CA2051062A1 - Inspection method and apparatus - Google Patents
Inspection method and apparatusInfo
- Publication number
- CA2051062A1 CA2051062A1 CA002051062A CA2051062A CA2051062A1 CA 2051062 A1 CA2051062 A1 CA 2051062A1 CA 002051062 A CA002051062 A CA 002051062A CA 2051062 A CA2051062 A CA 2051062A CA 2051062 A1 CA2051062 A1 CA 2051062A1
- Authority
- CA
- Canada
- Prior art keywords
- window
- inspection
- pattern
- inspected object
- setting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
- G01N21/9045—Inspection of ornamented or stippled container walls
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
Abstract
ABSTRACT OF THE DISCLOSURE
An inspection method for detecting existence or not of a defect on an inspected object in which an image of the inspected object irradiated by a light is picked by a video camera and a video signal therefrom is processed by an electronic processor is disclosed in which there are such steps of setting up a pattern judging window on the inspected object to thereby judge whether or not there exists a pattern on the inspected object, setting up a plurality of inspection windows when it is judged that there is no pattern on the inspected object to thereby perform a predetermined defect inspection on portions of the inspected object within the plurality of inspection windows, setting up a pattern discrimination window on the inspected object when it is judged that there exists a pattern to thereby discriminate a kind of the pattern, and either setting up the inspection window or another inspection window dependent on the kind of the pattern discriminated.
An inspection apparatus carrying out the above method is also disclosed which is formed of first means for setting up a pattern judging window on the inspected object to thereby judge whether or not there exists a pattern on the inspected object, a second means for setting up a plurality of inspection windows when it is judged that there is no pattern on the inspected object to thereby perform a predetermined defect inspection on portions of the inspected object within the plurality of inspection windows, a third means for setting up a pattern discrimination window on the inspected object when it is judged that there exists a pattern to thereby discriminate a kind of the pattern, and a fourth means for either setting up the inspection windows or another inspection window dependent on the kind of the pattern discriminated.
An inspection method for detecting existence or not of a defect on an inspected object in which an image of the inspected object irradiated by a light is picked by a video camera and a video signal therefrom is processed by an electronic processor is disclosed in which there are such steps of setting up a pattern judging window on the inspected object to thereby judge whether or not there exists a pattern on the inspected object, setting up a plurality of inspection windows when it is judged that there is no pattern on the inspected object to thereby perform a predetermined defect inspection on portions of the inspected object within the plurality of inspection windows, setting up a pattern discrimination window on the inspected object when it is judged that there exists a pattern to thereby discriminate a kind of the pattern, and either setting up the inspection window or another inspection window dependent on the kind of the pattern discriminated.
An inspection apparatus carrying out the above method is also disclosed which is formed of first means for setting up a pattern judging window on the inspected object to thereby judge whether or not there exists a pattern on the inspected object, a second means for setting up a plurality of inspection windows when it is judged that there is no pattern on the inspected object to thereby perform a predetermined defect inspection on portions of the inspected object within the plurality of inspection windows, a third means for setting up a pattern discrimination window on the inspected object when it is judged that there exists a pattern to thereby discriminate a kind of the pattern, and a fourth means for either setting up the inspection windows or another inspection window dependent on the kind of the pattern discriminated.
Description
20~1062 TITLE: INSPECTION METHOD AND APPARATUS
BACKGROUND OF THE INVENT _ Field of the Invention The present invention relates generally to an inspection method and an apparatus therefor and, more particularly, is directed to an inspection method and an apparatus to practice the same for products that are containers or the like that particularly use a video camera or the like as image sensors and an electronic processor.
Description of the Prior Art It conventionally is the practice to manually conduct visual inspection during the production processing or completion, in order to detect the defects on the half products during the produstion processing or for the quality inspection of appearances on completed products. However, in the recent years, from aims of labour savings or automation as means to face the labour shortage, it is the trend to install automatic inspection apparatus with a video camera and an electronic processor to replace the manual inspection.
As an example, in the beverage circle, bottles or the like formed by plastic or glass are widely used as the beverage containers, but there often are cases where the containers break or fluid leakage occurances are noted, due to improper processing during the manufacturing or the handling during transit. In such cases, although the handling carelessness -for containers may be out of the question, mishaps during the manufacturing process of containers that cause damage to the containers, or trouble during the manufacturing process thereof, have often become the cause for defective condition during the filling process of the beverages into the containers or the capping process to the 20~1~62 ~ontainers. Therefore, it is the present status that a great number of people are conducting visual inspection at the various stages, starting with the beverage container manufacturing to the container washing, filling, capping as well as the packaging.
Accordingly, as described above, in order to replace the manual processing, the installation of automatic inspection apparatuses that utilize a video camera and an electronic processor has become the practice to automatically reject the commodities containing mishaps upon the processing or defects in the commodity by detecting such defects.
This type of arrangements are not only limited to the beverage containers, but also noted during the production processes generally on various types of products.
As the next step, one example of such above stated container or commodity inspection apparatus of the prior art shall be explained in reference with Fig. 1 to Fig. 3.
Fig. 1 is a schematic diagram that shows the entire structure of a container inspection apparatus of the prior art.
On the Fig. 1, 1 is a container that is to be inspected which is made of transparent material such as glass, plastics or the like, 2 is a lighting device or light source such as a lamp or the like for irradiating the container 1, 3 is a light diffuser plate that is placed between the lighting device 2 and container 1 in order to uniformly diffuse the light from light source 2, 4 is a video camera that is used as an image sensor to pickup the image of container 1, 5 is an electronic processor that processes the output from video camera 4, which is composed of a computer or the like. Ml is a monitor to which the outputs from the video camera 4 and electronic processor 5 are supplied so that the respect.ive windows 6 and 71 - 74 which will be described later 20~1062 re shaped and displayed thereon with the image of container 1.
At this apparatus, the light from the lighting device 2 is uniformly diffused by the light diffuser plate 3 to irradiate the entire body of container 1. This light passes container 1 and is caught by video camera 4, which video output is processed by electronic processor 5 so that the existence or not of defects on the container 1 is detected. Also the container 1 in this case is assumed to be made of transparent material. For containers that are opaque natured, by arranging the composition to catch the reflection light therefrom and electronically processing the same, it is needless to say that a similar container defect inspection can be conducted.
Fig. 2 is a block diagram showing the composition and function of the electronic processor S in the inspection apparatus of the prior art, and Fig. 3 is a schematic diagram that shows the positions of the respective windows relative to the container 1. As shown on Figs. 2 and 3, from the output video signal of video camera 4, firstly, a positioning window 6 is set at the neck portion of container 1 and the center axis X-X
of container 1 is determined by an electronic processing circuit 6A of electronic processor 5. In other words, both side end edges of the neck portion of container 1 that is caught within window 6 are detected, whereas the center axis X-X of container 1 is sought on the basis of the side end edges detected. The purpose for this center axis X-X is to accurately setup the positions of respective inspection windows, that will be described, retative to container 1. In other words, when the container 1 is assumed to be of symmetrical shape with respect to the center axis X-X, the respective inspection windows can be setup to be symmetrical shaped with respect to the center axis X-2~1062 of container l.
