 1996-01-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EEER | Examination request | ||
MKEX | Expiry |
Effective date: 20150316 |