On Figs. 2 and 3, 7,, 72 , 73 , 74 indicate the above-mentioned inspection windows. In this case, if 4 inspection windows 7~ to 74 are used and the shapes of the respective inspection window 71 to 74 are adjusted slightly, the change of the shape of container l can be coped with. Further, in order to cope with the change of light transmission factor due to thP
change of the diameter of the same container l dependent on its position, the positions and shapes of the inspection windows 7 to 74 are made different upon electronic processing. ~he existence or not of defects of container l within the four inspection windows 7~ - 74 are judged at a judgement processing circuit 7A simultaneously.
Fig. 3 illustrates the arrangement of the position setting windows 6 and inspection windows 71 , 72 , 73 , 74 for the container l. The reason that the 4 respective inspection windows 71 - 74 are arranged for the one piece of container l in this embodiment is that when there is any variance in the shape of container l, such as (when the diameter of container l changes, or when the shape of its neck portion changes, etc), it will be easy to respond thereto by making slight changes in the dimension or shape of the respective windows 7, - 74 , or in order to respond to the changes of the light transmission factor owing to the differences of the same container l diameter by the positions, separate sensitivities can be setup for respective windows 71 -74 upon electronic processing. Further, on Fig. 3, 8 indicates a design or literal lineup that exists on a part of container l (hereafter called a pattern) where it is difficult to detect the defects only inclusive therein and the inspection for such portion is exempted.
20~10G2 At the inspection apparatus of the prior art as a~ove described, there is no presuppose to conduct inspection to the pattern 8 portion of container 1. However, such pattern 8 generally is existent not only around the entire outer round of the container 1 body, but also many cases are that such pattern 8 is formed only at half round, as an example. In these cases, it is necessary to judge the good or bad of the portions other than the pattern 8 on the container 1 body, but by the conventional apparatuses, it was impossible to judge the good or bad of this portion.
OBJECTS AND SUMMARY OF THE INVENTION
Accordingly, it is an object of the present invention to provide a novel inspection apparatus that entirely removes the faults of such above described apparatus of the prior art.
According to an aspect of the present invention, there is provided an inspection method for detecting existence or not of a defect on an inspected object in which an image of the inspected object irradiated by a light is picked by a video camera and a video signal therefrom is processed by an electronic processor comprising the steps of:
setting up a pattern judging window on said inspected object to thereby judge whether or not there exists a pattern on said inspected object;
setting up a plurality of inspection windows when it is judged that there is no pattern on said inspected object to thereby perform a predetermined defect inspection on portions of said inspected object within said plurality of inspection windows;
setting up a pattern discrimination window on said inspected object when it is judged that there exists a pattern on said 2051~62 .nspected object to thereby discriminate a kind of said pattern;
and either setting up said inspection window or another inspection window dependent on the kind of said pattern discrim:inated.
According to another aspect of the present invention, there is prov:ided an inspection apparatus for detecting existence or not of a defect on an inspected object in which an image of the inspected object irradiated by a light is picked by a video camera and a video signal therefrom is processed by an electronic processor comprising:
a first means for setting up a pattern judging window on said inspected object to thereby judge whether or not there exists a pattern on said inspected object;
a second means for setting up a plurality of inspection windows when it is judged that there is no pattern on said inspected object to thereby perform a predetermined defect inspection on portions of said inspected object within said plurality of inspection windows;
a third means for setting up a pattern discrimination window on said inspected object when it is judged that there exists a pattern on said inspected object to thereby discriminate a kind of said pattern; and a fourth means for either setting up said inspection windows or another inspection window dependent on the kind of said pattern discriminated.
A better understanding of the objects, features and advantages of the invention can be gained from a consideration of the following detailed description of the preferred embodiments thereof, in conjunction with the figures of the accompanying 20~1062 lrawings through which like references designate the same and similar elements.
BRIEF ~ESCRIPTION OF THE DRAWINGS
Fig. 1 is a schematic diagram of a conventional example embodiment to which the present invention is applied;
Fig. 2 is a block diagram that shows the structure and function of the electronic processor on Fig. 1;
Fig. 3 is a schematic diagram that is used to explain the function of an example of the prior art;
Fig. 4 is a block diagram showing the main structure and functions of an embodiment of the present invention; and Figs. 5A, 5B and Figs. 6A1, 6Bl, 6Cl as well as 6A2, 6B2 6C2 are schematic diagrams respectively used for the function explanation of the present invention.
DETAILED DESCRIPTION OF THB PREFERRED EMBODIM~NTS
An embodiment of the present invention will be explained in reference with Fig. 4 to Fig. 6. Further, at this embodiment of the present invention, a similar structure to that the conventional example shown on Fig. 1 is used, so that it is not shown and its explanation will be omitted.
Fig. 4 is a block diagram that shows an example of each of structure and function of electronic processor 5 in the inspection apparatus of the present invention. As shown on Fig.
4, at the present invention, based on the video signal from the video camera 4 (refer to Fig. 1), firstly a positioning window 9 is setup at the neck portion of container 1, and then based on this window 9, the center axis X-X of container 1 is sought by electronic processor 9A. Next, a pattern judgement window 10 that is used to judge whether there is existence or not of a pattern 8 on container 1 is setup.
~0~1062 Now, in order to have an easier understanding of operation of the present invention, the conditions of the respective windows are shown on Figs. 5A and 5B, and the above operation shall be explained as based on Fig. 4 and Figs. 5A and 5B.
At the present invention, the pattern judgement window 10 is setup at the zone portion that was exempted from inspection in the conventional examples as shown on Fig. 5A which is the pattern 8 portion. By the brightness in this window, the existence or not of pattern 8 is detected. In order words, when there is pattern 8 on the outer round of container 1, the irradiated light is diffused at the pattern 8 portion so that the light that arrives at the video camera 4 is weakened. Therefore, by checking the intensity of the light from the pattern 8 portion, the existence or not of pattern 8 is easily detected.
A brightness or darkness processing circuit lOA is used to select the positions, shapes and so on of the respective inspection window that are nextly setup, based on the existence or not of pattern 8 at window 10. That is, the processing circuit lOA operates such that when there exists pattern 8 on container 1, such portion is exempted from the inspection zone while when there is no pattern existing, it selects a separate window that does not exempt the same as described hereafter.
At the present invention, in such case that there is no pa~tern 8 on container 1 and accordingly, the electronic processor circuit lOA judges that such portion is bright, the electronic processor circuit lOA selectively sets up inspection window 11. This inspection window 11, in this case similar to the conventional example, is comprised of 4 windows 11~, 112, 113 ~ 114 . In this case, the difference to the above mentioned conventional case is that, as shown on Fig. 5A, the shape of 20~10~
~indow 114 is different to the conventional window 74 in that it is large enough to include the pattern 8. This is for the purpose to also include this portion in the inspection area when it is judged that there is no pattern. Thus, the defects of container 1 within the windows 11! ~ 114 are totally detected by defect processing circuit llA in the same manner to the conventional example.
On the other hand, when there exists pattern 8 within window 10 and the electronic processor circuit 10A judges the portion 8 as dark, this electronic processor circuit 10A, as shown on Fig.
4, selectively sets up a pattern judgement window 12 instead of window 11, in order to judge the pattern shape, etc. of pattern 8. This window 12, as shown on Fig. 5B, is formed by a pair of two windows 12~, 122 arranged adjacent in the lateral direction.
Then these windows 12l and 122 are setup at the pattern 8 portion of container 1 where there exist designs or letters and so on.
In other words, as shown on Fig. SB, one window 12l is setup at the one side of the pattern 8 portion which can be the left half side, while the other window 122 is setup at the right half side thereof.
In general, the status of the pattern 8 on container 1 varies considerably, such as cases to involve the pattern 8 on the entire outer round of container 1, only involving the pattern 8 on a partial area of container 1 etc. In this case, as shown in Figs. 6Al, 6Bl and 6C1, the instances where roughly half round of container 1 is covered by the pattern 8 shall be explained.
When the video camera 4 picks up container 1, the image of pattern 8 as picked up by the camera 4 shall vary depending upon the angle of container 1 in its rotation direction. This is, for instance, owing to the fact that when inspection is conducted ~hile container l is being transferred on a belt conveyer (not shown), the rotation angle of pattern 8 on container 1 against the video camera 4 becomes unfixed. Figs. 6A1, 6B1 and 6C1 illustrate three cases with different rotation angles of pattern 8 on container 1, in order to explain the operation.
In the case of Fig. 6Al, since both windows 121, 122 equally contain pattern 8, respective electronic processors or brightness detection and dimension processing circuits 121A and 122A will judge that the entire inner areas of both windows 12, and 122 are dark and as shown on Fig. 6A2 will setup the 4 inspection windows 13,, 132, 133, 134. In this case, as the portion containing pattern 8 of container 1 is eliminated from the inspection zone, the respective inspection windows 131 - 134 become the same as those 7, and 74, in the case of conventional art as shown on Fig.
BACKGROUND OF THE INVENT _ Field of the Invention The present invention relates generally to an inspection method and an apparatus therefor and, more particularly, is directed to an inspection method and an apparatus to practice the same for products that are containers or the like that particularly use a video camera or the like as image sensors and an electronic processor.
Description of the Prior Art It conventionally is the practice to manually conduct visual inspection during the production processing or completion, in order to detect the defects on the half products during the produstion processing or for the quality inspection of appearances on completed products. However, in the recent years, from aims of labour savings or automation as means to face the labour shortage, it is the trend to install automatic inspection apparatus with a video camera and an electronic processor to replace the manual inspection.
As an example, in the beverage circle, bottles or the like formed by plastic or glass are widely used as the beverage containers, but there often are cases where the containers break or fluid leakage occurances are noted, due to improper processing during the manufacturing or the handling during transit. In such cases, although the handling carelessness -for containers may be out of the question, mishaps during the manufacturing process of containers that cause damage to the containers, or trouble during the manufacturing process thereof, have often become the cause for defective condition during the filling process of the beverages into the containers or the capping process to the 20~1~62 ~ontainers. Therefore, it is the present status that a great number of people are conducting visual inspection at the various stages, starting with the beverage container manufacturing to the container washing, filling, capping as well as the packaging.
Accordingly, as described above, in order to replace the manual processing, the installation of automatic inspection apparatuses that utilize a video camera and an electronic processor has become the practice to automatically reject the commodities containing mishaps upon the processing or defects in the commodity by detecting such defects.
This type of arrangements are not only limited to the beverage containers, but also noted during the production processes generally on various types of products.
As the next step, one example of such above stated container or commodity inspection apparatus of the prior art shall be explained in reference with Fig. 1 to Fig. 3.
Fig. 1 is a schematic diagram that shows the entire structure of a container inspection apparatus of the prior art.
On the Fig. 1, 1 is a container that is to be inspected which is made of transparent material such as glass, plastics or the like, 2 is a lighting device or light source such as a lamp or the like for irradiating the container 1, 3 is a light diffuser plate that is placed between the lighting device 2 and container 1 in order to uniformly diffuse the light from light source 2, 4 is a video camera that is used as an image sensor to pickup the image of container 1, 5 is an electronic processor that processes the output from video camera 4, which is composed of a computer or the like. Ml is a monitor to which the outputs from the video camera 4 and electronic processor 5 are supplied so that the respect.ive windows 6 and 71 - 74 which will be described later 20~1062 re shaped and displayed thereon with the image of container 1.
At this apparatus, the light from the lighting device 2 is uniformly diffused by the light diffuser plate 3 to irradiate the entire body of container 1. This light passes container 1 and is caught by video camera 4, which video output is processed by electronic processor 5 so that the existence or not of defects on the container 1 is detected. Also the container 1 in this case is assumed to be made of transparent material. For containers that are opaque natured, by arranging the composition to catch the reflection light therefrom and electronically processing the same, it is needless to say that a similar container defect inspection can be conducted.
Fig. 2 is a block diagram showing the composition and function of the electronic processor S in the inspection apparatus of the prior art, and Fig. 3 is a schematic diagram that shows the positions of the respective windows relative to the container 1. As shown on Figs. 2 and 3, from the output video signal of video camera 4, firstly, a positioning window 6 is set at the neck portion of container 1 and the center axis X-X
of container 1 is determined by an electronic processing circuit 6A of electronic processor 5. In other words, both side end edges of the neck portion of container 1 that is caught within window 6 are detected, whereas the center axis X-X of container 1 is sought on the basis of the side end edges detected. The purpose for this center axis X-X is to accurately setup the positions of respective inspection windows, that will be described, retative to container 1. In other words, when the container 1 is assumed to be of symmetrical shape with respect to the center axis X-X, the respective inspection windows can be setup to be symmetrical shaped with respect to the center axis X-2~1062 of container l.
On Figs. 2 and 3, 7,, 72 , 73 , 74 indicate the above-mentioned inspection windows. In this case, if 4 inspection windows 7~ to 74 are used and the shapes of the respective inspection window 71 to 74 are adjusted slightly, the change of the shape of container l can be coped with. Further, in order to cope with the change of light transmission factor due to thP
change of the diameter of the same container l dependent on its position, the positions and shapes of the inspection windows 7 to 74 are made different upon electronic processing. ~he existence or not of defects of container l within the four inspection windows 7~ - 74 are judged at a judgement processing circuit 7A simultaneously.
Fig. 3 illustrates the arrangement of the position setting windows 6 and inspection windows 71 , 72 , 73 , 74 for the container l. The reason that the 4 respective inspection windows 71 - 74 are arranged for the one piece of container l in this embodiment is that when there is any variance in the shape of container l, such as (when the diameter of container l changes, or when the shape of its neck portion changes, etc), it will be easy to respond thereto by making slight changes in the dimension or shape of the respective windows 7, - 74 , or in order to respond to the changes of the light transmission factor owing to the differences of the same container l diameter by the positions, separate sensitivities can be setup for respective windows 71 -74 upon electronic processing. Further, on Fig. 3, 8 indicates a design or literal lineup that exists on a part of container l (hereafter called a pattern) where it is difficult to detect the defects only inclusive therein and the inspection for such portion is exempted.
20~10G2 At the inspection apparatus of the prior art as a~ove described, there is no presuppose to conduct inspection to the pattern 8 portion of container 1. However, such pattern 8 generally is existent not only around the entire outer round of the container 1 body, but also many cases are that such pattern 8 is formed only at half round, as an example. In these cases, it is necessary to judge the good or bad of the portions other than the pattern 8 on the container 1 body, but by the conventional apparatuses, it was impossible to judge the good or bad of this portion.
OBJECTS AND SUMMARY OF THE INVENTION
Accordingly, it is an object of the present invention to provide a novel inspection apparatus that entirely removes the faults of such above described apparatus of the prior art.
According to an aspect of the present invention, there is provided an inspection method for detecting existence or not of a defect on an inspected object in which an image of the inspected object irradiated by a light is picked by a video camera and a video signal therefrom is processed by an electronic processor comprising the steps of:
setting up a pattern judging window on said inspected object to thereby judge whether or not there exists a pattern on said inspected object;
setting up a plurality of inspection windows when it is judged that there is no pattern on said inspected object to thereby perform a predetermined defect inspection on portions of said inspected object within said plurality of inspection windows;
setting up a pattern discrimination window on said inspected object when it is judged that there exists a pattern on said 2051~62 .nspected object to thereby discriminate a kind of said pattern;
and either setting up said inspection window or another inspection window dependent on the kind of said pattern discrim:inated.
According to another aspect of the present invention, there is prov:ided an inspection apparatus for detecting existence or not of a defect on an inspected object in which an image of the inspected object irradiated by a light is picked by a video camera and a video signal therefrom is processed by an electronic processor comprising:
a first means for setting up a pattern judging window on said inspected object to thereby judge whether or not there exists a pattern on said inspected object;
a second means for setting up a plurality of inspection windows when it is judged that there is no pattern on said inspected object to thereby perform a predetermined defect inspection on portions of said inspected object within said plurality of inspection windows;
a third means for setting up a pattern discrimination window on said inspected object when it is judged that there exists a pattern on said inspected object to thereby discriminate a kind of said pattern; and a fourth means for either setting up said inspection windows or another inspection window dependent on the kind of said pattern discriminated.
A better understanding of the objects, features and advantages of the invention can be gained from a consideration of the following detailed description of the preferred embodiments thereof, in conjunction with the figures of the accompanying 20~1062 lrawings through which like references designate the same and similar elements.
BRIEF ~ESCRIPTION OF THE DRAWINGS
Fig. 1 is a schematic diagram of a conventional example embodiment to which the present invention is applied;
Fig. 2 is a block diagram that shows the structure and function of the electronic processor on Fig. 1;
Fig. 3 is a schematic diagram that is used to explain the function of an example of the prior art;
Fig. 4 is a block diagram showing the main structure and functions of an embodiment of the present invention; and Figs. 5A, 5B and Figs. 6A1, 6Bl, 6Cl as well as 6A2, 6B2 6C2 are schematic diagrams respectively used for the function explanation of the present invention.
DETAILED DESCRIPTION OF THB PREFERRED EMBODIM~NTS
An embodiment of the present invention will be explained in reference with Fig. 4 to Fig. 6. Further, at this embodiment of the present invention, a similar structure to that the conventional example shown on Fig. 1 is used, so that it is not shown and its explanation will be omitted.
Fig. 4 is a block diagram that shows an example of each of structure and function of electronic processor 5 in the inspection apparatus of the present invention. As shown on Fig.
4, at the present invention, based on the video signal from the video camera 4 (refer to Fig. 1), firstly a positioning window 9 is setup at the neck portion of container 1, and then based on this window 9, the center axis X-X of container 1 is sought by electronic processor 9A. Next, a pattern judgement window 10 that is used to judge whether there is existence or not of a pattern 8 on container 1 is setup.
~0~1062 Now, in order to have an easier understanding of operation of the present invention, the conditions of the respective windows are shown on Figs. 5A and 5B, and the above operation shall be explained as based on Fig. 4 and Figs. 5A and 5B.
At the present invention, the pattern judgement window 10 is setup at the zone portion that was exempted from inspection in the conventional examples as shown on Fig. 5A which is the pattern 8 portion. By the brightness in this window, the existence or not of pattern 8 is detected. In order words, when there is pattern 8 on the outer round of container 1, the irradiated light is diffused at the pattern 8 portion so that the light that arrives at the video camera 4 is weakened. Therefore, by checking the intensity of the light from the pattern 8 portion, the existence or not of pattern 8 is easily detected.
A brightness or darkness processing circuit lOA is used to select the positions, shapes and so on of the respective inspection window that are nextly setup, based on the existence or not of pattern 8 at window 10. That is, the processing circuit lOA operates such that when there exists pattern 8 on container 1, such portion is exempted from the inspection zone while when there is no pattern existing, it selects a separate window that does not exempt the same as described hereafter.
At the present invention, in such case that there is no pa~tern 8 on container 1 and accordingly, the electronic processor circuit lOA judges that such portion is bright, the electronic processor circuit lOA selectively sets up inspection window 11. This inspection window 11, in this case similar to the conventional example, is comprised of 4 windows 11~, 112, 113 ~ 114 . In this case, the difference to the above mentioned conventional case is that, as shown on Fig. 5A, the shape of 20~10~
~indow 114 is different to the conventional window 74 in that it is large enough to include the pattern 8. This is for the purpose to also include this portion in the inspection area when it is judged that there is no pattern. Thus, the defects of container 1 within the windows 11! ~ 114 are totally detected by defect processing circuit llA in the same manner to the conventional example.
On the other hand, when there exists pattern 8 within window 10 and the electronic processor circuit 10A judges the portion 8 as dark, this electronic processor circuit 10A, as shown on Fig.
4, selectively sets up a pattern judgement window 12 instead of window 11, in order to judge the pattern shape, etc. of pattern 8. This window 12, as shown on Fig. 5B, is formed by a pair of two windows 12~, 122 arranged adjacent in the lateral direction.
Then these windows 12l and 122 are setup at the pattern 8 portion of container 1 where there exist designs or letters and so on.
In other words, as shown on Fig. SB, one window 12l is setup at the one side of the pattern 8 portion which can be the left half side, while the other window 122 is setup at the right half side thereof.
In general, the status of the pattern 8 on container 1 varies considerably, such as cases to involve the pattern 8 on the entire outer round of container 1, only involving the pattern 8 on a partial area of container 1 etc. In this case, as shown in Figs. 6Al, 6Bl and 6C1, the instances where roughly half round of container 1 is covered by the pattern 8 shall be explained.
When the video camera 4 picks up container 1, the image of pattern 8 as picked up by the camera 4 shall vary depending upon the angle of container 1 in its rotation direction. This is, for instance, owing to the fact that when inspection is conducted ~hile container l is being transferred on a belt conveyer (not shown), the rotation angle of pattern 8 on container 1 against the video camera 4 becomes unfixed. Figs. 6A1, 6B1 and 6C1 illustrate three cases with different rotation angles of pattern 8 on container 1, in order to explain the operation.
In the case of Fig. 6Al, since both windows 121, 122 equally contain pattern 8, respective electronic processors or brightness detection and dimension processing circuits 121A and 122A will judge that the entire inner areas of both windows 12, and 122 are dark and as shown on Fig. 6A2 will setup the 4 inspection windows 13,, 132, 133, 134. In this case, as the portion containing pattern 8 of container 1 is eliminated from the inspection zone, the respective inspection windows 131 - 134 become the same as those 7, and 74, in the case of conventional art as shown on Fig.
3. A defect detection processor circuit or electronic processing circuit 13A equally processes the defect detection on container 1 within the 4 respective windows 13~ - 134 in the same mànner to conventional cases.
Fig. 6B1 shows the case assuming that the pattern 8 is at the left side of container 1. In this case, one window 12l includes the pattern 8 so that its electronic processor circuit 12~A judges that the area within window 12~ is dark, and sets up the above-mentioned inspection windows 131r 132, 133, 134. At the same time, since there is no pattern 8 existence within window 122, its electronic processor circuit 122A judges that the area within window 122 is bright and hence as shown on Fig.
6B2, in addition to the 4 windows 13~ - 134, sets up an inspection window 13~ at the portion of container 1 where window 122 exists. In this case, the inspection windows 13, - 134 are the same as the inspection windows 111 - 114 so that only 20~10~2 nspection window 135 is added to them. By this inspection window 135, the right side of container 1 which does not have pattern 8 can be inspected. This is a function that was impossible with the conventional apparatus. Then, the defects within t:he 5 windows 13~ - 135 can be totally detection-processed by a defect detection processor circuit or an electronic processing circuit 13A.
Fig. 6C1 illustrates the case assuming that pattern 8 is at the right side on container 1 while the left edge of pattern 8 little protrudes to the left over the center axis X-X of container 1. In this case, the electronic processor circuit 122A of course judges that the area within window 122 is dark and as shown on Fig. 6C2 sets up the inspection windows 13" 132, 133, 134 similarly to the case shown on Fig. 6A2. At the same time, electronic processor circuit 12~A judges that a bright portion partially exists within window 12~, measures the dimention of the left side portion of window 12l where there is no pattern 8, and sets up an inspection window 136 in an appropriate shape as shown on Fig. 6C2 along with windows 131 -134. At this time, the electronic processor circuit 13A equally electronically processes the defects within the 5 windows 131 to 13~ and 136 in the same manner as previously described.
On Fig. 6B1, if one right edge of pattern 8 is protruded to the right side exceeding the center axis X-X of container 1, it is needless to say that same as the case on Fig. 6C2, the electronic processor circuit 122A measures the dimension of the right side of window 122 where the pattern 8 is not existing and sets up an inspection window 135 in an adequate shape.
The judgement outputs from electronic processor circuits llA
and 13A are input to a total judgement circuit 14. The total 20~1062 ,udgement circuit 14 makes the final information output signal as necessary from the judgement outputs of electronic processor circuits llA and 13A and outputs the same. This output signal may be supplied to a host computer and to a printer for recording, or used to control a conveying system and so on although not shown on the drawings. It is needless to say that the judgement outputs from electronic circuits llA and 13A may be directly used at times. Also, as shown on Fig. l, the outputs from video camera 4 as well as electronic processor 5, may be supplied to the monitor M1 so that the respective windows can be displayed thereon as overlapped on the image of container 1, then the apparatus function conditions can be easily verified.
As such as above described, the inspection apparatus of the present invention can flexibly respond to the existence or not of patterns or lettered line or the different appearances of the patterns or lettered line due to the varied angles of rotation of the containers. In the explanations, an example case with containers was cited, but it is apparent that the main concept of the present invention can be applied to other products and commodities. That is to say that it is of course applicable by flexible structures composed without being bond to the sample embodiments as cited, by arrangements of the number of windows as well as the number of processings to such numbers of windows.
Further, although defect inspection depending upon rectangular shaped windows was explained, the window shapes may be freely composed, or as alternative methods for the electronic processing, judgement of the shapes within the windows or the appropriate processing method that respond to the purposes such as measurement of specific areas may be adopted as mentioned above.
20~1062 Further, when the pattern 8 on container 1 is not one as explained above, but is a plural number, by setting up a plural number of pattern judgement windows at the pattern portions in the same number, and conduct the processing against pattern judgement window 10 as shown on Fig. 4, in the same manner to these plural numbered pattern judgement windows, shall suffice.
Also, in accordance to the results of defect detection processing circuits llA, 13A as shown on Fig. 4, setup of pattern judgement window 10 and the consecutive processing in such same manner may be added. It is further needless to say that such processing may be conducted in a multi consecutive manner.
In the case that plural numbers of windows were setup on inspection apparatus of the prior art, the functions were in parallel with exclusive processing conducted, while the setup conditions were constant without flexibility. Against such, the functions of the multi windows of the present invention are setup in a manner of casual relations respectively to each other. That is, in accordance to the results of specific electronic processing to any specific window, the next setup window is selected in order to form a consolidated flow of inspection processing.
Once the windows and electronic processing methods are established so that response to various condition changes is secured, the apparatus automatically judges in compliance with the physical or optical variations of the inspected object, so that a flexible and appropriate consolidated judgement can be made which is a great function of the invention that does not exist with inspection apparatus of the prior art. Therefore, the application range to product inspection of many variations is widened while the setup change manipulations upon making the ~0~10~2 lnspections may be exempted, so that an extremely large merit for practical use is available.
It should be understood that the above description is presented by way of example on the preferred embodiments of the invention and it will be apparent that many modifications and variations thereof could be effected by one with ordinary skill in the art without departing from the spirit and scope of the novel concepts of the invention so that the scope of the invention should be determined only.by the appended claims.
Fig. 6B1 shows the case assuming that the pattern 8 is at the left side of container 1. In this case, one window 12l includes the pattern 8 so that its electronic processor circuit 12~A judges that the area within window 12~ is dark, and sets up the above-mentioned inspection windows 131r 132, 133, 134. At the same time, since there is no pattern 8 existence within window 122, its electronic processor circuit 122A judges that the area within window 122 is bright and hence as shown on Fig.
6B2, in addition to the 4 windows 13~ - 134, sets up an inspection window 13~ at the portion of container 1 where window 122 exists. In this case, the inspection windows 13, - 134 are the same as the inspection windows 111 - 114 so that only 20~10~2 nspection window 135 is added to them. By this inspection window 135, the right side of container 1 which does not have pattern 8 can be inspected. This is a function that was impossible with the conventional apparatus. Then, the defects within t:he 5 windows 13~ - 135 can be totally detection-processed by a defect detection processor circuit or an electronic processing circuit 13A.
Fig. 6C1 illustrates the case assuming that pattern 8 is at the right side on container 1 while the left edge of pattern 8 little protrudes to the left over the center axis X-X of container 1. In this case, the electronic processor circuit 122A of course judges that the area within window 122 is dark and as shown on Fig. 6C2 sets up the inspection windows 13" 132, 133, 134 similarly to the case shown on Fig. 6A2. At the same time, electronic processor circuit 12~A judges that a bright portion partially exists within window 12~, measures the dimention of the left side portion of window 12l where there is no pattern 8, and sets up an inspection window 136 in an appropriate shape as shown on Fig. 6C2 along with windows 131 -134. At this time, the electronic processor circuit 13A equally electronically processes the defects within the 5 windows 131 to 13~ and 136 in the same manner as previously described.
On Fig. 6B1, if one right edge of pattern 8 is protruded to the right side exceeding the center axis X-X of container 1, it is needless to say that same as the case on Fig. 6C2, the electronic processor circuit 122A measures the dimension of the right side of window 122 where the pattern 8 is not existing and sets up an inspection window 135 in an adequate shape.
The judgement outputs from electronic processor circuits llA
and 13A are input to a total judgement circuit 14. The total 20~1062 ,udgement circuit 14 makes the final information output signal as necessary from the judgement outputs of electronic processor circuits llA and 13A and outputs the same. This output signal may be supplied to a host computer and to a printer for recording, or used to control a conveying system and so on although not shown on the drawings. It is needless to say that the judgement outputs from electronic circuits llA and 13A may be directly used at times. Also, as shown on Fig. l, the outputs from video camera 4 as well as electronic processor 5, may be supplied to the monitor M1 so that the respective windows can be displayed thereon as overlapped on the image of container 1, then the apparatus function conditions can be easily verified.
As such as above described, the inspection apparatus of the present invention can flexibly respond to the existence or not of patterns or lettered line or the different appearances of the patterns or lettered line due to the varied angles of rotation of the containers. In the explanations, an example case with containers was cited, but it is apparent that the main concept of the present invention can be applied to other products and commodities. That is to say that it is of course applicable by flexible structures composed without being bond to the sample embodiments as cited, by arrangements of the number of windows as well as the number of processings to such numbers of windows.
Further, although defect inspection depending upon rectangular shaped windows was explained, the window shapes may be freely composed, or as alternative methods for the electronic processing, judgement of the shapes within the windows or the appropriate processing method that respond to the purposes such as measurement of specific areas may be adopted as mentioned above.
20~1062 Further, when the pattern 8 on container 1 is not one as explained above, but is a plural number, by setting up a plural number of pattern judgement windows at the pattern portions in the same number, and conduct the processing against pattern judgement window 10 as shown on Fig. 4, in the same manner to these plural numbered pattern judgement windows, shall suffice.
Also, in accordance to the results of defect detection processing circuits llA, 13A as shown on Fig. 4, setup of pattern judgement window 10 and the consecutive processing in such same manner may be added. It is further needless to say that such processing may be conducted in a multi consecutive manner.
In the case that plural numbers of windows were setup on inspection apparatus of the prior art, the functions were in parallel with exclusive processing conducted, while the setup conditions were constant without flexibility. Against such, the functions of the multi windows of the present invention are setup in a manner of casual relations respectively to each other. That is, in accordance to the results of specific electronic processing to any specific window, the next setup window is selected in order to form a consolidated flow of inspection processing.
Once the windows and electronic processing methods are established so that response to various condition changes is secured, the apparatus automatically judges in compliance with the physical or optical variations of the inspected object, so that a flexible and appropriate consolidated judgement can be made which is a great function of the invention that does not exist with inspection apparatus of the prior art. Therefore, the application range to product inspection of many variations is widened while the setup change manipulations upon making the ~0~10~2 lnspections may be exempted, so that an extremely large merit for practical use is available.
It should be understood that the above description is presented by way of example on the preferred embodiments of the invention and it will be apparent that many modifications and variations thereof could be effected by one with ordinary skill in the art without departing from the spirit and scope of the novel concepts of the invention so that the scope of the invention should be determined only.by the appended claims.
Claims (22)
1. An inspection method for detecting existence or not of a defect on an inspected object in which an image of the inspected object irradiated by a light is picked by a video camera and a video signal therefrom is processed by an electronic processor comprising the steps of:
a) setting up a pattern judging window on said inspected object to thereby judge whether or not there exists a pattern on said inspected object;
b) setting up a plurality of inspection windows when it is judged that there is no pattern on said inspected object to thereby perform a predetermined defect inspection on portions of said inspected object within said plurality of inspection windows;
c) setting up a pattern discrimination window on said inspected object when it is judged that there exists a pattern on said inspected object to thereby discriminate a kind of said pattern; and d) either setting up said inspection window or another inspection window dependent on the kind of said pattern discriminated.
a) setting up a pattern judging window on said inspected object to thereby judge whether or not there exists a pattern on said inspected object;
b) setting up a plurality of inspection windows when it is judged that there is no pattern on said inspected object to thereby perform a predetermined defect inspection on portions of said inspected object within said plurality of inspection windows;
c) setting up a pattern discrimination window on said inspected object when it is judged that there exists a pattern on said inspected object to thereby discriminate a kind of said pattern; and d) either setting up said inspection window or another inspection window dependent on the kind of said pattern discriminated.
2. An inspection apparatus for detecting existence or not of a defect on an inspected object in which an image of the inspected object irradiated by a light is picked by a video camera and a video signal therefrom is processed by an electronic processor comprising:
a) a first means for setting up a pattern judging window on said inspected object to thereby judge whether or not there exists a pattern on said inspected object;
b) a second means for setting up a plurality of inspection indows when it is judged that there is no pattern on said inspected object to thereby perform a predetermined defect inspection on portions of said inspected object within said plurality of inspection windows;
c) a third means for setting up a pattern discrimination window on said inspected object when it is judged that there exists a pattern on said inspected object to thereby discriminate a kind of said pattern; and d) a fourth means for either setting up said inspection windows or another inspection window dependent on the kind of said pattern discriminated.
a) a first means for setting up a pattern judging window on said inspected object to thereby judge whether or not there exists a pattern on said inspected object;
b) a second means for setting up a plurality of inspection indows when it is judged that there is no pattern on said inspected object to thereby perform a predetermined defect inspection on portions of said inspected object within said plurality of inspection windows;
c) a third means for setting up a pattern discrimination window on said inspected object when it is judged that there exists a pattern on said inspected object to thereby discriminate a kind of said pattern; and d) a fourth means for either setting up said inspection windows or another inspection window dependent on the kind of said pattern discriminated.
3. An inspection method for detecting existence or not of defects on an inspected object comprising the steps of:
a) irradiating light on an inspected object, picking up the reflected or transmission light therefrom by a video camera for photoelectrical conversion and analyzing an image signal output from said video camera by an electronic processor;
b) setting up a first window with a predetermined shape in an image picked up by said video camera at a predetermined position;
c) conducting a first preset electronic processing for an image within said first window;
d) setting up a plurality of second windows of preset positions and shapes for inspection on the inspected object based on the result of the first preset electronic processing conducted against the image within the first window;
e) conducting a second preset electronic processing against an image within said second windows;
f) setting a third window having a preset position and shape against the inspected object based on the first preset ?lectronic processing results;
g) conducting a third preset electronic processing against an image within said third window;
based upon the results of said third electronic processing, either changing a part of said second window or setting up a fourth window, conducting a fourth preset electronic processing to an image within said fourth window based upon the results of said fourth electronic processing, either setting up said second window or setting up a fifth window in addition to said second window; and h) conducting a fifth preset electronic processing against an image within the said second window and/or fifth window, so that inspection of the existence or not of defects on the inspected object may be conducted.
a) irradiating light on an inspected object, picking up the reflected or transmission light therefrom by a video camera for photoelectrical conversion and analyzing an image signal output from said video camera by an electronic processor;
b) setting up a first window with a predetermined shape in an image picked up by said video camera at a predetermined position;
c) conducting a first preset electronic processing for an image within said first window;
d) setting up a plurality of second windows of preset positions and shapes for inspection on the inspected object based on the result of the first preset electronic processing conducted against the image within the first window;
e) conducting a second preset electronic processing against an image within said second windows;
f) setting a third window having a preset position and shape against the inspected object based on the first preset ?lectronic processing results;
g) conducting a third preset electronic processing against an image within said third window;
based upon the results of said third electronic processing, either changing a part of said second window or setting up a fourth window, conducting a fourth preset electronic processing to an image within said fourth window based upon the results of said fourth electronic processing, either setting up said second window or setting up a fifth window in addition to said second window; and h) conducting a fifth preset electronic processing against an image within the said second window and/or fifth window, so that inspection of the existence or not of defects on the inspected object may be conducted.
4. An inspection apparatus for detecting existence or not of defects on an inspected objects comprising:
a) light source for irradiating an inspected object;
b) a video camera picking up reflection or transmission light from said inspected object and for producing a video signal;
c) an electronical processor for analyzing said video signal and setting up a first window having a preset place and shape against an image of the inspected object within an image as caught by said video camera;
d) a first electronic processor for performing a first preset electronic processing against the image within said first window;
e) a first means for, based on the results of the first preset electronic processing conducted against an image within the said first window, setting up a plural number of second windows with preset shapes and places for inspection against the inspected object;
f) a second electronic processor for performing a second preset electronic processing against an image within the said second window;
g) a second means for, based on the results of the first preset electronic processing, setting up a third window with preset place and shape against said inspected object;
h) a third electronic processor for conducting a third preset electronic processing against an image within said third window;
i) a third means for, based on the results of said third electronic processor either changing a part of said second windows or setting up a fourth window;
j) a fourth electronic processor for conducting a fourth preset electronic processing against an image within the said fourth window;
k) a fourth means for, based on the results of said fourth electronic processing, either setting the said second windows or setting up a fifth window; and l) a fifth electronic processor for conducting a fifth electronic processing against an image within said second windows and/or fifth window to thereby detect whether or not there is a defect on the inspected object.
a) light source for irradiating an inspected object;
b) a video camera picking up reflection or transmission light from said inspected object and for producing a video signal;
c) an electronical processor for analyzing said video signal and setting up a first window having a preset place and shape against an image of the inspected object within an image as caught by said video camera;
d) a first electronic processor for performing a first preset electronic processing against the image within said first window;
e) a first means for, based on the results of the first preset electronic processing conducted against an image within the said first window, setting up a plural number of second windows with preset shapes and places for inspection against the inspected object;
f) a second electronic processor for performing a second preset electronic processing against an image within the said second window;
g) a second means for, based on the results of the first preset electronic processing, setting up a third window with preset place and shape against said inspected object;
h) a third electronic processor for conducting a third preset electronic processing against an image within said third window;
i) a third means for, based on the results of said third electronic processor either changing a part of said second windows or setting up a fourth window;
j) a fourth electronic processor for conducting a fourth preset electronic processing against an image within the said fourth window;
k) a fourth means for, based on the results of said fourth electronic processing, either setting the said second windows or setting up a fifth window; and l) a fifth electronic processor for conducting a fifth electronic processing against an image within said second windows and/or fifth window to thereby detect whether or not there is a defect on the inspected object.
5. An inspection method as claimed in claim 3, wherein said third window is a pattern judgement window for judging whether a pattern exists or not on the inspected object.
6. An inspection method as claim in claim 3, wherein said second preset electronic processing is a defect detection processing.
7. An inspection method as claimed in claim 5, wherein said third preset electronic processing is a brightness and darkness judgement processing.
8. An inspection method as claimed in claim 3, wherein said fourth window is a pattern discrimination window.
9. An inspection method as claimed in claim 8, wherein said pattern discrimination window is comprised of two windows.
10. An inspection method as claimed in claim 9, wherein said fourth preset electronic processing is brightness and darkness judgement and dimentional processings.
11. An inspection method as claimed in claim 3, wherein said fifth window is an inspection window.
12. An inspection method as claimed in claim 3, wherein said fifth preset electronic processing is a defect detection processing.
13. An inspection method according to claim 3 further comprising the step of totally judging the results of said second and fifth preset electronic processings to detect whether or not there exists a defect.
14. An inspection apparatus as claimed in claim 4, wherein said third window is a pattern judgement window for judging whether or not there is a pattern on the said inspected object.
15. An inspection apparatus as claimed in claim 4, wherein said second preset electronic processing circuit is a defect detection processing circuit.
16. An inspection apparatus as claimed in claim 14, wherein said third preset electronic processing circuit is a brightness and darkness judgement processing circuit.
17. An inspection apparatus as claimed in claim 4, wherein said fourth window is a pattern discrimination window.
18. An inspection apparatus as claimed in claim 16, wherein said pattern discrimination window is comprised of two windows.
19. An inspection apparatus as claimed in claim 18, wherein said fourth preset electronic processing circuit is a brightness and darkness judgement and dimentional processing circuit.
20. An inspection apparatus as claimed in claim 4, wherein said fifth window is an inspection window.
21. An inspection apparatus as claimed in claim 4, wherein said fifth preset electronic processing circuit is a defect detection processing circuit.
22. An inspection apparatus according to claim 4, further comprising defect existence inspection means which is conducted by feeding outputs from said second and fifth electronic processing circuits to a consolidated judgement circuit.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2249711A JPH0736004B2 (en) | 1990-09-19 | 1990-09-19 | Inspection method and device |
| JP249711/1990 | 1990-09-19 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA2051062A1 true CA2051062A1 (en) | 1992-03-20 |
Family
ID=17197065
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA002051062A Abandoned CA2051062A1 (en) | 1990-09-19 | 1991-09-10 | Inspection method and apparatus |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US5187573A (en) |
| JP (1) | JPH0736004B2 (en) |
| AU (1) | AU8380691A (en) |
| CA (1) | CA2051062A1 (en) |
| DE (1) | DE4130373A1 (en) |
| FR (1) | FR2667399A1 (en) |
| GB (1) | GB2248930A (en) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2893078B2 (en) * | 1990-12-06 | 1999-05-17 | オムロン株式会社 | Shading correction method and device |
| JP3484196B2 (en) * | 1993-04-30 | 2004-01-06 | ウールマン ヴィジオテック ゲゼルシャフト ミット ベシュレンクテル ハフツング | Method and apparatus for sorting material parts |
| US5486692A (en) * | 1994-10-19 | 1996-01-23 | Emhart Glass Machinery Investments Inc. | Glassware inspection machine comprising diffused light sources and two-dimensional cameras |
| US6064429A (en) * | 1997-08-18 | 2000-05-16 | Mcdonnell Douglas Corporation | Foreign object video detection and alert system and method |
| JP4670090B2 (en) * | 2000-08-11 | 2011-04-13 | 味の素株式会社 | Foreign matter inspection apparatus for flexible plastic container and foreign matter inspection method thereof |
| US6621573B2 (en) * | 2001-02-27 | 2003-09-16 | Emhart Glass, S.A. | Glass container inspection machine |
| US7171033B2 (en) * | 2001-03-28 | 2007-01-30 | The Boeing Company | System and method for identifying defects in a composite structure |
| US6871684B2 (en) | 2002-08-13 | 2005-03-29 | The Boeing Company | System for identifying defects in a composite structure |
| US20060108048A1 (en) * | 2004-11-24 | 2006-05-25 | The Boeing Company | In-process vision detection of flaws and fod by back field illumination |
| US7424902B2 (en) | 2004-11-24 | 2008-09-16 | The Boeing Company | In-process vision detection of flaw and FOD characteristics |
| DE102007021130A1 (en) | 2007-05-03 | 2008-11-13 | Panasonic Electric Works Europe Ag | Method for the automatic determination of test areas, test methods and test system |
| FR2961599B1 (en) * | 2010-06-18 | 2012-08-24 | Sgd Sa | AUTOMATED DECOR OPTICAL CONTROL METHOD AND AUTOMATED AUTOMATED CONTROL DEVICE THEREFOR. |
| US10001445B2 (en) * | 2011-09-27 | 2018-06-19 | Ring Container Technologies, Llc | Vision system |
| DE102012009783B3 (en) * | 2012-05-18 | 2013-08-14 | Khs Gmbh | Method and device for inspection of empty bottles |
| FR2991052B1 (en) | 2012-05-28 | 2015-05-01 | Msc & Sgcc | OPTICAL METHOD FOR INSPECTING TRANSPARENT OR TRANSLUCENT CONTAINERS WITH VISUAL REASONS |
| JP6796704B2 (en) * | 2017-02-28 | 2020-12-09 | 東洋ガラス株式会社 | Container inspection device and container inspection method |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4002823A (en) * | 1974-11-01 | 1977-01-11 | Ball Corporation | Method and apparatus for video inspection of articles of manufacture |
| GB1581392A (en) * | 1976-11-04 | 1980-12-10 | Industrial Dynamics Co | Optical bottle inspection apparatus |
| DE2705936B2 (en) * | 1977-02-10 | 1979-11-08 | Barry-Wehmiller Co., Saint Louis, Mo. (V.St.A.) | Method and arrangement for electronic image analysis |
| US4691231A (en) * | 1985-10-01 | 1987-09-01 | Vistech Corporation | Bottle inspection system |
| US4915237A (en) * | 1986-09-11 | 1990-04-10 | Inex/Vistech Technologies, Inc. | Comprehensive container inspection system |
| US5007096A (en) * | 1987-02-18 | 1991-04-09 | Hajime Industries Ltd. | Object inspection apparatus |
| DE8702811U1 (en) * | 1987-02-24 | 1987-07-09 | Hajime Industries, Ltd., Tokio/Tokyo, Jp | |
| US4910411A (en) * | 1988-02-12 | 1990-03-20 | Sumitumo Rubber Industries | Apparatus for inspecting a side wall of a tire |
| JPH0641924B2 (en) * | 1988-05-27 | 1994-06-01 | 株式会社キリンテクノシステム | Defect detection device for bottle body |
| US5046111A (en) * | 1989-02-09 | 1991-09-03 | Philip Morris Incorporated | Methods and apparatus for optically determining the acceptability of products |
-
1990
- 1990-09-19 JP JP2249711A patent/JPH0736004B2/en not_active Expired - Lifetime
-
1991
- 1991-09-10 CA CA002051062A patent/CA2051062A1/en not_active Abandoned
- 1991-09-11 US US07/757,543 patent/US5187573A/en not_active Expired - Fee Related
- 1991-09-11 AU AU83806/91A patent/AU8380691A/en not_active Abandoned
- 1991-09-12 GB GB9119503A patent/GB2248930A/en not_active Withdrawn
- 1991-09-12 DE DE4130373A patent/DE4130373A1/en not_active Withdrawn
- 1991-09-19 FR FR9111556A patent/FR2667399A1/en not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| US5187573A (en) | 1993-02-16 |
| GB9119503D0 (en) | 1991-10-23 |
| DE4130373A1 (en) | 1992-03-26 |
| JPH04128635A (en) | 1992-04-30 |
| GB2248930A (en) | 1992-04-22 |
| FR2667399A1 (en) | 1992-04-03 |
| AU8380691A (en) | 1992-03-26 |
| JPH0736004B2 (en) | 1995-04-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CA2051062A1 (en) | Inspection method and apparatus | |
| CA1228136A (en) | Surface inspection apparatus | |
| CA1065436A (en) | Method and apparatus for video inspection of articles of manufacture | |
| EP0344617B1 (en) | Method and apparatus for inspecting sidewalls of bottles | |
| US4682023A (en) | Bottle sidewall defect detector employing masking means | |
| CA1261026A (en) | Bottle mouth defect inspection apparatus | |
| AU672094B2 (en) | Apparatus for inspecting a bottom border portion of a transparent glass vessel for a foreign article | |
| WO1999026052A3 (en) | Automatic lens inspection system | |
| US6911653B2 (en) | Inspecting method and apparatus for foreign matter | |
| US4487322A (en) | Method for inspecting glass containers | |
| JP3929647B2 (en) | Tablet appearance inspection device and PTP packaging machine | |
| JPH11295034A (en) | Inspecting device for vessel | |
| JP3155106B2 (en) | Bottle seal appearance inspection method and apparatus | |
| JPH06186002A (en) | Inspection method for outside appearance of label and its device | |
| JPH11271240A (en) | Inspection method for foreign matter on inner surface of paper cup container | |
| JPH07121721A (en) | Printed character inspecting method | |
| JP2960672B2 (en) | Filling amount inspection device | |
| JP2735964B2 (en) | Label inspection device | |
| JPH10160676A (en) | Rice grain inspection device | |
| JPS6186370A (en) | Automatic package inspection unit | |
| JPS57208153A (en) | Inspecting method for defective aluminum pattern of semiconductor or the like | |
| US20040263619A1 (en) | Container inspection machine | |
| JPS62192638A (en) | Inspecting method for colored capsule | |
| JP2000055827A (en) | Method and device for inspecting mouth part of glass container, etc. | |
| JPS63282639A (en) | Inspecting instrument for label of glass bottle with circular section |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FZDE | Discontinued |